Table with post-fit yields in the four regions used in the measurement. The correlations of the nuisance parameters, as obtained by the fit, are considered for the calculation of the uncertainties.

Ratio of the $t\bar{t}$ to the $Z$-boson cross section compared to the predictions for several sets of parton distribution functions. The total cross section for $t\bar{t}$ production and the fiducial cross section for $Z$-boson production are used. The uncertainty on the prediction represents the PDF+$\alpha_{s}$ variations.

Nuisance parameter ranking plot for the $t\bar{t}$ signal-strength. Only the 10 most important nuisance parameters are shown. The impact of each nuisance parameter on the measured cross section, is defined as the shift induced in measured cross-section as the nuisance parameter is shifted by its pre-fit and post-fit uncertainties from its nominal best-fit value and then fixed while all other nuisance parameters profiled.

Nuisance parameter ranking plot for the ratio of the $t\bar{t}$ and $Z$-boson signal-strengths. Only the 10 most important nuisance parameters are shown. The impact of each nuisance parameter on the measured ratio, is defined as the shift induced in measured ratio as the nuisance parameter is shifted by its pre-fit and post-fit uncertainties from its nominal best-fit value and then fixed while all other nuisance parameters profiled.

Nuisance parameter ranking plot for the $Z$-boson signal-strength. Only the 10 most important nuisance parameters are shown. The impact of each nuisance parameter on the measured cross section, is defined as the shift induced in measured cross-section as the nuisance parameter is shifted by its pre-fit and post-fit uncertainties from its nominal best-fit value and then fixed while all other nuisance parameters profiled.

Measured unfolded differential cross-section as a function of the dilepton transverse momentum $p^{ll}_{\mathrm{T}}$. NLO predictions from Sherpa 2.2.10 and MadGraph5_aMC@NLO 2.7.3 are also shown. The uncertainty in the predictions is divided into statistical and theoretical uncertainties (scale and PDF+$\alpha_{s}$).

Measured unfolded differential cross-section as a function of the the four-body transverse momentum $p^{ll\gamma\gamma}_{\mathrm{T}}$. NLO predictions from Sherpa 2.2.10 and MadGraph5_aMC@NLO 2.7.3 are also shown. The uncertainty in the predictions is divided into statistical and theoretical uncertainties (scale and PDF+$\alpha_{s}$).

Measured unfolded differential cross-section as a function of the diphoton invariant mass $m_{\gamma\gamma}$. NLO predictions from Sherpa 2.2.10 and MadGraph5_aMC@NLO 2.7.3 are also shown. The uncertainty in the predictions is divided into statistical and theoretical uncertainties (scale and PDF+$\alpha_{s}$).

Measured unfolded differential cross-section as a function of the four-body invariant mass $m_{ll\gamma\gamma}$. NLO predictions from Sherpa 2.2.10 and MadGraph5_aMC@NLO 2.7.3 are also shown. The uncertainty in the predictions is divided into statistical and theoretical uncertainties (scale and PDF+$\alpha_{s}$).

Expected and observed $95\%$ confidence intervals for the coupling parameters $f_{T,j}/\Lambda^{4}$ of transverse dimension-8 operators. All parameter values outside of the stated range are excluded at the chosen confidence level. No unitarity constraints are applied.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,8}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,0}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,1}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,2}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,5}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,6}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,7}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,9}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Differential fiducial cross section of the Z boson $|y|$ in events with $Z(\rightarrow ll)\ge+1$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the leading b-jet $|y|$ in events with $Z(\rightarrow ll)\ge+1$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $\Delta \phi$ between Z boson and leading $b$-jet in events with $Z(\rightarrow ll)\ge+1$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $\Delta y$ between Z boson and leading $b$-jet in events with $Z(\rightarrow ll)\ge+1$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $\Delta R$ between Z boson and leading $b$-jet in events with $Z(\rightarrow ll)\ge+1$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $\Delta \phi$ between the first two leading $b$-jets in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $\Delta y$ between the first two leading $b$-jets in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $\Delta R$ between the first two leading $b$-jets in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the invariant mass of the first two leading $b$-jets in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the Z boson $p_{\text{T}}$ in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $p_{\text{T}}$ of the first two leading $b$-jets in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the ratio between the $p_{\text{T}}$ and the invariant mass of the first two leading $b$-jets in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Overview of the detector efficiency correction factors, $C_{Z}$ , for the electron and muon channels and their systematic uncertainty contributions.

Overview of the detector efficiency correction factors, $C_{Z}$ , for the electron and muon channels and their systematic uncertainty contributions.

Overview of the detector efficiency correction factors, $C_{Z}$ , for the electron and muon channels and their systematic uncertainty contributions.

Measured inclusive cross-section in the fiducial volume in the electron and muon decay channels at Born level and their combination as well as the theory prediction at NNLO in $\alpha_{s}$ using the CT14 PDF set.

Measured inclusive cross-section in the fiducial volume in the electron and muon decay channels at Born level and their combination as well as the theory prediction at NNLO in $\alpha_{s}$ using the CT14 PDF set.

Measured inclusive cross-section in the fiducial volume in the electron and muon decay channels at Born level and their combination as well as the theory prediction at NNLO in $\alpha_{s}$ using the CT14 PDF set.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton invariant mass $m_{ll}$ , the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton invariant mass $m_{ll}$ , the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton invariant mass $m_{ll}$ , the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton invariant mass $m_{ll}$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton invariant mass $m_{ll}$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton invariant mass $m_{ll}$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The measured normalized cross section as a function of $p_{ll}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown. The $p_{ll}$ distribution is split into linear and logarithmic scales at 30 GeV.

The measured normalized cross section as a function of $p_{ll}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown. The $p_{ll}$ distribution is split into linear and logarithmic scales at 30 GeV.

The measured normalized cross section as a function of $p_{ll}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown. The $p_{ll}$ distribution is split into linear and logarithmic scales at 30 GeV.

The measured normalized cross section as a function of $\phi_{\eta}^{*}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown.

The measured normalized cross section as a function of $\phi_{\eta}^{*}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown.

The measured normalized cross section as a function of $\phi_{\eta}^{*}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown.

