Two-dimensional distribution of the invariant mass $m_{DV}$ and the track multiplicity in the High-pT jet SR for observed data events

Two-dimensional distribution of the invariant mass $m_{DV}$ and the track multiplicity in the High-pT jet SR for expected signal events in the strong gluino pair pair production model with m(gluino)=1.8 TeV, m(chi0)=0.2 TeV, tau(chi0)=0.1 ns

Two-dimensional distribution of the invariant mass $m_{DV}$ and the track multiplicity in the Trackless jet SR for observed data events

Two-dimensional distribution of the invariant mass $m_{DV}$ and the track multiplicity in the Trackless jet SR for expected signal events in the electroweak pair production model

Expected exclusion limits at 95% CL on the lifetime and mass of the neutralino in electroweakino pair production models

Expected (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in electroweakino pair production models

Expected (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in electroweakino pair production models

Observed exclusion limits at 95% CL on the lifetime and mass of the neutralino in electroweakino pair production models

Observed (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in electroweakino pair production models

Observed (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in electroweakino pair production models

Expected exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.4 TeV

Expected (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.4 TeV

Expected (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.4 TeV

Observed exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.4 TeV

Observed (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.4 TeV

Observed (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.4 TeV

Exclusion limits at 95% CL on the production cross section in the electroweak pair production model.

Exclusion limits at 95% CL on the production cross section in the strong gluino pair production models and m(gluino)=2.4 TeV

Expected exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.0 TeV

Expected (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.0 TeV

Expected (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.0 TeV

Observed exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.0 TeV

Observed (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.0 TeV

Observed (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.0 TeV

Expected exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.2 TeV

Expected (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.2 TeV

Expected (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.2 TeV

Observed exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.2 TeV

Observed (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.2 TeV

Observed (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.2 TeV

Expected exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=50 GeV

Expected (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=50 GeV

Expected (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=50 GeV

Observed exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=50 GeV

Observed (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=50 GeV

Observed (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=50 GeV

Expected exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=450 GeV

Expected (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=450 GeV

Expected (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=450 GeV

Observed exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=450 GeV

Observed (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=450 GeV

Observed (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=450 GeV

Expected exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.01 ns

Expected (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.01 ns

Expected (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.01 ns

Observed exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.01 ns

Observed (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.01 ns

Observed (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.01 ns

Expected exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.1 ns

Expected (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.1 ns

Expected (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.1 ns

Observed exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.1 ns

Observed (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.1 ns

Observed (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.1 ns

Expected exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=1 ns

Expected (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=1 ns

Expected (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=1 ns

Observed exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=1 ns

Observed (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=1 ns

Observed (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=1 ns

Expected exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=10 ns

Expected (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=10 ns

Expected (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=10 ns

Observed exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=10 ns

Observed (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=10 ns

Observed (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=10 ns

Exclusion limits at 95% CL on the production cross section in the strong gluino pair production models and m($ ilde{\chi}^0_1$)=1.25 TeV

Acceptance cutflow for the High-pT SR for representative points in the strong gluino pair production model. See additional resources for more information.

Acceptance cutflow for the Trackless SR for representative points in the electroweak pair production model. See additional resources for more information.

Acceptance cutflow for the Trackless SR for representative points in the electroweak pair production model with heavy-flavor quarks final state. See additional resources for more information.

Acceptance cutflow for the High-pT SR for representative points in the electroweak pair production model with heavy-flavor quarks final state. See additional resources for more information.

Reinterpretation Material: Event-level Efficiency for HighPt SR selections, R < 1150 mm

Reinterpretation Material: Event-level Efficiency for HighPt SR selections, R [1150, 3870] mm

Reinterpretation Material: Event-level Efficiency for HighPt SR selections, R > 3870 mm

Reinterpretation Material: Event-level Efficiency for Trackless SR selections, R < 1150 mm

Reinterpretation Material: Event-level Efficiency for Trackless SR selections, R [1150, 3870] mm

Reinterpretation Material: Event-level Efficiency for Trackless SR selections, R > 3870 mm

Reinterpretation Material: Vertex-level Efficiency for R < 22 mm

Reinterpretation Material: Vertex-level Efficiency for R [22, 25] mm

Reinterpretation Material: Vertex-level Efficiency for R [25, 29] mm

Reinterpretation Material: Vertex-level Efficiency for R [29, 38] mm

Reinterpretation Material: Vertex-level Efficiency for R [38, 46] mm

Reinterpretation Material: Vertex-level Efficiency for R [46, 73] mm

Reinterpretation Material: Vertex-level Efficiency for R [73, 84] mm

Reinterpretation Material: Vertex-level Efficiency for R [84, 111] mm

Reinterpretation Material: Vertex-level Efficiency for R [111, 120] mm

Reinterpretation Material: Vertex-level Efficiency for R [120, 145] mm

Reinterpretation Material: Vertex-level Efficiency for R [145, 180] mm

Reinterpretation Material: Vertex-level Efficiency for R [180, 300] mm

Cutflow (acceptance x efficiency) for the High-pT SR for representative points in the strong gluino pair production model. See additional resources for more information.

Cutflow (acceptance x efficiency) for the Trackless SR for representative points in the electroweak pair production model. See additional resources for more information.

Cutflow (acceptance x efficiency) for the Trackless SR for representative points in the electroweak pair production model with heavy-flavor quarks. See additional resources for more information.

Cutflow (acceptance x efficiency) for the High-pT SR for representative points in the electroweak pair production model with heavy-flavor quarks. See additional resources for more information.

Parametrization of the $A_{X}$ factor, defined as the fraction of diphoton resonances satisfying the fiducial acceptance at the particle level, as function of $m_{X}$ obtained from the narrow width simulated signal samples produced in gluon fusion.

The correction factor, $C_{X}$, defined as the ratio between the number of reconstructed signal events passing the analysis cuts and the number of signal events at the particle level generated within the fiducial volume, and acceptance correction factor, $A_{X}$, defined as the fraction of diphoton resonances satisfying the fiducial acceptance at the particle level. Both are computed for NWA spin-0 models as a function of $m_{X}$.

Effect of event selections on a scalar MC signal sample generated for $m_{X}$ = 15 GeV and on the data. For the MC sample, the efficiencies are shown after applying event weights and a truth level filter that requires two photons with $p^{\gamma\gamma}_{T}>40$ GeV; for the data, the absolute yields are shown. The initial yields for data include a trigger preselection that is the OR of a list of single photon and diphoton triggers. The "2 $loose$ photons" step includes the kinematic acceptance cuts.

Parameterization of the Double Sided Crystal Ball function parameters describing the scalar mass resolution model as a function of $m_{X}$ [GeV].

The reconstruction efficiency for caloDPJs produced by the decay of &gamma;_d into e⁺e^- or qq&#772;. The reconstruction efficiency is shown for &gamma;_d with 0&lt;|&eta;|&lt;1.1 as a function of their transverse momentum in events where the &gamma;_d L_xy is between 2&nbsp;m and 4&nbsp;m.

Observed 95% CL upper limits on the branching ratio (B) for the decay H&rarr;&nbsp;2&gamma;_d+X and ggF selection, for different &gamma;_d masses and a 125&nbsp;GeV Higgs boson. The limits are shown for the SR_2&mu;^ggF, assuming an FRVZ signal model. The hatched band denotes the region in which the branching ratio of H&rarr;&nbsp;2&gamma;_d+X is larger than unity.

Observed 95% CL upper limits on the branching ratio (B) for the decay H&rarr;&nbsp;2&gamma;_d+X and ggF selection, for different &gamma;_d masses and a 125&nbsp;GeV Higgs boson. The limits are shown for the SR_c+&mu;^ggF, assuming an FRVZ signal model. The hatched band denotes the region in which the branching ratio of H&rarr;&nbsp;2&gamma;_d+X is larger than unity.

Observed 95% CL upper limits on the branching ratio (B) for the decay H&rarr;&nbsp;2&gamma;_d+X and ggF selection, for different &gamma;_d masses and a 125&nbsp;GeV Higgs boson. The limits are shown for the SR_2c^ggF, assuming an FRVZ signal model. The hatched band denotes the region in which the branching ratio of H&rarr;&nbsp;2&gamma;_d+X is larger than unity.

