Distributions in SR-low of the data and post-fit background prediction for H^boost. The SR-low event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt̄, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-low of the data and post-fit background prediction for m_eff^3ℓ/H^boost. The SR-low event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt̄, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-low of the data and post-fit background prediction for m_eff^3ℓ/H^boost. The SR-low event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt̄, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-low of the data and post-fit background prediction for p_T^soft/(p_T^soft + m_eff^3ℓ). The SR-low event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt̄, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-low of the data and post-fit background prediction for p_T^soft/(p_T^soft + m_eff^3ℓ). The SR-low event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt̄, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-ISR of the data and post-fit background prediction for m_T. The SR-ISR event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt̄, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-ISR of the data and post-fit background prediction for m_T. The SR-ISR event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt̄, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-ISR of the data and post-fit background prediction for R(E_T^miss,jets). The SR-ISR event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt̄, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-ISR of the data and post-fit background prediction for R(E_T^miss,jets). The SR-ISR event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt̄, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-ISR of the data and post-fit background prediction for p_T^soft. The SR-ISR event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt̄, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-ISR of the data and post-fit background prediction for p_T^soft. The SR-ISR event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt̄, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-ISR of the data and post-fit background prediction for p_T^jets. The SR-ISR event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt̄, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-ISR of the data and post-fit background prediction for p_T^jets. The SR-ISR event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt̄, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Observed exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Observed exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Expected exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Expected exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Plus 1$\sigma$ uncertainty, varying the signal cross section within its uncertainty, on the observed exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Plus 1$\sigma$ uncertainty, varying the signal cross section within its uncertainty, on the observed exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Minus 1$\sigma$ uncertainty, varying the signal cross section within its uncertainty, on the observed exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Minus 1$\sigma$ uncertainty, varying the signal cross section within its uncertainty, on the observed exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Plus 1$\sigma$ uncertainty, due to uncertainties in the background prediction and experimental uncertainties affecting the signal, on the expected exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Plus 1$\sigma$ uncertainty, due to uncertainties in the background prediction and experimental uncertainties affecting the signal, on the expected exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Minus 1$\sigma$ uncertainty, due to uncertainties in the background prediction and experimental uncertainties affecting the signal, on the expected exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Minus 1$\sigma$ uncertainty, due to uncertainties in the background prediction and experimental uncertainties affecting the signal, on the expected exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Upper limits on observed wino-bino simplified model signal cross section $\sigma_\text{obs}^\text{95}$.

Upper limits on observed wino-bino simplified model signal cross section $\sigma_\text{obs}^\text{95}$.

Upper limits on expected wino-bino simplified model signal cross section $\sigma_\text{exp}^\text{95}$.

Upper limits on expected wino-bino simplified model signal cross section $\sigma_\text{exp}^\text{95}$.

Signal acceptance in SR-low, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} \geq 100$ GeV.

Signal acceptance in SR-low, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} \geq 100$ GeV.

Signal efficiency in SR-low, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} \geq 100$ GeV.

Signal efficiency in SR-low, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} \geq 100$ GeV.

Signal acceptance in SR-ISR, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} \geq 100$ GeV.

Signal acceptance in SR-ISR, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} \geq 100$ GeV.

Signal efficiency in SR-ISR, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} \geq 100$ GeV.

Signal efficiency in SR-ISR, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} \geq 100$ GeV.

Signal acceptance in SR-low, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} < 100$ GeV.

Signal acceptance in SR-low, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} < 100$ GeV.

Signal efficiency in SR-low, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} < 100$ GeV.

Signal efficiency in SR-low, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} < 100$ GeV.

Signal acceptance in SR-ISR, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} < 100$ GeV.

Signal acceptance in SR-ISR, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} < 100$ GeV.

Signal efficiency in SR-ISR, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} < 100$ GeV.

Signal efficiency in SR-ISR, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} < 100$ GeV.

The observed and expected yields after the background-only fit in the SRs. The normalization factors of the $WZ$ sample for the low-mass and ISR regions are different and are treated separately in the combined fit. \The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. Combined statistical and systematic uncertainties are presented. The individual uncertainties can be correlated and do not necessarily add in quadrature to equal the total background uncertainty.

The observed and expected yields after the background-only fit in the SRs. The normalization factors of the $WZ$ sample for the low-mass and ISR regions are different and are treated separately in the combined fit. \The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. Combined statistical and systematic uncertainties are presented. The individual uncertainties can be correlated and do not necessarily add in quadrature to equal the total background uncertainty.

Summary of the expected background and data yields in $\text{SR-low}$ and $\text{SR-ISR}$. The second and third columns show the data and total expected background with systematic uncertainties. The fourth column gives the model-independent upper limits at 95\% CL on the visible cross section ($\sigma_\text{vis}$). The fifth and sixth columns give the visible number of observed ($S^{95}_\text{obs}$) and expected ($S^{95}_\text{exp}$) events of a generic beyond-the-SM process, where uncertainties on $S^{95}_\text{exp}$ reflect the $\pm 1 \sigma$ uncertainties on the background estimation. The last column shows the discovery $p$-value and Gaussian significance $Z$ assuming no signal.

Summary of the expected background and data yields in $\text{SR-low}$ and $\text{SR-ISR}$. The second and third columns show the data and total expected background with systematic uncertainties. The fourth column gives the model-independent upper limits at 95\% CL on the visible cross section ($\sigma_\text{vis}$). The fifth and sixth columns give the visible number of observed ($S^{95}_\text{obs}$) and expected ($S^{95}_\text{exp}$) events of a generic beyond-the-SM process, where uncertainties on $S^{95}_\text{exp}$ reflect the $\pm 1 \sigma$ uncertainties on the background estimation. The last column shows the discovery $p$-value and Gaussian significance $Z$ assuming no signal.

Upper limits on observed (expected) wino-bino simplified model signal cross section $\sigma_\text{obs(exp)}^\text{95}$.

Upper limits on observed (expected) wino-bino simplified model signal cross section $\sigma_\text{obs(exp)}^\text{95}$.

Full list of event selections and MC generator-weighted yields and in $\text{SR-ISR}$ for the main $WZ$ background and a representative $\tilde{\chi}^{\pm}_{1}\tilde{\chi}^{0}_{2}$ signal point of mass 200 GeV and mass splitting $\Delta m = 100$ GeV normalized to 139 fb$^{-1}$. 40000 events were generated.

Full list of event selections and MC generator-weighted yields and in $\text{SR-ISR}$ for the main $WZ$ background and a representative $\tilde{\chi}^{\pm}_{1}\tilde{\chi}^{0}_{2}$ signal point of mass 200 GeV and mass splitting $\Delta m = 100$ GeV normalized to 139 fb$^{-1}$. 40000 events were generated.

