Statistical correlation between bins in data for the differential cross sections for the production of W⁺ bosons as a function of the inclusive jet multiplicity.

Statistical correlation between bins in data for the differential cross sections for the production of W^- bosons as a function of the inclusive jet multiplicity.

Differential cross section for the production of W bosons as a function of H_T for events with N_jets ≥ 1.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of H_T for events with N_jets ≥ 1.

Differential cross sections for the production of W⁺ bosons, W^- bosons and the W⁺/W^- cross section ratio as a function of the H_T for events with N_jets ≥ 1.

Statistical correlation between bins in data for the differential cross sections for the production of W⁺ bosons as a function of the H_T for events with N_jets ≥ 1.

Statistical correlation between bins in data for the differential cross sections for the production of W^- bosons as a function of the H_T for events with N_jets ≥ 1.

Differential cross section for the production of W bosons as a function of the W p_T for events with N_jets ≥ 1.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of the W p_T for events with N_jets ≥ 1.

Differential cross sections for the production of W⁺ bosons, W^- bosons and the W⁺/W^- cross section ratio as a function of the W p_T for events with N_jets ≥ 1.

Statistical correlation between bins in data for the differential cross sections for the production of W⁺ bosons as a function of the W p_T for events with N_jets ≥ 1.

Statistical correlation between bins in data for the differential cross sections for the production of W^- bosons as a function of the W p_T for events with N_jets ≥ 1.

Differential cross section for the production of W bosons as a function of the leading jet p_T for events with N_jets ≥ 1.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of the leading jet p_T for events with N_jets ≥ 1.

Differential cross sections for the production of W⁺ bosons, W^- bosons and the W⁺/W^- cross section ratio as a function of the leading jet p_T for events with N_jets ≥ 1.

Statistical correlation between bins in data for the differential cross sections for the production of W⁺ bosons as a function of the leading jet p_T for events with N_jets ≥ 1.

Statistical correlation between bins in data for the differential cross sections for the production of W^- bosons as a function of the leading jet p_T for events with N_jets ≥ 1.

Differential cross section for the production of W bosons as a function of the leading jet rapidity for events with N_jets ≥ 1.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of the leading jet rapidity for events with N_jets ≥ 1.

Differential cross sections for the production of W⁺ bosons, W^- bosons and the W⁺/W^- cross section ratio as a function of the leading jet rapidity for events with N_jets ≥ 1.

Statistical correlation between bins in data for the differential cross sections for the production of W⁺ bosons as a function of the leading jet rapidity for events with N_jets ≥ 1.

Statistical correlation between bins in data for the differential cross sections for the production of W^- bosons as a function of the leading jet rapidity for events with N_jets ≥ 1.

Differential cross section for the production of W bosons as a function of second leading jet p_T for events with N_jets ≥ 2.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of second leading jet p_T for events with N_jets ≥ 2.

Differential cross section for the production of W bosons as a function of second leading jet rapidity for events with N_jets ≥ 2.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of second leading jet rapidity for events with N_jets ≥ 2.

Differential cross section for the production of W bosons as a function of Δ R_jet1,jet2 for events with N_jets ≥ 2.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of Δ R_jet1,jet2 for events with N_jets ≥ 2.

Differential cross section for the production of W bosons as a function of dijet invariant mass for events with N_jets ≥ 2.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of dijet invariant mass for events with N_jets ≥ 2.

Cross section for the production of W bosons as a function of exclusive jet multiplicity.

Statistical correlation between bins in data for the cross section for the production of W bosons as a function of exclusive jet multiplicity.

Differential cross section for the production of W bosons as a function of the H_T for events with N_jets ≥ 2.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of the H_T for events with N_jets ≥ 2.

Differential cross sections for the production of W⁺ bosons, W^- bosons and the W⁺/W^- cross section ratio as a function of the H_T for events with N_jets ≥ 2.

Statistical correlation between bins in data for the differential cross sections for the production of W⁺ bosons as a function of the H_T for events with N_jets ≥ 2.

Statistical correlation between bins in data for the differential cross sections for the production of W^- bosons as a function of the H_T for events with N_jets ≥ 2.

Differential cross section for the production of W bosons as a function of the W p_T for events with N_jets ≥ 2.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of the W p_T for events with N_jets ≥ 2.

