Observed charged particle multiplicity distribution in different pseudorapidity bins. The first quoted uncertainty is statistical and the second systematic.

Observed charged particle multiplicity distribution in different transversal momentum bins. The first quoted uncertainty is statistical and the second systematic.

Vertex-level efficiency if no re-tracking is performed, as a function of the vertex radial position for an RPV SUSY model of squark production with $\tilde{q}\to q[\tilde{\chi}_1^0\to\mu qq]$, where $m(\tilde{q}) = 700$ GeV, $m(\tilde{\chi}_1^0) = 494$ GeV and $c\tau(\tilde{\chi}_1^0)$ = 175 mm. The result with re-tracking is tabulated in http://hepdata.cedar.ac.uk/view/ins1362183/d1.

Upper limits (95% CL) on the number of DV+muon displaced vertices in 20.3 fb$^{-1}$ and the corresponding vertex-level efficiencies (from Auxiliary Figure 7a) for four RPV SUSY models as a function of the $\tilde{\chi}_1^0$ proper decay distance $c\tau$. The models consider squark or gluino pair production, with masses in GeV as indicated, with either $\tilde{q}\to q[\tilde{\chi}_1^0\to\mu qq]$ or $\tilde{g}\to qq[\tilde{\chi}_1^0\to\mu qq]$ decays, respectively.

Upper limits (95% CL) on the number of DV+muon displaced vertices in 20.3 fb$^{-1}$ and the corresponding vertex-level efficiencies (from Auxiliary Figure 7b) for four RPV SUSY models as a function of the $\tilde{\chi}_1^0$ proper decay distance $c\tau$. The models consider squark or gluino pair production, with masses in GeV as indicated, with either $\tilde{q}\to q\tilde{\chi}_1^0$ or $\tilde{g}\to qq\tilde{\chi}_1^0$ decays, respectively.

Upper limits (95% CL) on the number of DV+electron displaced vertices in 20.3 fb$^{-1}$ and the corresponding vertex-level efficiencies (from Auxiliary Figure 7c) for four RPV SUSY models as a function of the $\tilde{\chi}_1^0$ proper decay distance $c\tau$. The models consider squark or gluino pair production, with masses in GeV as indicated, with either $\tilde{q}\to q[\tilde{\chi}_1^0\to e qq]$ or $\tilde{g}\to qq[\tilde{\chi}_1^0\to e qq]$ decays, respectively.

Upper limits (95% CL) on the number of DV+electron displaced vertices in 20.3 fb$^{-1}$ and the corresponding vertex-level efficiencies (from Auxiliary Figure 7d) for four RPV SUSY models as a function of the $\tilde{\chi}_1^0$ proper decay distance $c\tau$. The models consider squark or gluino pair production, with masses in GeV as indicated, with either $\tilde{q}\to q\tilde{\chi}_1^0$ or $\tilde{g}\to qq\tilde{\chi}_1^0$ decays, respectively.

Upper limits (95% CL) on the number of dilepton $e^+e^-$ displaced vertices in 20.3 fb$^{-1}$ and the corresponding vertex-level efficiencies (from Auxiliary Figure 5a) for four RPV SUSY models as a function of the $\tilde{\chi}_1^0$ proper decay distance $c\tau$. The models consider gluino pair production, with $\tilde{g}\to qq[\tilde{\chi}_1^0\to ee\nu]$ decays and masses in GeV as indicated. A dash indicates results omitted due to limited statistical precision.

Upper limits (95% CL) on the number of dilepton $e^{\pm}\mu^{\mp}$ displaced vertices in 20.3 fb$^{-1}$ and the corresponding vertex-level efficiencies (from Auxiliary Figure 5b) for four RPV SUSY models as a function of the $\tilde{\chi}_1^0$ proper decay distance $c\tau$. The models consider gluino pair production, with $\tilde{g}\to qq[\tilde{\chi}_1^0\to e\mu\nu]$ decays and masses in GeV as indicated.

