Expected (dashed black line) and observed (solid red line) 95% CL exclusion limits on the higgsino simplified model being considered. These are shown with $\pm 1\sigma_{\mathrm{exp}}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm 1\sigma_{\mathrm{theory}}^{\mathrm{SUSY}}$ (red dotted lines) from signal cross-section uncertainties, respectively. The limits set by the latest ATLAS searches using the soft lepton and disappearing track signatures are illustrated by the blue and green regions, respectively, while the limit imposed by the LEP experiments is shown in gray. The dot-dashed gray line indicates the predicted mass-splitting for the pure higgsino scenario.

Expected (dashed black line) and observed (solid red line) 95% CL exclusion limits on the higgsino simplified model being considered. These are shown with $\pm 1\sigma_{\mathrm{exp}}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm 1\sigma_{\mathrm{theory}}^{\mathrm{SUSY}}$ (red dotted lines) from signal cross-section uncertainties, respectively. The limits set by the latest ATLAS searches using the soft lepton and disappearing track signatures are illustrated by the blue and green regions, respectively, while the limit imposed by the LEP experiments is shown in gray. The dot-dashed gray line indicates the predicted mass-splitting for the pure higgsino scenario.

Expected (dashed black line) and observed (solid red line) 95% CL exclusion limits on the higgsino simplified model being considered. These are shown with $\pm 1\sigma_{\mathrm{exp}}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm 1\sigma_{\mathrm{theory}}^{\mathrm{SUSY}}$ (red dotted lines) from signal cross-section uncertainties, respectively. The limits set by the latest ATLAS searches using the soft lepton and disappearing track signatures are illustrated by the blue and green regions, respectively, while the limit imposed by the LEP experiments is shown in gray. The dot-dashed gray line indicates the predicted mass-splitting for the pure higgsino scenario.

Expected (dashed black line) and observed (solid red line) 95% CL exclusion limits on the higgsino simplified model being considered. These are shown with $\pm 1\sigma_{\mathrm{exp}}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm 1\sigma_{\mathrm{theory}}^{\mathrm{SUSY}}$ (red dotted lines) from signal cross-section uncertainties, respectively. The limits set by the latest ATLAS searches using the soft lepton and disappearing track signatures are illustrated by the blue and green regions, respectively, while the limit imposed by the LEP experiments is shown in gray. The dot-dashed gray line indicates the predicted mass-splitting for the pure higgsino scenario.

Expected (dashed black line) and observed (solid red line) 95% CL exclusion limits on the higgsino simplified model being considered. These are shown with $\pm 1\sigma_{\mathrm{exp}}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm 1\sigma_{\mathrm{theory}}^{\mathrm{SUSY}}$ (red dotted lines) from signal cross-section uncertainties, respectively. The limits set by the latest ATLAS searches using the soft lepton and disappearing track signatures are illustrated by the blue and green regions, respectively, while the limit imposed by the LEP experiments is shown in gray. The dot-dashed gray line indicates the predicted mass-splitting for the pure higgsino scenario.

Expected (dashed black line) and observed (solid red line) 95% CL exclusion limits on the higgsino simplified model being considered. These are shown with $\pm 1\sigma_{\mathrm{exp}}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm 1\sigma_{\mathrm{theory}}^{\mathrm{SUSY}}$ (red dotted lines) from signal cross-section uncertainties, respectively. The limits set by the latest ATLAS searches using the soft lepton and disappearing track signatures are illustrated by the blue and green regions, respectively, while the limit imposed by the LEP experiments is shown in gray. The dot-dashed gray line indicates the predicted mass-splitting for the pure higgsino scenario.

Expected (dashed black line) and observed (solid red line) 95% CL exclusion limits on the higgsino simplified model being considered. These are shown with $\pm 1\sigma_{\mathrm{exp}}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm 1\sigma_{\mathrm{theory}}^{\mathrm{SUSY}}$ (red dotted lines) from signal cross-section uncertainties, respectively. The limits set by the latest ATLAS searches using the soft lepton and disappearing track signatures are illustrated by the blue and green regions, respectively, while the limit imposed by the LEP experiments is shown in gray. The dot-dashed gray line indicates the predicted mass-splitting for the pure higgsino scenario.

Expected (dashed black line) and observed (solid red line) 95% CL exclusion limits on the higgsino simplified model being considered. These are shown with $\pm 1\sigma_{\mathrm{exp}}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm 1\sigma_{\mathrm{theory}}^{\mathrm{SUSY}}$ (red dotted lines) from signal cross-section uncertainties, respectively. The limits set by the latest ATLAS searches using the soft lepton and disappearing track signatures are illustrated by the blue and green regions, respectively, while the limit imposed by the LEP experiments is shown in gray. The dot-dashed gray line indicates the predicted mass-splitting for the pure higgsino scenario.

Expected (dashed black line) and observed (solid red line) 95% CL exclusion limits on the higgsino simplified model being considered. These are shown with $\pm 1\sigma_{\mathrm{exp}}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm 1\sigma_{\mathrm{theory}}^{\mathrm{SUSY}}$ (red dotted lines) from signal cross-section uncertainties, respectively. The limits set by the latest ATLAS searches using the soft lepton and disappearing track signatures are illustrated by the blue and green regions, respectively, while the limit imposed by the LEP experiments is shown in gray. The dot-dashed gray line indicates the predicted mass-splitting for the pure higgsino scenario.

