The rho-parameter, i.e. the ratio of the real to imaginary part of the elastic scattering amplitude extrapolated to t=0. The systematic uncertainty includes experimental and theoretical uncerainties.

The nuclear slope parameter B from a fit of the form exp(-Bt-Ct^2-Dt^3). The systematic uncertainty includes experimental and theoretical uncerainties.

The nuclear slope parameter B from a fit of the form exp(-Bt-Ct^2-Dt^3). The systematic uncertainty includes experimental and theoretical uncerainties.

The nuclear slope parameter C from a fit of the form exp(-Bt-Ct^2-Dt^3). The systematic uncertainty includes experimental and theoretical uncerainties.

The nuclear slope parameter C from a fit of the form exp(-Bt-Ct^2-Dt^3). The systematic uncertainty includes experimental and theoretical uncerainties.

The nuclear slope parameter D from a fit of the form exp(-Bt-Ct^2-Dt^3). The systematic uncertainty includes experimental and theoretical uncerainties.

The nuclear slope parameter D from a fit of the form exp(-Bt-Ct^2-Dt^3). The systematic uncertainty includes experimental and theoretical uncerainties.

The total elastic cross section measured inside the fiducial volume. The systematic uncertainty includes experimental uncertainties.

The total elastic cross section measured inside the fiducial volume. The systematic uncertainty includes experimental uncertainties.

The total elastic cross section obtained from the fitted parameters, extrapolated to full phase space using only the nuclear amplitude.

The total elastic cross section obtained from the fitted parameters, extrapolated to full phase space using only the nuclear amplitude.

The total inelastic cross section.

The total inelastic cross section.

The ratio of elastic to total cross section.

The ratio of elastic to total cross section.

The differential elastic cross section as function of t with statistical and systematic uncertainties. The systematic uncertainties are given as signed relative change for 20 sources of experimental uncertainty associated to nuisance parameters used in the fit for the extraction of physics parameters.

The differential elastic cross section as function of t with statistical and systematic uncertainties. The systematic uncertainties are given as signed relative change for 20 sources of experimental uncertainty associated to nuisance parameters used in the fit for the extraction of physics parameters.

Statistical covariance matrix for the measurement of the differential elastic cross section as function of t.

Statistical covariance matrix for the measurement of the differential elastic cross section as function of t.

Ratio of measured PSI(2S) over J/PSI(1S) cross section in charged-particle multiplicity intervals and integrated in multiplicity.

Ratio of measured PSI(2S) over J/PSI(1S) cross section in charged-particle multiplicity intervals and integrated in multiplicity.

Ratio of measured PSI(2S) over J/PSI(1S) cross section in charged-particle multiplicity intervals and integrated in multiplicity.

The Bose-Einstein correlation (BEC) parameter R as a function of n_ch for HMT events using different MC generators in the calculation of R₂(Q). The uncertainties shown are statistical. The lower panel of each plot shows the ratio of the BEC parameters obtained using EPOS LHC (red circles), Pythia 8 Monash (blue squares) and Herwig++ UE-EE-5 (green triangles) compared with the parameters obtained using Pythia 8 A2. The gray band in the lower panels is the MC systematic uncertainty, obtained as explained in the text.

The Bose-Einstein correlation (BEC) parameter R as a function of k_T for MB events using different MC generators in the calculation of R₂(Q). The uncertainties shown are statistical. The lower panel of each plot shows the ratio of the BEC parameters obtained using EPOS LHC (red circles), Pythia 8 Monash (blue squares) and Herwig++ UE-EE-5 (green triangles) compared with the parameters obtained using Pythia 8 A2. The gray band in the lower panels is the MC systematic uncertainty, obtained as explained in the text.

The Bose-Einstein correlation (BEC) parameter λ as a function of k_T for MB events using different MC generators in the calculation of R₂(Q). The uncertainties shown are statistical. The lower panel of each plot shows the ratio of the BEC parameters obtained using EPOS LHC (red circles), Pythia 8 Monash (blue squares) and Herwig++ UE-EE-5 (green triangles) compared with the parameters obtained using Pythia 8 A2. The gray band in the lower panels is the MC systematic uncertainty, obtained as explained in the text.

The two-particle double-ratio correlation function, R₂(Q), for pp collisions for track p_T >100 MeV at √s=13 TeV in the multiplicity interval 71 ≤ n_ch < 80 for the minimum-bias (MB) events. The blue dashed and red solid lines show the results of the exponential and Gaussian fits, respectively. The region excluded from the fits is shown. The statistical uncertainty and the systematic uncertainty for imperfections in the data reconstruction procedure are added in quadrature.

The two-particle double-ratio correlation function, R₂(Q), for pp collisions for track p_T >100 MeV at √s=13 TeV in the multiplicity interval 231 ≤ n_ch < 300 for the high-multiplicity track (HMT) events. The blue dashed and red solid lines show the results of the exponential and Gaussian fits, respectively. The region excluded from the fits is shown. The statistical uncertainty and the systematic uncertainty for imperfections in the data reconstruction procedure are added in quadrature.

The dependence of the correlation strength, λ(m_ch), on rescaled multiplicity, m_ch, obtained from the exponential fit of the R₂(Q) correlation functions for tracks with p_T > 100  MeV and p_T > 500 MeV at √s = 13  TeV for the minimum-bias (MB) and high multiplicity track (HMT) data. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the exponential fit of λ(m_ch) for p_T >100 MeV and p_T >500 MeV, respectively.

The dependence of the correlation strength, λ(m_ch), on rescaled multiplicity, m_ch, obtained from the exponential fit of the R₂(Q) correlation functions for tracks with p_T > 100  MeV and p_T > 500 MeV at √s = 13  TeV for the minimum-bias (MB) and high multiplicity track (HMT) data. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the exponential fit of λ(m_ch) for p_T >100 MeV and p_T >500 MeV, respectively.

The dependence of the correlation strength, λ(m_ch), on rescaled multiplicity, m_ch, obtained from the exponential fit of the R₂(Q) correlation functions for tracks with p_T > 100  MeV and p_T > 500 MeV at √s = 13  TeV for the minimum-bias (MB) and high multiplicity track (HMT) data. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the exponential fit of λ(m_ch) for p_T >100 MeV and p_T >500 MeV, respectively.

The dependence of the correlation strength, λ(m_ch), on rescaled multiplicity, m_ch, obtained from the exponential fit of the R₂(Q) correlation functions for tracks with p_T > 100  MeV and p_T > 500 MeV at √s = 13  TeV for the minimum-bias (MB) and high multiplicity track (HMT) data. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the exponential fit of λ(m_ch) for p_T >100 MeV and p_T >500 MeV, respectively.

The dependence of the source radius, R(m_ch), on m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for ∛m_ch < 1.2 for p_T >100 MeV and p_T >500 MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond ∛m_ch > 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for ∛m_ch > 1.45 with p_T >100 MeV and for ∛m_ch > 1.6 with p_T >500 MeV, respectively.

The dependence of the source radius, R(m_ch), on m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for ∛m_ch < 1.2 for p_T >100 MeV and p_T >500 MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond ∛m_ch > 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for ∛m_ch > 1.45 with p_T >100 MeV and for ∛m_ch > 1.6 with p_T >500 MeV, respectively.

The dependence of the source radius, R(m_ch), on m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for ∛m_ch < 1.2 for p_T >100 MeV and p_T >500 MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond ∛m_ch > 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for ∛m_ch > 1.45 with p_T >100 MeV and for ∛m_ch > 1.6 with p_T >500 MeV, respectively.

The dependence of the source radius, R(m_ch), on m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for ∛m_ch < 1.2 for p_T >100 MeV and p_T >500 MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond ∛m_ch > 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for ∛m_ch > 1.45 with p_T >100 MeV and for ∛m_ch > 1.6 with p_T >500 MeV, respectively.

The dependence of the R(m_ch) on ∛m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for ∛m_ch < 1.2 for p_T >100 MeV and p_T >500 MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond ∛m_ch > 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for ∛m_ch > 1.45 with p_T >100 MeV and for ∛m_ch > 1.6 with p_T >500 MeV, respectively

The dependence of the R(m_ch) on ∛m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for ∛m_ch < 1.2 for p_T >100 MeV and p_T >500 MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond ∛m_ch > 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for ∛m_ch > 1.45 with p_T >100 MeV and for ∛m_ch > 1.6 with p_T >500 MeV, respectively

The dependence of the R(m_ch) on ∛m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for ∛m_ch < 1.2 for p_T >100 MeV and p_T >500 MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond ∛m_ch > 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for ∛m_ch > 1.45 with p_T >100 MeV and for ∛m_ch > 1.6 with p_T >500 MeV, respectively

The dependence of the R(m_ch) on ∛m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for ∛m_ch < 1.2 for p_T >100 MeV and p_T >500 MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond ∛m_ch > 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for ∛m_ch > 1.45 with p_T >100 MeV and for ∛m_ch > 1.6 with p_T >500 MeV, respectively

Comparison of single-ratio two-particle correlation functions, using the unlike-charge particle (UCP) pair reference sample, for minimum-bias (MB) events, showing C₂^data(Q) (top panel) at 13 TeV (black circles) and 7 TeV (open blue circles), and the ratio of C₂^7 TeV (Q) to C₂^13 TeV (Q) (bottom panel). Comparison of C₂^data (Q) for representative multiplicity region 3.09 < m_ch ≤ 3.86. The statistical and systematic uncertainties, combined in quadrature, are presented. The systematic uncertainties include track efficiency, Coulomb correction, non-closure and multiplicity-unfolding uncertainties.

Comparison of single-ratio two-particle correlation functions, using the unlike-charge particle (UCP) pair reference sample, for minimum-bias (MB) events, showing C₂^data(Q) (top panel) at 13  TeV (black circles) and 7  TeV (open blue circles), and the ratio of C₂^7 TeV (Q) to C₂^13 TeV (Q) (bottom panel). Comparison of C₂^data (Q) for representative k_T region 400 < k_T ≤500  MeV. The statistical and systematic uncertainties, combined in quadrature, are presented. The systematic uncertainties include track efficiency, Coulomb correction, non-closure and multiplicity-unfolding uncertainties.

The k_T dependence of the correlation strength, λ(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch ≥ 2 and transfer momentum of tracks with p_T >100 MeV and p_T >500 MeV at √s=13 TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to λ(k_T).