Observed 95% CL upper limits on the branching ratio (B) for the decay H&rarr;&nbsp;2&gamma;_d+X and WH selection, for different &gamma;_d masses and a 125&nbsp;GeV Higgs boson. The limits are shown for the SR_c^WH, assuming an FRVZ signal model. The hatched band denotes the region in which the branching ratio of H&rarr;&nbsp;2&gamma;_d+X is larger than unity.

Observed 95% CL upper limits on the branching ratio (B) for the decay H&rarr;&nbsp;2&gamma;_d+X and WH selection, for different &gamma;_d masses and a 125&nbsp;GeV Higgs boson. The limits are shown for the SR_c+&mu;^WH, assuming an FRVZ signal model. The hatched band denotes the region in which the branching ratio of H&rarr;&nbsp;2&gamma;_d+X is larger than unity.

Observed 95% CL upper limits on the branching ratio (B) for the decay H&rarr;&nbsp;2&gamma;_d+X and WH selection, for different &gamma;_d masses and a 125&nbsp;GeV Higgs boson. The limits are shown for the SR_2c^WH, assuming an FRVZ signal model. The hatched band denotes the region in which the branching ratio of H&rarr;&nbsp;2&gamma;_d+X is larger than unity.

Observed 95% CL upper limits on the branching ratio (B) for the decay H&rarr;&nbsp;2&gamma;_d and ggF selection, for different &gamma;_d masses and a 125&nbsp;GeV Higgs boson. The limits are shown for the SR_2&mu;^ggF, assuming a HAHM signal model. The hatched band denotes the region in which the branching ratio of H&rarr;&nbsp;2&gamma;_d is larger than unity.

Observed 95% CL upper limits on the branching ratio (B) for the decay H&rarr;&nbsp;2&gamma;_d and ggF selection, for different &gamma;_d masses and a 125&nbsp;GeV Higgs boson. The limits are shown for the SR_c+&mu;^ggF, assuming a HAHM signal model. The hatched band denotes the region in which the branching ratio of H&rarr;&nbsp;2&gamma;_d is larger than unity.

Observed 95% CL upper limits on the branching ratio (B) for the decay H&rarr;&nbsp;2&gamma;_d and ggF selection, for different &gamma;_d masses and a 125&nbsp;GeV Higgs boson. The limits are shown for the SR_2c^ggF, assuming a HAHM signal model. The hatched band denotes the region in which the branching ratio of H&rarr;&nbsp;2&gamma;_d is larger than unity.

The CalRatio 2015--2016 trigger efficiency for the decay of &gamma;_d in e⁺e^- or qq&#772;. The trigger efficiency is shown for &gamma;_d with 0&lt;|&eta;|&lt;1.1 as function of the transverse decay length L_xy.

The CalRatio 2015--2016 trigger efficiency for the decay of &gamma;_d in e⁺e^- or qq&#772;. The trigger efficiency is shown for &gamma;_d with 0&lt;|&eta;|&lt;1.1 as function of the transverse momentum, in events where the &gamma;_d L_xy is between 2&nbsp;m and 4&nbsp;m.

The CalRatio 2017--2018 trigger efficiency for the decay of &gamma;_d in e⁺e^- or qq&#772;. The trigger efficiency is shown for &gamma;_d with 0&lt;|&eta;|&lt;1.1 as function of the transverse decay length L_xy.

The CalRatio 2017--2018 trigger efficiency for the decay of &gamma;_d in e⁺e^- or qq&#772;. The trigger efficiency is shown for &gamma;_d with 0&lt;|&eta;|&lt;1.1 as function of the transverse momentum, in events where the &gamma;_d L_xy is between 2&nbsp;m and 4&nbsp;m.

The narrow-scan 2015--2016 trigger efficiency for the decay of &gamma;_d in &mu;⁺&mu;^-. The trigger efficiency is shown for &gamma;_d with 0&lt;|&eta;|&lt;1.1 as function of the transverse decay length L_xy.

The narrow-scan 2015--2016 trigger efficiency for the decay of &gamma;_d in &mu;⁺&mu;^-. The trigger efficiency is shown for &gamma;_d with 0&lt;|&eta;|&lt;1.1 as function of the transverse momentum, in events where the &gamma;_d L_xy is below 6&nbsp;m.

The narrow-scan 2017--2018 trigger efficiency for the decay of &gamma;_d in &mu;⁺&mu;^-. The trigger efficiency is shown for &gamma;_d with 0&lt;|&eta;|&lt;1.1 as function of the transverse decay length L_xy.

The narrow-scan 2017--2018 trigger efficiency for the decay of &gamma;_d in &mu;⁺&mu;^-. The trigger efficiency is shown for &gamma;_d with 0&lt;|&eta;|&lt;1.1 as function of the transverse momentum, in events where the &gamma;_d L_xy is below 6&nbsp;m.

Efficiency of the cosmic-ray tagger as function of the &gamma;_d transverse decay length. The efficiency is calculated accepting the &mu;DPJs for which the cosmic-ray tagger score is &gt; 0.2 for each associated MS-only track.

Efficiency of the cosmic-ray tagger as function of the &gamma;_d transverse momentum. The efficiency is calculated accepting the &mu;DPJs for which the cosmic-ray tagger score is &gt; 0.2 for each associated MS-only track.

Efficiency of the QCD tagger as function of the &gamma;_d transverse decay length. The efficiency is calculated accepting the caloDPJs for which the QCD tagger score is &gt; 0.5.

Efficiency of the QCD tagger as function of the &gamma;_d transverse momentum. The efficiency is calculated accepting the caloDPJs for which the QCD tagger score is &gt; 0.5.

The extrapolated acceptance times efficiencies as a function of the &gamma;_d mean proper lifetime c&tau; for the FRVZ pp &rarr; H&rarr;&nbsp;2&gamma;_d+X process and a SM Higgs boson for the SR_2&mu;^ggF.

The extrapolated acceptance times efficiencies as a function of the &gamma;_d mean proper lifetime c&tau; for the FRVZ pp &rarr; H&rarr;&nbsp;2&gamma;_d+X process and a SM Higgs boson for the SR_c+&mu;^ggF.

The extrapolated acceptance times efficiencies as a function of the &gamma;_d mean proper lifetime c&tau; for the FRVZ pp &rarr; H&rarr;&nbsp;2&gamma;_d+X process and a SM Higgs boson for the SR_2c^ggF.

The extrapolated acceptance times efficiencies as a function of the &gamma;_d mean proper lifetime c&tau; for the FRVZ pp &rarr; H&rarr;&nbsp;2&gamma;_d+X process and a SM Higgs boson for the SR_c^WH.

The extrapolated acceptance times efficiencies as a function of the &gamma;_d mean proper lifetime c&tau; for the FRVZ pp &rarr; H&rarr;&nbsp;2&gamma;_d+X process and a SM Higgs boson for the SR_2c^WH.

The extrapolated acceptance times efficiencies as a function of the &gamma;_d mean proper lifetime c&tau; for the FRVZ pp &rarr; H&rarr;&nbsp;2&gamma;_d+X process and a SM Higgs boson for the SR_c+&mu;^WH.

The extrapolated acceptance times efficiencies for SR_2&mu;^ggF, as a function of the &gamma;_d mean proper lifetime c&tau; for the FRVZ pp &rarr; H&rarr;&nbsp;2&gamma;_d+X process and a Higgs-like scalar with a mass of 800&nbsp;GeV. The coloured bands represent the MC statistical uncertainties.

The extrapolated acceptance times efficiencies for SR_c+&mu;^ggF, as a function of the &gamma;_d mean proper lifetime c&tau; for the FRVZ pp &rarr; H&rarr;&nbsp;2&gamma;_d+X process and a Higgs-like scalar with a mass of 800&nbsp;GeV. The coloured bands represent the MC statistical uncertainties.

The extrapolated acceptance times efficiencies for SR_2c;^ggF, as a function of the &gamma;_d mean proper lifetime c&tau; for the FRVZ pp &rarr; H&rarr;&nbsp;2&gamma;_d+X process and a Higgs-like scalar with a mass of 800&nbsp;GeV. The coloured bands represent the MC statistical uncertainties.