Expected (dashed black line) and observed (solid red line) 95% CL exclusion limits on the higgsino simplified model being considered. These are shown with $\pm 1\sigma_{\mathrm{exp}}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm 1\sigma_{\mathrm{theory}}^{\mathrm{SUSY}}$ (red dotted lines) from signal cross-section uncertainties, respectively. The limits set by the latest ATLAS searches using the soft lepton and disappearing track signatures are illustrated by the blue and green regions, respectively, while the limit imposed by the LEP experiments is shown in gray. The dot-dashed gray line indicates the predicted mass-splitting for the pure higgsino scenario.

Expected (dashed black line) and observed (solid red line) 95% CL exclusion limits on the higgsino simplified model being considered. These are shown with $\pm 1\sigma_{\mathrm{exp}}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm 1\sigma_{\mathrm{theory}}^{\mathrm{SUSY}}$ (red dotted lines) from signal cross-section uncertainties, respectively. The limits set by the latest ATLAS searches using the soft lepton and disappearing track signatures are illustrated by the blue and green regions, respectively, while the limit imposed by the LEP experiments is shown in gray. The dot-dashed gray line indicates the predicted mass-splitting for the pure higgsino scenario.

Expected and observed CLs values per signal point represented by the grey numbers. The expected (dashed) and observed (solid) 95% CL exclusion limits are overlaid along with $\pm 1\sigma_{\mathrm{exp}}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm 1\sigma_{\mathrm{theory}}^{\mathrm{SUSY}}$ (red dotted lines) from signal cross-section uncertainties, respectively.

Expected and observed CLs values per signal point represented by the grey numbers. The expected (dashed) and observed (solid) 95% CL exclusion limits are overlaid along with $\pm 1\sigma_{\mathrm{exp}}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm 1\sigma_{\mathrm{theory}}^{\mathrm{SUSY}}$ (red dotted lines) from signal cross-section uncertainties, respectively.

Expected and observed CLs values per signal point represented by the grey numbers. The expected (dashed) and observed (solid) 95% CL exclusion limits are overlaid along with $\pm 1\sigma_{\mathrm{exp}}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm 1\sigma_{\mathrm{theory}}^{\mathrm{SUSY}}$ (red dotted lines) from signal cross-section uncertainties, respectively.

Expected and observed CLs values per signal point represented by the grey numbers. The expected (dashed) and observed (solid) 95% CL exclusion limits are overlaid along with $\pm 1\sigma_{\mathrm{exp}}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm 1\sigma_{\mathrm{theory}}^{\mathrm{SUSY}}$ (red dotted lines) from signal cross-section uncertainties, respectively.

Expected and observed cross-section upper-limit per signal point represented by the grey numbers. The expected (dashed) and observed (solid) 95% CL exclusion limits are overlaid along with $\pm 1\sigma_{\mathrm{exp}}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm 1\sigma_{\mathrm{theory}}^{\mathrm{SUSY}}$ (red dotted lines) from signal cross-section uncertainties, respectively.

Expected and observed cross-section upper-limit per signal point represented by the grey numbers. The expected (dashed) and observed (solid) 95% CL exclusion limits are overlaid along with $\pm 1\sigma_{\mathrm{exp}}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm 1\sigma_{\mathrm{theory}}^{\mathrm{SUSY}}$ (red dotted lines) from signal cross-section uncertainties, respectively.

Expected and observed cross-section upper-limit per signal point represented by the grey numbers. The expected (dashed) and observed (solid) 95% CL exclusion limits are overlaid along with $\pm 1\sigma_{\mathrm{exp}}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm 1\sigma_{\mathrm{theory}}^{\mathrm{SUSY}}$ (red dotted lines) from signal cross-section uncertainties, respectively.

Expected and observed cross-section upper-limit per signal point represented by the grey numbers. The expected (dashed) and observed (solid) 95% CL exclusion limits are overlaid along with $\pm 1\sigma_{\mathrm{exp}}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm 1\sigma_{\mathrm{theory}}^{\mathrm{SUSY}}$ (red dotted lines) from signal cross-section uncertainties, respectively.

Truth-level signal acceptances for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$) in a SR with the $S(d_0)$ requirement removed. The acceptance is defined as the fraction of accepted events divided by the total number of events in the generator-level signal Monte Carlo simulation, where the signal candidate track is identified as the charged particle with the largest distance between the interaction vertex and the secondary vertex of the higgsino decays.

Truth-level signal acceptances for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$) in a SR with the $S(d_0)$ requirement removed. The acceptance is defined as the fraction of accepted events divided by the total number of events in the generator-level signal Monte Carlo simulation, where the signal candidate track is identified as the charged particle with the largest distance between the interaction vertex and the secondary vertex of the higgsino decays.

Truth-level signal acceptances for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$) in a SR with the $S(d_0)$ requirement removed. The acceptance is defined as the fraction of accepted events divided by the total number of events in the generator-level signal Monte Carlo simulation, where the signal candidate track is identified as the charged particle with the largest distance between the interaction vertex and the secondary vertex of the higgsino decays.

Truth-level signal acceptances for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$) in a SR with the $S(d_0)$ requirement removed. The acceptance is defined as the fraction of accepted events divided by the total number of events in the generator-level signal Monte Carlo simulation, where the signal candidate track is identified as the charged particle with the largest distance between the interaction vertex and the secondary vertex of the higgsino decays.

Truth-level signal acceptances for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$) in a SR with the $S(d_0)$ requirement removed. The acceptance is defined as the fraction of accepted events divided by the total number of events in the generator-level signal Monte Carlo simulation, where the signal candidate track is identified as the charged particle with the largest distance between the interaction vertex and the secondary vertex of the higgsino decays.

Truth-level signal acceptances for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$) in a SR with the $S(d_0)$ requirement removed. The acceptance is defined as the fraction of accepted events divided by the total number of events in the generator-level signal Monte Carlo simulation, where the signal candidate track is identified as the charged particle with the largest distance between the interaction vertex and the secondary vertex of the higgsino decays.