Upper limits (95% CL) on the number of $\mu^+\mu^-$ displaced vertices in 20.3 fb$^{-1}$ and the corresponding vertex-level efficiencies (from Auxiliary Figure 5c) for four RPV SUSY models as a function of the $\tilde{\chi}_1^0$ proper decay distance $c\tau$. The models consider gluino pair production, with $\tilde{g}\to qq[\tilde{\chi}_1^0\to \mu\mu\nu]$ decays and masses in GeV as indicated. A dash indicates results omitted due to limited statistical precision.

Upper limits (95% CL) on the number of dilepton ($e^+e^-+e^{\pm}\mu^{\mp}+\mu^+\mu^-$) displaced vertices in 20.3 fb$^{-1}$ and the corresponding vertex-level efficiencies (from Auxiliary Figure 5d) for two GGM SUSY models as a function of the $\tilde{\chi}_1^0$ proper decay distance $c\tau$. The models consider gluino pair production, with $\tilde{g}\to qq[\tilde{\chi}_1^0\to Z\tilde{G}]$ decays, $m(\tilde{g})$ = 1100 GeV and $m(\tilde{\chi}_1^0)$ = 400 GeV.

Upper limits (95% CL) on the number of dilepton ($e^+e^-+e^{\pm}\mu^{\mp}+\mu^+\mu^-$) displaced vertices in 20.3 fb$^{-1}$ and the corresponding vertex-level efficiencies (from Auxiliary Figure 5d) for two GGM SUSY models as a function of the $\tilde{\chi}_1^0$ proper decay distance $c\tau$. The models consider gluino pair production, with $\tilde{g}\to qq[\tilde{\chi}_1^0\to Z\tilde{G}]$ decays, $m(\tilde{g})$ = 1100 GeV and $m(\tilde{\chi}_1^0)$ = 1000 GeV.

Upper limits (95% CL) from the dilepton $e^+e^-+e^{\pm}\mu^{\mp}$ channels on the production cross-section and the corresponding event-level efficiencies (from Auxiliary Figure 6a) for four RPV SUSY models as a function of the $\tilde{\chi}_1^0$ proper decay distance $c\tau$. The models consider gluino pair production, with $\tilde{g}\to qq[\tilde{\chi}_1^0\to e\mu\nu/ee\nu]$ decays and masses in GeV as indicated. For comparison, the production cross-sections for $m(\tilde{g})$ = 600 GeV and 1300 GeV are $1280\pm230$ fb and $1.7\pm0.7$ fb, respectively.

Upper limits (95% CL) from the dilepton $e^{\pm}\mu^{\mp}+\mu^+\mu^-$ channels on the production cross-section and the corresponding event-level efficiencies (from Auxiliary Figure 6b) for four RPV SUSY models as a function of the $\tilde{\chi}_1^0$ proper decay distance $c\tau$. The models consider gluino pair production, with $\tilde{g}\to qq[\tilde{\chi}_1^0\to e\mu\nu/\mu\mu\nu]$ decays and masses in GeV as indicated. For comparison, the production cross-sections for $m(\tilde{g})$ = 600 GeV and 1300 GeV are $1280\pm230$ fb and $1.7\pm0.7$ fb, respectively. A dash indicates results omitted due to limited statistical precision.

Upper limits (95% CL) from the dilepton $e^+e^-+e^{\pm}\mu^{\mp}+\mu^+\mu^-$ channels on the production cross-section and the corresponding event-level efficiencies (from Auxiliary Figure 6c) for two GGM SUSY models as a function of the $\tilde{\chi}_1^0$ proper decay distance $c\tau$. The models consider gluino pair production, with $\tilde{g}\to qq[\tilde{\chi}_1^0\to Z\tilde{G}]$ decays, $m(\tilde{g})$ = 1100 GeV and $m(\tilde{\chi}_1^0)$ = 400 GeV. For comparison, the production cross-section for $m(\tilde{g})$ = 1100 GeV is $7.6\pm2.8$ fb.