Differential cross sections for the production of W⁺ bosons, W^- bosons and the W⁺/W^- cross section ratio as a function of the W p_T for events with N_jets ≥ 2.

Statistical correlation between bins in data for the differential cross sections for the production of W⁺ bosons as a function of the W p_T for events with N_jets ≥ 2.

Statistical correlation between bins in data for the differential cross sections for the production of W^- bosons as a function of the W p_T for events with N_jets ≥ 2.

Differential cross section for the production of W bosons as a function of the leading jet p_T for events with N_jets ≥ 2.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of the leading jet p_T for events with N_jets ≥ 2.

Differential cross sections for the production of W⁺ bosons, W^- bosons and the W⁺/W^- cross section ratio as a function of the leading jet p_T for events with N_jets ≥ 2.

Statistical correlation between bins in data for the differential cross sections for the production of W⁺ bosons as a function of the leading jet p_T for events with N_jets ≥ 2.

Statistical correlation between bins in data for the differential cross sections for the production of W^- bosons as a function of the leading jet p_T for events with N_jets ≥ 2.

Differential cross section for the production of W bosons as a function of the electron η for events with N_jets ≥ 0.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of the electron η for events with N_jets ≥ 0.

Differential cross sections for the production of W⁺ bosons, W^- bosons and the W⁺/W^- cross section ratio as a function of the electron η for events with N_jets ≥ 0.

Statistical correlation between bins in data for the differential cross sections for the production of W⁺ bosons as a function of the electron η for events with N_jets ≥ 0.

Statistical correlation between bins in data for the differential cross sections for the production of W^- bosons as a function of the electron η for events with N_jets ≥ 0.

Differential cross section for the production of W bosons as a function of the electron η for events with N_jets ≥ 1.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of the electron η for events with N_jets ≥ 1.

Differential cross sections for the production of W⁺ bosons, W^- bosons and the W⁺/W^- cross section ratio as a function of the electron η for events with N_jets ≥ 1.

Statistical correlation between bins in data for the differential cross sections for the production of W⁺ bosons as a function of the electron η for events with N_jets ≥ 1.

Statistical correlation between bins in data for the differential cross sections for the production of W^- bosons as a function of the electron η for events with N_jets ≥ 1.

List of experimentally considered systematic uncertainties for the W+jets cross section measurement

Non-perturbative corrections for the cross section for the production of W bosons for different inclusive jet multiplicities.

Non-perturbative corrections for the differential cross sections for the production of W⁺ bosons and W^- bosons as a function of the inclusive jet multiplicity.

Non-perturbative corrections for the differential cross section for the production of W bosons as a function of H_T for events with N_jets ≥ 1.

Non-perturbative corrections for the differential cross sections for the production of W⁺ bosons and W^- bosons as a function of the H_T for events with N_jets ≥ 1.

Non-perturbative corrections for the differential cross section for the production of W bosons as a function of the W p_T for events with N_jets ≥ 1.

Non-perturbative corrections for the differential cross sections for the production of W⁺ bosons and W^- bosons as a function of the W p_T for events with N_jets ≥ 1.

Non-perturbative corrections for the differential cross section for the production of W bosons as a function of the leading jet p_T for events with N_jets ≥ 1.

Non-perturbative corrections for the differential cross sections for the production of W⁺ bosons and W^- bosons as a function of the leading jet p_T for events with N_jets ≥ 1.

Non-perturbative corrections for the differential cross section for the production of W bosons as a function of the leading jet rapidity for events with N_jets ≥ 1.

Non-perturbative corrections for the differential cross sections for the production of W⁺ bosons and W^- bosons as a function of the leading jet rapidity for events with N_jets ≥ 1.

Non-perturbative corrections for the differential cross section for the production of W bosons as a function of second leading jet p_T for events with N_jets ≥ 2.

Non-perturbative corrections for the differential cross section for the production of W bosons as a function of second leading jet rapidity for events with N_jets ≥ 2.

Non-perturbative corrections for the differential cross section for the production of W bosons as a function of Δ R_jet1,jet2 for events with N_jets ≥ 2.

Non-perturbative corrections for the differential cross section for the production of W bosons as a function of dijet invariant mass for events with N_jets ≥ 2.

Non-perturbative corrections for the cross section for the production of W bosons as a function of exclusive jet multiplicity.