Full list of event selections and MC generator-weighted yields and in $\text{SR-low}$ for the main $WZ$ background and a representative $\tilde{\chi}^{\pm}_{1}\tilde{\chi}^{0}_{2}$ signal point of mass 200 GeV and mass splitting $\Delta m = 100$ GeV normalized to 139 fb$^{-1}$. 40000 events were generated.

Full list of event selections and MC generator-weighted yields and in $\text{SR-low}$ for the main $WZ$ background and a representative $\tilde{\chi}^{\pm}_{1}\tilde{\chi}^{0}_{2}$ signal point of mass 200 GeV and mass splitting $\Delta m = 100$ GeV normalized to 139 fb$^{-1}$. 40000 events were generated.

Transverse region charged particle <pT> as a function of the leading jet pT for pT>0.2 GeV/c (open symbols) and pT>0.5 GeV/c (filled symbols). Simulations are also shown as curves. The wide curves are PYTHIA 6 (STAR). The middle width curves are default PYTHIA 6 Perugia 2012 tune. The thin curves are PYTHIA 8 Monash 2013 tune.

Detector-level average charged particle multiplicity densities for TransMax and TransMin as functions of the leading jet pT. Points are measured data. Histograms are calculated values assuming TransMax and TransMin are derived from the same parent distribution.

Transverse charged particle densities at various center-of-mass collision energies. Uncertainties smaller than the marker sizes.

Yield ratios of chi_c2 over chi_c1 mesons as a function of costh (HX) in the J/psi pT range 8-12 GeV

Yield ratios of chi_c2 over chi_c1 mesons as a function of costh (HX) in the J/psi pT range 12-18 GeV

Yield ratios of chi_c2 over chi_c1 mesons as a function of costh (HX) in the J/psi pT range 18-30 GeV

Data from Figure 32 – STEREO exclusion and exclusion sensitivity contours at 90% C.L. for 179 days reactor-on (phase-I+II). A full graphical presentation can be downloaded at "Resources" for reference.

Data from Figures 33 and 34 – STEREO exclusion and exclusion sensitivity contours at 95% C.L. for 179 days reactor-on (phase-I+II) using the two-dimensional method. A graphical presentation can be downloaded at "Resources" for reference.

Data from Figures 33 and 34 – STEREO exclusion and exclusion sensitivity contours at 95% C.L. for 179 days reactor-on (phase-I+II) using the two-dimensional method. A graphical presentation can be downloaded at "Resources" for reference.

$\Delta \chi^2$ map of phase-I+II data calculated by a raster-scan method. To be used in combination with the $\Delta \chi^2_{\text{crit},x}$ values to generate exclusion contours at $x$% C.L. for phase-I+II data. Additional explanations are given there.

Data from Figure 34 – STEREO exclusion and exclusion sensitivity contours at 95% C.L. for 179 days reactor-on (phase-I+II) using the raster-scan method. A graphical presentation can be downloaded at "Resources" for reference.

Data from Figure 34 – STEREO exclusion and exclusion sensitivity contours at 95% C.L. for 179 days reactor-on (phase-I+II) using the raster-scan method. A graphical presentation can be downloaded at "Resources" for reference.

The $\Delta \chi^2_{\text{crit},x}$ map accounts for the fact that the $\Delta \chi^2$ values of the oscillation fit do not follow a $\chi^2$ distribution with 2 degrees of freedom. Therefore, the $\Delta \chi^2_{\text{crit},x}$ value for x% C.L. of each point $[\sin^2(2\theta_{ee}), \Delta m^2_{41}]$ in the parameter space, $\Delta \chi^2_{\text{crit},x}(\sin^2(2\theta_{ee}), \Delta m^2_{41})$, is determined from the $\Delta \chi^2$ obtained in pseudo-experiments at that point, such that $\Delta \chi^2 \leq \Delta \chi^2_{\text{crit},x}$, for $x$% of the pseudo-experiments. Applying these $\Delta \chi^2_{\text{crit},x}$ values to the $\Delta \chi^2$ map obtained with the data, $x$% C.L. exclusion contours are obtained. The point $[\sin^2(2\theta_{ee}), \Delta m^2_{41}]$ is excluded by the data at $x$% C.L. if $\Delta \chi^2(\sin^2(2\theta_{ee}), \Delta m^2_{41}) > \Delta \chi^2_{\text{crit},x}(\sin^2(2\theta_{ee}), \Delta m^2_{41})$. In order to obtain the $\Delta \chi^2_{\text{crit},x}$ map, $10^4$ pseudo-experiments were generated for each point $[\sin^2(2\theta_{ee}), \Delta m^2_{41}]$ in the parameter space, taking into account all statistical and systematic uncertainties. The $\Delta \chi^2$ value of a pseudo-experiment is calculated by subtracting the $\chi^2$ value of the best-fit in the parameter space from the $\chi^2$ value of the fit at the $[\sin^2(2\theta_{ee}), \Delta m^2_{41}]$ used in the generation of the pseudo-dataset, where all nuisance parameters are free within their pull terms. When combining the exclusion contours with other experimental data, special care should be exercised. The assumption of a standard $\chi^2$ law instead of the provided $\Delta \chi^2_{\text{crit},x}$ values derived from non-standard $\chi^2$ distributions leads to slightly modified contours. In addition, the contours were derived using a raster-scan in several fixed values of $\Delta m_{41}^2$. While this method is particularly suited to derive exclusion contours, it cannot be used to calculate allowed confidence regions for $\Delta m_{41}^2$ and consequently two-dimensional allowed confidence regions. This is because $\Delta \chi^2$ values are not reflecting the likelihood of individual $\Delta m_{41}^2$ values. Thus, a direct comparison of $\Delta \chi^2$ values across different $\Delta m_{41}^2$ values is not possible in a statistically meaningful way. When generating the exclusion contours with the aforementioned procedure, spurious exclusion regions at low values of $\sin^2(2\theta_{ee})$ can be encountered for some values of $\Delta m^2_{41}$. These should be ignored and are owed to the raster-scan procedure used to generate the maps.

Data from Figure 34 – STEREO exclusion and exclusion sensitivity contours at 95% C.L. for 179 days reactor-on (phase-I+II) using the CLs method. A graphical presentation can be downloaded at "Resources" for reference.

Data from Figure 34 – STEREO exclusion and exclusion sensitivity contours at 95% C.L. for 179 days reactor-on (phase-I+II) using the CLs method. A graphical presentation can be downloaded at "Resources" for reference.

$\Delta \chi^2$ map of phase-I+II data calculated by the two-dimensional method. To be used in combination with the $\Delta \chi^2_{\text{crit},x}$ values of the two-dimensional method to generate exclusion contours at $x$% C.L. for phase-I+II data. Additional explanations are given there.