Truth-level signal acceptances for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$) in a SR with the $S(d_0)$ requirement removed. The acceptance is defined as the fraction of accepted events divided by the total number of events in the generator-level signal Monte Carlo simulation, where the signal candidate track is identified as the charged particle with the largest distance between the interaction vertex and the secondary vertex of the higgsino decays.

Truth-level signal acceptances for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$) in a SR with the $S(d_0)$ requirement removed. The acceptance is defined as the fraction of accepted events divided by the total number of events in the generator-level signal Monte Carlo simulation, where the signal candidate track is identified as the charged particle with the largest distance between the interaction vertex and the secondary vertex of the higgsino decays.

Truth-level signal acceptances for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$) in a SR with the $S(d_0)$ requirement removed. The acceptance is defined as the fraction of accepted events divided by the total number of events in the generator-level signal Monte Carlo simulation, where the signal candidate track is identified as the charged particle with the largest distance between the interaction vertex and the secondary vertex of the higgsino decays.

Truth-level signal acceptances for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$) in a SR with the $S(d_0)$ requirement removed. The acceptance is defined as the fraction of accepted events divided by the total number of events in the generator-level signal Monte Carlo simulation, where the signal candidate track is identified as the charged particle with the largest distance between the interaction vertex and the secondary vertex of the higgsino decays.

Truth-level signal acceptances for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$) in a SR with the $S(d_0)$ requirement removed. The acceptance is defined as the fraction of accepted events divided by the total number of events in the generator-level signal Monte Carlo simulation, where the signal candidate track is identified as the charged particle with the largest distance between the interaction vertex and the secondary vertex of the higgsino decays.

Truth-level signal acceptances for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$) in a SR with the $S(d_0)$ requirement removed. The acceptance is defined as the fraction of accepted events divided by the total number of events in the generator-level signal Monte Carlo simulation, where the signal candidate track is identified as the charged particle with the largest distance between the interaction vertex and the secondary vertex of the higgsino decays.

Signal efficiencies in SR-Low for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-Low for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-Low for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-Low for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-Low for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-Low for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-Low for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-Low for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-Low for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-Low for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-Low for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-Low for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-High for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-High for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-High for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-High for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-High for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-High for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-High for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-High for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-High for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-High for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-High for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-High for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Event selection cutflows for signal samples with $m(\tilde{\chi}_{1}^0)$ = 150 GeV and $\Delta m(\tilde{\chi}_{1}^\pm, \tilde{\chi}_{1}^0)$ = 1.5, 1.0, and 0.75 GeV, including all six production processes ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$). The cross-section used to obtain the initial number of events ($\sigma(\mathrm{n}_{\mathrm{jets}}) \geq 1$) refers to an emission of at least one gluon or quark with $p_{\mathrm{T}} > 50$ GeV at the parton level.

Event selection cutflows for signal samples with $m(\tilde{\chi}_{1}^0)$ = 150 GeV and $\Delta m(\tilde{\chi}_{1}^\pm, \tilde{\chi}_{1}^0)$ = 1.5, 1.0, and 0.75 GeV, including all six production processes ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$). The cross-section used to obtain the initial number of events ($\sigma(\mathrm{n}_{\mathrm{jets}}) \geq 1$) refers to an emission of at least one gluon or quark with $p_{\mathrm{T}} > 50$ GeV at the parton level.

Event selection cutflows for signal samples with $m(\tilde{\chi}_{1}^0)$ = 150 GeV and $\Delta m(\tilde{\chi}_{1}^\pm, \tilde{\chi}_{1}^0)$ = 0.5, 0.35, and 0.25 GeV, including all six production processes ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$). The cross-section used to obtain the initial number of events ($\sigma(\mathrm{n}_{\mathrm{jets}}) \geq 1$) refers to an emission of at least one gluon or quark with $p_{\mathrm{T}} > 50$ GeV at the parton level.

Event selection cutflows for signal samples with $m(\tilde{\chi}_{1}^0)$ = 150 GeV and $\Delta m(\tilde{\chi}_{1}^\pm, \tilde{\chi}_{1}^0)$ = 0.5, 0.35, and 0.25 GeV, including all six production processes ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$). The cross-section used to obtain the initial number of events ($\sigma(\mathrm{n}_{\mathrm{jets}}) \geq 1$) refers to an emission of at least one gluon or quark with $p_{\mathrm{T}} > 50$ GeV at the parton level.

Distribution of $m_{\mathrm{JJ}}$ in the SR (black points) compared to the background-only expectation, where the shape is derived from the CR and the normalisation is fitted in the SR.

Observed and expected limits at 95% CL on the cross-section times branching ratio for the production of dark quarks through a $Z^\prime$ as a function of the $Z^\prime$ mass for model A (see the text for details). The darker and lighter shaded bands around the expected limits represent the $\pm 1 \sigma$ and $\pm 2 \sigma$ uncertainty range, respectively.

The predicted theory cross-section times branching ratio for the production of dark quarks through a $Z^\prime$ as a function of the $Z^\prime$ mass for model A (see the text for details). In the theory model, a universal coupling of the $Z^\prime$ to each SM quark $g_q$ is assumed and the dark quarks are all represented by one species with an effective coupling $g_{q_d}$ to the $Z^\prime$. For model A, the predicted cross-section is shown for $g_q=0.05$ and $g_{q_d} = 0.2$.