Comparison of the normalized $p_{ll}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $p_{ll}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $p_{ll}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $\phi_{\eta}^{*}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $\phi_{\eta}^{*}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $\phi_{\eta}^{*}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $p_{ll}$ distribution in the range $p_{ll}$ > 10 GeV. The Born level combined measurement is compared with predictions by Sherpa v2.2.1, fixed-order NNLOjet and NNLOjet supplied with NLO electroweak corrections. The uncertainties in the measurement are shown as vertical bars and the uncertainties in the predictions are indicated by the coloured bands.

Comparison of the normalized $p_{ll}$ distribution in the range $p_{ll}$ > 10 GeV. The Born level combined measurement is compared with predictions by Sherpa v2.2.1, fixed-order NNLOjet and NNLOjet supplied with NLO electroweak corrections. The uncertainties in the measurement are shown as vertical bars and the uncertainties in the predictions are indicated by the coloured bands.

Comparison of the normalized $p_{ll}$ distribution in the range $p_{ll}$ > 10 GeV. The Born level combined measurement is compared with predictions by Sherpa v2.2.1, fixed-order NNLOjet and NNLOjet supplied with NLO electroweak corrections. The uncertainties in the measurement are shown as vertical bars and the uncertainties in the predictions are indicated by the coloured bands.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at dressed level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at dressed level.

Measured fiducial cross section times leptonic branching ratio for W- production in the W- -> mu- nu final state.

Measured fiducial cross section times leptonic branching ratio for Z/gamma* production in the Z/gamma* -> e+ e- final state.

Measured fiducial cross section times leptonic branching ratio for Z/gamma* production in the Z/gamma* -> mu+ mu- final state.

Measured total cross section times leptonic branching ratio for W+ production in the W+ -> e+ nu final state.

Measured total cross section times leptonic branching ratio for W+ production in the W+ -> mu+ nu final state.

Measured total cross section times leptonic branching ratio for W- production in the W- -> e- nu final state.

Measured total cross section times leptonic branching ratio for W- production in the W- -> mu- nu final state.

Measured total cross section times leptonic branching ratio for Z/gamma* production in the Z/gamma* -> e+ e- final state.

Measured total cross section times leptonic branching ratio for Z/gamma* production in the Z/gamma* -> mu+ mu- final state.

Combined fiducial cross-section measurements for W+ boson production in the W+ -> l+ nu (l = e, mu) final state.

Combined fiducial cross-section measurements for W- boson production in the W- -> l- nu (l = e, mu) final state.

Combined fiducial cross-section measurements for W boson production in the W -> l nu (l = e, mu) final state.

Combined fiducial cross-section measurements for Z/gamma* production in the Z/gamma* -> l- l+ (l = e, mu) final state.

Combined total cross-section measurements for W+ boson production in the W+ -> l+ nu (l = e, mu) final state.

Combined total cross-section measurements for W- boson production in the W- -> l- nu (l = e, mu) final state.

Combined total cross-section measurements for W boson production in the W -> l nu (l = e, mu) final state.

Combined total cross-section measurements for Z/gamma* production in the Z/gamma* -> l- l+ (l = e, mu) final state.

Measured fiducial cross-section ratio R_{W+-/Z} = sigma (W+/- -> l+/- nu/nubar) / sigma (Z/gamma^* -> l+ l-) where l = e, mu.

Measured fiducial cross-section ratio R_{W+/W-} = sigma (W+ -> l+ nu) / sigma (W- -> l- nubar) where l = e, mu.

Measured charge asymmetry in W-boson production A_{l} = ( sigma (W+ -> l+ nu) - sigma (W- -> l- nubar) ) / ( sigma (W+ -> l+ nu) + sigma (W- -> l- nubar) ) where l = e, mu.

The ratio of measured W+ cross-sections in the electron and muon decay channels R_{W+} = sigma (W+ -> e+ nu) / sigma (W+ -> mu+ nu)

The ratio of measured W- cross-sections in the electron and muon decay channels R_{W-} = sigma (W- -> e- nu) / sigma (W- -> mu- nu)

The ratio of measured W cross-sections in the electron and muon decay channels R_{W} = sigma (W -> e nu) / sigma (W -> mu nu)

The ratio of measured Z/gamma^* cross-sections in the electron and muon decay channels R_{Z/gamma^*} = sigma (Z/gamma^* -> e+ e-) / sigma (Z/gamma^* -> mu+ mu-)

Correlation coefficients among (W- -> l- nubar), (W+ -> l+ nu), (Z/gamma^* -> l+ l-) where (l = e, mu) excluding the common normalisation uncertainty due to the luminosity calibration.

Measured jet multiplicity distribution in the $W\mu\nu$+jets control region for the inclusive SR1 selection, compared to the background expectations. The latter include the global normalization factors extracted from the data. Where appropriate, the last bin of the distribution includes overflows.

Measured dilepton invariant mass distribution in the $Z\mu\mu$+jets control region for the inclusive SR1 selection, compared to the background expectations. The latter include the global normalization factors extracted from the data. Where appropriate, the last bin of the distribution includes overflows. P P --> Z0 JET(S) X.

Measured $E_{T}^{miss}$ distribution in the $Z\mu\mu$+jets control region for the inclusive SR1 selection, compared to the background expectations. The latter include the global normalization factors extracted from the data. Where appropriate, the last bin of the distribution includes overflows. P P --> Z0 JET(S) X.

Measured leading jet $p_{T}$ distribution in the $Z\mu\mu$+jets control region for the inclusive SR1 selection, compared to the background expectations. The latter include the global normalization factors extracted from the data. Where appropriate, the last bin of the distribution includes overflows. P P --> Z0 JET(S) X.

Measured jet multiplicity distribution in the $Z\mu\mu$+jets control region for the inclusive SR1 selection, compared to the background expectations. The latter include the global normalization factors extracted from the data. Where appropriate, the last bin of the distribution includes overflows. P P --> Z0 JET(S) X.

Measured transverse mass distribution in the $We\nu$+jets control region for the inclusive SR1 selection, compared to the background expectations. The latter include the global normalization factors extracted from the data. Where appropriate, the last bin of the distribution includes overflows.

Measured $E_{T}^{miss}$ distribution in the $We\nu$+jets control region for the inclusive SR1 selection, compared to the background expectations. The latter include the global normalization factors extracted from the data. Where appropriate, the last bin of the distribution includes overflows.