The k_T dependence of the correlation strength, λ(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch ≥ 2 and transfer momentum of tracks with p_T >100 MeV and p_T >500 MeV at √s=13 TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to λ(k_T).

The k_T dependence of the correlation strength, λ(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch ≥ 2 and transfer momentum of tracks with p_T >100 MeV and p_T >500 MeV at √s=13 TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to λ(k_T).

The k_T dependence of the correlation strength, λ(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch ≥ 2 and transfer momentum of tracks with p_T >100 MeV and p_T >500 MeV at √s=13 TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to λ(k_T).

The k_T dependence of the source radius, R(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch ≥ 2 and transfer momentum of tracks with p_T >100 MeV and p_T >500 MeV at √s=13 TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to R(k_T).

The k_T dependence of the source radius, R(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch ≥ 2 and transfer momentum of tracks with p_T >100 MeV and p_T >500 MeV at √s=13 TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to R(k_T).

The k_T dependence of the source radius, R(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch ≥ 2 and transfer momentum of tracks with p_T >100 MeV and p_T >500 MeV at √s=13 TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to R(k_T).

The k_T dependence of the source radius, R(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch ≥ 2 and transfer momentum of tracks with p_T >100 MeV and p_T >500 MeV at √s=13 TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to R(k_T).

The two-dimensional dependence on m_ch and k_T for p_T > 100 MeV for the correlation strength, λ, obtained from the exponential fit to the R₂(Q) correlation functions using the MB sample for m_ch ≤ 3.08 and the HMT sample for m_ch > 3.08.

The two-dimensional dependence on m_ch and k_T for p_T > 100 MeV for the source radius, R, obtained from the exponential fit to the R₂(Q) correlation functions using the MB sample for m_ch ≤ 3.08 and the HMT sample for m_ch > 3.08.

The parameter λ for p_T > 100 MeV as a function of k_T in selected low m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter λ for p_T > 100 MeV as a function of k_T in selected low m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter λ for p_T > 100 MeV as a function of k_T in selected high m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter λ for p_T > 100 MeV as a function of k_T in selected high m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter λ for p_T > 100 MeV as a function of m_ch in k_T intervals between 0.1 and 0.5 GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter λ for p_T > 100 MeV as a function of m_ch in k_T intervals between 0.1 and 0.5 GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter λ for p_T > 100 MeV as a function of m_ch in k_T intervals between 0.5 and 1.5 GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter λ for p_T > 100 MeV as a function of m_ch in k_T intervals between 0.5 and 1.5 GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T > 100 MeV as a function of k_T in selected low m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T > 100 MeV as a function of k_T in selected low m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T > 100 MeV as a function of k_T in selected high m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T > 100 MeV as a function of k_T in selected high m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T > 100 MeV as a function of m_ch in k_T intervals between 0.1 and 0.5 GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T > 100 MeV as a function of m_ch in k_T intervals between 0.1 and 0.5 GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T > 100 MeV as a function of m_ch in k_T intervals between 0.5 and 1.5 GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T > 100 MeV as a function of m_ch in k_T intervals between 0.5 and 1.5 GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The fit parameter μ describing the dependence of the correlation strength, λ, on charged-particle scaled multiplicity, for track p_T>100 MeV and track p_T>500 MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at √s = 13 TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter μ on m_ch for tracks with p_T >100 MeV (p_T >500 MeV).

The fit parameter μ describing the dependence of the correlation strength, λ, on charged-particle scaled multiplicity, for track p_T>100 MeV and track p_T>500 MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at √s = 13 TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter μ on m_ch for tracks with p_T >100 MeV (p_T >500 MeV).

The fit parameter μ describing the dependence of the correlation strength, λ, on charged-particle scaled multiplicity, for track p_T>100 MeV and track p_T>500 MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at √s = 13 TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter μ on m_ch for tracks with p_T >100 MeV (p_T >500 MeV).

The fit parameter μ describing the dependence of the correlation strength, λ, on charged-particle scaled multiplicity, for track p_T>100 MeV and track p_T>500 MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at √s = 13 TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter μ on m_ch for tracks with p_T >100 MeV (p_T >500 MeV).

The fit parameter ν describing the dependence of the correlation strength, λ, on charged-particle scaled multiplicity, for track p_T>100 MeV and track p_T>500 MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at √s = 13 TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter ν on m_ch for tracks with p_T >100 MeV (p_T >500 MeV).

The fit parameter ν describing the dependence of the correlation strength, λ, on charged-particle scaled multiplicity, for track p_T>100 MeV and track p_T>500 MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at √s = 13 TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter ν on m_ch for tracks with p_T >100 MeV (p_T >500 MeV).

The fit parameter ν describing the dependence of the correlation strength, λ, on charged-particle scaled multiplicity, for track p_T>100 MeV and track p_T>500 MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at √s = 13 TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter ν on m_ch for tracks with p_T >100 MeV (p_T >500 MeV).

The fit parameter ν describing the dependence of the correlation strength, λ, on charged-particle scaled multiplicity, for track p_T>100 MeV and track p_T>500 MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at √s = 13 TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter ν on m_ch for tracks with p_T >100 MeV (p_T >500 MeV).

The parameter ξ describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m_ch, for track p_T>100 MeV and track p_T>500 MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at √s = 13 TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the saturated value of the parameter ξ for m_ch > 3.0 for tracks with p_T >100 MeV and for m_ch > 2.8 for tracks with p_T >500 MeV, respectively.

The parameter ξ describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m_ch, for track p_T>100 MeV and track p_T>500 MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at √s = 13 TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the saturated value of the parameter ξ for m_ch > 3.0 for tracks with p_T >100 MeV and for m_ch > 2.8 for tracks with p_T >500 MeV, respectively.

The parameter ξ describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m_ch, for track p_T>100 MeV and track p_T>500 MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at √s = 13 TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the saturated value of the parameter ξ for m_ch > 3.0 for tracks with p_T >100 MeV and for m_ch > 2.8 for tracks with p_T >500 MeV, respectively.