$\Delta \chi^2$ map of phase-I+II data calculated by the two-dimensional method. To be used in combination with the $\Delta \chi^2_{\text{crit},x}$ values of the two-dimensional method to generate exclusion contours at $x$% C.L. for phase-I+II data. Additional explanations are given there.

The $\Delta \chi^2_{\text{crit},x}$ map accounts for the fact that the $\Delta \chi^2$ values of the oscillation fit do not follow a $\chi^2$ distribution with 2 degrees of freedom. Therefore, the $\Delta \chi^2_{\text{crit},x}$ value for x% C.L. of each point $[\sin^2(2\theta_{ee}), \Delta m^2_{41}]$ in the parameter space, $\Delta \chi^2_{\text{crit},x}(\sin^2(2\theta_{ee}), \Delta m^2_{41})$, is determined from the $\Delta \chi^2$ obtained in pseudo-experiments at that point, such that $\Delta \chi^2 \leq \Delta \chi^2_{\text{crit},x}$, for $x$% of the pseudo-experiments. Applying these $\Delta \chi^2_{\text{crit},x}$ values to the $\Delta \chi^2$ map obtained with the data, $x$% C.L. exclusion contours are obtained. The point $[\sin^2(2\theta_{ee}), \Delta m^2_{41}]$ is excluded by the data at $x$% C.L. if $\Delta \chi^2(\sin^2(2\theta_{ee}), \Delta m^2_{41}) > \Delta \chi^2_{\text{crit},x}(\sin^2(2\theta_{ee}), \Delta m^2_{41})$. In order to obtain the $\Delta \chi^2_{\text{crit},x}$ map, $10^4$ pseudo-experiments were generated for each point $[\sin^2(2\theta_{ee}), \Delta m^2_{41}]$ in the parameter space, taking into account all statistical and systematic uncertainties. The $\Delta \chi^2$ value of a pseudo-experiment is calculated by subtracting the $\chi^2$ value of the best-fit in the parameter space from the $\chi^2$ value of the fit at the $[\sin^2(2\theta_{ee}), \Delta m^2_{41}]$ used in the generation of the pseudo-dataset, where all nuisance parameters are free within their pull terms. When combining the exclusion contours with other experimental data, special care should be exercised. The assumption of a standard $\chi^2$ law instead of the provided $\Delta \chi^2_{\text{crit},x}$ values derived from non-standard $\chi^2$ distributions leads to modified contours. In addition, for the interpretation of derived allowed confidence regions, one should always consider additional available information, in particular rate information. This is especially advisable considering the expected distribution of best-fit points in a prediction-free shape-only analysis, as discussed in the main publication.

The $\Delta \chi^2_{\text{crit},x}$ map accounts for the fact that the $\Delta \chi^2$ values of the oscillation fit do not follow a $\chi^2$ distribution with 2 degrees of freedom. Therefore, the $\Delta \chi^2_{\text{crit},x}$ value for x% C.L. of each point $[\sin^2(2\theta_{ee}), \Delta m^2_{41}]$ in the parameter space, $\Delta \chi^2_{\text{crit},x}(\sin^2(2\theta_{ee}), \Delta m^2_{41})$, is determined from the $\Delta \chi^2$ obtained in pseudo-experiments at that point, such that $\Delta \chi^2 \leq \Delta \chi^2_{\text{crit},x}$, for $x$% of the pseudo-experiments. Applying these $\Delta \chi^2_{\text{crit},x}$ values to the $\Delta \chi^2$ map obtained with the data, $x$% C.L. exclusion contours are obtained. The point $[\sin^2(2\theta_{ee}), \Delta m^2_{41}]$ is excluded by the data at $x$% C.L. if $\Delta \chi^2(\sin^2(2\theta_{ee}), \Delta m^2_{41}) > \Delta \chi^2_{\text{crit},x}(\sin^2(2\theta_{ee}), \Delta m^2_{41})$. In order to obtain the $\Delta \chi^2_{\text{crit},x}$ map, $10^4$ pseudo-experiments were generated for each point $[\sin^2(2\theta_{ee}), \Delta m^2_{41}]$ in the parameter space, taking into account all statistical and systematic uncertainties. The $\Delta \chi^2$ value of a pseudo-experiment is calculated by subtracting the $\chi^2$ value of the best-fit in the parameter space from the $\chi^2$ value of the fit at the $[\sin^2(2\theta_{ee}), \Delta m^2_{41}]$ used in the generation of the pseudo-dataset, where all nuisance parameters are free within their pull terms. When combining the exclusion contours with other experimental data, special care should be exercised. The assumption of a standard $\chi^2$ law instead of the provided $\Delta \chi^2_{\text{crit},x}$ values derived from non-standard $\chi^2$ distributions leads to modified contours. In addition, for the interpretation of derived allowed confidence regions, one should always consider additional available information, in particular rate information. This is especially advisable considering the expected distribution of best-fit points in a prediction-free shape-only analysis, as discussed in the main publication.

$\Delta \chi^2$ map of phase-I+II data calculated by the raster-scan method. To be used in combination with the $\Delta \chi^2_{\text{crit},x}$ values of the raster-scan method to generate exclusion contours at $x$% C.L. for phase-I+II data. Additional explanations are given there.

$\Delta \chi^2$ map of phase-I+II data calculated by the raster-scan method. To be used in combination with the $\Delta \chi^2_{\text{crit},x}$ values of the raster-scan method to generate exclusion contours at $x$% C.L. for phase-I+II data. Additional explanations are given there.

The $\Delta \chi^2_{\text{crit},x}$ and $\Delta \chi^2$ values in the raster-scan method serve the same purpose as in the two-dimensional method. The explanations given there also apply here, with the following changes: Instead of the two free oscillation parameters $[\sin^2(2\theta_{ee}), \Delta m^2_{41}]$, the raster-scan method fits only $\sin^2(2\theta_{ee})$ as free oscillation parameter while repeating the fit for several fixed values of $\Delta m_{41}^2$. While this method is particularly suited to derive exclusion contours, it cannot be used to calculate allowed confidence regions for $\Delta m_{41}^2$ and consequently two-dimensional allowed confidence regions. This is because $\Delta \chi^2$ values are not reflecting the likelihood of individual $\Delta m_{41}^2$ values. Thus, a direct comparison of $\Delta \chi^2$ values across different $\Delta m_{41}^2$ values is not possible in a statistically meaningful way. Moreover, when generating the exclusion contours with the aforementioned procedure, spurious exclusion regions at low values of $\sin^2(2\theta_{ee})$ can be encountered for some values of $\Delta m^2_{41}$. These should be ignored and are owed to the raster-scan procedure used to generate the maps.