Upper limits (95% CL) from the dilepton $e^+e^-+e^{\pm}\mu^{\mp}+\mu^+\mu^-$ channels on the production cross-section and the corresponding event-level efficiencies (from Auxiliary Figure 6c) for two GGM SUSY models as a function of the $\tilde{\chi}_1^0$ proper decay distance $c\tau$. The models consider gluino pair production, with $\tilde{g}\to qq[\tilde{\chi}_1^0\to Z\tilde{G}]$ decays, $m(\tilde{g})$ = 1100 GeV and $m(\tilde{\chi}_1^0)$ = 1000 GeV. For comparison, the production cross-section for $m(\tilde{g})$ = 1100 GeV is $7.6\pm2.8$ fb.

Upper limits (95% CL) from the DV+jets channel on the production cross-section and the corresponding event-level efficiencies (from Auxiliary Figure 8a) for four RPV SUSY models as a function of the $\tilde{\chi}_1^0$ proper decay distance $c\tau$. The models consider squark pair production, with $\tilde{q}\to q\tilde{\chi}_1^0$ decays, $m(\tilde{q})$ = 700 GeV and $m(\tilde{\chi}_1^0)$ = 494 GeV. For comparison, the production cross-section for $m(\tilde{q})$ = 700 GeV is $124\pm17$ fb. A dash indicates where the limit-setting procedure did not converge.

Upper limits (95% CL) from the DV+jets channel on the production cross-section and the corresponding event-level efficiencies (from Auxiliary Figure 8b) for four RPV SUSY models as a function of the $\tilde{\chi}_1^0$ proper decay distance $c\tau$. The models consider squark pair production, with $\tilde{q}\to q\tilde{\chi}_1^0$ decays, $m(\tilde{q})$ = 1000 GeV and $m(\tilde{\chi}_1^0)$ = 108 GeV. For comparison, the production cross-section for $m(\tilde{q})$ = 1000 GeV is $11.9\pm1.5$ fb. A dash indicates where the limit-setting procedure did not converge.

Upper limits (95% CL) from the DV+$E_T^{miss}$ channel on the production cross-section and the corresponding event-level efficiencies (from Auxiliary Figure 9a) for two GGM SUSY models as a function of the $\tilde{\chi}_1^0$ proper decay distance $c\tau$. The models consider gluino pair production, with $\tilde{g}\to qq[\tilde{\chi}_1^0\to Z\tilde{G}]$ decays, $m(\tilde{g})$ = 1100 GeV and a $\tilde{\chi}_1^0$ mass in GeV as indicated. For comparison, the production cross-section for $m(\tilde{g})$ = 1100 GeV is $7.6\pm2.8$ fb.

Upper limits (95% CL) from the DV+jets channel on the production cross-section and the corresponding event-level efficiencies (from Auxiliary Figure 9b) for two GGM SUSY models as a function of the $\tilde{\chi}_1^0$ proper decay distance $c\tau$. The models consider gluino pair production, with $\tilde{g}\to qq[\tilde{\chi}_1^0\to Z\tilde{G}]$ decays, $m(\tilde{g})$ = 1100 GeV and a $\tilde{\chi}_1^0$ mass in GeV as indicated. For comparison, the production cross-section for $m(\tilde{g})$ = 1100 GeV is $7.6\pm2.8$ fb. A dash indicates where the limit-setting procedure did not converge.

Upper limits (95% CL) from the DV+$E_T^{miss}$ channel on the production cross-section and the corresponding event-level efficiencies (from Auxiliary Figure 10a) for four split-SUSY models as a function of the $\tilde{g}$ proper decay distance $c\tau$. The models consider gluino pair production, with $[\tilde{g}\to g/qq \tilde{\chi}_1^0]$ decays, $\tilde{g}$ masses in GeV as indicated and $m(\tilde{\chi}_1^0)$ = 100 GeV. For comparison, the production cross-sections for $m(\tilde{g})$ = 400 GeV, 800 GeV and 1400 GeV are $18700\pm2800$ fb, $149\pm31$ fb and $0.71\pm0.32$ fb, respectively.