The parameter ξ describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m_ch, for track p_T>100 MeV and track p_T>500 MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at √s = 13 TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the saturated value of the parameter ξ for m_ch > 3.0 for tracks with p_T >100 MeV and for m_ch > 2.8 for tracks with p_T >500 MeV, respectively.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 10, (b) 11 < n_ch ≤ 20, (c) 21 < n_ch ≤ 30, (d) 31 < n_ch ≤ 40, (e) 41 < n_ch ≤ 50, (f) 51 < n_ch ≤ 60, (g) 61 < n_ch ≤ 70, (h) 71 < n_ch ≤ 80 and (i) 81 < n_ch ≤ 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 10, (b) 11 < n_ch ≤ 20, (c) 21 < n_ch ≤ 30, (d) 31 < n_ch ≤ 40, (e) 41 < n_ch ≤ 50, (f) 51 < n_ch ≤ 60, (g) 61 < n_ch ≤ 70, (h) 71 < n_ch ≤ 80 and (i) 81 < n_ch ≤ 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 10, (b) 11 < n_ch ≤ 20, (c) 21 < n_ch ≤ 30, (d) 31 < n_ch ≤ 40, (e) 41 < n_ch ≤ 50, (f) 51 < n_ch ≤ 60, (g) 61 < n_ch ≤ 70, (h) 71 < n_ch ≤ 80 and (i) 81 < n_ch ≤ 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 10, (b) 11 < n_ch ≤ 20, (c) 21 < n_ch ≤ 30, (d) 31 < n_ch ≤ 40, (e) 41 < n_ch ≤ 50, (f) 51 < n_ch ≤ 60, (g) 61 < n_ch ≤ 70, (h) 71 < n_ch ≤ 80 and (i) 81 < n_ch ≤ 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 10, (b) 11 < n_ch ≤ 20, (c) 21 < n_ch ≤ 30, (d) 31 < n_ch ≤ 40, (e) 41 < n_ch ≤ 50, (f) 51 < n_ch ≤ 60, (g) 61 < n_ch ≤ 70, (h) 71 < n_ch ≤ 80 and (i) 81 < n_ch ≤ 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 10, (b) 11 < n_ch ≤ 20, (c) 21 < n_ch ≤ 30, (d) 31 < n_ch ≤ 40, (e) 41 < n_ch ≤ 50, (f) 51 < n_ch ≤ 60, (g) 61 < n_ch ≤ 70, (h) 71 < n_ch ≤ 80 and (i) 81 < n_ch ≤ 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 10, (b) 11 < n_ch ≤ 20, (c) 21 < n_ch ≤ 30, (d) 31 < n_ch ≤ 40, (e) 41 < n_ch ≤ 50, (f) 51 < n_ch ≤ 60, (g) 61 < n_ch ≤ 70, (h) 71 < n_ch ≤ 80 and (i) 81 < n_ch ≤ 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 91 < n_ch ≤ 100, (b) 101 < n_ch ≤ 125, (c) 126 < n_ch ≤ 150, (d) 151 < n_ch ≤ 200, (e) 201 < n_ch ≤ 250. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 91 < n_ch ≤ 100, (b) 101 < n_ch ≤ 125, (c) 126 < n_ch ≤ 150, (d) 151 < n_ch ≤ 200, (e) 201 < n_ch ≤ 250. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 91 < n_ch ≤ 100, (b) 101 < n_ch ≤ 125, (c) 126 < n_ch ≤ 150, (d) 151 < n_ch ≤ 200, (e) 201 < n_ch ≤ 250. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 91 < n_ch ≤ 100, (b) 101 < n_ch ≤ 125, (c) 126 < n_ch ≤ 150, (d) 151 < n_ch ≤ 200, (e) 201 < n_ch ≤ 250. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 91 < n_ch ≤ 100, (b) 101 < n_ch ≤ 125, (c) 126 < n_ch ≤ 150, (d) 151 < n_ch ≤ 200, (e) 201 < n_ch ≤ 250. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 101 < n_ch ≤ 110, (b) 111 < n_ch ≤ 120, (c) 121 < n_ch ≤ 130, (d) 131 < n_ch ≤ 140, (e) 141 < n_ch ≤ 155, (f) 156 < n_ch ≤ 175, (g) 176 < n_ch ≤ 200, (h) 201 < n_ch ≤ 230 and (i) 231 < n_ch ≤ 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 101 < n_ch ≤ 110, (b) 111 < n_ch ≤ 120, (c) 121 < n_ch ≤ 130, (d) 131 < n_ch ≤ 140, (e) 141 < n_ch ≤ 155, (f) 156 < n_ch ≤ 175, (g) 176 < n_ch ≤ 200, (h) 201 < n_ch ≤ 230 and (i) 231 < n_ch ≤ 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 101 < n_ch ≤ 110, (b) 111 < n_ch ≤ 120, (c) 121 < n_ch ≤ 130, (d) 131 < n_ch ≤ 140, (e) 141 < n_ch ≤ 155, (f) 156 < n_ch ≤ 175, (g) 176 < n_ch ≤ 200, (h) 201 < n_ch ≤ 230 and (i) 231 < n_ch ≤ 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 101 < n_ch ≤ 110, (b) 111 < n_ch ≤ 120, (c) 121 < n_ch ≤ 130, (d) 131 < n_ch ≤ 140, (e) 141 < n_ch ≤ 155, (f) 156 < n_ch ≤ 175, (g) 176 < n_ch ≤ 200, (h) 201 < n_ch ≤ 230 and (i) 231 < n_ch ≤ 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 101 < n_ch ≤ 110, (b) 111 < n_ch ≤ 120, (c) 121 < n_ch ≤ 130, (d) 131 < n_ch ≤ 140, (e) 141 < n_ch ≤ 155, (f) 156 < n_ch ≤ 175, (g) 176 < n_ch ≤ 200, (h) 201 < n_ch ≤ 230 and (i) 231 < n_ch ≤ 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 101 < n_ch ≤ 110, (b) 111 < n_ch ≤ 120, (c) 121 < n_ch ≤ 130, (d) 131 < n_ch ≤ 140, (e) 141 < n_ch ≤ 155, (f) 156 < n_ch ≤ 175, (g) 176 < n_ch ≤ 200, (h) 201 < n_ch ≤ 230 and (i) 231 < n_ch ≤ 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 101 < n_ch ≤ 110, (b) 111 < n_ch ≤ 120, (c) 121 < n_ch ≤ 130, (d) 131 < n_ch ≤ 140, (e) 141 < n_ch ≤ 155, (f) 156 < n_ch ≤ 175, (g) 176 < n_ch ≤ 200, (h) 201 < n_ch ≤ 230 and (i) 231 < n_ch ≤ 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 101 < n_ch ≤ 110, (b) 111 < n_ch ≤ 120, (c) 121 < n_ch ≤ 130, (d) 131 < n_ch ≤ 140, (e) 141 < n_ch ≤ 155, (f) 156 < n_ch ≤ 175, (g) 176 < n_ch ≤ 200, (h) 201 < n_ch ≤ 230 and (i) 231 < n_ch ≤ 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 101 < n_ch ≤ 110, (b) 111 < n_ch ≤ 120, (c) 121 < n_ch ≤ 130, (d) 131 < n_ch ≤ 140, (e) 141 < n_ch ≤ 155, (f) 156 < n_ch ≤ 175, (g) 176 < n_ch ≤ 200, (h) 201 < n_ch ≤ 230 and (i) 231 < n_ch ≤ 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 9, (b) 10 < n_ch ≤ 18, (c) 19 < n_ch ≤ 27, (d) 28 < n_ch ≤ 36, (e) 37 < n_ch ≤ 45, (f) 46 < n_ch ≤ 54, (g) 55 < n_ch ≤ 63, (h) 64 < n_ch ≤ 72, (i) 73 < n_ch ≤ 81, (j) 82 < n_ch ≤ 90, (k) 91 < n_ch ≤ 113, and (l) 114 < n_ch ≤ 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 9, (b) 10 < n_ch ≤ 18, (c) 19 < n_ch ≤ 27, (d) 28 < n_ch ≤ 36, (e) 37 < n_ch ≤ 45, (f) 46 < n_ch ≤ 54, (g) 55 < n_ch ≤ 63, (h) 64 < n_ch ≤ 72, (i) 73 < n_ch ≤ 81, (j) 82 < n_ch ≤ 90, (k) 91 < n_ch ≤ 113, and (l) 114 < n_ch ≤ 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 9, (b) 10 < n_ch ≤ 18, (c) 19 < n_ch ≤ 27, (d) 28 < n_ch ≤ 36, (e) 37 < n_ch ≤ 45, (f) 46 < n_ch ≤ 54, (g) 55 < n_ch ≤ 63, (h) 64 < n_ch ≤ 72, (i) 73 < n_ch ≤ 81, (j) 82 < n_ch ≤ 90, (k) 91 < n_ch ≤ 113, and (l) 114 < n_ch ≤ 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 9, (b) 10 < n_ch ≤ 18, (c) 19 < n_ch ≤ 27, (d) 28 < n_ch ≤ 36, (e) 37 < n_ch ≤ 45, (f) 46 < n_ch ≤ 54, (g) 55 < n_ch ≤ 63, (h) 64 < n_ch ≤ 72, (i) 73 < n_ch ≤ 81, (j) 82 < n_ch ≤ 90, (k) 91 < n_ch ≤ 113, and (l) 114 < n_ch ≤ 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 9, (b) 10 < n_ch ≤ 18, (c) 19 < n_ch ≤ 27, (d) 28 < n_ch ≤ 36, (e) 37 < n_ch ≤ 45, (f) 46 < n_ch ≤ 54, (g) 55 < n_ch ≤ 63, (h) 64 < n_ch ≤ 72, (i) 73 < n_ch ≤ 81, (j) 82 < n_ch ≤ 90, (k) 91 < n_ch ≤ 113, and (l) 114 < n_ch ≤ 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 9, (b) 10 < n_ch ≤ 18, (c) 19 < n_ch ≤ 27, (d) 28 < n_ch ≤ 36, (e) 37 < n_ch ≤ 45, (f) 46 < n_ch ≤ 54, (g) 55 < n_ch ≤ 63, (h) 64 < n_ch ≤ 72, (i) 73 < n_ch ≤ 81, (j) 82 < n_ch ≤ 90, (k) 91 < n_ch ≤ 113, and (l) 114 < n_ch ≤ 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 9, (b) 10 < n_ch ≤ 18, (c) 19 < n_ch ≤ 27, (d) 28 < n_ch ≤ 36, (e) 37 < n_ch ≤ 45, (f) 46 < n_ch ≤ 54, (g) 55 < n_ch ≤ 63, (h) 64 < n_ch ≤ 72, (i) 73 < n_ch ≤ 81, (j) 82 < n_ch ≤ 90, (k) 91 < n_ch ≤ 113, and (l) 114 < n_ch ≤ 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 9, (b) 10 < n_ch ≤ 18, (c) 19 < n_ch ≤ 27, (d) 28 < n_ch ≤ 36, (e) 37 < n_ch ≤ 45, (f) 46 < n_ch ≤ 54, (g) 55 < n_ch ≤ 63, (h) 64 < n_ch ≤ 72, (i) 73 < n_ch ≤ 81, (j) 82 < n_ch ≤ 90, (k) 91 < n_ch ≤ 113, and (l) 114 < n_ch ≤ 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 9, (b) 10 < n_ch ≤ 18, (c) 19 < n_ch ≤ 27, (d) 28 < n_ch ≤ 36, (e) 37 < n_ch ≤ 45, (f) 46 < n_ch ≤ 54, (g) 55 < n_ch ≤ 63, (h) 64 < n_ch ≤ 72, (i) 73 < n_ch ≤ 81, (j) 82 < n_ch ≤ 90, (k) 91 < n_ch ≤ 113, and (l) 114 < n_ch ≤ 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 9, (b) 10 < n_ch ≤ 18, (c) 19 < n_ch ≤ 27, (d) 28 < n_ch ≤ 36, (e) 37 < n_ch ≤ 45, (f) 46 < n_ch ≤ 54, (g) 55 < n_ch ≤ 63, (h) 64 < n_ch ≤ 72, (i) 73 < n_ch ≤ 81, (j) 82 < n_ch ≤ 90, (k) 91 < n_ch ≤ 113, and (l) 114 < n_ch ≤ 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 9, (b) 10 < n_ch ≤ 18, (c) 19 < n_ch ≤ 27, (d) 28 < n_ch ≤ 36, (e) 37 < n_ch ≤ 45, (f) 46 < n_ch ≤ 54, (g) 55 < n_ch ≤ 63, (h) 64 < n_ch ≤ 72, (i) 73 < n_ch ≤ 81, (j) 82 < n_ch ≤ 90, (k) 91 < n_ch ≤ 113, and (l) 114 < n_ch ≤ 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 9, (b) 10 < n_ch ≤ 18, (c) 19 < n_ch ≤ 27, (d) 28 < n_ch ≤ 36, (e) 37 < n_ch ≤ 45, (f) 46 < n_ch ≤ 54, (g) 55 < n_ch ≤ 63, (h) 64 < n_ch ≤ 72, (i) 73 < n_ch ≤ 81, (j) 82 < n_ch ≤ 90, (k) 91 < n_ch ≤ 113, and (l) 114 < n_ch ≤ 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The correlation strength, λ, and source radius, R, of the exponential fits to the two-particle double-ratio correlation functions, R₂(Q), in dependence on the multiplicity, m_ch, intervals for the minimum-bias (MB) and the high-multiplicity track (HMT) events for p_T > 100 MeV at √s = 13 TeV. Statistical uncertainties for √χ²/ndf>1 are corrected by the √χ²/ndf. The total uncertainties are shown.

The correlation strength, λ, and source radius, R, of the exponential fits to the two-particle double-ratio correlation functions, R₂(Q), in dependence on the multiplicity, m_ch, intervals for the minimum-bias (MB) and the high-multiplicity track (HMT) events for p_T > 500 MeV at √s = 13 TeV. Statistical uncertainties for √χ²/ndf>1 are corrected by the √χ²/ndf. The total uncertainties are shown.

The correlation strength, λ, and source radius, R, of the exponential fits to the two-particle double-ratio correlation functions, R₂(Q), in dependence on the pair transverse momentum, k_T, intervals for the minimum-bias (MB) and the high-multiplicity track (HMT) events for p_T > 100 MeV at √s = 13 TeV. Statistical uncertainties for √χ²/ndf>1 are corrected by the √χ²/ndf. The total uncertainties are shown.