The extrapolated acceptance times efficiencies for SR_2&mu;^ggF, as a function of the &gamma;_d mean proper lifetime c&tau; for the HAHM H&rarr;&nbsp;2&gamma;_d+X process and a SM Higgs boson for the ggF channel.

The extrapolated acceptance times efficiencies for SR_c+&mu;^ggF, as a function of the &gamma;_d mean proper lifetime c&tau; for the HAHM H&rarr;&nbsp;2&gamma;_d+X process and a SM Higgs boson for the ggF channel.

The extrapolated acceptance times efficiencies for SR_2c;^ggF, as a function of the &gamma;_d mean proper lifetime c&tau; for the HAHM H&rarr;&nbsp;2&gamma;_d+X process and a SM Higgs boson for the ggF channel.

The extrapolated acceptance times efficiencies for SR_2&mu;^ggF, as a function of the &gamma;_d mean proper lifetime c&tau; for the FRVZ pp &rarr; H&rarr;&nbsp;4&gamma;_d+X process and a Higgs-like scalar with a mass of 800&nbsp;GeV. The coloured bands represent the MC statistical uncertainties.

The extrapolated acceptance times efficiencies for SR_c+&mu;^ggF, as a function of the &gamma;_d mean proper lifetime c&tau; for the FRVZ pp &rarr; H&rarr;&nbsp;4&gamma;_d+X process and a Higgs-like scalar with a mass of 800&nbsp;GeV. The coloured bands represent the MC statistical uncertainties.

The extrapolated acceptance times efficiencies for SR_2c;^ggF, as a function of the &gamma;_d mean proper lifetime c&tau; for the FRVZ pp &rarr; H&rarr;&nbsp;4&gamma;_d+X process and a Higgs-like scalar with a mass of 800&nbsp;GeV. The coloured bands represent the MC statistical uncertainties.

The extrapolated acceptance times efficiencies for SR_2&mu;^ggF, as a function of the &gamma;_d mean proper lifetime c&tau; for the FRVZ pp &rarr; H&rarr;&nbsp;4&gamma;_d+X process and a SM Higgs boson. The coloured bands represent the MC statistical uncertainties.

The extrapolated acceptance times efficiencies for SR_c+&mu;^ggF, as a function of the &gamma;_d mean proper lifetime c&tau; for the FRVZ pp &rarr; H&rarr;&nbsp;4&gamma;_d+X process and a SM Higgs boson. The coloured bands represent the MC statistical uncertainties.

The extrapolated acceptance times efficiencies for SR_2c;^ggF, as a function of the &gamma;_d mean proper lifetime c&tau; for the FRVZ pp &rarr; H&rarr;&nbsp;4&gamma;_d+X process and a SM Higgs boson. The coloured bands represent the MC statistical uncertainties.

Observed limits at the 95% CL on the branching ratio (B), obtained from the SR_2&mu;^ggF, for the process pp &rarr; H&rarr;&nbsp;4&gamma;_d+X, for different &gamma;_d masses and a 125 GeV Higgs boson. The limits are shown assuming an FRVZ signal model.

Observed limits at the 95% CL on the branching ratio (B), obtained from the SR_c+&mu;^ggF, for the process pp &rarr; H&rarr;&nbsp;4&gamma;_d+X, for different &gamma;_d masses and a 125 GeV Higgs boson. The limits are shown assuming an FRVZ signal model.

Observed limits at the 95% CL on the branching ratio (B), obtained from the SR_2c^ggF, for the process pp &rarr; H&rarr;&nbsp;4&gamma;_d+X, for different &gamma;_d masses and a 125 GeV Higgs boson. The limits are shown assuming an FRVZ signal model.

Observed limits at the 95% CL on the cross section, obtained from the SR_2&mu;^ggF, for the process pp &rarr; H&rarr;&nbsp;2&gamma;_d+X, for different &gamma;_d masses and a Higgs-like scalar with a mass of 800&nbsp;GeV. The limits are shown assuming an FRVZ signal model.

Observed limits at the 95% CL on the cross section, obtained from the SR_c+&mu;^ggF, for the process pp &rarr; H&rarr;&nbsp;2&gamma;_d+X, for different &gamma;_d masses and a Higgs-like scalar with a mass of 800&nbsp;GeV. The limits are shown assuming an FRVZ signal model.

Observed limits at the 95% CL on the cross section, obtained from the SR_2c^ggF, for the process pp &rarr; H&rarr;&nbsp;2&gamma;_d+X and ggF selection, for different &gamma;_d masses and a Higgs-like scalar with a mass of 800&nbsp;GeV. The limits are shown assuming an FRVZ signal model.

Observed limits at the 95% CL on the cross section for the process pp &rarr; H&rarr;&nbsp;4&gamma;_d+X and ggF selection, for different &gamma;_d masses and a Higgs-like scalar with a mass of 800&nbsp;GeV. The limits are shown for the 2&mu; search channel, assuming an FRVZ signal model.

Observed limits at the 95% CL on the cross section for the process pp &rarr; H&rarr;&nbsp;4&gamma;_d+X and ggF selection, for different &gamma;_d masses and a Higgs-like scalar with a mass of 800&nbsp;GeV. The limits are shown for the c+&mu; search channel, assuming an FRVZ signal model.

Observed limits at the 95% CL on the cross section for the process pp &rarr; H&rarr;&nbsp;4&gamma;_d+X and ggF selection, for different &gamma;_d masses and a Higgs-like scalar with a mass of 800&nbsp;GeV. The limits are shown for the 2c search channel, assuming an FRVZ signal model.

Comparison between data and background prediction before the fit (Pre-Fit) for the mass of the FCNC top-quark candidate in SR1. The uncertainty band includes both the statistical and systematic uncertainties in the background prediction. The four FCNC LH signals are also shown separately, normalized to five times the cross-section corresponding to the most stringent observed branching ratio limits. The first (last) bin in all distributions includes the underflow (overflow). The lower panels show the ratios of the data (Data) to the background prediction (Bkg.).

Comparison between data and background prediction before the fit (Pre-Fit) for the mass of the SM top-quark candidate in SR2. The uncertainty band includes both the statistical and systematic uncertainties in the background prediction. The four FCNC LH signals are also shown separately, normalized to five times the cross-section corresponding to the most stringent observed branching ratio limits. The first (last) bin in all distributions includes the underflow (overflow). The lower panels show the ratios of the data (Data) to the background prediction (Bkg.).

Comparison between data and background prediction before the fit (Pre-Fit) for the transverse momentum of the Z boson candidate in SR2. The uncertainty band includes both the statistical and systematic uncertainties in the background prediction. The four FCNC LH signals are also shown separately, normalized to five times the cross-section corresponding to the most stringent observed branching ratio limits. The first (last) bin in all distributions includes the underflow (overflow). The lower panels show the ratios of the data (Data) to the background prediction (Bkg.).

Comparison between data and background prediction after the fit to data (Post-Fit) for the FCNC tZu LH coupling extraction. The distribution is for the $D_{1}$ discriminant in the mass sideband CR1. The uncertainty band includes both the statistical and systematic uncertainties in the background prediction. The FCNC tZu LH signals are also separately shown, normalized to 500 times the best fit of the signal yield. The lower panels show the ratios of the data (Data) to the background prediction (Bkg.).

Comparison between data and background prediction after the fit to data (Post-Fit) for the FCNC tZu LH coupling extraction. The distribution is for the $D_{2}^{u}$ discriminant in the mass sideband CR2. The uncertainty band includes both the statistical and systematic uncertainties in the background prediction. The FCNC tZu LH signals are also separately shown, normalized to 500 times the best fit of the signal yield. The lower panels show the ratios of the data (Data) to the background prediction (Bkg.).

Comparison between data and background prediction after the fit to data (Post-Fit) for the FCNC tZu LH coupling extraction. The distribution is for the $D_{1}$ discriminant in SR1. The uncertainty band includes both the statistical and systematic uncertainties in the background prediction. The FCNC tZu LH signals are also separately shown, normalized to 50 times the best fit of the signal yield. The lower panels show the ratios of the data (Data) to the background prediction (Bkg.).