The $\Delta \chi^2_{\text{crit},x}$ and $\Delta \chi^2$ values in the raster-scan method serve the same purpose as in the two-dimensional method. The explanations given there also apply here, with the following changes: Instead of the two free oscillation parameters $[\sin^2(2\theta_{ee}), \Delta m^2_{41}]$, the raster-scan method fits only $\sin^2(2\theta_{ee})$ as free oscillation parameter while repeating the fit for several fixed values of $\Delta m_{41}^2$. While this method is particularly suited to derive exclusion contours, it cannot be used to calculate allowed confidence regions for $\Delta m_{41}^2$ and consequently two-dimensional allowed confidence regions. This is because $\Delta \chi^2$ values are not reflecting the likelihood of individual $\Delta m_{41}^2$ values. Thus, a direct comparison of $\Delta \chi^2$ values across different $\Delta m_{41}^2$ values is not possible in a statistically meaningful way. Moreover, when generating the exclusion contours with the aforementioned procedure, spurious exclusion regions at low values of $\sin^2(2\theta_{ee})$ can be encountered for some values of $\Delta m^2_{41}$. These should be ignored and are owed to the raster-scan procedure used to generate the maps.

$\Delta T$ map of phase-I+II data calculated by the CLs method. To be used in combination with the $\Delta T_{\text{crit},x}$ values of the CLs method to generate exclusion contours at $x$% C.L. for phase-I+II data. Additional explanations are given there.

$\Delta T$ map of phase-I+II data calculated by the CLs method. To be used in combination with the $\Delta T_{\text{crit},x}$ values of the CLs method to generate exclusion contours at $x$% C.L. for phase-I+II data. Additional explanations are given there.

The $\Delta T_{\text{crit},x}$ and $\Delta T$ values in the CLs method fulfil a similar purpose as the $\Delta \chi^2_{\text{crit},x}$ and $\Delta \chi^2$ values in the two-dimensional method. The explanations given there also apply here, with the following changes: The CLs method differs from the two-dimensional method as it normalises the confidence level of the oscillation-hypothesis to the confidence level of the null-hypothesis (i.e. no-oscillation-hypothesis), instead of the best-fit. The $\Delta T$ value of a dataset at the parameter space-point $[\sin^2(2\theta_{ee}), \Delta m^2_{41}]$ is computed by subtracting the $\chi^2$ value of the fit under the no-oscillation hypothesis from the $\chi^2$ value of the fit with the oscillation parameters fixed to $[\sin^2(2\theta_{ee}), \Delta m^2_{41}]$. With this definition, $\Delta T$ values can be positive or negative as opposed to $\Delta \chi^2$ values. Note that the values used to compare with are $-\Delta T$ and not $\Delta T$ directly. The CLs value of a parameter space-point $[\sin^2(2\theta_{ee}), \Delta m^2_{41}]$ is defined as $\text{CL}_\text{s}(\sin^2(2\theta_{ee}), \Delta m^2_{41}):=(1-p_1)/(1-p_0)$ where $(1-p_0)$ and $(1-p_1)$ are the confidence levels of the dataset, determined from the distributions of $-\Delta T$ created in pseudo-experiments assuming the oscillation parameters $[0,0]$ and $[\sin^2(2\theta_{ee}), \Delta m^2_{41}]$, respectively. The point $[\sin^2(2\theta_{ee}), \Delta m^2_{41}]$ is excluded by the data at $x$% C.L. if $\Delta T(\sin^2(2\theta_{ee}), \Delta m^2_{41}) < \Delta T_{\text{crit},x}(\sin^2(2\theta_{ee}), \Delta m^2_{41})$. Note the flipped sign with respect to the two-dimensional method and the raster-scan method. More information on the CLs method can be found at "Resources".

The $\Delta T_{\text{crit},x}$ and $\Delta T$ values in the CLs method fulfil a similar purpose as the $\Delta \chi^2_{\text{crit},x}$ and $\Delta \chi^2$ values in the two-dimensional method. The explanations given there also apply here, with the following changes: The CLs method differs from the two-dimensional method as it normalises the confidence level of the oscillation-hypothesis to the confidence level of the null-hypothesis (i.e. no-oscillation-hypothesis), instead of the best-fit. The $\Delta T$ value of a dataset at the parameter space-point $[\sin^2(2\theta_{ee}), \Delta m^2_{41}]$ is computed by subtracting the $\chi^2$ value of the fit under the no-oscillation hypothesis from the $\chi^2$ value of the fit with the oscillation parameters fixed to $[\sin^2(2\theta_{ee}), \Delta m^2_{41}]$. With this definition, $\Delta T$ values can be positive or negative as opposed to $\Delta \chi^2$ values. Note that the values used to compare with are $-\Delta T$ and not $\Delta T$ directly. The CLs value of a parameter space-point $[\sin^2(2\theta_{ee}), \Delta m^2_{41}]$ is defined as $\text{CL}_\text{s}(\sin^2(2\theta_{ee}), \Delta m^2_{41}):=(1-p_1)/(1-p_0)$ where $(1-p_0)$ and $(1-p_1)$ are the confidence levels of the dataset, determined from the distributions of $-\Delta T$ created in pseudo-experiments assuming the oscillation parameters $[0,0]$ and $[\sin^2(2\theta_{ee}), \Delta m^2_{41}]$, respectively. The point $[\sin^2(2\theta_{ee}), \Delta m^2_{41}]$ is excluded by the data at $x$% C.L. if $\Delta T(\sin^2(2\theta_{ee}), \Delta m^2_{41}) < \Delta T_{\text{crit},x}(\sin^2(2\theta_{ee}), \Delta m^2_{41})$. Note the flipped sign with respect to the two-dimensional method and the raster-scan method. More information on the CLs method can be found at "Resources".

Map of mean $\Delta \chi^2$ values derived from simulations of phase-I+II and calculated by the two-dimensional method. To be used analogously to the $\Delta \chi^2$ map of phase-I+II data in combination with the $\Delta \chi^2_{\text{crit},x}$ values of the two-dimensional method to generate sensitivity contours at $x$% C.L. for phase-I+II. Additional explanations are given there.

Overview of the detector efficiency correction factors, $C_{Z}$ , for the electron and muon channels and their systematic uncertainty contributions.

Overview of the detector efficiency correction factors, $C_{Z}$ , for the electron and muon channels and their systematic uncertainty contributions.

Overview of the detector efficiency correction factors, $C_{Z}$ , for the electron and muon channels and their systematic uncertainty contributions.

Measured inclusive cross-section in the fiducial volume in the electron and muon decay channels at Born level and their combination as well as the theory prediction at NNLO in $\alpha_{s}$ using the CT14 PDF set.

Measured inclusive cross-section in the fiducial volume in the electron and muon decay channels at Born level and their combination as well as the theory prediction at NNLO in $\alpha_{s}$ using the CT14 PDF set.