The correlation strength, λ, and source radius, R, of the exponential fits to the two-particle double-ratio correlation functions, R₂(Q), in dependence on the pair transverse momentum, k_T, intervals for the minimum-bias (MB) and the high-multiplicity track (HMT) events for p_T > 500 MeV at √s = 13 TeV. Statistical uncertainties for √χ²/ndf>1 are corrected by the √χ²/ndf. The total uncertainties are shown.

Measured inclusive fiducial $tt\gamma$ production cross section in the dilepton final state for the different dilepton-flavour channels and combined.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(\gamma)$ . The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $|\eta |(\gamma)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, \ell)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{1})$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{2})$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, b)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $|\Delta\eta(\ell\ell)|$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $\Delta \phi(\ell\ell)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(\ell\ell) $. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ . The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of min $\Delta R(\ell, j)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(j_{1})$ .

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(\gamma)$ . The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $|\eta |(\gamma)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, \ell)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{1})$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{2})$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, b)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $|\Delta\eta(\ell\ell)|$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $\Delta \phi(\ell\ell)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(\ell\ell) $. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ . The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of min $\Delta R(\ell, j)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(j_{1})$ . The values provided in the table are not divided by the bin width.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(\gamma)$ .

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(\gamma)$ .

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $|\eta |(\gamma)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $|\eta |(\gamma)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, \ell)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, \ell)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{1})$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{1})$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{2})$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{2})$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, b)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, b)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $|\Delta\eta(\ell\ell)|$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $|\Delta\eta(\ell\ell)|$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $\Delta \phi(\ell\ell)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $\Delta \phi(\ell\ell)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(\ell\ell) $.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(\ell\ell) $.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ .

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ .

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of min $\Delta R(\ell, j)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of min $\Delta R(\ell, j)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(j_{1})$ .

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(j_{1})$ .

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c^{I}_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c^{I}_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c^{I}_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c^{I}_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value as a function of Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$ from the interpretation of the dilepton measurement.

Negative log-likelihood difference from the best-fit value as a function of Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$ from the interpretation of the dilepton and lepton+jets measurements combined.

One-dimensional 68 and 95% CL intervals obtained for the Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$, using the photon $p_{T}$ distribution from the dilepton analysis, or the combination of photon pT distributions from the dilepton and lepton+jets analyses.

Comparison of observed $95\%$ CL intervals for the Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$. Results are shown from a CMS ttZ measurement [JHEP 03 (2020) 056], from a CMS ttZ & tZq interpretation [arXiv:2107.13896], from a CMS ttG (lepton+jets) measurement [arXiv:2107.01508], from this measurement, and from a global fit by J. Ellis et al. [JHEP 04 (2021) 279].

Pre-fit distribution of the reconstructed Higgs boson candidate $p_T^H$ for the dilepton $SR^{\geq 4j}_{\geq 4b}$ signal region. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations, except for the uncertainty in the $k({t\bar {t}+{\geq }1b})$ normalisation factor which is not defined pre-fit. The last bin includes the overflow.

Pre-fit distribution of the reconstructed Higgs boson candidate $p_T^H$ for the single-lepton resolved $SR^{\geq 6j}_{\geq 4b}$ signal region. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations, except for the uncertainty in the $k({t\bar {t}+{\geq }1b})$ normalisation factor which is not defined pre-fit. The last bin includes the overflow.

Pre-fit distribution of the reconstructed Higgs boson candidate $p_T^H$ for the single-lepton boosted ${{SR}_{{boosted}}}$ signal region. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations, except for the uncertainty in the $k({t\bar {t}+{\geq }1b})$ normalisation factor which is not defined pre-fit. The last bin includes the overflow.

Comparison of predicted and observed event yields in each of the control and signal regions in the dilepton channel after the fit to the data. The uncertainty band includes all uncertainties and their correlations.

Comparison of predicted and observed event yields in each of the control and signal regions in the single-lepton channels after the fit to the data. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the dilepton SRs after the inclusive fit to the data for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the dilepton SRs after the inclusive fit to the data for $120\le p_T^H<200$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the dilepton SRs after the inclusive fit to the data for $200\le p_T^H<300$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the dilepton SRs after the inclusive fit to the data for $p_{{T}}^{H}\ge 300$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton resolved SRs after the inclusive fit to the data for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton resolved SRs after the inclusive fit to the data for $120\le p_T^H<200$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton resolved SRs after the inclusive fit to the data for $200\le p_T^H<300$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton resolved SRs after the inclusive fit to the data for $300\le p_T^H<450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton resolved SRs after the inclusive fit to the data for $p_{{T}}^{H}\ge 450$ GeV (yield only). The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton boosted SRs after the inclusive fit to the data for $300\le p_T^H<450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton boosted SRs after the inclusive fit to the data for $p_{{T}}^{H}\ge 450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for ${\Delta R^{{avg}}_{bb}}$ after the inclusive fit to the data in the single-lepton $CR^{5j}_{{\geq}4b\ lo}$ control region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Comparison between data and prediction for ${\Delta R^{{avg}}_{bb}}$ after the inclusive fit to the data in the single-lepton $CR^{5j}_{{\geq}4b\ hi}$ control region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Post-fit yields of signal ($S$) and total background ($B$) as a function of $\log (S/B)$, compared with data. Final-discriminant bins in all dilepton and single-lepton analysis regions are combined into bins of $\log (S/B)$, with the signal normalised to the SM prediction used for the computation of $\log (S/B)$. The signal is then shown normalised to the best-fit value and the SM prediction. The lower frame reports the ratio of data to background, and this is compared with the expected ${t\bar {t}H}$-signal-plus-background yield divided by the background-only yield for the best-fit signal strength (solid red line) and the SM prediction (dashed orange line).

Comparison between data and prediction for the reconstruction BDT score for the Higgs boson candidate identified using Higgs boson information, after the inclusive fit to the data in the dilepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the average $\Delta \eta $ between $b$-tagged jets, after the inclusive fit to the data in the dilepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the likelihood discriminant, after the inclusive fit to the data in the single-lepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the average $\Delta R$ for all possible combinations of $b$-tagged jet pairs, after the inclusive fit to the data in the single-lepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the DNN $P(H)$ output for the Higgs boson candidate after the inclusive fit to the data in the single-lepton boosted channel for $300\le p_T^H<450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the DNN $P(H)$ output for the Higgs boson candidate after the inclusive fit to the data in the single-lepton boosted channel for $p_{{T}}^{H}\ge 450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Post-fit distribution of the reconstructed Higgs boson candidate mass for the dilepton $SR^{\geq 4j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Post-fit distribution of the reconstructed Higgs boson candidate mass for the single-lepton resolved $SR^{\geq 6j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Post-fit distribution of the reconstructed Higgs boson candidate mass for the single-lepton boosted ${{SR}_{{boosted}}}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Fitted values of the ${t\bar {t}H}$ signal strength parameter in the individual channels and in the inclusive signal-strength measurement.

Ranking of the 20 nuisance parameters with the largest post-fit impact on $\mu $ in the fit. Nuisance parameters corresponding to statistical uncertainties in the simulated event samples are not included. The empty blue rectangles correspond to the pre-fit impact on $\mu $ and the filled blue ones to the post-fit impact on $\mu $, both referring to the upper scale. The impact of each nuisance parameter, $\Delta \mu $, is computed by comparing the nominal best-fit value of $\mu $ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\hat{\theta }$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta $ ($\pm \Delta \hat{\theta }$). The black points show the pulls of the nuisance parameters relative to their nominal values, $\theta _0$. These pulls and their relative post-fit errors, $\Delta \hat{\theta }/\Delta \theta $, refer to the lower scale. The `ljets' (`dilep') label refers to the single-lepton (dilepton) channel.

Pre-fit distribution of the number of jets in the dilepton $SR^{\geq 4j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the Standard Model expectation. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations, except the uncertainty in the $k({t\bar {t}+{\geq }1b})$ normalisation factor that is not defined pre-fit.

Pre-fit distribution of the number of jets in the single-lepton resolved $SR^{\geq 6j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the Standard Model expectation. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations, except the uncertainty in the $k({t\bar {t}+{\geq }1b})$ normalisation factor that is not defined pre-fit.

Pre-fit distribution of the number of jets in the single-lepton boosted ${{SR}_{{boosted}}}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the Standard Model expectation. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations, except the uncertainty in the $k({t\bar {t}+{\geq }1b})$ normalisation factor that is not defined pre-fit.

Post-fit distribution of the number of jets in the dilepton $SR^{\geq 4j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Post-fit distribution of the number of jets in the single-lepton resolved $SR^{\geq 6j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Post-fit distribution of the number of jets in the single-lepton boosted ${{SR}_{{boosted}}}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Post-fit distribution of the reconstructed Higgs boson candidate $p_T^H$ for the dilepton $SR^{\geq 4j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The last bin includes the overflow.

Post-fit distribution of the reconstructed Higgs boson candidate $p_T^H$ for the single-lepton resolved $SR^{\geq 6j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The last bin includes the overflow.

Post-fit distribution of the reconstructed Higgs boson candidate $p_T^H$ for the single-lepton boosted ${{SR}_{{boosted}}}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The last bin includes the overflow.

Signal-strength measurements in the individual STXS ${\hat{p}_{{T}}^{H}}$ bins, as well as the inclusive signal strength.

95% CL simplified template cross-section upper limits in the individual STXS ${\hat{p}_{{T}}^{H}}$ bins, as well as the inclusive limit. The observed limits are shown (solid black lines), together with the expected limits both in the background-only hypothesis (dotted black lines) and in the SM hypothesis (dotted red lines). In the case of the expected limits in the background-only hypothesis, one- and two-standard-deviation uncertainty bands are also shown. The hatched uncertainty bands correspond to the theory uncertainty in the fiducial cross-section prediction in each bin.

The ratios $S/B$ (black solid line, referring to the vertical axis on the left) and $S/\sqrt{B}$ (red dashed line, referring to the vertical axis on the right) for each category in the inclusive analysis in the dilepton channel (left) and in the single-lepton channels (right), where $S$ ($B$) is the number of selected signal (background) events predicted by the simulation and normalised to a luminosity of 139 fb$^{-1}$ .