Comparison between data and background prediction after the fit to data (Post-Fit) for the FCNC tZu LH coupling extraction. The distribution is for the $D_{2}^{u}$ discriminant in SR2. The uncertainty band includes both the statistical and systematic uncertainties in the background prediction. The FCNC tZu LH signals are also separately shown, normalized to 50 times the best fit of the signal yield. The lower panels show the ratios of the data (Data) to the background prediction (Bkg.).

Comparison between data and background prediction after the fit to data (Post-Fit) for the FCNC tZc LH coupling extraction. The distribution is for the $D_{1}$ discriminant in the mass sideband CR1. The uncertainty band includes both the statistical and systematic uncertainties in the background prediction. The FCNC tZc LH signals are also separately shown, normalized to 500 times the best fit of the signal yield. The lower panels show the ratios of the data (Data) to the background prediction (Bkg.).

Comparison between data and background prediction after the fit to data (Post-Fit) for the FCNC tZc LH coupling extraction. The distribution is for the $D_{2}^{c}$ discriminant in the mass sideband CR2. The uncertainty band includes both the statistical and systematic uncertainties in the background prediction. The FCNC tZc LH signals are also separately shown, normalized to 500 times the best fit of the signal yield. The lower panels show the ratios of the data (Data) to the background prediction (Bkg.).

Comparison between data and background prediction after the fit to data (Post-Fit) for the FCNC tZc LH coupling extraction. The distribution is for the $D_{1}$ discriminant in SR1. The uncertainty band includes both the statistical and systematic uncertainties in the background prediction. The FCNC tZc LH signals are also separately shown, normalized to 50 times the best fit of the signal yield. The lower panels show the ratios of the data (Data) to the background prediction (Bkg.).

Comparison between data and background prediction after the fit to data (Post-Fit) for the FCNC tZc LH coupling extraction. The distribution is for the $D_{2}^{c}$ discriminant in SR2. The uncertainty band includes both the statistical and systematic uncertainties in the background prediction. The FCNC tZc LH signals are also separately shown, normalized to 50 times the best fit of the signal yield. The lower panels show the ratios of the data (Data) to the background prediction (Bkg.).

Comparison between data and background prediction after the fit to data (Post-Fit) for the FCNC tZu LH coupling extraction. The distribution is for the leading lepton $p_{T}$ in the $t\bar{t}$ CR. The uncertainty band includes both the statistical and systematic uncertainties in the background prediction. The FCNC tZu LH signals are also shown separately, normalized to $10^{3}$ times the best fit of the signal yield. The last bin includes the overflow. The lower panels show the ratios of the data (Data) to the background prediction (Bkg.).

Comparison between data and background prediction after the fit to data (Post-Fit) for the FCNC tZu LH coupling extraction. The distribution is for the third lepton $p_{T}$ in the $t\bar{t}$ CR. The uncertainty band includes both the statistical and systematic uncertainties in the background prediction. The FCNC tZu LH signals are also shown separately, normalized to $10^{3}$ times the best fit of the signal yield. The last bin includes the overflow. The lower panels show the ratios of the data (Data) to the background prediction (Bkg.).

Comparison between data and background prediction after the fit to data (Post-Fit) for the FCNC tZu LH coupling extraction. The distribution is for the leading lepton $p_{T}$ in the $t\bar{t}Z$ CR. The uncertainty band includes both the statistical and systematic uncertainties in the background prediction. The FCNC tZu LH signals are also shown separately, normalized to $10^{3}$ times the best fit of the signal yield. The last bin includes the overflow. The lower panels show the ratios of the data (Data) to the background prediction (Bkg.).

Comparison between data and background prediction after the fit to data (Post-Fit) for the FCNC tZu LH coupling extraction. The distribution is for the $D_{1}$ discriminant in the $t\bar{t}Z$ CR. The uncertainty band includes both the statistical and systematic uncertainties in the background prediction. The FCNC tZu LH signals are also shown separately, normalized to $10^{3}$ times the best fit of the signal yield. The lower panels show the ratios of the data (Data) to the background prediction (Bkg.).

Measured differential cross section as a function of observable $ p_{T}^{ll} - p_{T}^{\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll} + p_{T}^{\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll} + p_{T}^{\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ \Delta R (l,l)$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ \Delta R (l,l)$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ N_{jets}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ N_{jets}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{Jet1}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{Jet1}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{Jet2}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{Jet2}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{Jet2}/p_{T}^{Jet1}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{Jet2}/p_{T}^{Jet1}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ m_{jj}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ m_{jj}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ m_{ll\gamma j}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ m_{ll\gamma j}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ H_{T}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ H_{T}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{\gamma} / \sqrt{H_{T}}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{\gamma} / \sqrt{H_{T}}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ \Delta \phi (Jet,\gamma)$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ \Delta \phi (Jet,\gamma)$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma j}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma j}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ \phi_{CS}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ \phi_{CS}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ \cos \theta_{CS}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ \cos \theta_{CS}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma} / m_{ll\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma} / m_{ll\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma} / m_{ll\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma} / m_{ll\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma} / m_{ll\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma} / m_{ll\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll} - p_{T}^{\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll} - p_{T}^{\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll} - p_{T}^{\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll} - p_{T}^{\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll} - p_{T}^{\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll} - p_{T}^{\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma j}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma j}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma j}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma j}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma j}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma j}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{\gamma} / \sqrt{H_{T}}$ (Fig. 8 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{\gamma} / \sqrt{H_{T}}$ (Fig. 8 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ H_{T}$ (Fig. 8 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ H_{T}$ (Fig. 8 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ \Delta \phi (Jet,\gamma)$ (Fig. 8 (c))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ \Delta \phi (Jet,\gamma)$ (Fig. 8 (c))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ \Delta R (l,l)$ (Fig. 5 (d))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ \Delta R (l,l)$ (Fig. 5 (d))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll} - p_{T}^{\gamma}$ (Fig. 5 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll} - p_{T}^{\gamma}$ (Fig. 5 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll} - p_{T}^{\gamma} \textrm{ in bin } p_{T}^{ll} + p_{T}^{\gamma} < 200 GeV$ (Fig. 11 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll} - p_{T}^{\gamma} \textrm{ in bin } p_{T}^{ll} + p_{T}^{\gamma} < 200 GeV$ (Fig. 11 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll} - p_{T}^{\gamma} \textrm{ in bin } 200 GeV < p_{T}^{ll} + p_{T}^{\gamma} < 300 GeV$ (Fig. 11 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll} - p_{T}^{\gamma} \textrm{ in bin } 200 GeV < p_{T}^{ll} + p_{T}^{\gamma} < 300 GeV$ (Fig. 11 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll} - p_{T}^{\gamma} \textrm{ in bin } p_{T}^{ll} + p_{T}^{\gamma} > 300 GeV$ (Fig. 11 (c))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll} - p_{T}^{\gamma} \textrm{ in bin } p_{T}^{ll} + p_{T}^{\gamma} > 300 GeV$ (Fig. 11 (c))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ m_{jj}$ (Fig. 7 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ m_{jj}$ (Fig. 7 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ m_{ll\gamma j}$ (Fig. 7 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ m_{ll\gamma j}$ (Fig. 7 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ N_{jets}$ (Fig. 6 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ N_{jets}$ (Fig. 6 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{Jet1}$ (Fig. 6 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{Jet1}$ (Fig. 6 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{Jet2}$ (Fig. 6 (c))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{Jet2}$ (Fig. 6 (c))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{Jet2}/p_{T}^{Jet1}$ (Fig. 6 (d))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{Jet2}/p_{T}^{Jet1}$ (Fig. 6 (d))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll}$ (Fig. 5 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll}$ (Fig. 5 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma j}$ (Fig. 8 (d))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma j}$ (Fig. 8 (d))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma j} \textrm{ in bin } p_{T}^{ll\gamma} < 50 GeV$ (Fig. 12 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma j} \textrm{ in bin } p_{T}^{ll\gamma} < 50 GeV$ (Fig. 12 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma j} \textrm{ in bin } 50 GeV < p_{T}^{ll\gamma} < 75 GeV$ (Fig. 12 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma j} \textrm{ in bin } 50 GeV < p_{T}^{ll\gamma} < 75 GeV$ (Fig. 12 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma j} \textrm{ in bin } p_{T}^{ll\gamma} > 75 GeV$ (Fig. 12 (c))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma j} \textrm{ in bin } p_{T}^{ll\gamma} > 75 GeV$ (Fig. 12 (c))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma} / m_{ll\gamma} \textrm{ in bin } 125 GeV < m_{ll\gamma} < 200 GeV$ (Fig. 10 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma} / m_{ll\gamma} \textrm{ in bin } 125 GeV < m_{ll\gamma} < 200 GeV$ (Fig. 10 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma} / m_{ll\gamma} \textrm{ in bin } 200 GeV < m_{ll\gamma} < 300 GeV$ (Fig. 10 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma} / m_{ll\gamma} \textrm{ in bin } 200 GeV < m_{ll\gamma} < 300 GeV$ (Fig. 10 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma} / m_{ll\gamma} \textrm{ in bin } m_{ll\gamma} > 300 GeV$ (Fig. 10 (c))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma} / m_{ll\gamma} \textrm{ in bin } m_{ll\gamma} > 300 GeV$ (Fig. 10 (c))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll} + p_{T}^{\gamma}$ (Fig. 5 (c))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll} + p_{T}^{\gamma}$ (Fig. 5 (c))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ \cos \theta_{CS}$ (Fig. 9 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ \cos \theta_{CS}$ (Fig. 9 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ \phi_{CS}$ (Fig. 9 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ \phi_{CS}$ (Fig. 9 (a))