Non-perturbative corrections for the differential cross section for the production of W bosons as a function of the H_T for events with N_jets ≥ 2.

Non-perturbative corrections for the differential cross sections for the production of W⁺ bosons and W^- bosons as a function of the H_T for events with N_jets ≥ 2.

Non-perturbative corrections for the differential cross section for the production of W bosons as a function of the W p_T for events with N_jets ≥ 2.

Non-perturbative corrections for the differential cross sections for the production of W⁺ bosons and W^- bosons as a function of the W p_T for events with N_jets ≥ 2.

Non-perturbative corrections for the differential cross section for the production of W bosons as a function of the leading jet p_T for events with N_jets ≥ 2.

Non-perturbative corrections for the differential cross sections for the production of W⁺ bosons and W^- bosons as a function of the leading jet p_T for events with N_jets ≥ 2.

NNLO/NLO k-factors determined with NNLO Njetti for the differential cross sections for the production of W⁺ bosons and W^- bosons as a function of the H_T for events with N_jets ≥ 1. These numbers were obtained with code described in Phys. Rev. Lett. 115 (2015) 062002 [arXiv:1504.02131].

NNLO/NLO k-factors determined with NNLO Njetti for the differential cross sections for the production of W⁺ bosons and W^- bosons as a function of the W p_T for events with N_jets ≥ 1. These numbers were obtained with code described in Phys. Rev. Lett. 115 (2015) 062002 [arXiv:1504.02131].

NNLO/NLO k-factors determined with NNLO Njetti for the differential cross sections for the production of W⁺ bosons and W^- bosons as a function of the leading jet p_T for events with N_jets ≥ 1. These numbers were obtained with code described in Phys. Rev. Lett. 115 (2015) 062002 [arXiv:1504.02131].

NNLO/NLO k-factors determined with NNLO Njetti for the differential cross sections for the production of W⁺ bosons and W^- bosons as a function of the leading jet rapidity for events with N_jets ≥ 1. These numbers were obtained with code described in Phys. Rev. Lett. 115 (2015) 062002 [arXiv:1504.02131].