Measured leading jet $p_{T}$ distribution in the $We\nu$+jets control region for the inclusive SR1 selection, compared to the background expectations. The latter include the global normalization factors extracted from the data. Where appropriate, the last bin of the distribution includes overflows.

Measured jet multiplicity distribution in the $We\nu$+jets control region for the inclusive SR1 selection, compared to the background expectations. The latter include the global normalization factors extracted from the data. Where appropriate, the last bin of the distribution includes overflows.

Measured dilepton invariant mass distribution in the $Zee$+jets control region for the inclusive SR1 selection, compared to the background expectations. The latter include the global normalization factors extracted from the data. Where appropriate, the last bin of the distribution includes overflows.

Measured $E_{T}^{miss}$ distribution in the $Zee$+jets control region for the inclusive SR1 selection, compared to the background expectations. The latter include the global normalization factors extracted from the data. Where appropriate, the last bin of the distribution includes overflows.

Measured leading jet $p_{T}$ distribution in the $Zee$+jets control region for the inclusive SR1 selection, compared to the background expectations. The latter include the global normalization factors extracted from the data. Where appropriate, the last bin of the distribution includes overflows.

Measured jet multiplicity distribution in the $Zee$+jets control region for the inclusive SR1 selection, compared to the background expectations. The latter include the global normalization factors extracted from the data. Where appropriate, the last bin of the distribution includes overflows.

Measured distribution of the jet multiplicity for the SR1 selection compared to the SM expectations. The $Z\nu\nu$+jets contribution is shown as constrained by the $W\mu\nu$+jets control sample. Where appropriate, the last bin of the distribution includes overflows. The distribution of different ADD, WIMP and GMSB scenarios are included.

Measured distribution of $E_{T}^{miss}$ for the SR1 selection compared to the SM expectations. The $Z\nu\nu$+jets contribution is shown as constrained by the $W\mu\nu$+jets control sample. Where appropriate, the last bin of the distribution includes overflows. The distribution of different ADD, WIMP and GMSB scenarios are included.

Measured distribution of leading jet $p_{T}$ for the SR1 selection compared to the SM expectations. The $Z\nu\nu$+jets contribution is shown as constrained by the $W\mu\nu$+jets control sample. Where appropriate, the last bin of the distribution includes overflows. The distribution of different ADD, WIMP and GMSB scenarios are included.

Measured distribution of the leading jet $p_{T}$ to $E_{T}^{miss}$ ratio for the SR1 selection compared to the SM expectations. The $Z\nu\nu$+jets contribution is shown as constrained by the $W\mu\nu$+jets control sample. Where appropriate, the last bin of the distribution includes overflows. The distribution of different ADD, WIMP and GMSB scenarios are included.

Measured distribution of the jet multiplicity for SR7 selection compared to the SM expectations. The $Z\nu\nu$+jets contribution is shown as constrained by the $W\mu\nu$+jets control sample. Where appropriate, the last bin of the distribution includes overflows. The distribution of different ADD, WIMP and GMSB scenarios are included.

Measured distribution of the jet multiplicity for SR7 selection compared to the SM expectations. The $Z\nu\nu$+jets contribution is shown as constrained by the $W\mu\nu$+jets control sample. Where appropriate, the last bin of the distribution includes overflows. The distribution of different ADD, WIMP and GMSB scenarios are included.

Measured distribution of the leading jet $p_T$ for SR7 selection compared to the SM expectations. The $Z\nu\nu$+jets contribution is shown as constrained by the $W\mu\nu$+jets control sample. Where appropriate, the last bin of the distribution includes overflows. The distribution of different ADD, WIMP and GMSB scenarios are included.

Measured distribution of the leading jet $p_T$ for SR9 selection compared to the SM expectations. The $Z\nu\nu$+jets contribution is shown as constrained by the $W\mu\nu$+jets control sample. Where appropriate, the last bin of the distribution includes overflows. The distribution of different ADD, WIMP and GMSB scenarios are included.

Measured distribution of the leading jet $p_T$ to $E_{T}^{miss}$ ratio for SR7 selection compared to the SM expectations. The $Z\nu\nu$+jets contribution is shown as constrained by the $W\mu\nu$+jets control sample. Where appropriate, the last bin of the distribution includes overflows. The distribution of different ADD, WIMP and GMSB scenarios are included.

Measured distribution of the leading jet $p_T$ to $E_{T}^{miss}$ ratio for SR9 selection compared to the SM expectations. The $Z\nu\nu$+jets contribution is shown as constrained by the $W\mu\nu$+jets control sample. Where appropriate, the last bin of the distribution includes overflows. The distribution of different ADD, WIMP and GMSB scenarios are included.

Observed and expected 95$\%$ CL limit on the fundamental Planck scale in $4+n$ dimensions, $M_D$, as a function of the number of extra dimensions. In the figure the two results overlap. The shaded areas around the expected limit indicate the expected $\pm 1\sigma$ and $\pm 2\sigma$ ranges of limits in the absence of a signal. The 95$\%$ CL observed limits after the suppression of the events with $\hat{s} > M_D^2$ is applied (truncated) are also given.

Limits at 95% C.L. on the EFT suppression scale M* as a function of the WIMP mass m_chi, for the scalar operator D1. Results where EFT truncation is applied are also shown for couplings of 1 and the perturbative limit.

Limits at 95% C.L. on the EFT suppression scale M* as a function of the WIMP mass m_chi, for the vector operator D5. Results where EFT truncation is applied are also shown for couplings of 1 and the perturbative limit.

Limits at 95% C.L. on the EFT suppression scale M* as a function of the WIMP mass m_chi, for the axial vector operator D8. Results where EFT truncation is applied are also shown for couplings of 1 and the perturbative limit.

Limits at 95% C.L. on the EFT suppression scale M* as a function of the WIMP mass m_chi, for the tensor operator D9. Results where EFT truncation is applied are also shown for couplings of 1 and the perturbative limit.

Limits at 95% C.L. on the EFT suppression scale M* as a function of the WIMP mass m_chi, for the gluon operator D11. Results where EFT truncation is applied are also shown for couplings of 1 and the perturbative limit.

Limits at 95% C.L. on the EFT suppression scale M* as a function of the WIMP mass m_chi, for the gluon operator C5. Results where EFT truncation is applied are also shown for couplings of 1 and the perturbative limit.