Probability of finding at least one TAR jet, where the p_T-leading TAR jet passes the m_Wcand and D₂^&beta;=1 requirements, as a function of m_s. The probability is determined in a sample of signal events with m_Z'=2100 GeV, with the preselections applied.

Probability of finding a W_had candidate reconstructed as a pair of R=0.4 PFlow jets, as a function of m_s. The probability is determined in a sample of signal events with m_Z'=500 GeV, with the preselections applied that do not pass the requirements of the merged category.

Probability of finding a W_had candidate reconstructed as a pair of R=0.4 PFlow jets, as a function of m_s. The probability is determined in a sample of signal events with m_Z'=1000 GeV, with the preselections applied that do not pass the requirements of the merged category.

Probability of finding a W_had candidate reconstructed as a pair of R=0.4 PFlow jets, as a function of m_s. The probability is determined in a sample of signal events with m_Z'=1700 GeV, with the preselections applied that do not pass the requirements of the merged category.

Probability of finding a W_had candidate reconstructed as a pair of R=0.4 PFlow jets, as a function of m_s. The probability is determined in a sample of signal events with m_Z'=2100 GeV, with the preselections applied that do not pass the requirements of the merged category.

Observed exclusion contour at 95&#37; C.L. for the dark Higgs model in the (m_Z', m_s) plane for g_q=0.25, g_&chi;=1, m_&chi;=200 GeV, and sin&theta;=0.01.

Expected exclusion contour at 95&#37; C.L. for the dark Higgs model in the (m_Z', m_s) plane for g_q=0.25, g_&chi;=1, m_&chi;=200 GeV, and sin&theta;=0.01.

Expected+1&sigma; exclusion contour at 95&#37; C.L. for the dark Higgs model in the (m_Z', m_s) plane for g_q=0.25, g_&chi;=1, m_&chi;=200 GeV, and sin&theta;=0.01.

Expected-1&sigma; exclusion contour at 95&#37; C.L. for the dark Higgs model in the (m_Z', m_s) plane for g_q=0.25, g_&chi;=1, m_&chi;=200 GeV, and sin&theta;=0.01.

Expected+2&sigma; exclusion contour at 95&#37; C.L. for the dark Higgs model in the (m_Z', m_s) plane for g_q=0.25, g_&chi;=1, m_&chi;=200 GeV, and sin&theta;=0.01.

Expected-2&sigma; exclusion contour at 95&#37; C.L. for the dark Higgs model in the (m_Z', m_s) plane for g_q=0.25, g_&chi;=1, m_&chi;=200 GeV, and sin&theta;=0.01.

Observed upper limits at 95&#37; C.L. on &sigma;(pp &rarr; s &chi;&chi;) &times; B(s &rarr; W^&pm; W^&mp;) for m_Z'=0.5 TeV as a function of m_s. The expected limits, varied up and down by one and two standard deviations, are shown as green and yellow bands, respectively. The observed and expected limits are compared to the theoretical LO cross section for the &sigma;(pp &rarr; s &chi;&chi;) &times; B(s &rarr; W^&pm; W^&mp;) process for m_Z'=0.5 TeV, shown in dashed blue.

Observed upper limits at 95&#37; C.L. on &sigma;(pp &rarr; s &chi;&chi;) &times; B(s &rarr; W^&pm; W^&mp;) for m_Z'=1 TeV as a function of m_s. The expected limits, varied up and down by one and two standard deviations, are shown as green and yellow bands, respectively. The observed and expected limits are compared to the theoretical LO cross section for the &sigma;(pp &rarr; s &chi;&chi;) &times; B(s &rarr; W^&pm; W^&mp;) process for m_Z'=1 TeV, shown in dashed blue.

Observed upper limits at 95&#37; C.L. on &sigma;(pp &rarr; s &chi;&chi;) &times; B(s &rarr; W^&pm; W^&mp;) for m_Z'=1.7 TeV as a function of m_s. The expected limits, varied up and down by one and two standard deviations, are shown as green and yellow bands, respectively. The observed and expected limits are compared to the theoretical LO cross section for the &sigma;(pp &rarr; s &chi;&chi;) &times; B(s &rarr; W^&pm; W^&mp;) process for m_Z'=1.7 TeV, shown in dashed blue.

Observed upper limits at 95&#37; C.L. on &sigma;(pp &rarr; s &chi;&chi;) &times; B(s &rarr; W^&pm; W^&mp;) for m_Z'=2.1 TeV as a function of m_s. The expected limits, varied up and down by one and two standard deviations, are shown as green and yellow bands, respectively. The observed and expected limits are compared to the theoretical LO cross section for the &sigma;(pp &rarr; s &chi;&chi;) &times; B(s &rarr; W^&pm; W^&mp;) process for m_Z'=2.1 TeV, shown in dashed blue.

Data overlaid on SM background yields stacked in each SR and CR category after the fit to data ('Post-fit'). The yields in the SR are broken down into their contributions to the individual bins. The maximum-likelihood estimators are set to the conditional values of the CR-only fit, and propagated to SR and CRs.

Dominant sources of uncertainty for three dark Higgs scenarios after the fit to data. The uncertainties are quantified in terms of their contribution to the fitted signal uncertainty that is expressed relative to the theory prediction. Three representative dark Higgs signal scenarios with g_q=0.25, g_&chi;=1.0, sin&theta;=0.01 and m_&chi;=200 GeV are considered, which are indicated using the (m_Z', m_s) format in units of GeV in the table columns.

Cumulative efficiencies in the merged category for three representative dark Higgs signal scenarios with g_q=0.25, g_&chi;=1.0, sin&theta;=0.01, m_Z' = 1 TeV, and m_&chi;=200 GeV considering s&rarr;W(&ell;&nu;)W(qq) decays only.

Cumulative efficiencies in the resolved category for three representative dark Higgs signal scenarios with g_q=0.25, g_&chi;=1.0, sin&theta;=0.01, m_Z' = 1 TeV, and m_&chi;=200 GeV considering s&rarr;W(&ell;&nu;)W(qq) decays only.

Theoretical cross section for &sigma;(pp &rarr; s&chi;&chi;) &times; B(s &rarr; W^&plusmn;W^&#8723;) for each of the dark Higgs signal points at m_Z′ ={300, 350, 400, 500, 750} GeV, with g_q = 0.25, g<sub>&chi; = 1.0, sin&theta; = 0.01, m_Z′ = 1 TeV , and m_&chi; = 200 GeV. Also shown are experimentally excluded cross sections of &sigma;(pp &rarr; s&chi;&chi;) &times; B(s &rarr; W^&plusmn;W^&#8723;) (Obs.) together with the expectations (Exp.) varied up and down by one standard deviation (&plusmn;1&sigma;).