Fiducial phase-space relative differential cross-sections after combining the e+jets and $\mu$+jets channels for the $t\bar{t}$ system transverse momentum $p_{T}^{t\bar{t}}$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Fiducial phase-space absolute differential cross-sections after combining the e+jets and $\mu$+jets channels for the $t\bar{t$}$ system absolute rapidity $|y^{t\bar{t}}|$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Fiducial phase-space relative differential cross-sections after combining the e+jets and $\mu$+jets channels for the $t\bar{t$}$ system absolute rapidity $|y^{t\bar{t}}|$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Fiducial phase-space absolute differential cross-sections after combining the e+jets and $\mu$+jets channels for the hadronic top-quark transverse momentum $p_{T}^{t}$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Fiducial phase-space relative differential cross-sections after combining the e+jets and $\mu$+jets channels for the hadronic top-quark transverse momentum $p_{T}^{t}$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Fiducial phase-space absolute differential cross-sections after combining the e+jets and $\mu$+jets channels for the hadronic top-quark absolute rapidity $|y^{t}|$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Fiducial phase-space relative differential cross-sections after combining the e+jets and $\mu$+jets channels for the hadronic top-quark absolute rapidity $|y^{t}|$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Fiducial phase-space absolute differential cross-sections after combining the e+jets and $\mu$+jets channels for the $t\bar{t}$ system absolute out-of-plane momentum $|p_{out}^{t\bar{t}}|$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Fiducial phase-space relative differential cross-sections after combining the e+jets and $\mu$+jets channels for the $t\bar{t}$ system absolute out-of-plane momentum $|p_{out}^{t\bar{t}}|$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Fiducial phase-space absolute differential cross-sections after combining the e+jets and $\mu$+jets channels for the $t\bar{t}$ system azimuthal angle $\Delta \phi^{t\bar{t}}$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Fiducial phase-space relative differential cross-sections after combining the e+jets and $\mu$+jets channels for the $t\bar{t}$ system azimuthal angle $\Delta \phi^{t\bar{t}}$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Fiducial phase-space absolute differential cross-sections after combining the e+jets and $\mu$+jets channels for the scalar sum of the hadronic and leptonic top-quark transverse momenta $H_{T}^{t\bar{t}}$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Fiducial phase-space relative differential cross-sections after combining the e+jets and $\mu$+jets channels for the scalar sum of the hadronic and leptonic top-quark transverse momenta $H_{T}^{t\bar{t}}$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Fiducial phase-space absolute differential cross-sections after combining the e+jets and $\mu$+jets channels for $y_{boost}^{t\bar{t}}$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Fiducial phase-space relative differential cross-sections after combining the e+jets and $\mu$+jets channels for $y_{boost}^{t\bar{t}}$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Fiducial phase-space absolute differential cross-sections after combining the e+jets and $\mu$+jets channels for $\chi^{t\bar{t}}$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Fiducial phase-space relative differential cross-sections after combining the e+jets and $\mu$+jets channels for $\chi^{t\bar{t}}$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Fiducial phase-space absolute differential cross-sections after combining the e+jets and $\mu$+jets channels for $R_{Wt}$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Fiducial phase-space relative differential cross-sections after combining the e+jets and $\mu$+jets channels for $R_{Wt}$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Full phase-space absolute differential cross-sections after combining the e+jets and $\mu$+jets channels for the $t\bar{t}$ system invariant mass $m^{t\bar{t}}$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Full phase-space relative differential cross-sections after combining the e+jets and $\mu$+jets channels for the $t\bar{t}$ system invariant mass $m^{t\bar{t}}$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Full phase-space absolute differential cross-sections after combining the e+jets and $\mu$+jets channels for the $t\bar{t}$ system transverse momentum $p_{T}^{t\bar{t}}$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Full phase-space relative differential cross-sections after combining the e+jets and $\mu$+jets channels for the $t\bar{t}$ system transverse momentum $p_{T}^{t\bar{t}}$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Full phase-space absolute differential cross-sections after combining the e+jets and $\mu$+jets channels for the $t\bar{t}$ system absolute rapidity $|y^{t\bar{t}}|$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Full phase-space relative differential cross-sections after combining the e+jets and $\mu$+jets channels for the $t\bar{t}$ system absolute rapidity $|y^{t\bar{t}}|$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Full phase-space absolute differential cross-sections after combining the e+jets and $\mu$+jets channels for the top-quark transverse momentum $p_{T}^{t}$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Full phase-space relative differential cross-sections after combining the e+jets and $\mu$+jets channels for the top-quark transverse momentum $p_{T}^{t}$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Full phase-space absolute differential cross-sections after combining the e+jets and $\mu$+jets channels for the top-quark absolute rapidity $|y^{t}|$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Full phase-space relative differential cross-sections after combining the e+jets and $\mu$+jets channels for the top-quark absolute rapidity $|y^{t}|$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Full phase-space absolute differential cross-sections after combining the e+jets and $\mu$+jets channels for the $t\bar{t}$ system absolute out-of-plane momentum $|p_{out}^{t\bar{t}}|$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Full phase-space relative differential cross-sections after combining the e+jets and $\mu$+jets channels for the $t\bar{t}$ system absolute out-of-plane momentum $|p_{out}^{t\bar{t}}|$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Full phase-space absolute differential cross-sections after combining the e+jets and $\mu$+jets channels for the $t\bar{t}$ system azimuthal angle $\Delta \phi^{t\bar{t}}$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Full phase-space relative differential cross-sections after combining the e+jets and $\mu$+jets channels for the $t\bar{t}$ system azimuthal angle $\Delta \phi^{t\bar{t}}$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Full phase-space absolute differential cross-sections after combining the e+jets and $\mu$+jets channels for the scalar sum of the hadronic and leptonic top-quark transverse momenta $H_{T}^{t\bar{t}}$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Full phase-space relative differential cross-sections after combining the e+jets and $\mu$+jets channels for the scalar sum of the hadronic and leptonic top-quark transverse momenta $H_{T}^{t\bar{t}}$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Full phase-space absolute differential cross-sections after combining the e+jets and $\mu$+jets channels for $y_{boost}^{t\bar{t}}$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Full phase-space relative differential cross-sections after combining the e+jets and $\mu$+jets channels for $y_{boost}^{t\bar{t}}$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Full phase-space absolute differential cross-sections after combining the e+jets and $\mu$+jets channels for $\chi^{t\bar{t}}$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Full phase-space relative differential cross-sections after combining the e+jets and $\mu$+jets channels for $\chi^{t\bar{t}}$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

The measured differential as a function of aT.