Comparison between data and prediction for the $\Delta R$ between the Higgs candidate and the ${t\bar {t}}$ candidate system, after the inclusive fit to the data in the dilepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the number of $b$-tagged jet pairs with an invariant mass within 30 GeV of 125 GeV, after the inclusive fit to the data in the dilepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the reconstruction BDT score for the Higgs boson candidate identified using Higgs boson information, after the inclusive fit to the data in the single-lepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the $\Delta R$ between the two highest ${p_{{T}}}$ $b$-tagged jets, after the inclusive fit to the data in the single-lepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the sum of $b$-tagging discriminants of jets from Higgs, hadronic top and leptonic top candidates, after the inclusive fit to the data in the single-lepton boosted channel for $300\le p_T^H<450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Comparison between data and prediction for the sum of $b$-tagging discriminants of jets from Higgs, hadronic top and leptonic top candidates, after the inclusive fit to the data in the single-lepton boosted channel for $p_{{T}}^{H}\ge 450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Comparison between data and prediction for the hadronic top candidate invariant mass, after the inclusive fit to the data in the single-lepton boosted channel for $300\le p_T^H<450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Comparison between data and prediction for the hadronic top candidate invariant mass, after the inclusive fit to the data in the single-lepton boosted channel for $p_{{T}}^{H}\ge 450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Comparison between data and prediction for the fraction of the sum of $b$-tagging discriminants of all jets not associated to the Higgs or hadronic top candidates, after the inclusive fit to the data in the single-lepton boosted channel for $300\le p_T^H<450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Comparison between data and prediction for the fraction of the sum of $b$-tagging discriminants of all jets not associated to the Higgs or hadronic top candidates, after the inclusive fit to the data in the single-lepton boosted channel for $p_{{T}}^{H}\ge 450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Ranking of the 20 nuisance parameters with the largest post-fit impact on $\mu $ in the STXS fit for $0\le {\hat{p}_{{T}}^{H}}<120$ GeV. Nuisance parameters corresponding to statistical uncertainties in the simulated event samples are not included. The empty blue rectangles correspond to the pre-fit impact on $\mu $ and the filled blue ones to the post-fit impact on $\mu $, both referring to the upper scale. The impact of each nuisance parameter, $\Delta \mu $, is computed by comparing the nominal best-fit value of $\mu $ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\hat{\theta }$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta $ ($\pm \Delta \hat{\theta }$). The black points show the pulls of the nuisance parameters relative to their nominal values, $\theta _0$. These pulls and their relative post-fit errors, $\Delta \hat{\theta }/\Delta \theta $, refer to the lower scale. For experimental uncertainties that are decomposed into several independent sources, NP X corresponds to the X$^{th}$ nuisance parameter, ordered by their impact on $\mu $. The `ljets' (`dilep') label refers to the single-lepton (dilepton) channel.

Ranking of the 20 nuisance parameters with the largest post-fit impact on $\mu $ in the STXS fit for $120\le {\hat{p}_{{T}}^{H}}<200$ GeV. Nuisance parameters corresponding to statistical uncertainties in the simulated event samples are not included. The empty blue rectangles correspond to the pre-fit impact on $\mu $ and the filled blue ones to the post-fit impact on $\mu $, both referring to the upper scale. The impact of each nuisance parameter, $\Delta \mu $, is computed by comparing the nominal best-fit value of $\mu $ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\hat{\theta }$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta $ ($\pm \Delta \hat{\theta }$). The black points show the pulls of the nuisance parameters relative to their nominal values, $\theta _0$. These pulls and their relative post-fit errors, $\Delta \hat{\theta }/\Delta \theta $, refer to the lower scale. For experimental uncertainties that are decomposed into several independent sources, NP X corresponds to the X$^{th}$ nuisance parameter, ordered by their impact on $\mu $. The `ljets' (`dilep') label refers to the single-lepton (dilepton) channel.

Ranking of the 20 nuisance parameters with the largest post-fit impact on $\mu $ in the STXS fit for $200\le {\hat{p}_{{T}}^{H}}<300$ GeV. Nuisance parameters corresponding to statistical uncertainties in the simulated event samples are not included. The empty blue rectangles correspond to the pre-fit impact on $\mu $ and the filled blue ones to the post-fit impact on $\mu $, both referring to the upper scale. The impact of each nuisance parameter, $\Delta \mu $, is computed by comparing the nominal best-fit value of $\mu $ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\hat{\theta }$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta $ ($\pm \Delta \hat{\theta }$). The black points show the pulls of the nuisance parameters relative to their nominal values, $\theta _0$. These pulls and their relative post-fit errors, $\Delta \hat{\theta }/\Delta \theta $, refer to the lower scale. For experimental uncertainties that are decomposed into several independent sources, NP X corresponds to the X$^{th}$ nuisance parameter, ordered by their impact on $\mu $. The `ljets' (`dilep') label refers to the single-lepton (dilepton) channel.

Ranking of the 20 nuisance parameters with the largest post-fit impact on $\mu $ in the STXS fit for $300\le {\hat{p}_{{T}}^{H}}<450$ GeV. Nuisance parameters corresponding to statistical uncertainties in the simulated event samples are not included. The empty blue rectangles correspond to the pre-fit impact on $\mu $ and the filled blue ones to the post-fit impact on $\mu $, both referring to the upper scale. The impact of each nuisance parameter, $\Delta \mu $, is computed by comparing the nominal best-fit value of $\mu $ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\hat{\theta }$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta $ ($\pm \Delta \hat{\theta }$). The black points show the pulls of the nuisance parameters relative to their nominal values, $\theta _0$. These pulls and their relative post-fit errors, $\Delta \hat{\theta }/\Delta \theta $, refer to the lower scale. For experimental uncertainties that are decomposed into several independent sources, NP X corresponds to the X$^{th}$ nuisance parameter, ordered by their impact on $\mu $. The `ljets' (`dilep') label refers to the single-lepton (dilepton) channel.

Ranking of the 20 nuisance parameters with the largest post-fit impact on $\mu $ in the STXS fit for ${\hat{p}_{{T}}^{H}}\ge 450$ GeV. Nuisance parameters corresponding to statistical uncertainties in the simulated event samples are not included. The empty blue rectangles correspond to the pre-fit impact on $\mu $ and the filled blue ones to the post-fit impact on $\mu $, both referring to the upper scale. The impact of each nuisance parameter, $\Delta \mu $, is computed by comparing the nominal best-fit value of $\mu $ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\hat{\theta }$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta $ ($\pm \Delta \hat{\theta }$). The black points show the pulls of the nuisance parameters relative to their nominal values, $\theta _0$. These pulls and their relative post-fit errors, $\Delta \hat{\theta }/\Delta \theta $, refer to the lower scale. For experimental uncertainties that are decomposed into several independent sources, NP X corresponds to the X$^{th}$ nuisance parameter, ordered by their impact on $\mu $. The `ljets' (`dilep') label refers to the single-lepton (dilepton) channel.

95% confidence level upper limits on signal-strength measurements in the individual STXS ${\hat{p}_{{T}}^{H}}$ bins, as well as the inclusive signal-strength limit, after the fit used to extract multiple signal-strength parameters. The observed limits are shown (solid black lines), together with the expected limits both in the background-only hypothesis (dotted black lines) and in the SM hypothesis (dotted red lines). In the case of the expected limits in the background-only hypothesis, one- and two-standard-deviation uncertainty bands are also shown.

Post-fit correlation matrix (in percentages) between the $\mu $ values obtained in the STXS bins.

Performance of the Higgs boson reconstruction algorithms. For each row of `truth' ${\hat{p}_{{T}}^{H}}$, the matrix shows (in percentages) the fraction of Higgs boson candidates which are truth-matched to ${b\bar {b}}$ decays, with reconstructed $p_T^H$ in the various bins of the dilepton (left), single lepton resolved (middle) and boosted (right) channels.

Pre-fit event yields in the dilepton signal regions and control regions. All uncertainties are included except the $k({t\bar {t}+{\geq }1b})$ uncertainty that is not defined pre-fit. For the ${t\bar {t}H}$ signal, the pre-fit yield values correspond to the theoretical prediction and corresponding uncertainties. `Other sources' refers to s-channel, t-channel, $tW$, $tWZ$, $tZq$, $Z+$ jets and diboson events.

Post-fit event yields in the dilepton signal regions and control regions, after the inclusive fit in all channels. All uncertainties are included, taking into account correlations. For the ${t\bar {t}H}$ signal, the post-fit yield and uncertainties correspond to those in the inclusive signal-strength measurement. `Other sources' refers to s-channel, t-channel, $tW$, $tWZ$, $tZq$, $Z+$ jets and diboson events.

Pre-fit event yields in the single-lepton resolved and boosted signal regions and control regions. All uncertainties are included except the $k({t\bar {t}+{\geq }1b})$ uncertainty that is not defined pre-fit. For the ${t\bar {t}H}$ signal, the pre-fit yield values correspond to the theoretical prediction and corresponding uncertainties. `Other top sources' refers to s-channel, t-channel, $tWZ$ and $tZq$ events.

Post-fit event yields in the single-lepton resolved and boosted signal regions and control regions, after the inclusive fit in all channels. All uncertainties are included, taking into account correlations. For the ${t\bar {t}H}$ signal, the post-fit yield and uncertainties correspond to those in the inclusive signal-strength measurement. `Other top sources' refers to s-channel, t-channel, $tWZ$ and $tZq$ events.

Breakdown of the contributions to the uncertainties in $\mu$. The contributions from the different sources of uncertainty are evaluated after the fit. The $\Delta \mu $ values are obtained by repeating the fit after having fixed a certain set of nuisance parameters corresponding to a group of systematic uncertainties, and then evaluating $(\Delta \mu)^2$ by subtracting the resulting squared uncertainty of $\mu $ from its squared uncertainty found in the full fit. The same procedure is followed when quoting the effect of the ${t\bar {t}+{\geq }1b}$ normalisation. The total uncertainty is different from the sum in quadrature of the different components due to correlations between nuisance parameters existing in the fit.

Fraction (in percentages) of signal events, after SR and CR selections, originating from $b\bar {b}$, $WW$ and other remaining Higgs boson decay modes in the dilepton channel.

Fraction (in percentages) of signal events, after SR and CR selections, originating from $b\bar {b}$, $WW$ and other remaining Higgs boson decay modes in the single-lepton channels.

Predicted SM ${t\bar {t}H}$ cross-section in each of the five STXS ${\hat{p}_{{T}}^{H}}$ bins and signal acceptance times efficiency (including all event selection criteria) in each STXS bin as well as for the inclusive ${\hat{p}_{{T}}^{H}}$ range.