Observed 95% CL limits on the suppression scale M* as a function of the mediator mass Mmed, assuming a Z'-like boson in a simplified model and a DM mass of 50 GeV and 400 GeV. The width of the mediator is varied between Mmed/3 and Mmed/8pi.

Observed 95% CL upper limits on the product of couplings of the simplified model vertex in the plane of mediator and WIMP mass (Mmed versus m_chi).

Upper limits at 90% C.L. on the WIMP-nucleon scattering cross section as a function of m_chi for spin-independent interactions, for a coupling strength of unity or the maximum value that keeps the model within its perturbative regime. The truncation procedure is applied for both cases.

Upper limits at 90% C.L. on the WIMP-nucleon scattering cross section as a function of m_chi for spin-dependent interactions, for a coupling strength of unity or the maximum value that keeps the model within its perturbative regime. The truncation procedure is applied for both cases.

Upper limits at 90% C.L. on the WIMP-nucleon annihilation cross section as a function of m_chi, for a coupling strength of unity or the maximum value that keeps the model within its perturbative regime. The truncation procedure is applied for both cases.

95$\%$ CL lower limits on the gravitino mass $m_{\tilde{G}}$ as a function of the squark mass $m_{\tilde{q}}$ for degenerate squark/gluino masses.

95$\%$ CL lower limits on the gravitino mass $m_{\tilde{G}}$ as a function of the squark mass $m_{\tilde{q}}$ for non-degenerate squark/gluino masses: $ m_{\tilde{g}} = 1/2 \times m_{\tilde{q}}$.

95$\%$ CL lower limits on the gravitino mass $m_{\tilde{G}}$ as a function of the squark mass $m_{\tilde{q}}$ for non-degenerate squark/gluino masses: $ m_{\tilde{g}} = 1/4 \times m_{\tilde{q}}$.

95$\%$ CL lower limits on the gravitino mass $m_{\tilde{G}}$ as a function of the squark mass $m_{\tilde{q}}$ for non-degenerate squark/gluino masses: $ m_{\tilde{g}} = 2 \times m_{\tilde{q}}$.

95$\%$ CL lower limits on the gravitino mass $m_{\tilde{G}}$ as a function of the squark mass $m_{\tilde{q}}$ for non-degenerate squark/gluino masses: $ m_{\tilde{g}} = 4 \times m_{\tilde{q}}$.

Observed and expected 95$\%$ CL upper limit on $\sigma \times {\rm{BR}}(H \to {\rm{invisible}})$ as a function of the Higgs boson mass.

Limits at 95% C.L. on the EFT suppression scale M* as a function of the WIMP mass m_chi, for the scalar operator C1. Results where EFT truncation is applied are also shown for couplings of 1 and the perturbative limit.

Observed and expected $E_T^{miss}$ distribution in soft dimuon signal region. The last bin includes the overflow.

Observed and expected $m_{eff}^{incl}$ distribution in hard single-lepton 3-jet signal region. The last bin includes the overflow.

Observed and expected $m_{eff}^{incl}$ distribution for hard single-lepton 5-jet signal region. The last bin includes the overflow.

Observed and expected $E_{T}^{miss}$ distribution for hard single-lepton 6-jet signal region. The last bin includes the overflow.

Observed and expected $M_{R}'$ distribution for hard same-flavour dilepton low-multiplicity signal region. The last bin includes the overflow.

Observed and expected $M_{R}'$ distribution for hard same-flavour dilepton 3-jet signal region. The last bin includes the overflow.

Observed and expected $M_{R}'$ distribution for hard opposite-flavour dilepton low-multiplicity signal region. The last bin includes the overflow.

Observed and expected $M_{R}'$ distribution for hard opposite-flavour dilepton 3-jet opposite-flavour signal region. The last bin includes the overflow.

Observed 95% exclusion contour for the mSUGRA/CMSSM model with $\tan\beta=30$, $A_{0}=-2m_{0}$ and $\mu > 0$.

Expected 95% exclusion contour for the mSUGRA/CMSSM model with $\tan\beta=30$, $A_{0}=-2m_{0}$ and $\mu > 0$.

Observed 95% exclusion contour for the bRPV MSUGRA/CMSSM model.

Expected 95% exclusion contour for the bRPV MSUGRA/CMSSM model.

Observed 95% exclusion contour for the natural gauge mediation with a stau NLSP model (nGM).

Expected 95% exclusion contour for the natural gauge mediation with a stau NLSP model (nGM).

Observed 95% exclusion contour for the non-universal higgs masses with gaugino mediation model (NUHMG).

Expected 95% exclusion contour for the non-universal higgs masses with gaugino mediation model (NUHMG).

Observed 95% exclusion contour for the minimal UED model from the combination of the hard dilepton and soft dilepton analyses.

Expected 95% exclusion contour for the minimal UED model from the combination of the hard dilepton and soft dilepton analyses.

Observed 95% exclusion contour for the minimal UED model from the hard dilepton analysis.

Expected 95% exclusion contour for the minimal UED model from the hard dilepton analysis.

Observed 95% exclusion contour for the minimal UED model from the soft dilepton analysis.

Expected 95% exclusion contour for the minimal UED model from the soft dilepton analysis.

Observed 95% exclusion contour for the simplified model with gluino-mediated top squark production where the top squark is assumed to decay exclusively via $\tilde{t} \rightarrow c \tilde{\chi}^{0}_{1}$.

Expected 95% exclusion contour for the simplified model with gluino-mediated top squark production, where the top squark is assumed to decay exclusively via $\tilde{t} \rightarrow c \tilde{\chi}^{0}_{1}$.

Observed 95% exclusion contour for the simplified model with gluino-mediated top squark production where the gluinos are assumed to decay exclusively through a virtual top squark, $\tilde{g} \rightarrow tt+\tilde{\chi}^{0}_{1}$.

Expected 95% exclusion contour for the simplified model with gluino-mediated top squark production where the gluinos are assumed to decay exclusively through a virtual top squark, $\tilde{g} \rightarrow tt+\tilde{\chi}^{0}_{1}$.