Theoretical cross section for &sigma;(pp &rarr; s&chi;&chi;) &times; B(s &rarr; W^&plusmn;W^&#8723;) for each of the dark Higgs signal points at m_Z′ ={1000, 1700} GeV, with g_q = 0.25, g<sub>&chi; = 1.0, sin&theta; = 0.01, m_Z′ = 1 TeV , and m_&chi; = 200 GeV. Also shown are experimentally excluded cross sections of &sigma;(pp &rarr; s&chi;&chi;) &times; B(s &rarr; W^&plusmn;W^&#8723;) (Obs.) together with the expectations (Exp.) varied up and down by one standard deviation (&plusmn;1&sigma;).

Theoretical cross section for &sigma;(pp &rarr; s&chi;&chi;) &times; B(s &rarr; W^&plusmn;W^&#8723;) for each of the dark Higgs signal points at m_Z′ ={2100, 2500, 2900, 3300} GeV, with g_q = 0.25, g<sub>&chi; = 1.0, sin&theta; = 0.01, m_Z′ = 1 TeV , and m_&chi; = 200 GeV. Also shown are experimentally excluded cross sections of &sigma;(pp &rarr; s&chi;&chi;) &times; B(s &rarr; W^&plusmn;W^&#8723;) (Obs.) together with the expectations (Exp.) varied up and down by one standard deviation (&plusmn;1&sigma;).

Distribution of ${E}_{T}^{miss}$ after the fit of the multijet backgrounds, in the electron channel, in the $t\bar{t}$ 3-jets VR, without applying the cut on ${E}_{T}^{miss}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of ${E}_{T}^{miss}$ after the fit of the multijet backgrounds, in the electron channel, in the $t\bar{t}$ 4-jets VR, without applying the cut on ${E}_{T}^{miss}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of $m_{T}^{W}$ after the fit of the multijet backgrounds, in the muon channel, in the signal region, without applying the cut on $m_{T}^{W}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of $m_{T}^{W}$ after the fit of the multijet backgrounds, in the muon channel, in the $W$+jets VR, without applying the cut on $m_{T}^{W}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of $m_{T}^{W}$ after the fit of the multijet backgrounds, in the muon channel, in the $t\bar{t}$ 3-jets VR, without applying the cut on $m_{T}^{W}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of $m_{T}^{W}$ after the fit of the multijet backgrounds, in the muon channel, in the $t\bar{t}$ 4-jets VR, without applying the cut on $m_{T}^{W}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Expected distributions of the MEM discriminant $P(S|X)$ in the SR, for the s-channel single-top signal, and for the $t\bar{t}$ and $W$+jets backgrounds, for MEM discriminant values larger than $2.0\times10^{-4}$. Each distribution is normalised to unity. The binning is the same as the optimised binning used in the signal extraction fit, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the $W$+jets VR. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit presented in Section 5 in the paper. The uncertainty band indicates the simulation's statistical uncertainty and the normalisation uncertainties for the various processes in each bin, summed in quadrature. The ratio of the observed number to the predicted number of events in each bin is shown in the lower panel of the figure, with different vertical axis ranges. The binning is the same as the optimised binning used in the signal extraction fit described in Section 8 in the paper, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the $t\bar{t}$ 3-jets VR. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit presented in Section 5 in the paper. The uncertainty band indicates the simulation's statistical uncertainty and the normalisation uncertainties for the various processes in each bin, summed in quadrature. The ratio of the observed number to the predicted number of events in each bin is shown in the lower panel of the figure, with different vertical axis ranges. The binning is the same as the optimised binning used in the signal extraction fit described in Section 8 in the paper, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the $t\bar{t}$ 4-jets VR. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit presented in Section 5 in the paper. The uncertainty bands indicate the simulation's statistical uncertainty and the normalisation uncertainties for the various processes in each bin, summed in quadrature. The ratio of the observed number to the predicted number of events in each bin is shown in the lower panel of the figure, with different vertical axis ranges. The binning is the same as the optimised binning used in the signal extraction fit described in Section 8 in the paper, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the SR before the fit to data, for MEM discriminant values larger than $2.0\times10^{-4}$. The lower panel of the figure shows the ratio of the data to the prediction, with different vertical axis ranges. The uncertainty band indicates the total uncertainties and their correlations in each bin. The uncertainties in the $t\bar{t}$ and $W$+jets normalisation factors, as well as in the s-channel signal cross-section, are not defined pre-fit and therefore not included. The binning is the same as the optimised binning used in the fit, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the SR after the fit to data, for MEM discriminant values larger than $2.0\times10^{-4}$. The lower panel of the figure shows the ratio of the data to the prediction, with different vertical axis ranges. The uncertainty band indicates the total uncertainties and their correlations in each bin. The binning is the same as the optimised binning used in the fit, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the SR after the fit to data, for MEM discriminant values larger than $2.0\times10^{-4}$, after subtraction of all backgrounds. The fitted distribution for the simulation of the signal is shown together with the post-fit uncertainty in the backgrounds. The binning is the same as the optimised binning used in the fit, resulting in a non-linear horizontal scale.

Pre-fit and post-fit event yields in the SR, for MEM discriminant values larger than $2.0\times10^{-4}$. The central value of the event yield for each process is calculated by summing the values of the discriminant bin contents, using the nominal expected yield for the pre-fit value, and the best-fit estimate for the post-fit value. The error includes statistical and systematic uncertainties summed in quadrature. All sources of systematic uncertainties are included, taking into account correlations and anti-correlations in the post-fit case. The uncertainties in the $t\bar{t}$ and $W$+jets normalisation factors, as well as in the s-channel signal cross-section, are not defined pre-fit and therefore only included in the post-fit uncertainties.

Observed impact of the different sources of uncertainty on the measured s-channel signal cross-section, grouped by categories. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. The 'Systematic uncertainties' category combines all sources of systematic uncertainties. The statistical uncertainty is obtained by repeating the fit after having fixed all nuisance parameters, including the $t\bar{t}$ and $W$+jets normalisation factors. 'Total' gives the total uncertainty on the measurement.

Observed impact of the different sources of $t\bar{t}$ modelling uncertainty on the measured s-channel signal cross-section. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. 'PS & had.' refers to the parton shower and hadronisation model, and 'ME/PS matching' to the matching of the ME to the parton shower.

Observed impact of the different sources of s-channel modelling uncertainty on the measured s-channel signal cross-section. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. 'PS & had.' refers to the parton shower and hadronisation model, as described in Section 7 in the paper.

Observed impact of the different sources of t-channel modelling uncertainty on the measured s-channel signal cross-section. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. 'PS & had.' refers to the parton shower and hadronisation model, as described in Section 7 in the paper.

Observed impact of the different sources of $tW$ modelling uncertainty on the measured s-channel signal cross-section, grouped by categories. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. 'PS & had.' refers to the parton shower and hadronisation model, and '$t\bar{t}$ overlap' to the algorithm removing the overlap between $tW$ and $t\bar{t}$ production at NLO, as described in Section 7 in the paper.

Observed impact of the different sources of PDF uncertainties on the measured s-channel signal cross-section, grouped by categories. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root.

Comparison between data and prediction after the fit to data in the signal region for the leading-jet $p_{T}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the leading-jet $\eta$. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the subleading-jet $p_{T}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the subleading-jet $\eta$. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the lepton $p_{T}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the lepton $\eta$. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the ${E}_{T}^{miss}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the $m_{T}^{W}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Nuisance parameters ranked according to their post-fit impacts on the best-fit value of the ratio $\mu$ of the measured cross-section to the predicted cross-section. In the figure, only the 20 nuisance parameters with the largest post-fit impacts are shown. The empty (solid) blue rectangles illustrate the pre-fit (post-fit) impact on $\mu$, corresponding to the upper axis. The pre-fit (post-fit) impact of each nuisance parameter, $\Delta\mu$, is calculated as the difference in the fitted value of $\mu$ between the nominal fit and the fit when fixing the corresponding nuisance parameter to $\hat{\theta}\pm\Delta\theta$ ($\hat{\theta}\pm\Delta\hat{\theta}$), where $\hat{\theta}$ is the best-fit value of the nuisance parameter and $\Delta\theta$ ($\Delta\hat{\theta}$) is its pre-fit (post-fit) uncertainty. Several systematic uncertainties are split into different nuisance parameters, which are indicated by NP. JES (JER) indicates jet energy scale (resolution), and $\gamma$ indicates a nuisance parameter associated to the MC statistics in one of the 18 bins numbered from 0 to 17. The black points show the best-fit values of the nuisance parameters, with the error bars representing the post-fit uncertainties. Each nuisance parameter is shown wrt. its nominal value, $\theta_0$, and in units of its pre-fit uncertainty, except the free-floating normalisation factors of the $t\bar{t}$ and $W$+jets backgrounds, and the parameters associated to the MC statistics in each bin, for which the post-fit values and uncertainties are shown.