The measured differential as a function of phiStarEta.

The measured differential as a function of abs(cosThetaStarEta).

The measured differential as a function of deltaPhi.

cross section ratio for Z(1b) and Z+jets production as a function of the leading b/inclusive (j) jet |eta|

Differential fiducial cross section for Z(1b) production as a function of the Z boson pT

cross section ratio for Z(1b) and Z+jets production as a function of the Z boson pT

Differential fiducial cross section for Z(1b) production as a function of HT

cross section ratio for Z(1b) and Z+jets production as a function of HT

Differential fiducial cross section for Z(1b) production as a function of DeltaPhi(Zb)

cross section ratio for Z(1b) and Z+jets production as a function of DeltaPhi(Zb)

Differential fiducial cross section for Z(2b) production as a function of the leading b jet pT

Differential fiducial cross section for Z(2b) production as a function of the subleading b jet pT

Differential fiducial cross section for Z(2b) production as a function of the Z boson pT

Differential fiducial cross section for Z(2b) production as a function of the invari- ant mass of the b jet pair, Mbb

Differential fiducial cross section for Z(2b) production as a function of the invari- ant mass of the Zbb system, MZbb

Differential fiducial cross section for Z(2b) production as a function of DeltaPhi(bb)

Differential fiducial cross section for Z(2b) production as a function of DeltaR(bb)

Differential fiducial cross section for Z(2b) production as a function of minimum DeltaR(Zb)

Differential fiducial cross section for Z(2b) production as a function of AZbb

fiducial cross section, for a single lepton type, for the production of Z(1b) and Z(2b) events

The measured fiducial cross sections are corrected to the dressed level. The ratio of $C_{WZ}^{\textrm{dressed}}/C_{WZ}^{\textrm{Born}}$ factors presented in this table can be used to correct fiducial integrated cross sections from dressed to Born level.

Cross section extrapolated to total phase space and all W and Z boson decays. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the theory uncertainty and the third is the luminosity uncertainty.

The total cross section is measured at dressed level and can also be corrected to Born level use this acceptance correction factor.

Ratio of fiducial cross sections measured for $W^{+} Z$ and $W^{-} Z$ production. The first systematic uncertainty is the combined systematic uncertainty excluding the luminosity uncertainty, the second is the luminosity uncertainty.

Observed and expected upper limits at $95\%$ CL in fb on the fiducial cross section $\sigma^{\mathrm{fid.}}_{W^{\pm} Zjj \textrm{-EW} \rightarrow \ell^{'} \nu \ell \ell}$, multiplied by the $W$ and $Z$ branching ratios in a single leptonic channel with muons or electrons in the VBS fiducial phase space. Values obtained with or without subtraction of the $tZj$ contribution are presented. The $1$ $\sigma$ and $2$ $\sigma$ uncertainty intervals around the expected limits are also indicated.

Observed and expected upper limits at $95\%$ CL in fb on the fiducial cross section $\sigma^{\mathrm{fid.}}_{W^{\pm} Zjj \textrm{-EW} \rightarrow \ell^{'} \nu \ell \ell}$, multiplied by the $W$ and $Z$ branching ratios in a single leptonic channel with muons or electrons in the aQGC fiducial phase space. Values obtained with or without subtraction of the $tZj$ contribution are presented. The $1$ $\sigma$ and $2$ $\sigma$ uncertainty intervals around the expected limits are also indicated.

Expected and observed one-dimensional 95% Confidence Level intervals on the anomalous couplings parameters. Anomalous couplings are introduced as form factors using a cut-off scale $\Lambda_{\mathrm{co}}$.

Expected and observed one-dimensional intervals at 95% Confidence Level on the Effective Field Theory (EFT) parameters.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Ratio of $W^{+}Z$ over $W^{-}Z$ differential fiducial cross sections measured in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The last bin is a cross section for all events above the lower end of the bin.

Ratio of $W^{+}Z$ over $W^{-}Z$ differential fiducial cross sections measured in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The last bin is a cross section for all events above the lower end of the bin.