Observed 95% exclusion contour for the gluino simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Expected 95% exclusion contour for the gluino simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Observed 95% exclusion contour for the gluino simplified model from the hard single-lepton analyses for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Expected 95% exclusion contour for the gluino simplified model from the hard single-lepton analyses for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Observed 95% exclusion contour for the gluino simplified model from the soft single-lepton analyses for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Expected 95% exclusion contour for the gluino simplified model from the soft single-lepton analyses for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Observed 95% exclusion contour for the the first- and second-generation squark simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which the chargino mass is fixed at x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) = 1/2.

Expected 95% exclusion contour for the the first- and second-generation squark simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which the chargino mass is fixed at x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) = 1/2.

Observed 95% exclusion contour for the the first- and second-generation squark simplified model from the hard single-lepton analysis for the case in which the chargino mass is fixed at x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) = 1/2.

Expected 95% exclusion contour for the the first- and second-generation squark simplified model from the hard single-lepton analysis for the case in which the chargino mass is fixed at x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) = 1/2.

Observed 95% exclusion contour for the the first- and second-generation squark simplified model from the soft single-lepton analysis for the case in which the chargino mass is fixed at x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) = 1/2.

Expected 95% exclusion contour for the the first- and second-generation squark simplified model from the soft single-lepton analysis for the case in which the chargino mass is fixed at x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) = 1/2.

Observed 95% exclusion contour for the gluino simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Expected 95% exclusion contour for the gluino simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Observed 95% exclusion contour for the gluino simplified model from the hard single-lepton analysis for the case in which x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Expected 95% exclusion contour for the gluino simplified model from the hard single-lepton analysis for the case in which x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Observed 95% exclusion contour for the gluino simplified model from the soft single-lepton analysis for the case in which x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Expected 95% exclusion contour for the gluino simplified model from the soft single-lepton analysis for the case in which x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Observed 95% exclusion contour for the first- and second-generation squark simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Expected 95% exclusion contour for the first- and second-generation squark simplified model from the combination of soft single-lepton and hard single-lepton analyses for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Observed 95% exclusion contour for the first- and second-generation squark simplified model from the hard single-lepton analyses for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Expected 95% exclusion contour for the first- and second-generation squark simplified model from the hard single-lepton analyses for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Observed 95% exclusion contour for the first- and second-generation squark simplified model from the soft single-lepton analyses for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Expected 95% exclusion contour for the first- and second-generation squark simplified model from the soft single-lepton analyses for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Observed 95% exclusion contour for the two-step gluino simplified model with sleptons from the combination of the hard dilepton and hard single-lepton analyses.

Expected 95% exclusion contour for the two-step gluino simplified model with sleptons from the combination of the hard dilepton and hard single-lepton analyses.

Observed 95% exclusion contour for the two-step gluino simplified model with sleptons from the hard single-lepton analysis.

Expected 95% exclusion contour for the two-step gluino simplified model with sleptons from the hard single-lepton analysis.

Observed 95% exclusion contour for the two-step gluino simplified model with sleptons from the hard dilepton analysis.

Expected 95% exclusion contour for the two-step gluino simplified model with sleptons from the hard dilepton analysis.

Observed 95% exclusion contour for the two-step first- and second-generation squark simplified model with sleptons from the hard dilepton analysis.

Expected 95% exclusion contour for the two-step first- and second-generation squark simplified model with sleptons from the hard dilepton analysis.

Observed 95% exclusion contour for the two-step gluino simplified model without sleptons from the hard single-lepton analysis.

Expected 95% exclusion contour for the two-step gluino simplified model without sleptons from the hard single-lepton analysis.

Number of generated events in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Production cross-section in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Number of generated events in the the first- and second-generation squark simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV. squark decaying to quark neutralino1 with varying x.

Production cross-section in the the first- and second-generation squark simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Number of generated evens in the minimal UED model.

Production cross-section in the minimal UED model in pb.

Number of generated events in the two-step first- and second-generation squark simplified model with sleptons.

Production cross-section in the two-step first- and second-generation squark simplified model with sleptons.

Acceptance for soft single-lepton 3-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Efficiency for soft single-lepton 3-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Acceptance for soft single-lepton 5-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Efficiency for soft single-lepton 5-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Acceptance for soft single-lepton 3-jet inclusive signal region in the gluino simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Efficiency for the soft single-lepton 3-jet inclusive signal region in the gluino simplified model for the case in x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Expected CLs from the combination of the soft single-lepton and hard single-lepton analyses in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Expected CLs from the combination of the soft single-lepton and hard single-lepton analyses in the gluino simplified model for the case in which the chargino mass is varied and the LSP mass is set at 60 GeV. The chargino mass is parameterised using x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)).

Observed CLs from the combination of the soft single-lepton and hard single-lepton analyses in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Observed CLs from the combination of the soft single-lepton and hard single-lepton analyses in the gluino simplified model for the case in which the chargino mass is varied and the LSP mass is set at 60 GeV. The chargino mass is parameterised using x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)).

Acceptance for soft dimuon signal region in the minimal UED model (mUED).

Efficiency for soft dimuon signal region in minimal UED model (mUED).

Acceptance for hard dilepton 3-jet opposite-flavour signal region in the two-step first- and second-generation squark simplified model with sleptons.

Efficiency for hard dilepton 3jet opposite-flavour signal region in the two-step first- and second-generation squark simplified model with sleptons.

Acceptance for hard dilepton 3-jet same-flavour signal region in the two-step first- and second-generation squark simplified model with sleptons.

Efficiency for hard dilepton 3-jet same-flavour signal region in the two-step first- and second-generation squark simplified model with sleptons.

Acceptance for hard dilepton low-multiplicity opposite-flavour signal region in the two-step first- and second-generation squark simplified model with sleptons.

Efficiency for hard dilepton low-multiplicity opposite-flavour signal region in the two-step first- and second-generation squark simplified model with sleptons.

Acceptance for hard dilepton low-multiplicity same-flavour signal region in the two-step first- and second-generation squark simplified model with sleptons.

Efficiency for hard dilepton low-multiplicity same-flavour signal region in the two-step first- and second-generation squark simplified model with sleptons.

Best expected signal region in the minimal UED model (mUED).

Expected CLs from hard dilepton analysis in the two-step first- and second-generation squark simplified model with sleptons.

Observed CLs from the hard dilepton analysis in the two-step first- and second-generation squark simplified model with sleptons.

Expected CLs from the combination of the soft dimuon and hard dilepton analyses in the minimal UED model (mUED).