Correlation matrix of the nuisance parameters and of the ratio $\mu$ of the measured cross-section to the predicted cross-section. The correlations are given after the fit to data. In the figure, only the parameters which have a correlation of at least 0.2 with any other parameter are shown.

Distribution of the MEM discriminant $P(S|X)$ in the SR for MEM discriminant values larger than $2.0\times10^{-4}$, for the collision data used for the measurement, and for 1000 pseudo-data replicas, generated using a bootstrapping technique, in order to assess the statistical correlations between this measurement and others, for the purpose of combinations. The replicas are obtained by reweighting each observed data event by a random integer generated according to Poisson statistics, using the <a href="https://zenodo.org/record/5361038">BootstrapGenerator</a> software package , which implements a technique described in <a href="https://cds.cern.ch/record/2759945/">ATL-PHYS-PUB-2021-011</a>. The ATLAS event number and run number of each event are used as seed to uniquely but reproducibly initialise the random number generator for each event. Each pseudo-data replica is assigned an index, ranging from 0 to 999, corresponding to the random number index used consistently for each observed data event.

Measured values of the signal cross-section and of the $t\bar{t}$ and $W$+jets normalisation factors, obtained by statistical-only fits to the collision data used for the measurement, and to 1000 pseudo-data replicas, generated using a bootstrapping technique, in order to assess the statistical correlations between this measurement and others, for the purpose of combinations. The central values and their statistical uncertainties are obtained by repeating the fit after having fixed all nuisance parameters, except the $t\bar{t}$ and $W$+jets normalisation factors, which are let free-floating (unlike for the statistical uncertainty on the cross-section quoted in the paper). The replicas are obtained by reweighting each observed data event by a random integer generated according to Poisson statistics, using the <a href="https://zenodo.org/record/5361038">BootstrapGenerator</a> software package , which implements a technique described in <a href="https://cds.cern.ch/record/2759945/">ATL-PHYS-PUB-2021-011</a>. The ATLAS event number and run number of each event are used as seed to uniquely but reproducibly initialise the random number generator for each event. Each pseudo-data replica is assigned an index, ranging from 0 to 999, corresponding to the random number index used consistently for each observed data event.

Normalisation factors for the major background processes and ttW ($\Delta \eta < 0$) from the fit using only statistical uncertainties (fixing Nuisance Parameters (NP) to their fitted values) to data in all analysis regions.

Normalisation factors for the major background processes and ttW ($\Delta \eta < 0$) from the fit using using both statistical and systematic uncertainties to data in all analysis regions.

Correlation matrix between the Normalisation Factors in the fit using only statistical uncertainties (fixing Nuisance Parameters (NP) to their fitted values) to data in all analysis regions.

The most relevant systematic uncertainties ranked by their impact on the leptonic charge asymmetry ($A_c^{\ell}$) parameter at reconstructed level. The impact of the uncertainties is shown before and after the combined profile-likelihood fit to data in the signal and control regions. Pulls introduced by the fitting procedure are also shown. The entries shown in bold are the uncertainties of the freely floating background normalisations. ME stands for "matrix element", PS for "parton shower" and JER for "jet energy resolution". The gamma-uncertainties refer to the MC statistical uncertainties in a specific region and bin.

The most relevant systematic uncertainties ranked by their impact on the ttW Normalisation Factor ($\Delta \eta < 0$) parameter at reconstructed level. The impact of the uncertainties is shown before and after the combined profile-likelihood fit to data in the signal and control regions. Pulls introduced by the fitting procedure are also shown. ME stands for "matrix element", PS for "parton shower" and JER for "jet energy resolution". The gamma-uncertainties refer to the MC statistical uncertainties in a specific region and bin.

The predicted and observed numbers of events in the control and signal regions. The predictions are shown before the fit to data. The indicated uncertainties consider statistical as well as all experimental and theoretical systematic uncertainties. Background categories with event yields with a value of 1.0e-6 have a negligible contribution to the region and are manually set to that value.

The predicted and observed numbers of events in the control and signal regions. The predictions are shown after the fit to data. The indicated uncertainties consider statistical as well as all experimental and theoretical systematic uncertainties. Background categories with event yields with a value of 1.0e-6 have a negligible contribution to the region and are manually set to that value.

Pre-fit comparison between data and background in the baseline SR for two of the variables used as input for the BSM pBDT: HT.

Data and post-fit background comparison for the distributions of the discriminant variables fitted in the control regions obtained with the background-only fit: CR HF e.

Data and post-fit background comparison for the distributions of the discriminant variables fitted in the control regions obtained with the background-only fit: CR HF mu.

Data and post-fit background comparison for the distributions of the discriminant variables fitted in the control regions obtained with the background-only fit: CR Conv.

Data and post-fit background comparison for the distributions of the discriminant variables fitted in the control regions obtained with the background-only fit: CR ttW.

Data and post-fit background comparison for the distributions of the discriminant variables fitted in the control regions obtained with the background-only fit: CR lowBDT.

Data and post-fit background comparison obtained with the background-only fit in the validation region defined for ttW+jets events: number of jets.

Data and post-fit background comparison obtained with the background-only fit in the validation region defined for ttW+jets events: SM BDT.

Data and post-fit background comparison obtained with the background-only fit to the BSM SR for the BSM pBDT distribution used for mH = 400 GeV.

Data and post-fit background comparison obtained with the background-only fit to the BSM SR for the BSM pBDT distribution used for mH = 1000 GeV.

Observed (black solid line) and expected (black dashed line) 95% CL upper limits on the ttH/A cross-section times branching fraction of H/A->tt as a function of mH/A.

Observed (red line) and expected (black dashed line) exclusion regions at 95% CL in the tan(beta) versus mass plane assuming that both, a heavy scalar H and pseudo-scalar A, contribute to the tttt final state and have the same mass mH=mA.

Observed (red line) and expected (black dashed line) exclusion regions at 95% CL in the tan(beta) versus mass plane assuming that only the scalar H contributes to the tttt final state.

Data and post-fit background comparison obtained with the background-only fit to the BSM SR for the BSM pBDT distribution used for mH = 500 GeV.

Data and post-fit background comparison obtained with the background-only fit to the BSM SR for the BSM pBDT distribution used for mH = 600 GeV.

Data and post-fit background comparison obtained with the background-only fit to the BSM SR for the BSM pBDT distribution used for mH = 700 GeV.

Data and post-fit background comparison obtained with the background-only fit to the BSM SR for the BSM pBDT distribution used for mH = 800 GeV.

Data and post-fit background comparison obtained with the background-only fit to the BSM SR for the BSM pBDT distribution used for mH = 900 GeV.

Observed (red line) and expected (black dashed line) exclusion regions at 95% CL in the tan(beta) versus mass plane assuming that only the pseudo-scalar A contributes to the tttt final state.

The product of acceptance and efficiency (A×ε), defined as the number of signal events satisfying the full set of selection criteria of the BSM SR, divided by the total number of generated signal events, for the tt̄H(→ tt̄ ) process in a type-II 2HDM for tanβ = 1 for the different heavy Higgs mass hypotheses.

Electron $p_{T}$ distribution using 2016-2018 data sets. The complete set of selection criteria were applied. Two examples of SSM WPRIME boson signal samples with masses of 3.8 and 5.6 TeV are shown. The lower panel shows the ratio of data to SM prediction, and the shaded band represents the systematic uncertainties.

$p_{T}^{miss}$ distribution in the electron channel using 2016-2018 data sets. The complete set of selection criteria were applied. Two examples of SSM WPRIME boson signal samples with masses of 3.8 and 5.6 TeV are shown. The lower panel shows the ratio of data to SM prediction, and the shaded band represents the systematic uncertainties.