Number of expected signal events before the fit, after each selection requirement applied to enter the dilepton channel $SR^{\geq 4j}_{\geq 4b}$ region. All ${t\bar {t}H}$ signal events are included, regardless of the $H$ or ${t\bar {t}H}$ decay mode. All object corrections are applied, except for the initial number of events which is calculated using the NLO QCD+EW theoretical prediction. All quoted numbers are rounded to unity. More details on the selection criteria can be found in the text.

Number of expected signal events before the fit, after each selection requirement applied to enter the single-lepton channel resolved $SR^{\geq 6j}_{\geq 4b}$ region. All ${t\bar {t}H}$ signal events are included, regardless of the $H$ or ${t\bar {t}H}$ decay mode. All object corrections are applied, except for the initial number of events which is calculated using the NLO QCD+EW theoretical prediction. All quoted numbers are rounded to unity. More details on the selection criteria can be found in the text.

Number of expected signal events before the fit, after each selection requirement applied to enter the single-lepton channel boosted $SR_{boosted}$ region. All ${t\bar {t}H}$ signal events are included, regardless of the $H$ or ${t\bar {t}H}$ decay mode. All object corrections are applied, except for the initial number of events which is calculated using the NLO QCD+EW theoretical prediction. All quoted numbers are rounded to unity. More details on the selection criteria can be found in the text.

Distribution of $m_{T}(W)$ in the $N_{jet}\geq 3$ signal region.

Distribution of $M_{3}$ in the $N_{jet}\geq 3$ signal region.

Distribution of $M_{3}$ in the $N_{jet}\geq 3$ signal region.

Distribution of $m(l,\gamma)$ in the $N_{jet}\geq 3$ signal region.

Distribution of $m(l,\gamma)$ in the $N_{jet}\geq 3$ signal region.

Distribution of $\Delta R(l,\gamma)$ in the $N_{jet}\geq 3$ signal region.

Distribution of $\Delta R(l,\gamma)$ in the $N_{jet}\geq 3$ signal region.

Distribution of $\Delta R(j,\gamma)$ in the $N_{jet}\geq 3$ signal region.

Distribution of $\Delta R(j,\gamma)$ in the $N_{jet}\geq 3$ signal region.

Fit result of the multijet template obtained with loosely isolated leptons and the electroweak background to the measured $m_{T}(W)$ distribution with isolated leptons in the $N_{jet}=2$, $N_{b jet}=0$ selection for electrons.

Fit result of the multijet template obtained with loosely isolated leptons and the electroweak background to the measured $m_{T}(W)$ distribution with isolated leptons in the $N_{jet}=2$, $N_{b jet}=0$ selection for electrons.

Fit result of the multijet template obtained with loosely isolated leptons and the electroweak background to the measured $m_{T}(W)$ distribution with isolated leptons in the $N_{jet}=2$, $N_{b jet}=0$ selection for muons.

Fit result of the multijet template obtained with loosely isolated leptons and the electroweak background to the measured $m_{T}(W)$ distribution with isolated leptons in the $N_{jet}=2$, $N_{b jet}=0$ selection for muons.

Distribution of the invariant mass of the lepton and the photon ($m(l,\gamma)$) in the $N_{jet}\geq 3$, $N_{b jet}=0$ selection for the e channel.

Distribution of the invariant mass of the lepton and the photon ($m(l,\gamma)$) in the $N_{jet}\geq 3$, $N_{b jet}=0$ selection for the e channel.

Distribution of the invariant mass of the lepton and the photon ($m(l,\gamma)$) in the $N_{jet}\geq 3$, $N_{b jet}=0$ selection for the $\mu$ channel.

Distribution of the invariant mass of the lepton and the photon ($m(l,\gamma)$) in the $N_{jet}\geq 3$, $N_{b jet}=0$ selection for the $\mu$ channel.

Extracted scale factors for the contribution from misidentified electrons for the three data-taking periods, and the Z$\gamma$, W$\gamma$ simulations.

Extracted scale factors for the contribution from misidentified electrons for the three data-taking periods, and the Z$\gamma$, W$\gamma$ simulations.

Predicted and observed yields in the control regions in the $N_{jet}= 3$ and $\geq 4$ seletions using the post-fit values of the nuisance parameters.

Predicted and observed yields in the control regions in the $N_{jet}= 3$ and $\geq 4$ seletions using the post-fit values of the nuisance parameters.

Predicted and observed yields in the signal regions in the $N_{jet}= 3$ and $\geq 4$ seletions using the post-fit values of the nuisance parameters.

Predicted and observed yields in the signal regions in the $N_{jet}= 3$ and $\geq 4$ seletions using the post-fit values of the nuisance parameters.

The measured inclusive ttgamma cross section in the fiducial phase space compared to the prediction from simulation using Madgraph_aMC@NLO at a center-of-mass energy of 13 TeV.

The measured inclusive ttgamma cross section in the fiducial phase space compared to the prediction from simulation using Madgraph_aMC@NLO at a center-of-mass energy of 13 TeV.

Summary of the measured cross section ratios with respect to the NLO cross section prediction for signal regions binned in the electron channel, muon channel and the combined single lepton measurement.

Summary of the measured cross section ratios with respect to the NLO cross section prediction for signal regions binned in the electron channel, muon channel and the combined single lepton measurement.

The unfolded differential cross sections for $p_{T}(\gamma)$ and the comparison to simulations.

The unfolded differential cross sections for $p_{T}(\gamma)$ and the comparison to simulations.

The unfolded differential cross sections for $|\eta(\gamma)|$ and the comparison to simulations.

The unfolded differential cross sections for $|\eta(\gamma)|$ and the comparison to simulations.

The unfolded differential cross sections for $\Delta R(l,\gamma)$ and the comparison to simulations.

The unfolded differential cross sections for $\Delta R(l,\gamma)$ and the comparison to simulations.

The covariance matrix of systematic uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The covariance matrix of systematic uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The covariance matrix of systematic uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The covariance matrix of systematic uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The covariance matrix of systematic uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The covariance matrix of systematic uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The covariance matrix of statistic uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The covariance matrix of statistic uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The covariance matrix of statistic uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The covariance matrix of statistic uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The covariance matrix of statistic uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The covariance matrix of statistic uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The correlation matrix of statistical uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The correlation matrix of statistical uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The correlation matrix of statistical uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The correlation matrix of statistical uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The correlation matrix of statistical uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The correlation matrix of statistical uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The correlation matrix of systematic uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The correlation matrix of systematic uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The correlation matrix of systematic uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The correlation matrix of systematic uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The correlation matrix of systematic uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The correlation matrix of systematic uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

Summary of the one-dimensional intervals at 68 and 95% CL.

Summary of the one-dimensional intervals at 68 and 95% CL.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR3 signal region for the electron channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR3 signal region for the electron channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR3 signal region for the muon channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR3 signal region for the muon channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR4p signal region for the electron channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR4p signal region for the electron channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR4p signal region for the muon channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR4p signal region for the muon channel.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional profiled scan for the Wilson coefficient $c_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional profiled scan for the Wilson coefficient $c_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional profiled scan for the Wilson coefficient $c^{I}_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional profiled scan for the Wilson coefficient $c^{I}_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional scan for the Wilson coefficient $c_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional scan for the Wilson coefficient $c_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional scan for the Wilson coefficient $c^{I}_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional scan for the Wilson coefficient $c^{I}_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the two-dimensional scan for the Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the two-dimensional scan for the Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$.

Differential cross sections as function of transverse momentum imbalance between Z boson and dijet for Z+ ≥ 2 jets events.

Differential cross sections as function of transverse momentum imbalance between leading and subleading jet for Z+ ≥ 2 jets events.

Area normalized distribution as function of Delta Phi between Z boson and the leading jet for Z+ ≥ 1 jet events.

Area normalized distribution as function of transverse momentum imbalance between Z boson and the leading jet for Z+ ≥ 1 jet events.

Area normalized distribution as function of Delta Phi between Z boson and dijet for Z+ ≥ 2 jets events.

Area normalized distribution as function of transverse momentum imbalance between Z boson and dijet for Z+ ≥ 2 jets events.

Area normalized distribution as function of transverse momentum imbalance between leading and subleading jet for Z+ ≥ 2 jets events

Response matrix for Delta Phi between Z boson and the leading jet for Z+ ≥ 1 jet events.

Response matrix for transverse momentum imbalance between Z boson and the leading jet for Z+ ≥ 1 jet events.

Response matrix for Delta Phi between Z boson and dijet for Z+ ≥ 2 jets events.

Response matrix for transverse momentum imbalance between Z boson and dijet for Z+ ≥ 2 jets events.

Response matrix for transverse momentum imbalance between the leading jet and subleading jet for Z+ ≥ 2 jets events.

Correlation matrix for Delta Phi between Z boson and the leading jet for Z+ ≥ 1 jet events (for absolute differential cross section measurements).

Correlation matrix for transverse momentum imbalance between Z boson and the leading jet for Z+ ≥ 1 jet events (for absolute differential cross section measurements).

Correlation matrix for Delta Phi between Z boson and dijet for Z+ ≥ 2 jets events (for absolute differential cross section measurements).

Correlation matrix for transverse momentum imbalance between Z boson and dijet for Z+ ≥ 2 jets events (for absolute differential cross section measurements).

Correlation matrix for transverse momentum imbalance between the leading jet and subleading jet for Z+ ≥ 2 jets events (for absolute differential cross section measurements).

Correlation matrix for Delta Phi between Z boson and the leading jet for Z+ ≥ 1 jet events (for normalized differential cross section measurements).

Correlation matrix for transverse momentum imbalance between Z boson and the leading jet for Z+ ≥ 1 jet events (for normalized differential cross section measurements).

Correlation matrix for Delta Phi between Z boson and dijet for Z+ ≥ 2 jets events (for normalized differential cross section measurements).

Correlation matrix for transverse momentum imbalance between Z boson and dijet for Z+ ≥ 2 jets events (for normalized differential cross section measurements).

Correlation matrix for transverse momentum imbalance between the leading jet and subleading jet for Z+ ≥ 2 jets events (for normalized differential cross section measurements).