Observed CLs from the combination of the soft dimuon and hard dilepton analyses in the minimal UED model (mUED).

Acceptance for hard single-lepton 3-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Efficiency for hard single-lepton 3-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Acceptance for hard single-lepton 5-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Efficiency for hard single-lepton 5-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Acceptance for hard single-lepton 6-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Efficiency for hard single-lepton 6-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Acceptance for hard single-lepton 3-jet signal region in the first- and second-generation squark simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Efficiency for hard single-lepton 3-jet signal region in the first- and second-generation squark simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Acceptance for hard single-lepton 5-jet signal region in the first- and second-generation squark simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Efficiency for hard single-lepton 5-jet signal region in the first- and second-generation squark simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Acceptance for hard single-lepton 6-jet signal region in the first- and second-generation squark simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Efficiency for hard single-lepton 6-jet signal region in the first- and second-generation squark simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Observed 95% upper limit on the visible cross-section in the gluino simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Observed 95% upper limit on the visible cross-section in the first- and second-generation squark simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Observed 95% upper limit on the visible cross-section in the first- and second-generation squark simplified model with sleptons from the hard dilepton analysis.

Observed 95% upper limit on the visible cross-section in the minimal UED model (mUED) from the combination of the soft dimuon and hard dilepton analyses.

Breakdown of systematic uncertainties (in %) for the inclusive $b$-jet cross-section $\sigma(Zb)\times N_{b\text{-jet}}$ as a function of $b$-jet $p_T$.

The inclusive $b$-jet cross-section $\sigma(Zb)\times N_{b\text{-jet}}$ as a function of $b$-jet $|y|$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the inclusive $b$-jet cross-section $\sigma(Zb)\times N_{b\text{-jet}}$ as a function of $b$-jet $|y|$.

The inclusive $b$-jet cross-section $\sigma(Zb)\times N_{b\text{-jet}}$ as a function of $y_{\text{boost}}(Z,b)$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the inclusive $b$-jet cross-section $\sigma(Zb)\times N_{b\text{-jet}}$ as a function of $y_{\text{boost}}(Z,b)$.

The inclusive $b$-jet cross-section $\sigma^{*}(Zb)\times N_{b\text{-jet}}$ as a function of $\Delta y(Z,b)$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the inclusive $b$-jet cross-section $\sigma^{*}(Zb)\times N_{b\text{-jet}}$ as a function of $\Delta y(Z,b)$.

The inclusive $b$-jet cross-section $\sigma^{*}(Zb)\times N_{b\text{-jet}}$ as a function of $\Delta\phi(Z,b)$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the inclusive $b$-jet cross-section $\sigma^{*}(Zb)\times N_{b\text{-jet}}$ as a function of $\Delta\phi(Z,b)$.

The inclusive $b$-jet cross-section $\sigma^{*}(Zb)\times N_{b\text{-jet}}$ as a function of $\Delta R(Z,b)$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the inclusive $b$-jet cross-section $\sigma^{*}(Zb)\times N_{b\text{-jet}}$ as a function of $\Delta R(Z,b)$.

The cross-section $\sigma(Zb)$ as a function of $Z$ boson $p_T$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the cross-section $\sigma(Zb)$ as a function of $Z$ boson $p_T$.

The cross-section $\sigma(Zb)$ as a function of $Z$ boson $|y|$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the cross-section $\sigma(Zb)$ as a function of $Z$ boson $|y|$.

Integrated $Z+\ge 2$ $b$-jets cross-section.

Breakdown of systematic uncertainties (in %) for the integrated $Z+\ge 2$ $b$-jets cross-section.

The cross-section $\sigma(Zbb)$ as a function of $\Delta R(b,b)$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the cross-section $\sigma(Zbb)$ as a function of $\Delta R(b,b)$.

The cross-section $\sigma(Zbb)$ as a function of $\Delta m(b,b)$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the cross-section $\sigma(Zbb)$ as a function of $\Delta m(b,b)$.

The cross-section $\sigma(Zbb)$ as a function of $Z$ boson $p_T$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the cross-section $\sigma(Zbb)$ as a function of $Z$ boson $p_T$.

The cross-section $\sigma(Zbb)$ as a function of $Z$ boson $|y|$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the cross-section $\sigma(Zbb)$ as a function of $Z$ boson $|y|$.

The effective mass distribution in VR2Z.

The ETmiss distribution in SR0noZa.

The effective mass distribution in SR0noZa.

The ETmiss distribution in SR1noZa.

The effective mass distribution in SR1noZa.

The ETmiss distribution in SR2noZa.

The effective mass distribution in SR2noZa.

The ETmiss distribution in SR0noZb.

The effective mass distribution in SR0noZb.

The ETmiss distribution in SR1noZb.

The effective mass distribution in SR1noZb.

The ETmiss distribution in SR2noZb.

The effective mass distribution in SR2noZb.

The ETmiss distribution in SR0Z.

The effective mass distribution in SR0Z.

The ETmiss distribution in SR1Z.

The effective mass distribution in SR1Z.

The ETmiss distribution in SR2Z.

The effective mass distribution in SR2Z.

Observed 95% CL exclusion contour for the RPV chargino NLSP model with lambda_121 != 0.

Expected 95% CL exclusion contour for the RPV chargino NLSP model with lambda_121 != 0.

Observed 95% CL exclusion contour for the RPV chargino NLSP model with lambda_122 != 0.

Expected 95% CL exclusion contour for the RPV chargino NLSP model with lambda_122 != 0.

Observed 95% CL exclusion contour for the RPV chargino NLSP model with lambda_133 != 0.

Expected 95% CL exclusion contour for the RPV chargino NLSP model with lambda_133 != 0.

Observed 95% CL exclusion contour for the RPV chargino NLSP model with lambda_233 != 0.

Expected 95% CL exclusion contour for the RPV chargino NLSP model with lambda_233 != 0.

Observed 95% CL exclusion contour for the RPV gluino NLSP model with lambda_121 != 0.

Expected 95% CL exclusion contour for the RPV gluino NLSP model with lambda_121 != 0.

Observed 95% CL exclusion contour for the RPV gluino NLSP model with lambda_122 != 0.

Expected 95% CL exclusion contour for the RPV gluino NLSP model with lambda_122 != 0.

Observed 95% CL exclusion contour for the RPV gluino NLSP model with lambda_133 != 0.