Observed and expected limits at 95% CL on the cross-section times branching ratio for the production of dark quarks through a $Z^\prime$ as a function of the $Z^\prime$ mass for model B (see the text for details). The darker and lighter shaded bands around the expected limits represent the $\pm 1 \sigma$ and $\pm 2 \sigma$ uncertainty range, respectively.

The predicted theory cross-section times branching ratio for the production of dark quarks through a $Z^\prime$ as a function of the $Z^\prime$ mass for model B (see the text for details). In the theory model, a universal coupling of the $Z^\prime$ to each SM quark $g_q$ is assumed and the dark quarks are all represented by one species with an effective coupling $g_{q_d}$ to the $Z^\prime$. For model B, the predicted cross-section is shown for $g_q=0.15$ and $g_{q_d} = 0.5$.

Observed and expected limits at 95% CL on the cross-section times branching ratio for the production of dark quarks through a $Z^\prime$ as a function of the $Z^\prime$ mass for model C (see the text for details). The darker and lighter shaded bands around the expected limits represent the $\pm 1 \sigma$ and $\pm 2 \sigma$ uncertainty range, respectively.

The predicted theory cross-section times branching ratio for the production of dark quarks through a $Z^\prime$ as a function of the $Z^\prime$ mass for model C (see the text for details). In the theory model, a universal coupling of the $Z^\prime$ to each SM quark $g_q$ is assumed and the dark quarks are all represented by one species with an effective coupling $g_{q_d}$ to the $Z^\prime$. For model C, the predicted cross-section is shown for $g_q=0.15$ and $g_{q_d}= 0.5$.

Observed and expected limits at 95% CL on the cross-section times branching ratio for the production of dark quarks through a $Z^\prime$ as a function of the $Z^\prime$ mass for model D (see the text for details). The darker and lighter shaded bands around the expected limits represent the $\pm 1 \sigma$ and $\pm 2 \sigma$ uncertainty range, respectively.

The predicted theory cross-section times branching ratio for the production of dark quarks through a $Z^\prime$ as a function of the $Z^\prime$ mass for model D (see the text for details). In the theory model, a universal coupling of the $Z^\prime$ to each SM quark $g_q$ is assumed and the dark quarks are all represented by one species with an effective coupling $g_{q_d}$ to the $Z^\prime$. For model D, the predicted cross-section is shown for $g_q=0.05$ and $g_{q_d} = 0.2$.

Relative efficiency (in %) of each stage of the analysis selection with respect to the previous one for models A through D and $m_{Z^\prime}=2.5$ TeV. Approximately 90000 events were generated per signal mass hypothesis.

Unfolded $M(l^{-}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64822.9 $\pm$ 254.6, NPowHeg truth =634276.

Unfolded dR distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64273.2 $\pm$ 253.5, NPowHeg truth =338671.

Unfolded dR distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 65362.4 $\pm$ 255.7 , NPowHeg truth =634214.

Unfolded $P_{T}^{\gamma}$ distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 63486.8 $\pm$ 252.0, NPowHeg truth =333348.

Unfolded $P_{T}^{\gamma}$ distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64432.6 $\pm$ 253.8, NPowHeg truth =624059.

Unfolded $M(l^{+}\gamma)$ distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57095.9 $\pm$ 254 , NPowHeg truth =301666, N Sherpa truth =76327.

Unfolded $M(l^{-}\gamma)$ distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57130 $\pm$ 254 , NPowHeg truth =301666, N Sherpa truth =763273.

Unfolded $M(l^{+}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58310.9 $\pm$ 245, NPowHeg truth =564672, N Sherpa truth =814016.

Unfolded $M(l^{-}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58320.9 $\pm$ 245, NPowHeg truth =564672, N Sherpa truth =814016.

Unfolded dR distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57705.4 $\pm$ 254 , NPowHeg truth =301655, N Sherpa truth =763259.

Unfolded dR distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58869.2 $\pm$ 256, NPowHeg truth =564660, NS herpa truth =813995.

Unfolded $P_{T}^{\gamma}$ distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57358.6 $\pm$ 254 , NPowHeg truth =298662, N Sherpa truth =756609.

Unfolded $P_{T}^{\gamma}$ distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58226.4 $\pm$ 254, NPowHeg truth =558949, N Sherpa truth =806988.

Unfolded $M(l^{+}\gamma)$ distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 63717.4 $\pm$ 252.4, NPowHeg truth =338714.

Unfolded $M(l^{-}\gamma)$ distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 63855.8 $\pm$ 252.7 , NPowHeg truth =338708.

Unfolded $M(l^{+}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64809.8 $\pm$ 254.6, NPowHeg truth =634285.

Unfolded $M(l^{-}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64822.9 $\pm$ 254.6, NPowHeg truth =634276.

Unfolded dR distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64273.2 $\pm$ 253.5, NPowHeg truth =338671.

Unfolded dR distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 65362.4 $\pm$ 255.7 , NPowHeg truth =634214.

Unfolded $P_{T}^{\gamma}$ distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 63486.8 $\pm$ 252.0, NPowHeg truth =333348.

Unfolded $P_{T}^{\gamma}$ distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64432.6 $\pm$ 253.8, NPowHeg truth =624059.

Unfolded $M(l^{+}\gamma)$ distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57095.9 $\pm$ 254 , NPowHeg truth =301666, N Sherpa truth =76327.

Unfolded $M(l^{-}\gamma)$ distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57130 $\pm$ 254 , NPowHeg truth =301666, N Sherpa truth =763273.

Unfolded $M(l^{+}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58310.9 $\pm$ 245, NPowHeg truth =564672, N Sherpa truth =814016.

Unfolded $M(l^{-}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58320.9 $\pm$ 245, NPowHeg truth =564672, N Sherpa truth =814016.