Measured inclusive cross-section in the fiducial volume in the electron and muon decay channels at Born level and their combination as well as the theory prediction at NNLO in $\alpha_{s}$ using the CT14 PDF set.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton invariant mass $m_{ll}$ , the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton invariant mass $m_{ll}$ , the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton invariant mass $m_{ll}$ , the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton invariant mass $m_{ll}$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton invariant mass $m_{ll}$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton invariant mass $m_{ll}$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The measured normalized cross section as a function of $p_{ll}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown. The $p_{ll}$ distribution is split into linear and logarithmic scales at 30 GeV.

The measured normalized cross section as a function of $p_{ll}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown. The $p_{ll}$ distribution is split into linear and logarithmic scales at 30 GeV.

The measured normalized cross section as a function of $p_{ll}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown. The $p_{ll}$ distribution is split into linear and logarithmic scales at 30 GeV.

The measured normalized cross section as a function of $\phi_{\eta}^{*}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown.

The measured normalized cross section as a function of $\phi_{\eta}^{*}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown.

The measured normalized cross section as a function of $\phi_{\eta}^{*}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown.

Comparison of the normalized $p_{ll}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $p_{ll}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $p_{ll}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $\phi_{\eta}^{*}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $\phi_{\eta}^{*}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $\phi_{\eta}^{*}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $p_{ll}$ distribution in the range $p_{ll}$ > 10 GeV. The Born level combined measurement is compared with predictions by Sherpa v2.2.1, fixed-order NNLOjet and NNLOjet supplied with NLO electroweak corrections. The uncertainties in the measurement are shown as vertical bars and the uncertainties in the predictions are indicated by the coloured bands.

Comparison of the normalized $p_{ll}$ distribution in the range $p_{ll}$ > 10 GeV. The Born level combined measurement is compared with predictions by Sherpa v2.2.1, fixed-order NNLOjet and NNLOjet supplied with NLO electroweak corrections. The uncertainties in the measurement are shown as vertical bars and the uncertainties in the predictions are indicated by the coloured bands.

Comparison of the normalized $p_{ll}$ distribution in the range $p_{ll}$ > 10 GeV. The Born level combined measurement is compared with predictions by Sherpa v2.2.1, fixed-order NNLOjet and NNLOjet supplied with NLO electroweak corrections. The uncertainties in the measurement are shown as vertical bars and the uncertainties in the predictions are indicated by the coloured bands.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at dressed level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at dressed level.

Observed $CL_S$ limits on $\sigma \times BR$ for $m_{\Phi} = 200-400$ GeV.

Observed $CL_S$ limits on $\sigma \times BR$ for $m_{\Phi} = 600-1000$ GeV.

Combined limits from this analysis (ID) and the CR and MS analyses for $m_{H} = 125$ GeV, $m_s = 15$ GeV.

Combined limits from this analysis (ID) and the CR and MS analyses for $m_{H} = 125$ GeV, $m_s = 25$ GeV.

Combined limits from this analysis (ID) and the CR and MS analyses for $m_{H} = 125$ GeV, $m_s = 40$ GeV.

Combined limits from this analysis (ID) and the CR and MS analyses for $m_{H} = 125$ GeV, $m_s = 55$ GeV.

Combined limits from this analysis (ID) and the CR and MS analyses for $m_{\Phi} = 200$ GeV, $m_s = 25$ GeV.

Combined limits from this analysis (ID) and the CR and MS analyses for $m_{\Phi} = 200$ GeV, $m_s = 50$ GeV.

Comparison of the IDVx reconstruction and selection efficiency for a Higgs with a mass of 125 GeV decaying to an LLP with a mass of 8 GeV, using only standard tracking versus using standard and large radius tracking for all ID vertices in the signal MC sample.

Comparison of the IDVx reconstruction and selection efficiency for a Higgs with a mass of 125 GeV decaying to an LLP with a mass of 8 GeV, using only standard tracking versus using standard and large radius tracking for ID vertices passing the full IDVx selection criteria.

Comparison of the IDVx reconstruction and selection efficiency for a $\Phi$ with a mass of 1000 GeV decaying to an LLP with a mass of 150 GeV, using only standard tracking versus using standard and large radius tracking for all ID vertices in the signal MC sample.

Comparison of the IDVx reconstruction and selection efficiency for a $\Phi$ with a mass of 1000 GeV decaying to an LLP with a mass of 150 GeV, using only standard tracking versus using standard and large radius tracking for ID vertices passing the full IDVx selection criteria.

The IDVx selection efficiency as a function of long-lived particle decay $z$ position for MC signal samples with a 125 GeV Higgs boson decaying to LLPs with masses of 8, 25, and 55 GeV. The efficiency for the 55 GeV LLP sample is shown both with and without the material veto applied.

The IDVx selection efficiency as a function of long-lived particle decay $z$ position for MC signal samples with mediators of masses 200, 400, and 600 GeV decaying to LLPs with a mass of 50 GeV. The efficiency for the 200 GeV mediator sample is shown both with and without the material veto applied.

The impact of the IDVx selections on the selection efficiency for the MC signal sample with a Higgs with a mass of 125 GeV decaying to an LLP with a mass of 8 GeV.

The impact of the IDVx selections on the selection efficiency for the MC signal sample with a Higgs with a mass of 125 GeV decaying to an LLP with a mass of 8 GeV.

The impact of the IDVx selections on the selection efficiency for the MC signal sample with a Higgs with a mass of 125 GeV decaying to an LLP with a mass of 8 GeV.

The impact of the IDVx selections on the selection efficiency for the MC signal sample with a $\Phi$ with a mass of 400 GeV decaying to an LLP with a mass of 50 GeV.

The impact of the IDVx selections on the selection efficiency for the MC signal sample with a $\Phi$ with a mass of 400 GeV decaying to an LLP with a mass of 50 GeV.

The impact of the IDVx selections on the selection efficiency for the MC signal sample with a $\Phi$ with a mass of 400 GeV decaying to an LLP with a mass of 50 GeV.

The impact of the IDVx selections on the selection efficiency for the MC signal sample with a $\Phi$ with a mass of 1000 GeV decaying to an LLP with a mass of 150 GeV.

The impact of the IDVx selections on the selection efficiency for the MC signal sample with a $\Phi$ with a mass of 1000 GeV decaying to an LLP with a mass of 150 GeV.

The impact of the IDVx selections on the selection efficiency for the MC signal sample with a $\Phi$ with a mass of 1000 GeV decaying to an LLP with a mass of 150 GeV.

$CL_S$ limits on $B_{H\rightarrow ss}$ for $m_{H} = 125$ GeV, $m_s = 8$ GeV.

$CL_S$ limits on $B_{H\rightarrow ss}$ for $m_{H} = 125$ GeV, $m_s = 15$ GeV.