Expected 95% CL exclusion contour for the RPV gluino NLSP model with lambda_133 != 0.

Observed 95% CL exclusion contour for the RPV gluino NLSP model with lambda_233 != 0.

Expected 95% CL exclusion contour for the RPV gluino NLSP model with lambda_233 != 0.

Observed 95% CL exclusion contour for the RPV Lslepton NLSP model with lambda_121 != 0.

Expected 95% CL exclusion contour for the RPV Lslepton NLSP model with lambda_121 != 0.

Observed 95% CL exclusion contour for the RPV Lslepton NLSP model with lambda_122 != 0.

Expected 95% CL exclusion contour for the RPV Lslepton NLSP model with lambda_122 != 0.

Observed 95% CL exclusion contour for the RPV Lslepton NLSP model with lambda_133 != 0.

Expected 95% CL exclusion contour for the RPV Lslepton NLSP model with lambda_133 != 0.

Observed 95% CL exclusion contour for the RPV Lslepton NLSP model with lambda_233 != 0.

Expected 95% CL exclusion contour for the RPV Lslepton NLSP model with lambda_233 != 0.

Observed 95% CL exclusion contour for the RPV Rslepton NLSP model with lambda_121 != 0.

Expected 95% CL exclusion contour for the RPV Rslepton NLSP model with lambda_121 != 0.

Observed 95% CL exclusion contour for the RPV Rslepton NLSP model with lambda_122 != 0.

Expected 95% CL exclusion contour for the RPV Rslepton NLSP model with lambda_122 != 0.

Observed 95% CL exclusion contour for the RPV Rslepton NLSP model with lambda_133 != 0.

Expected 95% CL exclusion contour for the RPV Rslepton NLSP model with lambda_133 != 0.

Observed 95% CL exclusion contour for the RPV Rslepton NLSP model with lambda_233 != 0.

Expected 95% CL exclusion contour for the RPV Rslepton NLSP model with lambda_233 != 0.

Observed 95% CL exclusion contour for the RPV sneutrino NLSP model with lambda_121 != 0.

Expected 95% CL exclusion contour for the RPV sneutrino NLSP model with lambda_121 != 0.

Observed 95% CL exclusion contour for the RPV sneutrino NLSP model with lambda_122 != 0.

Expected 95% CL exclusion contour for the RPV sneutrino NLSP model with lambda_122 != 0.

Observed 95% CL exclusion contour for the RPV sneutrino NLSP model with lambda_133 != 0.

Expected 95% CL exclusion contour for the RPV sneutrino NLSP model with lambda_133 != 0.

Observed 95% CL exclusion contour for the RPV sneutrino NLSP model with lambda_233 != 0.

Expected 95% CL exclusion contour for the RPV sneutrino NLSP model with lambda_233 != 0.

Observed 95% CL exclusion contour for the R-slepton RPC model.

Expected 95% CL exclusion contour for the R-slepton RPC model.

Observed and expected 95% CL cross-section upper limits for the Stau RPC model, together with the theoretically predicted cross-section.

Observed and expected 95% CL cross-section upper limits for the Z RPC model, together with the theoretically predicted cross-section.

Observed 95% CL exclusion contour for the GGM tan beta = 1.5 model.

Expected 95% CL exclusion contour for the GGM tan beta = 1.5 model.

Observed 95% CL exclusion contour for the GGM tan beta = 30 model.

Expected 95% CL exclusion contour for the GGM tan beta = 30 model.

Observed 95% CL cross-section upper limit for the RPV chargino NLSP models with lambda_121 != 0 and lambda_122 != 0, and the selection of Z-veto signal regions used to set limits in these models. The combination of regions used is ordered by the minimum number of hadronic taus required. For example, ``bba' means that the regions SR0noZb, SR1noZb and SR2noZa were used, in addition to the three Z-rich regions (SR0-2Z).

Observed 95% CL cross-section upper limit for the RPV chargino NLSP models with lambda_133 != 0 and lambda_233 != 0, and the selection of Z-veto signal regions used to set limits in these models. The combination of regions used is ordered by the minimum number of hadronic taus required. For example, ``bba' means that the regions SR0noZb, SR1noZb and SR2noZa were used, in addition to the three Z-rich regions (SR0-2Z).

Observed 95% CL cross-section upper limit for the RPV gluino NLSP models with lambda_121 != 0 and lambda_122 != 0, and the selection of Z-veto signal regions used to set limits in these models. The combination of regions used is ordered by the minimum number of hadronic taus required. For example, ``bba' means that the regions SR0noZb, SR1noZb and SR2noZa were used, in addition to the three Z-rich regions (SR0-2Z).

Observed 95% CL cross-section upper limit for the RPV gluino NLSP models with lambda_133 != 0 and lambda_233 != 0, and the selection of Z-veto signal regions used to set limits in these models. The combination of regions used is ordered by the minimum number of hadronic taus required. For example, ``bba' means that the regions SR0noZb, SR1noZb and SR2noZa were used, in addition to the three Z-rich regions (SR0-2Z).

Observed 95% CL cross-section upper limit for the RPV Lslepton NLSP models with lambda_121 != 0 and lambda_122 != 0, and the selection of Z-veto signal regions used to set limits in these models. The combination of regions used is ordered by the minimum number of hadronic taus required. For example, ``bba' means that the regions SR0noZb, SR1noZb and SR2noZa were used, in addition to the three Z-rich regions (SR0-2Z).

Observed 95% CL cross-section upper limit for the RPV Lslepton NLSP models with lambda_133 != 0 and lambda_233 != 0, and the selection of Z-veto signal regions used to set limits in these models. The combination of regions used is ordered by the minimum number of hadronic taus required. For example, ``bba' means that the regions SR0noZb, SR1noZb and SR2noZa were used, in addition to the three Z-rich regions (SR0-2Z).

Observed 95% CL cross-section upper limit for the RPV Rslepton NLSP models with lambda_121 != 0 and lambda_122 != 0, and the selection of Z-veto signal regions used to set limits in these models. The combination of regions used is ordered by the minimum number of hadronic taus required. For example, ``bba' means that the regions SR0noZb, SR1noZb and SR2noZa were used, in addition to the three Z-rich regions (SR0-2Z).