Unfolded dR distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57705.4 $\pm$ 254 , NPowHeg truth =301655, N Sherpa truth =763259.

Unfolded dR distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58869.2 $\pm$ 256, NPowHeg truth =564660, NS herpa truth =813995.

Unfolded $P_{T}^{\gamma}$ distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57358.6 $\pm$ 254 , NPowHeg truth =298662, N Sherpa truth =756609.

Unfolded $P_{T}^{\gamma}$ distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58226.4 $\pm$ 254, NPowHeg truth =558949, N Sherpa truth =806988.

Truth $P_{T}^{Z}$ distribution after reweghting to data.

Combined Covariance Matrix for Unfolded $M(l^{+}\gamma)$ distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 63717.4 $\pm$ 252.4, NPowHeg truth =338714.

Combined Covariance Matrix for Unfolded $M(l^{-}\gamma)$ distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 63855.8 $\pm$ 252.7 , NPowHeg truth =338708.

Combined Covariance Matrix for Unfolded $M(l^{+}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64809.8 $\pm$ 254.6, NPowHeg truth =634285.

Combined Covariance Matrix for Unfolded $M(l^{-}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64822.9 $\pm$ 254.6, NPowHeg truth =634276.

Combined Covariance Matrix for Unfolded dR distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64273.2 $\pm$ 253.5, NPowHeg truth =338671.

Combined Covariance Matrix for Unfolded dR distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 65362.4 $\pm$ 255.7 , NPowHeg truth =634214.

Combined Covariance Matrix for Unfolded $P_{T}^{\gamma}$ distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 63486.8 $\pm$ 252.0, NPowHeg truth =333348.

Combined Covariance Matrix for Unfolded $P_{T}^{\gamma}$ distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64432.6 $\pm$ 253.8, NPowHeg truth =624059.

Combined Covariance Matrix for Unfolded $M(l^{+}\gamma)$ distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57095.9 $\pm$ 254 , NPowHeg truth =301666, N Sherpa truth =76327.

Combined Covariance Matrix for Unfolded $M(l^{-}\gamma)$ distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57130 $\pm$ 254 , NPowHeg truth =301666, N Sherpa truth =763273.

Combined Covariance Matrix for Unfolded $M(l^{+}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58310.9 $\pm$ 245, NPowHeg truth =564672, N Sherpa truth =814016.

Combined Covariance Matrix for Unfolded $M(l^{-}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58320.9 $\pm$ 245, NPowHeg truth =564672, N Sherpa truth =814016.

Combined Covariance Matrix for Unfolded dR distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57705.4 $\pm$ 254 , NPowHeg truth =301655, N Sherpa truth =763259.

Combined Covariance Matrix for Unfolded dR distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58869.2 $\pm$ 256, NPowHeg truth =564660, NS herpa truth =813995.

Combined Covariance Matrix for Unfolded $P_{T}^{\gamma}$ distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57358.6 $\pm$ 254 , NPowHeg truth =298662, N Sherpa truth =756609.

Combined Covariance Matrix for Unfolded $P_{T}^{\gamma}$ distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58226.4 $\pm$ 254, NPowHeg truth =558949, N Sherpa truth =806988.

Combined Covariance Matrix for Unfolded $M(l^{+}\gamma)$ distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 63717.4 $\pm$ 252.4, NPowHeg truth =338714.

Combined Covariance Matrix for Unfolded $M(l^{-}\gamma)$ distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 63855.8 $\pm$ 252.7 , NPowHeg truth =338708.

Combined Covariance Matrix for Unfolded $M(l^{+}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64809.8 $\pm$ 254.6, NPowHeg truth =634285.

Combined Covariance Matrix for Unfolded $M(l^{-}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64822.9 $\pm$ 254.6, NPowHeg truth =634276.

Combined Covariance Matrix for Unfolded dR distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64273.2 $\pm$ 253.5, NPowHeg truth =338671.

Combined Covariance Matrix for Unfolded dR distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 65362.4 $\pm$ 255.7 , NPowHeg truth =634214.

Combined Covariance Matrix for Unfolded $P_{T}^{\gamma}$ distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 63486.8 $\pm$ 252.0, NPowHeg truth =333348.

Combined Covariance Matrix for Unfolded $P_{T}^{\gamma}$ distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64432.6 $\pm$ 253.8, NPowHeg truth =624059.

Combined Covariance Matrix for Unfolded $M(l^{+}\gamma)$ distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57095.9 $\pm$ 254 , NPowHeg truth =301666, N Sherpa truth =76327.

Combined Covariance Matrix for Unfolded $M(l^{-}\gamma)$ distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57130 $\pm$ 254 , NPowHeg truth =301666, N Sherpa truth =763273.

Combined Covariance Matrix for Unfolded $M(l^{+}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58310.9 $\pm$ 245, NPowHeg truth =564672, N Sherpa truth =814016.

Combined Covariance Matrix for Unfolded $M(l^{-}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58320.9 $\pm$ 245, NPowHeg truth =564672, N Sherpa truth =814016.

Combined Covariance Matrix for Unfolded dR distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57705.4 $\pm$ 254 , NPowHeg truth =301655, N Sherpa truth =763259.

Combined Covariance Matrix for Unfolded dR distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58869.2 $\pm$ 256, NPowHeg truth =564660, NS herpa truth =813995.

Combined Covariance Matrix for Unfolded $P_{T}^{\gamma}$ distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57358.6 $\pm$ 254 , NPowHeg truth =298662, N Sherpa truth =756609.