$CL_S$ limits on $B_{H\rightarrow ss}$ for $m_{H} = 125$ GeV, $m_s = 25$ GeV.

$CL_S$ limits on $B_{H\rightarrow ss}$ for $m_{H} = 125$ GeV, $m_s = 40$ GeV.

$CL_S$ limits on $B_{H\rightarrow ss}$ for $m_{H} = 125$ GeV, $m_s = 55$ GeV.

$CL_S$ limits on $\sigma \times B_{\Phi\rightarrow ss}$ for $m_{\Phi} = 200$ GeV, $m_s = 8$ GeV.

$CL_S$ limits on $\sigma \times B_{\Phi\rightarrow ss}$ for $m_{\Phi} = 200$ GeV, $m_s = 25$ GeV.

$CL_S$ limits on $\sigma \times B_{\Phi\rightarrow ss}$ for $m_{\Phi} = 200$ GeV, $m_s = 50$ GeV.

$CL_S$ limits on $\sigma \times B_{\Phi\rightarrow ss}$ for $m_{\Phi} = 400$ GeV, $m_s = 50$ GeV.

$CL_S$ limits on $\sigma \times B_{\Phi\rightarrow ss}$ for $m_{\Phi} = 400$ GeV, $m_s = 100$ GeV.

$CL_S$ limits on $\sigma \times B_{\Phi\rightarrow ss}$ for $m_{\Phi} = 600$ GeV, $m_s = 50$ GeV.

$CL_S$ limits on $\sigma \times B_{\Phi\rightarrow ss}$ for $m_{\Phi} = 600$ GeV, $m_s = 150$ GeV.

$CL_S$ limits on $\sigma \times B_{\Phi\rightarrow ss}$ for $m_{\Phi} = 1000$ GeV, $m_s = 50$ GeV.

$CL_S$ limits on $\sigma \times B_{\Phi\rightarrow ss}$ for $m_{\Phi} = 1000$ GeV, $m_s = 150$ GeV.

$CL_S$ limits on $\sigma \times B_{\Phi\rightarrow ss}$ for $m_{\Phi} = 1000$ GeV, $m_s = 400$ GeV.

Expected 95% CL exclusion sensitivity for simplified models of direct higgsino production.

Expected 95% CL exclusion sensitivity for simplified models of direct higgsino production.

Observed 95% CL exclusion sensitivity for simplified models of direct higgsino production.

Observed 95% CL exclusion sensitivity for simplified models of direct higgsino production.

Observed 95% CL exclusion sensitivity for simplified models of direct higgsino production.

Observed 95% CL exclusion sensitivity for simplified models of direct higgsino production.

Observed 95% CL exclusion sensitivity for simplified models of direct higgsino production.

Expected 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})<0$.

Expected 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})<0$.

Expected 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})<0$.

Expected 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})<0$.

Expected 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})<0$.

Observed 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})<0$.

Observed 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})<0$.

Observed 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})<0$.

Observed 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})<0$.

Observed 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})<0$.

Expected 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})>0$.

Expected 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})>0$.

Expected 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})>0$.

Expected 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})>0$.

Expected 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})>0$.

Observed 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})>0$.

Observed 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})>0$.

Observed 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})>0$.

Observed 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})>0$.

Observed 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})>0$.

Expected 95% CL exclusion sensitivity for simplified models of VBF wino-bino production.

Expected 95% CL exclusion sensitivity for simplified models of VBF wino-bino production.

Expected 95% CL exclusion sensitivity for simplified models of VBF wino-bino production.

Expected 95% CL exclusion sensitivity for simplified models of VBF wino-bino production.

Expected 95% CL exclusion sensitivity for simplified models of VBF wino-bino production.

Observed 95% CL exclusion sensitivity for simplified models of direct wino-bino production.

Observed 95% CL exclusion sensitivity for simplified models of direct wino-bino production.

Observed 95% CL exclusion sensitivity for simplified models of direct wino-bino production.

Observed 95% CL exclusion sensitivity for simplified models of direct wino-bino production.

Observed 95% CL exclusion sensitivity for simplified models of direct wino-bino production.

Expected 95% CL exclusion sensitivity for simplified models of direct slepton production.

Expected 95% CL exclusion sensitivity for simplified models of direct slepton production.

Expected 95% CL exclusion sensitivity for simplified models of direct slepton production.

Expected 95% CL exclusion sensitivity for simplified models of direct slepton production.

Expected 95% CL exclusion sensitivity for simplified models of direct slepton production.

Observed 95% CL exclusion sensitivity for simplified models of direct slepton production.

Observed 95% CL exclusion sensitivity for simplified models of direct slepton production.

Observed 95% CL exclusion sensitivity for simplified models of direct slepton production.

Observed 95% CL exclusion sensitivity for simplified models of direct slepton production.

Observed 95% CL exclusion sensitivity for simplified models of direct slepton production.

Expected 95% CL exclusion sensitivity for simplified models of direct LH smuon production.

Expected 95% CL exclusion sensitivity for simplified models of direct LH smuon production.

Expected 95% CL exclusion sensitivity for simplified models of direct smuon production.

Expected 95% CL exclusion sensitivity for simplified models of direct smuon production.

Expected 95% CL exclusion sensitivity for simplified models of direct smuon production.

Observed 95% CL exclusion sensitivity for simplified models of direct LH smuon production.

Observed 95% CL exclusion sensitivity for simplified models of direct LH smuon production.

Observed 95% CL exclusion sensitivity for simplified models of direct smuon production.

Observed 95% CL exclusion sensitivity for simplified models of direct smuon production.

Observed 95% CL exclusion sensitivity for simplified models of direct smuon production.

Expected 95% CL exclusion sensitivity for simplified models of direct RH smuon production.

Expected 95% CL exclusion sensitivity for simplified models of direct RH smuon production.

Expected 95% CL exclusion sensitivity for simplified models of direct selectron production.

Expected 95% CL exclusion sensitivity for simplified models of direct selectron production.

Expected 95% CL exclusion sensitivity for simplified models of direct selectron production.

Observed 95% CL exclusion sensitivity for simplified models of direct RH smuon production.

Observed 95% CL exclusion sensitivity for simplified models of direct RH smuon production.

Observed 95% CL exclusion sensitivity for simplified models of direct selectron production.

Observed 95% CL exclusion sensitivity for simplified models of direct selectron production.

Observed 95% CL exclusion sensitivity for simplified models of direct selectron production.

Expected 95% CL exclusion sensitivity for simplified models of direct LH selectron production.

Expected 95% CL exclusion sensitivity for simplified models of direct LH selectron production.

Expected 95% CL exclusion sensitivity for simplified models of direct LH slepton production.

Expected 95% CL exclusion sensitivity for simplified models of direct LH slepton production.