Ratio of $W^{+}Z$ over $W^{-}Z$ differential fiducial cross sections measured in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The last bin is a cross section for all events above the lower end of the bin.

Ratio of $W^{+}Z$ over $W^{-}Z$ differential fiducial cross sections measured in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The last bin is a cross section for all events above the lower end of the bin.

Ratio of $W^{+}Z$ over $W^{-}Z$ differential fiducial cross sections measured in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$.

Measured cross section in bins of $p_{\rm{T}}^{\rm{j}1}$.

Measured fractions in bins of $p_{\rm{T}}^{\rm{H}}$.

Measured fractions in bins of $|y^{\rm{H}}|$.

Measured fractions in bins of $N_{\rm{jets}}$.

Measured fractions in bins of $p_{\rm{T}}^{\rm{j1}}$.

Correlation matrix for the total uncertainty of the differential cross-section measurement in bins of $p_{\rm{T}}^{\rm{H}}$.

Correlation matrix for the total uncertainty of the differential cross-section measurement in bins of $|y^{\rm{H}}|$.

Correlation matrix for the total uncertainty of the differential cross-section measurement in bins of $N_{\rm{jets}}$.

Correlation matrix for the total uncertainty of the differential cross-section measurement in bins of $p_{\rm{T}}^{\rm{j1}}$.

Correlation matrix for the total uncertainty of the differential shape measurement in bins of $p_{\rm{T}}^{\rm{H}}$.

Correlation matrix for the total uncertainty of the differential shape measurement in bins of $|y^{\rm{H}}|$.

Correlation matrix for the total uncertainty of the differential shape measurement in bins of $N_{\rm{jets}}$.

Correlation matrix for the total uncertainty of the differential shape measurement in bins of $p_{\rm{T}}^{\rm{j1}}$.

The total $pp\to H$ cross section in the $H\to\gamma\gamma$ and $H\to ZZ^*\to 4\ell$ channels and their combination.

The electron channel Born-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kDressed) is also provided.

The electron channel Born-level double-differential cross section D2SIG/DM/DABSYRAP. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kDressed) is also provided.

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kDressed) is also provided.

The muon channel Born-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kdressed) is also provided.

The muon channel Born-level double-differential cross section D2SIG/DM/DABSYRAP. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kdressed) is also provided.

The muon channel Born-level double-differential cross section D2SIG/DM/DABSDETA. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kdressed) is also provided.

Born-level differential fiducial cross section prediction DSIG/DM at NNLO including NLO electroweak corrections and the PI contribution. The calculation is performed using the MMHT2014 NNLO PDF set and with dynamic scales set equal to the invariant mass. The predictions are listed together with the statistical uncertainty, the PDF eigenvector variation, the uncertainty from the variation of alpha_s, the combined uncertainty from mu_F and mu_R, and the uncertainty from the variation of the photon PDF in the PI contribution. The fraction of the PI contribution, f(PI), is also given.

Born-level differential fiducial cross section prediction D2SIG/DM/DABSYRAP at NNLO including NLO electroweak corrections and the PI contribution. The calculation is performed using the MMHT2014 NNLO PDF set and with dynamic scales set equal to the invariant mass. The predictions are listed together with the statistical uncertainty, the PDF eigenvector variation, the uncertainty from the variation of alpha_s, the combined uncertainty from mu_F and mu_R, and the uncertainty from the variation of the photon PDF in the PI contribution. The fraction of the PI contribution, f(PI), is also given.

Born-level differential fiducial cross section prediction D2SIG/DM/DABSDETA at NNLO including NLO electroweak corrections and the PI contribution. The calculation is performed using the MMHT2014 NNLO PDF set and with dynamic scales set equal to the invariant mass. The predictions are listed together with the statistical uncertainty, the PDF eigenvector variation, the uncertainty from the variation of alpha_s, the combined uncertainty from mu_F and mu_R, and the uncertainty from the variation of the photon PDF in the PI contribution. The fraction of the PI contribution, f(PI), is also given.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 116 GeV < M(EE) < 150 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 150 GeV < M(EE) < 200 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 200 GeV < M(EE) < 300 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 300 GeV < M(EE) < 500 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 500 GeV < M(EE) < 1500 GeV.