Combined Covariance Matrix for Unfolded $P_{T}^{\gamma}$ distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58226.4 $\pm$ 254, NPowHeg truth =558949, N Sherpa truth =806988.

Unfolded $M(l^{+}\gamma\gamma)$ distribution for $Z \to ll\gamma\gamma$ process with dressed leptons.

Unfolded $M(l^{+}\gamma\gamma)$ distribution for $Z \to ll\gamma\gamma$ process with bare leptons.

Unfolded dR distribution for $Z \to ll\gamma\gamma$ process with dressed leptons for leading photon.

Unfolded dR distribution for $Z \to ll\gamma\gamma$ process with bare leptons for leading photon.

Unfolded dR distribution for $Z \to ll\gamma\gamma$ process with dressed leptons for second photon.

Unfolded dR distribution for $Z \to ll\gamma\gamma$ process with bare leptons for second photon.

Unfolded dRgg distribution for $Z \to ll\gamma\gamma$ process with dressed leptons.

Unfolded dRgg distribution for $Z \to ll\gamma\gamma$ process with bare leptons.

Unfolded $P_{T}^{\gamma 1}$ distribution for $Z \to ll\gamma\gamma$ process with dressed leptons for leading photon.

Unfolded $P_{T}^{\gamma 1}$ distribution for $Z \to ll\gamma\gamma$ process with bare leptons for leading photon.

Unfolded $P_{T}^{\gamma 2}$ distribution for $Z \to ll\gamma\gamma$ process with dressed leptons for second photon.

Unfolded $P_{T}^{\gamma 2}$ distribution for $Z \to ll\gamma\gamma$ process with bare leptons for second photon.

Summary of results for cross-section of non-prompt $\psi(2S)$ decaying to a muon pair for 13 TeV data in fb/GeV. Uncertainties are statistical and systematic, respectively.

Summary of results for non-prompt fraction of $J/\psi$ decaying to a muon pair as a percentage for 13 TeV data. Uncertainties are statistical and systematic, respectively.

Summary of results for non-prompt fraction of $\psi(2S)$ decaying to a muon pair as a percentage for 13 TeV data. Uncertainties are statistical and systematic, respectively.

Summary of results for prompt $\psi(2S)$ over $J/\psi$ ratio as a percentage for 13 TeV data. Uncertainties are statistical and systematic, respectively.

Summary of results for non-prompt $\psi(2S)$ over $J/\psi$ ratio as a percentage for 13 TeV data. Uncertainties are statistical and systematic, respectively.

Correction factors for an assumed angular dependence $\propto 1+\lambda_{\theta} \cos^2\theta $ in the helicity frame, for several values of the parameter $\lambda_{\theta}$. The correction factors were found to be the same (within 1% - 2%) for $J\psi$ and $\psi(2S)$ mesons, for prompt and non-prompt production mechanisms, and for the three rapidity intervals considered in this paper.

Measured $p_T$ cross sections in full-lepton phase space for 1.2 < |y| < 1.6.

Measured $p_T$ cross sections in full-lepton phase space for 1.6 < |y| < 2.0.

Measured $p_T$ cross sections in full-lepton phase space for 2.0 < |y| < 2.4.

Measured $p_T$ cross sections in full-lepton phase space for 2.4 < |y| < 2.8.

Measured $p_T$ cross sections in full-lepton phase space for 2.8 < |y| < 3.2.

Measured cross sections in full-lepton phase space as a function of |y|.

Normalised measured $p_T$ cross sections in full-lepton phase space for |y| < 1.6.

The average tetrajet invariant mass distributions in data, along with the fitted background estimates for 0.16 < $\alpha$ < 0.18.

The average tetrajet invariant mass distributions in data, along with the fitted background estimates for 0.18 < $\alpha$ < 0.20.

The average tetrajet invariant mass distributions in data, along with the fitted background estimates for 0.20 < $\alpha$ < 0.22.

The average tetrajet invariant mass distributions in data, along with the fitted background estimates for 0.22 < $\alpha$ < 0.24.

The average tetrajet invariant mass distributions in data, along with the fitted background estimates for 0.24 < $\alpha$ < 0.26.

The average tetrajet invariant mass distributions in data, along with the fitted background estimates for 0.26 < $\alpha$ < 0.28.

The average tetrajet invariant mass distributions in data, along with the fitted background estimates for 0.28 < $\alpha$ < 0.30.

The average tetrajet invariant mass distributions in data, along with the fitted background estimates for 0.30 < $\alpha$ < 0.32.

The average tetrajet invariant mass distributions in data, along with the fitted background estimates for 0.32 < $\alpha$ < 0.34.

The average dijet invariant mass distributions in data, along with the fitted background estimates for 0.10 < $\alpha$ < 0.12.

The average dijet invariant mass distributions in data, along with the fitted background estimates for 0.12 < $\alpha$ < 0.14.

The average dijet invariant mass distributions in data, along with the fitted background estimates for 0.14 < $\alpha$ < 0.16.

The average dijet invariant mass distributions in data, along with the fitted background estimates for 0.16 < $\alpha$ < 0.18.

The average dijet invariant mass distributions in data, along with the fitted background estimates for 0.18 < $\alpha$ < 0.20.

The average dijet invariant mass distributions in data, along with the fitted background estimates for 0.20 < $\alpha$ < 0.22.

The average dijet invariant mass distributions in data, along with the fitted background estimates for 0.22 < $\alpha$ < 0.24.

The average dijet invariant mass distributions in data, along with the fitted background estimates for 0.24 < $\alpha$ < 0.26.

The average dijet invariant mass distributions in data, along with the fitted background estimates for 0.26 < $\alpha$ < 0.28.