Muon $p_T$ distribution using 2016-2018 data sets. The complete set of selection criteria were applied. Two examples of SSM WPRIME boson signal samples with masses of 3.8 and 5.6 TeV are shown. The lower panel shows the ratio of data to SM prediction, and the shaded band represents the systematic uncertainties.

$p_T^{miss}$ distribution in the muon channel using 2016-2018 data sets. The complete set of selection criteria were applied. Two examples of SSM WPRIME boson signal samples with masses of 3.8 and 5.6 TeV are shown. The lower panel shows the ratio of data to SM prediction, and the shaded band represents the systematic uncertainties.

$M_T$ distribution for the E+INVISIBLE system using 2016-2018 data sets. The complete set of selection criteria were applied. Two examples of SSM WPRIME boson signal samples with masses of 3.8 and 5.6 TeV are shown. The lower panel shows the ratio of data to SM prediction, and the shaded band represents the systematic uncertainties.

$M_T$ distribution for the MU+INVISIBLE system using 2016-2018 data sets. The complete set of selection criteria were applied. Two examples of SSM WPRIME boson signal samples with masses of 3.8 and 5.6 TeV are shown. The lower panel shows the ratio of data to SM prediction, and the shaded band represents the systematic uncertainties.

Theoretical prediction for the production and decay cross-section of SSM WPRIME bosons (W --> LEPTON + NU) as a function of the WPRIME mass, for the range 200-6400 GeV and inclusive in phase-space (no cuts). The uncertainty shown covers PDF and ALPHAS uncertainties. These theoretical predictions are obtained with PYTHIA (LO) and corrected to NNLO in QCD using FEWZ program.

Observed (solid line) and expected (dashed line) upper limits at 95% CL on the product of WPRIME cross-section production and BF(WPRIME --> LEPTON + NU) for an SSM WPRIME boson, as a function of the boson mass, for the electron decay channel. The shaded bands represent the one (green) and two (yellow) standard deviation uncertainty bands for the expected limits. The theoretical predictions for the SSM at NNLO precision in QCD are shown with narrow gray bands corresponding to the PDF and ALPHAS uncertainties.

Observed (solid line) and expected (dashed line) upper limits at 95% CL on the product of WPRIME cross-section production and BF(WPRIME --> LEPTON + NU) for an SSM WPRIME boson, as a function of the boson mass, for the muon decay channel. The shaded bands represent the one (green) and two (yellow) standard deviation uncertainty bands for the expected limits. The theoretical predictions for the SSM at NNLO precision in QCD are shown with narrow gray bands corresponding to the PDF and ALPHAS uncertainties.

Observed (solid line) and expected (dashed line) upper limits at 95% CL on the product of WPRIME cross-section production and BF(WPRIME --> LEPTON + NU) for an SSM WPRIME boson, as a function of the boson mass, for the combined electron and muon decay channels. The shaded bands represent the one (green) and two (yellow) standard deviation uncertainty bands for the expected limits. The theoretical predictions for the SSM at NNLO precision in QCD are shown with narrow gray bands corresponding to the PDF and ALPHAS uncertainties.

The 95% CL observed (solid line) and expected (dashed line) model independent cross section upper limits as function of the $MT_{min}$ threshold, for the electron decay channel. The shaded bands represent the one (green) and two (yellow) standard deviation uncertainty bands for the expected limits.

The 95% CL observed (solid line) and expected (dashed line) model independent cross section upper limits as function of the $MT_{min}$ threshold, for the muon decay channel. The shaded bands represent the one (green) and two (yellow) standard deviation uncertainty bands for the expected limits.

The 95% CL observed (solid line) and expected (dashed line) model independent cross section upper limits as function of the $MT_{min}$ threshold, for the combined electron and muon decay channels. The shaded bands represent the one (green) and two (yellow) standard deviation uncertainty bands for the expected limits.

Observed (solid line) and expected (dashed line) upper limits at 95% CL on the coupling strength ratio, gWprime/gW as a function of the mass of the WPRIME boson, for the electron channel. The one (green) and two (yellow) standard deviation uncertainty bands for the expected limits are shown. The area above the limit curve is excluded. The dotted line represents the case of SSM coupling, gWprime, being equal to gW, the SM coupling.

Observed (solid line) and expected (dashed line) upper limits at 95% CL on the coupling strength ratio, gWprime/gW, as a function of the mass of the WPRIME boson, for the muon channel. The one (green) and two (yellow) standard deviation uncertainty bands for the expected limits are shown. The area above the limit curve is excluded. The dotted line represents the case of SSM coupling, gWprime , being equal to gW, the SM coupling.

Exclusion limits in the 2D plane (1/R, $\mu$) for the split-UED interpretation for the n = 2 case, for the electron channel for the 2016-2018 data sets. R is the radius of the additional spatial dimension and $\mu$ the bulk mass for the fermion field in five dimensions. The expected limit is depicted as a black dashed line. The one (green) and two (yellow) standard deviation uncertainty bands for the expected limits are shown. The experimentally excluded region is the entire area to the left of the solid black line.

Exclusion limits in the 2D plane (1/R, $\mu$) for the split-UED interpretation for the n = 2 case, for the muon channel for the 2016-2018 data sets. R is the radius of the additional spatial dimension and $\mu$ the bulk mass for the fermion field in five dimensions. The expected limit is depicted as a black dashed line. The one (green) and two (yellow) standard deviation uncertainty bands for the expected limits are shown. The experimentally excluded region is the entire area to the left of the solid black line.

Exclusion limits in the 2D plane (1/R, $\mu$) for the split-UED interpretation for the n = 2 case, for the combined electron and muon channels for the 2016-2018 data sets. R is the radius of the additional spatial dimension and $\mu$ the bulk mass for the fermion field in five dimensions. The expected limit is depicted as a black dashed line. The one (green) and two (yellow) standard deviation uncertainty bands for the expected limits are shown. The experimentally excluded region is the entire area to the left of the solid black line.

Observed (solid line) and expected (dashed line) upper limits at 95% CL on the ${\lambda}_{231}$ coupling in the RPV SUSY model with a STAU mediator, as a function of the mass of STAU, for the electron channel and for the production coupling, ${\lambda}^{'}_{3ij}$=0.5 . The couplings ${\lambda}^{'}_{3ij}$, ${\lambda}_{231}$, and ${\lambda}_{132}$ are defined in Fig. 1. The one (green) and two (yellow) standard deviation uncertainty bands for the expected limits are shown. The area above the limit curve is excluded. Limits for other values of ${\lambda}^{'}_{3ij}$ are obtained multiplying the ones shown by the ratio ${\lambda}^{'}_{3ij}$/0.5

Observed (solid line) and expected (dashed line) upper limits at 95% CL on the ${\lambda}_{132}$ coupling in the RPV SUSY model with a stau mediator, as a function of the mass of the stau, for the muon channel and for the production coupling, ${\lambda}^{'}_{3ij}$ = 0.5 . The couplings ${\lambda}^{'}_{3ij}$, ${\lambda}_{231}$, and ${\lambda}_{132}$ are defined in Fig. 1. The one (green) and two (yellow) standard deviation uncertainty bands for the expected limits are shown. The area above the limit curve is excluded. Limits for other values of ${\lambda}^{'}_{3ij}$ are obtained multiplying these ones by the ratio ${\lambda}^{'}_{3ij}$/0.5

Region in the oblique (W,Y) parameter phase space allowed by the current analysis at 95% CL. The combination of the electron and muon channel distributions from the 2017 and 2018 data sets at sqrt(s) = 13 TeV is used, having 101 fb-1 of luminosity.

Negative Log-Likelihood for the determination of the oblique W parameter, for the combination of the electron and muon channel and for 2017 and 2018 data sets (L=101 fb-1) at sqrt(s) = 13 TeV.

Total background estimate and observed data in all bins used in the limit calculation for the SSM WPRIME limits. The total event sample is split into the three years of data taking and the two lepton flavors.The distributions being shown are $M_T$ ones. The associated integrated luminosities for each year are of 35.9, 41.5, and 59.4 fb$̣^{-1}. The mass bins are numbered in ascending order.