Observed 95% CL cross-section upper limit for the RPV Rslepton NLSP models with lambda_133 != 0 and lambda_233 != 0, and the selection of Z-veto signal regions used to set limits in these models. The combination of regions used is ordered by the minimum number of hadronic taus required. For example, ``bba' means that the regions SR0noZb, SR1noZb and SR2noZa were used, in addition to the three Z-rich regions (SR0-2Z).

Observed 95% CL cross-section upper limit for the RPV sneutrino NLSP models with lambda_121 != 0 and lambda_122 != 0, and the selection of Z-veto signal regions used to set limits in these models. The combination of regions used is ordered by the minimum number of hadronic taus required. For example, ``bba' means that the regions SR0noZb, SR1noZb and SR2noZa were used, in addition to the three Z-rich regions (SR0-2Z).

Observed 95% CL cross-section upper limit for the RPV sneutrino NLSP models with lambda_133 != 0 and lambda_233 != 0, and the selection of Z-veto signal regions used to set limits in these models. The combination of regions used is ordered by the minimum number of hadronic taus required. For example, ``bba' means that the regions SR0noZb, SR1noZb and SR2noZa were used, in addition to the three Z-rich regions (SR0-2Z).

Observed 95% CL cross-section upper limit for the R-slepton RPC model, and the selection of Z-veto signal regions used to set limits in this model. The combination of regions used is ordered by the minimum number of hadronic taus required. For example, ``bbb' means that the regions SR0noZb, SR1noZb and SR2noZb were used, in addition to the three Z-rich regions (SR0-2Z). For the RPC stau and Z models, the ``aaa' combination of regions was used throughout.

Performance of the SR0noZa selection in the R-slepton RPC model: number of generated signal events; total signal cross-section; acceptance; efficiency; total experimental systematic uncertainty, not including Monte Carlo statistics; observed CL using this region alone; expected CL using this region alone.

Performance of the SR0noZb selection in the RPV chargino NLSP model with lambda_121 != 0: number of generated signal events; total signal cross-section; acceptance; efficiency; total experimental systematic uncertainty, not including Monte Carlo statistics; observed CL using this region alone; expected CL using this region alone.

Performance of the SR1noZa selection in the RPV sneutrino NLSP model with lambda_233 != 0: number of generated signal events; total signal cross-section; acceptance; efficiency; total experimental systematic uncertainty, not including Monte Carlo statistics; observed CL using this region alone; expected CL using this region alone.

Performance of the SR1noZb selection in the RPV gluino NLSP model with lambda_133 != 0: number of generated signal events; total signal cross-section; acceptance; efficiency; total experimental systematic uncertainty, not including Monte Carlo statistics; observed CL using this region alone; expected CL using this region alone.

Performance of the SR2noZa selection in the RPV sneutrino NLSP model with lambda_233 != 0: number of generated signal events; total signal cross-section; acceptance; efficiency; total experimental systematic uncertainty, not including Monte Carlo statistics; observed CL using this region alone; expected CL using this region alone.

Performance of the SR2noZb selection in the RPV gluino NLSP model with lambda_133 != 0: number of generated signal events; total signal cross-section; acceptance; efficiency; total experimental systematic uncertainty, not including Monte Carlo statistics; observed CL using this region alone; expected CL using this region alone.

Performance of the SR0Z selection in the GGM tan beta = 30 model: number of generated signal events; total signal cross-section; acceptance; efficiency; total experimental systematic uncertainty, not including Monte Carlo statistics; observed CL using this region alone; expected CL using this region alone.

Cut flows for a representative selection of SUSY signal points in the Z-veto signal regions. In each case, m2 and m1 refer to the axes of the plots in Sec. XI, where m2 is the larger of the two masses. The number of events expected for a luminosity of 20.3 fb-1 is quoted at each step of the selection. The preselection requires four baseline leptons, at least two of which are light leptons; the signal lepton selection is made at the ``Lepton Multiplicity' stage. ``Event Cleaning' refers to the selection criteria applied to remove non-collision backgrounds and detector noise.

Cut flows for a representative selection of SUSY signal points in the Z-rich signal regions. In each case, m2 and m1 refer to the axes of the plots in Sec. XI, where m2 is the larger of the two masses (or the value of mu in the case of GGM models). The number of events expected for a luminosity of 20.3 fb-1 is quoted at each step of the selection. The preselection requires four baseline leptons, at least two of which are light leptons; the signal lepton selection is made at the ``Lepton Multiplicity' stage. ``Event Cleaning' refers to the selection criteria applied to remove non-collision backgrounds and detector noise.

Cut flows by lepton channel for a representative selection of SUSY signal points in the SR0noZa signal region. In each case, m2 and m1 refer to the axes of the plots in Sec. XI, where m2 is the larger of the two masses. The number of events expected for a luminosity of 20.3 fb-1 is quoted at each step of the selection. The preselection requires four baseline leptons, at least two of which are light leptons; the signal lepton selection is made at the ``Lepton Multiplicity' stage. ``Event Cleaning' refers to the selection criteria applied to remove non-collision backgrounds and detector noise. The RPC R-slepton model is used, with (m2,m1) = (450,300) GeV.

Cut flows by lepton channel for a representative selection of SUSY signal points in the SR1noZb signal region. In each case, m2 and m1 refer to the axes of the plots in Sec. XI, where m2 is the larger of the two masses. The number of events expected for a luminosity of 20.3 fb-1 is quoted at each step of the selection. The preselection requires four baseline leptons, at least two of which are light leptons; the signal lepton selection is made at the ``Lepton Multiplicity' stage. ``Event Cleaning' refers to the selection criteria applied to remove non-collision backgrounds and detector noise. The RPV gluino NLSP model is used, with lambda_133 != 0 and (m2,m1) = (800,400) GeV.

Cut flows by lepton channel for a representative selection of SUSY signal points in the SR0Z signal region. In each case, m2 and m1 refer to the axes of the plots in Sec. XI, where m2 is the value of mu. The number of events expected for a luminosity of 20.3 fb-1 is quoted at each step of the selection. The preselection requires four baseline leptons, at least two of which are light leptons; the signal lepton selection is made at the ``Lepton Multiplicity' stage. ``Event Cleaning' refers to the selection criteria applied to remove non-collision backgrounds and detector noise. The GGM tan beta = 30 model is used, with (m2,m1) = (200,1000) GeV.