The average dijet invariant mass distributions in data, along with the fitted background estimates for 0.28 < $\alpha$ < 0.30.

The average dijet invariant mass distributions in data, along with the fitted background estimates for 0.30 < $\alpha$ < 0.32.

The average dijet invariant mass distributions in data, along with the fitted background estimates for 0.32 < $\alpha$ < 0.34.

The expected and observed limits on $m_{4j}$ for signal templates using a 4-parameter fit function for 0.10 < $\alpha$ < 0.12.

The expected and observed limits on $m_{4j}$ for signal templates using a 4-parameter fit function for 0.12 < $\alpha$ < 0.14.

The expected and observed limits on $m_{4j}$ for signal templates using a 4-parameter fit function for 0.14 < $\alpha$ < 0.16.

The expected and observed limits on $m_{4j}$ for signal templates using a 4-parameter fit function for 0.16 < $\alpha$ < 0.18.

The expected and observed limits on $m_{4j}$ for signal templates using a 4-parameter fit function for 0.18 < $\alpha$ < 0.20.

The expected and observed limits on $m_{4j}$ for signal templates using a 4-parameter fit function for 0.20 < $\alpha$ < 0.22.

The expected and observed limits on $m_{4j}$ for signal templates using a 4-parameter fit function for 0.22 < $\alpha$ < 0.24.

The expected and observed limits on $m_{4j}$ for signal templates using a 4-parameter fit function for 0.24 < $\alpha$ < 0.26.

The expected and observed limits on $m_{4j}$ for signal templates using a 4-parameter fit function for 0.26 < $\alpha$ < 0.28.

The expected and observed limits on $m_{4j}$ for signal templates using a 4-parameter fit function for 0.28 < $\alpha$ < 0.30.

The expected and observed limits on $m_{4j}$ for signal templates using a 4-parameter fit function for 0.30 < $\alpha$ < 0.32.

The expected and observed limits on $m_{4j}$ for signal templates using a 4-parameter fit function for 0.32 < $\alpha$ < 0.34.

The expected and observed limits on $m_{\langle 2j \rangle}$ for signal templates using a 4-parameter fit function for 0.10 < $\alpha$ < 0.12.

The expected and observed limits on $m_{\langle 2j \rangle}$ for signal templates using a 4-parameter fit function for 0.12 < $\alpha$ < 0.14.

The expected and observed limits on $m_{\langle 2j \rangle}$ for signal templates using a 4-parameter fit function for 0.14 < $\alpha$ < 0.16.

The expected and observed limits on $m_{\langle 2j \rangle}$ for signal templates using a 4-parameter fit function for 0.16 < $\alpha$ < 0.18.

The expected and observed limits on $m_{\langle 2j \rangle}$ for signal templates using a 4-parameter fit function for 0.18 < $\alpha$ < 0.20.

The expected and observed limits on $m_{\langle 2j \rangle}$ for signal templates using a 4-parameter fit function for 0.20 < $\alpha$ < 0.22.

The expected and observed limits on $m_{\langle 2j \rangle}$ for signal templates using a 4-parameter fit function for 0.22 < $\alpha$ < 0.24.

The expected and observed limits on $m_{\langle 2j \rangle}$ for signal templates using a 4-parameter fit function for 0.24 < $\alpha$ < 0.26.

The expected and observed limits on $m_{\langle 2j \rangle}$ for signal templates using a 4-parameter fit function for 0.26 < $\alpha$ < 0.28.

The expected and observed limits on $m_{\langle 2j \rangle}$ for signal templates using a 4-parameter fit function for 0.28 < $\alpha$ < 0.30.

The expected and observed limits on $m_{\langle 2j \rangle}$ for signal templates using a 4-parameter fit function for 0.30 < $\alpha$ < 0.32.

The expected and observed limits on $m_{\langle 2j \rangle}$ for signal templates using a 4-parameter fit function for 0.32 < $\alpha$ < 0.34.

The expected and observed limits on $m_{4j}$ for Gaussian signal templates using a 4-parameter fit function for 0.10 < $\alpha$ < 0.12.

The expected and observed limits on $m_{4j}$ for Gaussian signal templates using a 4-parameter fit function for 0.12 < $\alpha$ < 0.14.

The expected and observed limits on $m_{4j}$ for Gaussian signal templates using a 4-parameter fit function for 0.14 < $\alpha$ < 0.16.

The expected and observed limits on $m_{4j}$ for Gaussian signal templates using a 4-parameter fit function for 0.16 < $\alpha$ < 0.18.

The expected and observed limits on $m_{4j}$ for Gaussian signal templates using a 4-parameter fit function for 0.18 < $\alpha$ < 0.20.

The expected and observed limits on $m_{4j}$ for Gaussian signal templates using a 4-parameter fit function for 0.20 < $\alpha$ < 0.22.

The expected and observed limits on $m_{4j}$ for Gaussian signal templates using a 4-parameter fit function for 0.22 < $\alpha$ < 0.24.

The expected and observed limits on $m_{4j}$ for Gaussian signal templates using a 4-parameter fit function for 0.24 < $\alpha$ < 0.26.

The expected and observed limits on $m_{4j}$ for Gaussian signal templates using a 4-parameter fit function for 0.26 < $\alpha$ < 0.28.

The expected and observed limits on $m_{4j}$ for Gaussian signal templates using a 4-parameter fit function for 0.28 < $\alpha$ < 0.30.

The expected and observed limits on $m_{4j}$ for Gaussian signal templates using a 4-parameter fit function for 0.30 < $\alpha$ < 0.32.