The electron channel dressed-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 116 GeV < M(EE) < 150 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 150 GeV < M(EE) < 200 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 200 GeV < M(EE) < 300 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 300 GeV < M(EE) < 500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 500 GeV < M(EE) < 1500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 116 GeV < M(EE) < 150 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 150 GeV < M(EE) < 200 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 200 GeV < M(EE) < 300 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 300 GeV < M(EE) < 500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 500 GeV < M(EE) < 1500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 116 GeV < M(MM) < 150 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 150 GeV < M(MM) < 200 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 200 GeV < M(MM) < 300 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 300 GeV < M(MM) < 500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 500 GeV < M(MM) < 1500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 116 GeV < M(MM) < 150 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 150 GeV < M(MM) < 200 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 200 GeV < M(MM) < 300 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 300 GeV < M(MM) < 500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 500 GeV < M(MM) < 1500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The total inelastic cross section.

The measured differential elastic cross section. In addition to the statistical and total systematic uncertainties, the following 22 systematic shifts are given, which are included in the profile fit with their signs: -- Constraints: Beam optics uncertainty obtained by varying the ALFA constraints in the optics fit -- QScan: Variation by +/- 0.1 % of the quadrupole strength -- Q2: Fit of the strength of Q2 using the best value for the strength of Q1 and Q3 -- Q5Q6: Variation of the strength of Q5 and Q6 by -0.2% as indicated by machine constraints -- MadX: Uncertainty related to the beam transport replacing matrix transport by MadX PTC tracking -- Qmisal: Uncertainty due to the mis-alignment of the quadrupoles in the beam line -- Q1Q3: Propagation of the optics fit uncertainty in the strenght of Q1 and Q3 on the differential elastic cross section -- Aopt: Alignment uncertainty from the optimization procedure -- Offv: Alignment uncertainty related to the vertical beam center offset -- Offh: Alignment uncertainty related to the horizontal beam center offset -- Ang: Alignment uncertainty related to the detector rotation in the x-y plane -- BGn: Uncertainty from the background normalization -- BGs: Uncertainty from the background shape -- MCres: Error from modelling of the detector response -- Slope: Residual dependence on the physics model estimated by varying the nuclear slope in the simulation by +/- 1 GeV^-2 -- Emit: Uncertainty from the emittance used to calculate beam divergence in the simulation -- Unf: Unfolding uncertainty from the data-driven closure test -- Trac: Uncertainty from the variation of the track reconstruction selection cuts -- Xing: Uncertainty from residual crossing angle in the horizontal plane -- Eff: Uncertainty from the reconstruction efficiency -- Lumi: Luminosity uncertainty (+/- 1.5%) -- Ebeam: Uncertainty from the nominal beam energy (+/- 0.65%) Small differences in the values given here compared to the published version are related to insignificant rounding issues.

The statistical covariance matrix for the differential elastic cross section.

Measured cross-section as a function of angular separation between the muon and the closest jet for $500~\text{GeV} < p_T^{\text{leading jet}} < 600~\text{GeV}$. Multiplicative correction factors for using prompt muons and prompt dressing photons in the particle-level selection, derived from ALPGEN 2.14 interfaced with PYTHIA 6.426, are also shown.

Measured cross-section as a function of angular separation between the muon and the closest jet for $p_T^{\text{leading jet}} > 650~\text{GeV}$. Multiplicative correction factors for using prompt muons and prompt dressing photons in the particle-level selection, derived from ALPGEN 2.14 interfaced with PYTHIA 6.426, are also shown.

Correlation matrix of systematic uncertainties for $\sigma^{\pm}$. The statistical and integrated luminosity uncertainties are not included. The first and the last eleven indices correspond to the systematic uncertainites of $W^+$ ($\sigma^+_{1-11}$) and $W^-$ ($\sigma^-_{1-11}$) cross sections, respectively, in 11 muon pseudorapidity bins. The values are expressed as percentages.

Correlation matrix of statistical uncertainties for $\sigma^{\pm}$. The first and the last eleven indices correspond to the statistical uncertainites of $W^+$ ($\sigma^+_{1-11}$) and $W^-$ ($\sigma^-_{1-11}$) cross sections, respectively, in 11 muon pseudorapidity bins. The values are expressed as percentages.

Correlation matrix of systematic uncertainties for $\mathcal{A}$. The values are expressed as percentages.