Post-fit $m_{T}$ distribution in the SR 2J b-tag N-1 region. N-1 refers to all cuts except for the requirement on $m_T$ being applied. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{T}$ distribution in the SR 4J b-veto N-1 region. N-1 refers to all cuts except for the requirement on $m_T$ being applied. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{T}$ distribution in the SR 4J b-veto N-1 region. N-1 refers to all cuts except for the requirement on $m_T$ being applied. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{T}$ distribution in the SR 4J b-tag N-1 region. N-1 refers to all cuts except for the requirement on $m_T$ being applied. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{T}$ distribution in the SR 4J b-tag N-1 region. N-1 refers to all cuts except for the requirement on $m_T$ being applied. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{T}$ distribution in the SR 6J b-veto N-1 region. N-1 refers to all cuts except for the requirement on $m_T$ being applied. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{T}$ distribution in the SR 6J b-veto N-1 region. N-1 refers to all cuts except for the requirement on $m_T$ being applied. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{T}$ distribution in the SR 6J b-tag N-1 region. N-1 refers to all cuts except for the requirement on $m_T$ being applied. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{T}$ distribution in the SR 6J b-tag N-1 region. N-1 refers to all cuts except for the requirement on $m_T$ being applied. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Pre-fit $m_{eff}$ distribution in the TR6J control region. Uncertainties include statistical and systematic uncertainties (added in quadrature). The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 2J b-tag signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Pre-fit $m_{eff}$ distribution in the WR6J control region. Uncertainties include statistical and systematic uncertainties (added in quadrature). The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 2J b-veto signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the TR6J control region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 4J low-x b-tag signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the WR6J control region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 4J low-x b-veto signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 2J b-tag signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 4J high-x b-tag signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 2J b-veto signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 4J high-x b-veto signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 4J low-x b-tag signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 6J b-tag signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 4J low-x b-veto signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 6J b-veto signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 4J high-x b-tag signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Observed 95% CL exclusion contours for the gluino one-step x = 1/2 model.

Post-fit $m_{eff}$ distribution in the 4J high-x b-veto signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Expected 95% CL exclusion contours for the gluino one-step x = 1/2 model. space.

Post-fit $m_{eff}$ distribution in the 6J b-tag signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Observed 95% CL exclusion contours for the gluino one-step variable-x

Post-fit $m_{eff}$ distribution in the 6J b-veto signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Expected 95% CL exclusion contours for the gluino one-step variable-x

Observed 95% CL exclusion contours for the gluino one-step x = 1/2 model.

Observed 95% CL exclusion contours for the squark one-step x = 1/2 model.

Expected 95% CL exclusion contours for the gluino one-step x = 1/2 model. space.

Observed 95% CL exclusion contours for the squark one-step x = 1/2 model.

Observed 95% CL exclusion contours for the gluino one-step variable-x

Observed 95% CL exclusion contours for one-flavour schemes in one-step x = 1/2 model.

Expected 95% CL exclusion contours for the gluino one-step variable-x

Observed 95% CL exclusion contours for one-flavour schemes in one-step x = 1/2 model.

Observed 95% CL exclusion contours for the squark one-step x = 1/2 model.

Expected 95% CL exclusion contours for the squark one-step variable-x

Observed 95% CL exclusion contours for the squark one-step x = 1/2 model.

Expected 95% CL exclusion contours for the squark one-step variable-x

Observed 95% CL exclusion contours for one-flavour schemes in one-step x = 1/2 model.

Expected 95% CL exclusion contours for the squark one-flavour schemes in variable-x

Observed 95% CL exclusion contours for one-flavour schemes in one-step x = 1/2 model.

Expected 95% CL exclusion contours for the squark one-flavour schemes in variable-x

Expected 95% CL exclusion contours for the squark one-step variable-x

Upper limits on the signal cross section for simplified model gluino one-step x = 1/2

Expected 95% CL exclusion contours for the squark one-step variable-x

Upper limits on the signal cross section for simplified model gluino one-step variable-x

Expected 95% CL exclusion contours for the squark one-flavour schemes in variable-x

Upper limits on the signal cross section for simplified model squark one-step x = 1/2

Expected 95% CL exclusion contours for the squark one-flavour schemes in variable-x

Upper limits on the signal cross section for simplified model squark one-step variable-x

Upper limits on the signal cross section for simplified model gluino one-step x = 1/2

Upper limits on the signal cross section for simplified model squark one-step x=1/2 in one-flavour schemes

Upper limits on the signal cross section for simplified model gluino one-step variable-x

Upper limits on the signal cross section for simplified model squark one-step variable-x in one-flavour schemes

Upper limits on the signal cross section for simplified model squark one-step x = 1/2

Post-fit $m_{eff}$ distribution in the 2J b-tag validation region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Upper limits on the signal cross section for simplified model squark one-step variable-x

Post-fit $m_{eff}$ distribution in the 2J b-veto validation region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Upper limits on the signal cross section for simplified model squark one-step x=1/2 in one-flavour schemes

Post-fit $m_{eff}$ distribution in the 4J b-tag validation region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Upper limits on the signal cross section for simplified model squark one-step variable-x in one-flavour schemes

Post-fit $m_{eff}$ distribution in the 4J b-veto validation region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the TR2J control region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 6J b-tag validation region. Uncertainties include statistical and systematic uncertainties.

Post-fit $m_{eff}$ distribution in the WR2J control region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 6J b-veto validation region. Uncertainties include statistical and systematic uncertainties.

Post-fit $m_{eff}$ distribution in the TR4J control region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Event selection cutflow for two representative signal samples for the SR2JBT. The gluino, squark, chargino and neutralino masses are reported. Weighted events including statistical uncertainties are shown.

Post-fit $m_{eff}$ distribution in the WR4J control region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Event selection cutflow for two representative signal samples for the SR2JBV. The gluino, squark, chargino and neutralino masses are reported. Weighted events including statistical uncertainties are shown.

Post-fit $m_{eff}$ distribution in the 2J b-tag validation region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Event selection cutflow for two representative signal samples for the SR4JBT. The gluino, squark, chargino and neutralino masses are reported. Weighted events including statistical uncertainties are shown.

Post-fit $m_{eff}$ distribution in the 2J b-veto validation region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Event selection cutflow for two representative signal samples for the SR4JBV. The gluino, squark, chargino and neutralino masses are reported. Weighted events including statistical uncertainties are shown.

Post-fit $m_{eff}$ distribution in the 4J b-tag validation region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Event selection cutflow for two representative signal samples for the SR6JBT. The gluino, squark, chargino and neutralino masses are reported. Weighted events including statistical uncertainties are shown.

Post-fit $m_{eff}$ distribution in the 4J b-veto validation region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Event selection cutflow for two representative signal samples for the SR6JBV. The gluino, squark, chargino and neutralino masses are reported. Weighted events including statistical uncertainties are shown.

Post-fit $m_{eff}$ distribution in the 6J b-tag validation region. Uncertainties include statistical and systematic uncertainties.

Signal acceptance in SR2J b-Tag bin1 region for gluino production one-step x = 1/2 simplified models

Post-fit $m_{eff}$ distribution in the 6J b-veto validation region. Uncertainties include statistical and systematic uncertainties.

Signal acceptance in SR2J b-Tag bin2 region for gluino production one-step x = 1/2 simplified models

Event selection cutflow for two representative signal samples for the SR2JBT. The gluino, squark, chargino and neutralino masses are reported. Weighted events including statistical uncertainties are shown.

Signal acceptance in SR2J b-Tag bin3 region for gluino production one-step x = 1/2 simplified models

Event selection cutflow for two representative signal samples for the SR2JBV. The gluino, squark, chargino and neutralino masses are reported. Weighted events including statistical uncertainties are shown.

Signal acceptance in SR2J b-Veto bin1 region for gluino production one-step x = 1/2 simplified models

Event selection cutflow for two representative signal samples for the SR4JBT. The gluino, squark, chargino and neutralino masses are reported. Weighted events including statistical uncertainties are shown.

Signal acceptance in SR2J b-Veto bin2 region for gluino production one-step x = 1/2 simplified models

Event selection cutflow for two representative signal samples for the SR4JBV. The gluino, squark, chargino and neutralino masses are reported. Weighted events including statistical uncertainties are shown.

Signal acceptance in SR2J b-Veto bin3 region for gluino production one-step x = 1/2 simplified models

Event selection cutflow for two representative signal samples for the SR6JBT. The gluino, squark, chargino and neutralino masses are reported. Weighted events including statistical uncertainties are shown.

Signal acceptance in SR2J discovery high region for gluino production one-step x = 1/2 simplified models

Event selection cutflow for two representative signal samples for the SR6JBV. The gluino, squark, chargino and neutralino masses are reported. Weighted events including statistical uncertainties are shown.

Signal acceptance in SR2J discovery low region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Tag bin1 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx discovery region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Tag bin2 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Tag bin1 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Tag bin3 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Tag bin2 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Veto bin1 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Tag bin3 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Veto bin2 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Veto bin1 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Veto bin3 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Veto bin2 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J discovery high region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Veto bin3 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J discovery low region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx discovery region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx discovery region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Tag bin1 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Tag bin1 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Tag bin2 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Tag bin2 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Tag bin3 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Tag bin3 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Veto bin1 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Veto bin1 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Veto bin2 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Veto bin2 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Veto bin3 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Veto bin3 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Tag bin1 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx discovery region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Tag bin2 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Tag bin1 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Tag bin3 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Tag bin2 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Tag bin4 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Tag bin3 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Veto bin1 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Veto bin1 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Veto bin2 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Veto bin2 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Veto bin3 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Veto bin3 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Veto bin4 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Tag bin1 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR6J discovery high region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Tag bin2 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR6J discovery low region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Tag bin3 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Tag bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Tag bin4 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Tag bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Veto bin1 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Tag bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Veto bin2 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Veto bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Veto bin3 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Veto bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Veto bin4 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Veto bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J discovery high region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J discovery high region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J discovery low region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J discovery low region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J b-Tag bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jhx discovery region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J b-Tag bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Tag bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J b-Tag bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Tag bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J b-Veto bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Tag bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J b-Veto bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Veto bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J b-Veto bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Veto bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J discovery high region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Veto bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J discovery low region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jlx discovery region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jhx discovery region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Tag bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Tag bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Tag bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Tag bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Tag bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Tag bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Veto bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Veto bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Veto bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Veto bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Veto bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Veto bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Tag bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jlx discovery region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Tag bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Tag bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Tag bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Tag bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Tag bin4 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Tag bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Veto bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Veto bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Veto bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Veto bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Veto bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Veto bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Veto bin4 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Tag bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J discovery high region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Tag bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J discovery low region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Tag bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J b-Tag bin1 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Tag bin4 region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J b-Tag bin2 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Veto bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J b-Tag bin3 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Veto bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J b-Veto bin1 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Veto bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J b-Veto bin2 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Veto bin4 region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J b-Veto bin3 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J discovery high region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J discovery high region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J discovery low region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J discovery low region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Tag bin1 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx discovery region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Tag bin2 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Tag bin1 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Tag bin3 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Tag bin2 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Veto bin1 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Tag bin3 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Veto bin2 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Veto bin1 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Veto bin3 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Veto bin2 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR2J discovery high region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Veto bin3 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR2J discovery low region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx discovery region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx discovery region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Tag bin1 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Tag bin1 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Tag bin2 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Tag bin2 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Tag bin3 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Tag bin3 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Veto bin1 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Veto bin1 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Veto bin2 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Veto bin2 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Veto bin3 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Veto bin3 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Tag bin1 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx discovery region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Tag bin2 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Tag bin1 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Tag bin3 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Tag bin2 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Tag bin4 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Tag bin3 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Veto bin1 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Veto bin1 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Veto bin2 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Veto bin2 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Veto bin3 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Veto bin3 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Veto bin4 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Tag bin1 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J discovery high region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Tag bin2 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J discovery low region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Tag bin3 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Tag bin1 region for squark production one-step variable-x simplified models