The expected and observed limits on $m_{4j}$ for Gaussian signal templates using a 4-parameter fit function for 0.32 < $\alpha$ < 0.34.

The expected and observed limits on $m_{\langle 2j \rangle}$ for Gaussian signal templates using a 4-parameter fit function for 0.10 < $\alpha$ < 0.12.

The expected and observed limits on $m_{\langle 2j \rangle}$ for Gaussian signal templates using a 4-parameter fit function for 0.12 < $\alpha$ < 0.14.

The expected and observed limits on $m_{\langle 2j \rangle}$ for Gaussian signal templates using a 4-parameter fit function for 0.14 < $\alpha$ < 0.16.

The expected and observed limits on $m_{\langle 2j \rangle}$ for Gaussian signal templates using a 4-parameter fit function for 0.16 < $\alpha$ < 0.18.

The expected and observed limits on $m_{\langle 2j \rangle}$ for Gaussian signal templates using a 4-parameter fit function for 0.18 < $\alpha$ < 0.20.

The expected and observed limits on $m_{\langle 2j \rangle}$ for Gaussian signal templates using a 4-parameter fit function for 0.20 < $\alpha$ < 0.22.

The expected and observed limits on $m_{\langle 2j \rangle}$ for Gaussian signal templates using a 4-parameter fit function for 0.22 < $\alpha$ < 0.24.

The expected and observed limits on $m_{\langle 2j \rangle}$ for Gaussian signal templates using a 4-parameter fit function for 0.24 < $\alpha$ < 0.26.

The expected and observed limits on $m_{\langle 2j \rangle}$ for Gaussian signal templates using a 4-parameter fit function for 0.26 < $\alpha$ < 0.28.

The expected and observed limits on $m_{\langle 2j \rangle}$ for Gaussian signal templates using a 4-parameter fit function for 0.28 < $\alpha$ < 0.30.

The expected and observed limits on $m_{\langle 2j \rangle}$ for Gaussian signal templates using a 4-parameter fit function for 0.30 < $\alpha$ < 0.32.

The expected and observed limits on $m_{\langle 2j \rangle}$ for Gaussian signal templates using a 4-parameter fit function for 0.32 < $\alpha$ < 0.34.

The product of the analysis acceptance and selection efficiency for all analysis selection criteria is shown as a function of $m_Y$ and $m_{X}/m_{Y}$.

The cross-section of the signal samples is shown as a function of $m_Y$ and $m_{X}/m_{Y}$.

Summary of the observed and expected 95% CL upper limits on the cross section for $\mathrm{LQ}_{\mathrm{mix}}^{\mathrm{d}}$ pair production as a function of $m_{\mathrm{LQ}_{\mathrm{mix}}^{\mathrm{d}}}$ under the assumptions of B(LQ$\rightarrow t\mu$)=1.

Summary of observed and predicted yields in the four signal region categories. The background prediction is shown after the combined likelihood fit to data under the background-only hypothesis across all control region and signal region categories. The expected signal yields that are obtained by using their theoretical cross sections are also shown with their pre-fit uncertainties, assuming B=1 and $\mu$=1. The "Other" contribution is dominated by $t\bar{t}t\bar{t}$ and $t\bar{t}WW$ in the $3\ell$ SRs, whereas it is dominated by $tWZ$ and $t\bar{t}WW$ in the $4\ell$ SRs. Dashes refer to components that are negligible or not applicable.

Summary of the data, background and signal yields in the four signal region categories. The background prediction is shown before the combined likelihood fit to data. Dashes (--) refer to components that are negligible or not applicable.

Summary of the data and background yields in the seven control region categories. The background prediction is shown before the combined likelihood fit to data. Dashes (--) refer to components that are negligible or not applicable.

Summary of the data and background yields in the seven control region categories. The background prediction is shown after the combined likelihood fit to data under the background-only hypothesis across all control region categories. Dashes (--) refer to components that are negligible or not applicable.

Acceptance times efficiency for signal grid in merged two-prong signal region.

Acceptance times efficiency for signal grid in resolved two-prong signal region.

Acceptance times efficiency for signal grid in resolved two-prong signal region.

The obtained p-value from comparing data to background estimation across all bins, defined by windows in the X and Y particle masses, in the anomaly signal region.

The obtained p-value from comparing data to background estimation across all bins, defined by windows in the X and Y particle masses, in the anomaly signal region.

The expected 95% CL limits on the cross-section $\sigma(pp \rightarrow Y \rightarrow XH \rightarrow q\bar{q}b\bar{b}$) in pb in the two-dimensional space of $m_Y$ versus $m_X$, obtained from a simultaneous fit of both merged and resolved two-prong signal regions with all statistical and systematic uncertainties.

The expected 95% CL limits on the cross-section $\sigma(pp \rightarrow Y \rightarrow XH \rightarrow q\bar{q}b\bar{b}$) in pb in the two-dimensional space of $m_Y$ versus $m_X$, obtained from a simultaneous fit of both merged and resolved two-prong signal regions with all statistical and systematic uncertainties.

The observed 95% CL limits on the cross-section $\sigma(pp \rightarrow Y \rightarrow XH \rightarrow q\bar{q}b\bar{b}$) in pb in the two-dimensional space of $m_Y$ versus $m_X$, obtained from a simultaneous fit of both merged and resolved two-prong signal regions with all statistical and systematic uncertainties.

The observed 95% CL limits on the cross-section $\sigma(pp \rightarrow Y \rightarrow XH \rightarrow q\bar{q}b\bar{b}$) in pb in the two-dimensional space of $m_Y$ versus $m_X$, obtained from a simultaneous fit of both merged and resolved two-prong signal regions with all statistical and systematic uncertainties.