Expected 95% CL exclusion sensitivity for simplified models of direct LH slepton production.

Observed 95% CL exclusion sensitivity for simplified models of direct LH selectron production.

Observed 95% CL exclusion sensitivity for simplified models of direct LH selectron production.

Observed 95% CL exclusion sensitivity for simplified models of direct LH slepton production.

Observed 95% CL exclusion sensitivity for simplified models of direct LH slepton production.

Observed 95% CL exclusion sensitivity for simplified models of direct LH slepton production.

Expected 95% CL exclusion sensitivity for simplified models of direct RH selectron production.

Expected 95% CL exclusion sensitivity for simplified models of direct RH selectron production.

Expected 95% CL exclusion sensitivity for simplified models of direct RH slepton production.

Expected 95% CL exclusion sensitivity for simplified models of direct RH slepton production.

Expected 95% CL exclusion sensitivity for simplified models of direct RH slepton production.

Observed 95% CL exclusion sensitivity for simplified models of direct RH selectron production.

Observed 95% CL exclusion sensitivity for simplified models of direct RH selectron production.

Observed 95% CL exclusion sensitivity for simplified models of direct RH slepton production.

Observed 95% CL exclusion sensitivity for simplified models of direct RH slepton production.

Observed 95% CL exclusion sensitivity for simplified models of direct RH slepton production.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Expected 95% CL exclusion sensitivity for simplified models of direct LH smuon production.

Expected 95% CL exclusion sensitivity for simplified models of direct LH smuon production.

Expected 95% CL exclusion sensitivity for simplified models of direct LH smuon production.

Efficiency for the C1C1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the C1C1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Observed 95% CL exclusion sensitivity for simplified models of direct LH smuon production.

Observed 95% CL exclusion sensitivity for simplified models of direct LH smuon production.

Observed 95% CL exclusion sensitivity for simplified models of direct LH smuon production.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Expected 95% CL exclusion sensitivity for simplified models of direct RH smuon production.

Expected 95% CL exclusion sensitivity for simplified models of direct RH smuon production.

Expected 95% CL exclusion sensitivity for simplified models of direct RH smuon production.

Efficiency for the C1C1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the C1C1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Observed 95% CL exclusion sensitivity for simplified models of direct RH smuon production.

Observed 95% CL exclusion sensitivity for simplified models of direct RH smuon production.

Observed 95% CL exclusion sensitivity for simplified models of direct RH smuon production.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Expected 95% CL exclusion sensitivity for simplified models of direct LH selectron production.

Expected 95% CL exclusion sensitivity for simplified models of direct LH selectron production.

Expected 95% CL exclusion sensitivity for simplified models of direct LH selectron production.

Efficiency for the C1C1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the C1C1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Observed 95% CL exclusion sensitivity for simplified models of direct LH selectron production.

Observed 95% CL exclusion sensitivity for simplified models of direct LH selectron production.

Observed 95% CL exclusion sensitivity for simplified models of direct LH selectron production.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Expected 95% CL exclusion sensitivity for simplified models of direct RH selectron production.

Expected 95% CL exclusion sensitivity for simplified models of direct RH selectron production.

Expected 95% CL exclusion sensitivity for simplified models of direct RH selectron production.

Efficiency for the N2N1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Observed 95% CL exclusion sensitivity for simplified models of direct RH selectron production.

Observed 95% CL exclusion sensitivity for simplified models of direct RH selectron production.

Observed 95% CL exclusion sensitivity for simplified models of direct RH selectron production.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the C1C1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the C1C1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the C1C1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the C1C1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the C1C1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the C1C1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the C1C1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the C1C1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the C1C1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-3}$) for the slepton process in the SR-S region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Acceptance (note the $z$-axis is in units of $10^{-3}$) for the slepton process in the SR-S region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the slepton process in the SR-S region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Efficiency for the slepton process in the SR-S region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-3}$) for the slepton process in the SR-S-high region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Acceptance (note the $z$-axis is in units of $10^{-3}$) for the slepton process in the SR-S-high region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the slepton process in the SR-S-high region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Efficiency for the slepton process in the SR-S-high region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-3}$) for the slepton process in the SR-S-low region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Acceptance (note the $z$-axis is in units of $10^{-3}$) for the slepton process in the SR-S-low region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the slepton process in the SR-S-low region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Efficiency for the slepton process in the SR-S-low region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the C1C1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the C1C1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-3}$) for the slepton process in the SR-S region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Acceptance (note the $z$-axis is in units of $10^{-3}$) for the slepton process in the SR-S region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Acceptance (note the $z$-axis is in units of $10^{-3}$) for the slepton process in the SR-S region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Efficiency for the C1C1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the C1C1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the slepton process in the SR-S region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Efficiency for the slepton process in the SR-S region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Efficiency for the slepton process in the SR-S region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-3}$) for the slepton process in the SR-S-high region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Acceptance (note the $z$-axis is in units of $10^{-3}$) for the slepton process in the SR-S-high region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Acceptance (note the $z$-axis is in units of $10^{-3}$) for the slepton process in the SR-S-high region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Efficiency for the C1C1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the C1C1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the slepton process in the SR-S-high region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Efficiency for the slepton process in the SR-S-high region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Efficiency for the slepton process in the SR-S-high region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-3}$) for the slepton process in the SR-S-low region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Acceptance (note the $z$-axis is in units of $10^{-3}$) for the slepton process in the SR-S-low region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Acceptance (note the $z$-axis is in units of $10^{-3}$) for the slepton process in the SR-S-low region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Efficiency for the N2N1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2N1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the slepton process in the SR-S-low region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Efficiency for the slepton process in the SR-S-low region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Efficiency for the slepton process in the SR-S-low region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2N1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2N1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the C1C1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the C1C1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the C1C1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2N1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2N1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the C1C1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the C1C1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the C1C1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1p VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1p VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the C1C1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the C1C1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the C1C1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1p VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1p VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2N1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2N1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2N1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1p VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1p VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2N1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2N1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2N1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1m VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1m VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2N1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2N1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2N1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1m VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1m VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1p VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1p VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1p VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1m VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1m VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1p VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1p VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1p VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Observed and Expected upper cross-section limits for wino-bino scenarios, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})>0$.

Observed and Expected upper cross-section limits for wino-bino scenarios, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})>0$.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Observed and Expected upper cross-section limits for wino-bino scenarios, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})<0$.

Observed and Expected upper cross-section limits for wino-bino scenarios, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})<0$.

Efficiency for the N2C1p VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1p VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1p VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Observed and Expected upper cross-section limits for higgsino scenarios.

Observed and Expected upper cross-section limits for higgsino scenarios.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Observed and Expected upper cross-section limits for higgsino scenarios, assuming VBF production..