Signal acceptance in SR6J b-Tag bin4 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Tag bin2 region for squark production one-step variable-x simplified models

Signal acceptance in SR6J b-Veto bin1 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Tag bin3 region for squark production one-step variable-x simplified models

Signal acceptance in SR6J b-Veto bin2 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Veto bin1 region for squark production one-step variable-x simplified models

Signal acceptance in SR6J b-Veto bin3 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Veto bin2 region for squark production one-step variable-x simplified models

Signal acceptance in SR6J b-Veto bin4 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Veto bin3 region for squark production one-step variable-x simplified models

Signal acceptance in SR6J discovery high region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR2J discovery high region for squark production one-step variable-x simplified models

Signal acceptance in SR6J discovery low region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR2J discovery low region for squark production one-step variable-x simplified models

Signal acceptance in SR2J b-Tag bin1 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jhx discovery region for squark production one-step variable-x simplified models

Signal acceptance in SR2J b-Tag bin2 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Tag bin1 region for squark production one-step variable-x simplified models

Signal acceptance in SR2J b-Tag bin3 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Tag bin2 region for squark production one-step variable-x simplified models

Signal acceptance in SR2J b-Veto bin1 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Tag bin3 region for squark production one-step variable-x simplified models

Signal acceptance in SR2J b-Veto bin2 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Veto bin1 region for squark production one-step variable-x simplified models

Signal acceptance in SR2J b-Veto bin3 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Veto bin2 region for squark production one-step variable-x simplified models

Signal acceptance in SR2J discovery high region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Veto bin3 region for squark production one-step variable-x simplified models

Signal acceptance in SR2J discovery low region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jlx discovery region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jhx discovery region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Tag bin1 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Tag bin1 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Tag bin2 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Tag bin2 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Tag bin3 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Tag bin3 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Veto bin1 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Veto bin1 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Veto bin2 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Veto bin2 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Veto bin3 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Veto bin3 region for squark production one-step variable-x simplified models

Signal acceptance in SR6J b-Tag bin1 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jlx discovery region for squark production one-step variable-x simplified models

Signal acceptance in SR6J b-Tag bin2 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Tag bin1 region for squark production one-step variable-x simplified models

Signal acceptance in SR6J b-Tag bin3 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Tag bin2 region for squark production one-step variable-x simplified models

Signal acceptance in SR6J b-Tag bin4 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Tag bin3 region for squark production one-step variable-x simplified models

Signal acceptance in SR6J b-Veto bin1 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Veto bin1 region for squark production one-step variable-x simplified models

Signal acceptance in SR6J b-Veto bin2 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Veto bin2 region for squark production one-step variable-x simplified models

Signal acceptance in SR6J b-Veto bin3 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Veto bin3 region for squark production one-step variable-x simplified models

Signal acceptance in SR6J b-Veto bin4 region for squark production one-step variable-x simplified models

Signal acceptance in SR6J b-Tag bin1 region for squark production one-step variable-x simplified models

Signal acceptance in SR6J discovery high region for squark production one-step variable-x simplified models

Signal acceptance in SR6J b-Tag bin2 region for squark production one-step variable-x simplified models

Signal acceptance in SR6J discovery low region for squark production one-step variable-x simplified models

Signal acceptance in SR6J b-Tag bin3 region for squark production one-step variable-x simplified models

Signal efficiency in SR2J b-Tag bin1 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal acceptance in SR6J b-Tag bin4 region for squark production one-step variable-x simplified models

Signal efficiency in SR2J b-Tag bin2 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal acceptance in SR6J b-Veto bin1 region for squark production one-step variable-x simplified models

Signal efficiency in SR2J b-Tag bin3 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal acceptance in SR6J b-Veto bin2 region for squark production one-step variable-x simplified models

Signal efficiency in SR2J b-Veto bin1 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal acceptance in SR6J b-Veto bin3 region for squark production one-step variable-x simplified models

Signal efficiency in SR2J b-Veto bin2 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal acceptance in SR6J b-Veto bin4 region for squark production one-step variable-x simplified models

Signal efficiency in SR2J b-Veto bin3 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal acceptance in SR6J discovery high region for squark production one-step variable-x simplified models

Signal efficiency in SR2J discovery high region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal acceptance in SR6J discovery low region for squark production one-step variable-x simplified models

Signal efficiency in SR2J discovery low region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Tag bin1 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx discovery region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Tag bin2 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Tag bin1 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Tag bin3 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Tag bin2 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Veto bin1 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Tag bin3 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Veto bin2 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Veto bin1 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Veto bin3 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Veto bin2 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J discovery high region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Veto bin3 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J discovery low region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx discovery region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx discovery region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Tag bin1 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Tag bin1 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Tag bin2 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Tag bin2 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Tag bin3 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Tag bin3 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Veto bin1 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Veto bin1 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Veto bin2 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Veto bin2 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Veto bin3 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Veto bin3 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Tag bin1 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx discovery region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Tag bin2 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Tag bin1 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Tag bin3 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Tag bin2 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Tag bin4 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Tag bin3 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Veto bin1 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Veto bin1 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Veto bin2 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Veto bin2 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Veto bin3 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Veto bin3 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Veto bin4 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Tag bin1 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J discovery high region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Tag bin2 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J discovery low region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Tag bin3 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Tag bin1 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Tag bin4 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Tag bin2 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Veto bin1 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Tag bin3 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Veto bin2 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Veto bin1 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Veto bin3 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Veto bin2 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Veto bin4 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Veto bin3 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J discovery high region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J discovery high region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J discovery low region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J discovery low region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Tag bin1 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx discovery region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Tag bin2 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Tag bin1 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Tag bin3 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Tag bin2 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Veto bin1 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Tag bin3 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Veto bin2 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Veto bin1 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Veto bin3 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Veto bin2 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J discovery high region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Veto bin3 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J discovery low region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx discovery region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx discovery region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Tag bin1 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Tag bin1 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Tag bin2 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Tag bin2 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Tag bin3 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Tag bin3 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Veto bin1 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Veto bin1 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Veto bin2 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Veto bin2 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Veto bin3 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Veto bin3 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Tag bin1 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx discovery region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Tag bin2 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Tag bin1 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Tag bin3 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Tag bin2 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Tag bin4 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Tag bin3 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Veto bin1 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Veto bin1 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Veto bin2 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Veto bin2 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Veto bin3 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Veto bin3 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Veto bin4 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Tag bin1 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J discovery high region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Tag bin2 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J discovery low region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Tag bin3 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Tag bin1 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Tag bin4 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Tag bin2 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Veto bin1 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Tag bin3 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Veto bin2 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Veto bin1 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Veto bin3 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Veto bin2 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Veto bin4 region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Veto bin3 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J discovery high region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J discovery high region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J discovery low region for gluino production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J discovery low region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Tag bin1 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx discovery region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Tag bin2 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Tag bin1 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Tag bin3 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Tag bin2 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Veto bin1 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Tag bin3 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Veto bin2 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Veto bin1 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Veto bin3 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Veto bin2 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J discovery high region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Veto bin3 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J discovery low region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx discovery region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx discovery region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Tag bin1 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Tag bin1 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Tag bin2 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Tag bin2 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Tag bin3 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Tag bin3 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Veto bin1 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Veto bin1 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Veto bin2 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Veto bin2 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Veto bin3 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Veto bin3 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Tag bin1 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx discovery region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Tag bin2 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Tag bin1 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Tag bin3 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Tag bin2 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Tag bin4 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Tag bin3 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Veto bin1 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Veto bin1 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Veto bin2 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Veto bin2 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Veto bin3 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Veto bin3 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Veto bin4 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Tag bin1 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J discovery high region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Tag bin2 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J discovery low region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Tag bin3 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Tag bin1 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Tag bin4 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Tag bin2 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Veto bin1 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Tag bin3 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Veto bin2 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Veto bin1 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Veto bin3 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Veto bin2 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Veto bin4 region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Veto bin3 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J discovery high region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J discovery high region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J discovery low region for squark production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J discovery low region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Tag bin1 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx discovery region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Tag bin2 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Tag bin1 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Tag bin3 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Tag bin2 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Veto bin1 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Tag bin3 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Veto bin2 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Veto bin1 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Veto bin3 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Veto bin2 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J discovery high region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Veto bin3 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J discovery low region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx discovery region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx discovery region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Tag bin1 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Tag bin1 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Tag bin2 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Tag bin2 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Tag bin3 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Tag bin3 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Veto bin1 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Veto bin1 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Veto bin2 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Veto bin2 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Veto bin3 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Veto bin3 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Tag bin1 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx discovery region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Tag bin2 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Tag bin1 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Tag bin3 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Tag bin2 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Tag bin4 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Tag bin3 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Veto bin1 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Veto bin1 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Veto bin2 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Veto bin2 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Veto bin3 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jlx b-Veto bin3 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Veto bin4 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Tag bin1 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J discovery high region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Tag bin2 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J discovery low region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Tag bin3 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Tag bin4 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Veto bin1 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Veto bin2 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Veto bin3 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J b-Veto bin4 region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J discovery high region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR6J discovery low region for squark production one-step variable-x simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0