Observed and Expected upper cross-section limits for higgsino scenarios, assuming VBF production..

Efficiency for the N2C1m VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1m VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1m VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Observed and Expected upper cross-section limits for direct slepton scenarios.

Observed and Expected upper cross-section limits for direct slepton scenarios.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Observed and Expected upper cross-section limits for direct LH slepton scenarios.

Observed and Expected upper cross-section limits for direct LH slepton scenarios.

Efficiency for the N2C1m VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1m VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1m VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Observed and Expected upper cross-section limits for direct RH slepton scenarios.

Observed and Expected upper cross-section limits for direct RH slepton scenarios.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Observed and Expected upper cross-section limits for direct smuon scenarios.

Observed and Expected upper cross-section limits for direct smuon scenarios.

Efficiency for the N2C1m VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1m VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1m VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Observed and Expected upper cross-section limits for direct LH smuon scenarios.

Observed and Expected upper cross-section limits for direct LH smuon scenarios.

Observed and Expected upper cross-section limits for wino-bino scenarios, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})>0$.

Observed and Expected upper cross-section limits for wino-bino scenarios, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})>0$.

Observed and Expected upper cross-section limits for wino-bino scenarios, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})>0$.

Observed and Expected upper cross-section limits for direct RH smuon scenarios.

Observed and Expected upper cross-section limits for direct RH smuon scenarios.

Observed and Expected upper cross-section limits for wino-bino scenarios, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})<0$.

Observed and Expected upper cross-section limits for wino-bino scenarios, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})<0$.

Observed and Expected upper cross-section limits for wino-bino scenarios, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})<0$.

Observed and Expected upper cross-section limits for direct selectron scenarios.

Observed and Expected upper cross-section limits for direct selectron scenarios.

Observed and Expected upper cross-section limits for higgsino scenarios.

Observed and Expected upper cross-section limits for higgsino scenarios.

Observed and Expected upper cross-section limits for higgsino scenarios.

Observed and Expected upper cross-section limits for direct LH selectron scenarios.

Observed and Expected upper cross-section limits for direct LH selectron scenarios.

Observed and Expected upper cross-section limits for higgsino scenarios, assuming VBF production..

Observed and Expected upper cross-section limits for higgsino scenarios, assuming VBF production..

Observed and Expected upper cross-section limits for higgsino scenarios, assuming VBF production..

Observed and Expected upper cross-section limits for direct RH selectron scenarios.

Observed and Expected upper cross-section limits for direct RH selectron scenarios.

Observed and Expected upper cross-section limits for direct slepton scenarios.

Observed and Expected upper cross-section limits for direct slepton scenarios.

Observed and Expected upper cross-section limits for direct slepton scenarios.

Number of signal events in SR-E-1L1T for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-E-1L1T for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Observed and Expected upper cross-section limits for direct LH slepton scenarios.

Observed and Expected upper cross-section limits for direct LH slepton scenarios.

Observed and Expected upper cross-section limits for direct LH slepton scenarios.

Number of signal events in SR-E-high for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-E-high for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Observed and Expected upper cross-section limits for direct RH slepton scenarios.

Observed and Expected upper cross-section limits for direct RH slepton scenarios.

Observed and Expected upper cross-section limits for direct RH slepton scenarios.

Number of signal events in SR-E-low for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-E-low for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Observed and Expected upper cross-section limits for direct smuon scenarios.

Observed and Expected upper cross-section limits for direct smuon scenarios.

Observed and Expected upper cross-section limits for direct smuon scenarios.

Number of signal events in SR-E-med for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-E-med for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Observed and Expected upper cross-section limits for direct LH smuon scenarios.

Observed and Expected upper cross-section limits for direct LH smuon scenarios.

Observed and Expected upper cross-section limits for direct LH smuon scenarios.

Number of signal events in SR-S-high for the (m($\tilde{\ell}$),m($\tilde{\chi}_{1}^{0}$)) = (150 GeV, 140 GeV) Slepton signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-S-high for the (m($\tilde{\ell}$),m($\tilde{\chi}_{1}^{0}$)) = (150 GeV, 140 GeV) Slepton signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Observed and Expected upper cross-section limits for direct RH smuon scenarios.

Observed and Expected upper cross-section limits for direct RH smuon scenarios.

Observed and Expected upper cross-section limits for direct RH smuon scenarios.

Number of signal events in SR-S-low for the (m($\tilde{\ell}$),m($\tilde{\chi}_{1}^{0}$)) = (150 GeV, 140 GeV) Slepton signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-S-low for the (m($\tilde{\ell}$),m($\tilde{\chi}_{1}^{0}$)) = (150 GeV, 140 GeV) Slepton signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Observed and Expected upper cross-section limits for direct selectron scenarios.

Observed and Expected upper cross-section limits for direct selectron scenarios.

Observed and Expected upper cross-section limits for direct selectron scenarios.

Number of signal events in SR-VBF for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (100 GeV, 95 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-VBF for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (100 GeV, 95 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Observed and Expected upper cross-section limits for direct LH selectron scenarios.

Observed and Expected upper cross-section limits for direct LH selectron scenarios.

Observed and Expected upper cross-section limits for direct LH selectron scenarios.

Observed and Expected upper cross-section limits for direct RH selectron scenarios.

Observed and Expected upper cross-section limits for direct RH selectron scenarios.

Observed and Expected upper cross-section limits for direct RH selectron scenarios.

Number of signal events in SR-E-1L1T for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-E-1L1T for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-E-1L1T for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-E-high for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-E-high for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-E-high for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-E-low for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-E-low for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-E-low for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-E-med for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-E-med for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-E-med for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-S-high for the (m($\tilde{\ell}$),m($\tilde{\chi}_{1}^{0}$)) = (150 GeV, 140 GeV) Slepton signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-S-high for the (m($\tilde{\ell}$),m($\tilde{\chi}_{1}^{0}$)) = (150 GeV, 140 GeV) Slepton signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-S-high for the (m($\tilde{\ell}$),m($\tilde{\chi}_{1}^{0}$)) = (150 GeV, 140 GeV) Slepton signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-S-low for the (m($\tilde{\ell}$),m($\tilde{\chi}_{1}^{0}$)) = (150 GeV, 140 GeV) Slepton signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-S-low for the (m($\tilde{\ell}$),m($\tilde{\chi}_{1}^{0}$)) = (150 GeV, 140 GeV) Slepton signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-S-low for the (m($\tilde{\ell}$),m($\tilde{\chi}_{1}^{0}$)) = (150 GeV, 140 GeV) Slepton signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-VBF for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (100 GeV, 95 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-VBF for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (100 GeV, 95 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-VBF for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (100 GeV, 95 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Per-trigger yield of the near-side 2D gaussian, presented as a function of centrality.