Upper limits (95% CL) from the DV+jets channel on the production cross-section and the corresponding event-level efficiencies (from Auxiliary Figure 10b) for four split-SUSY models as a function of the $\tilde{g}$ proper decay distance $c\tau$. The models consider gluino pair production, with $[\tilde{g}\to g/qq \tilde{\chi}_1^0]$ decays, $\tilde{g}$ masses in GeV as indicated and $m(\tilde{\chi}_1^0)$ = 100 GeV. For comparison, the production cross-sections for $m(\tilde{g})$ = 400 GeV, 800 GeV and 1400 GeV are $18700\pm2800$ fb, $149\pm31$ fb and $0.71\pm0.32$ fb, respectively. A dash indicates where the limit-setting procedure did not converge or the limit is greater than $10^8$ fb.

Upper limits (95% CL) from the DV+$E_T^{miss}$ channel on the production cross-section and the corresponding event-level efficiencies (from Auxiliary Figure 10c) for three split-SUSY models as a function of the $\tilde{g}$ proper decay distance $c\tau$. The models consider gluino pair production, with $[\tilde{g}\to tt \tilde{\chi}_1^0]$ decays, $\tilde{g}$ masses in GeV as indicated and $m(\tilde{\chi}_1^0)$ = 100 GeV. For comparison, the production cross-sections for $m(\tilde{g})$ = 600 GeV, 1000 GeV and 1400 GeV are $1270\pm230$ fb, $22\pm6$ fb and $0.71\pm0.32$ fb, respectively.

Upper limits (95% CL) from the DV+jets channel on the production cross-section and the corresponding event-level efficiencies (from Auxiliary Figure 10d) for three split-SUSY models as a function of the $\tilde{g}$ proper decay distance $c\tau$. The models consider gluino pair production, with $[\tilde{g}\to tt \tilde{\chi}_1^0]$ decays, $\tilde{g}$ masses in GeV as indicated and $m(\tilde{\chi}_1^0)$ = 100 GeV. For comparison, the production cross-sections for $m(\tilde{g})$ = 600 GeV, 1000 GeV and 1400 GeV are $1270\pm230$ fb, $22\pm6$ fb and $0.71\pm0.32$ fb, respectively. A dash indicates where the limit-setting procedure did not converge.

Upper limits (95% CL) from the DV+$E_T^{miss}$ channel on the production cross-section and the corresponding event-level efficiencies (from Auxiliary Figure 10e) for four split-SUSY models as a function of the $\tilde{g}$ proper decay distance $c\tau$. The models consider gluino pair production, with $[\tilde{g}\to tt \tilde{\chi}_1^0]$ decays, $\tilde{g}$ masses in GeV as indicated and $m(\tilde{\chi}_1^0)$ = $m(\tilde{g}) - 480$ GeV. For comparison, the production cross-sections for $m(\tilde{g})$ = 500 GeV, 800 GeV and 1400 GeV are $4450\pm700$ fb, $149\pm31$ fb and $0.71\pm0.32$ fb, respectively.

Upper limits (95% CL) from the DV+jets channel on the production cross-section and the corresponding event-level efficiencies (from Auxiliary Figure 10f) for four split-SUSY models as a function of the $\tilde{g}$ proper decay distance $c\tau$. The models consider gluino pair production, with $[\tilde{g}\to tt \tilde{\chi}_1^0]$ decays, $\tilde{g}$ masses in GeV as indicated and $m(\tilde{\chi}_1^0)$ = $m(\tilde{g}) - 480$ GeV. For comparison, the production cross-sections for $m(\tilde{g})$ = 500 GeV, 800 GeV and 1400 GeV are $4450\pm700$ fb, $149\pm31$ fb and $0.71\pm0.32$ fb, respectively. A dash indicates where the limit-setting procedure did not converge.

Observed 95% CL exclusion contour in the $m(\tilde{g})$-$c\tau$ plane for the split-SUSY model with gluino production, $[\tilde{g}\to g/qq \tilde{\chi}_1^0]$ decays and $m(\tilde{\chi}_1^0)$ = 100 GeV. These results are obtained from the DV+$E_T^{miss}$ and DV+jets channels, see http://hepdata.cedar.ac.uk/view/ins1362183/d34 for details.

Expected 95% CL exclusion contour in the $m(\tilde{g})$-$c\tau$ plane for the split-SUSY model with gluino production, $[\tilde{g}\to g/qq \tilde{\chi}_1^0]$ decays and $m(\tilde{\chi}_1^0)$ = 100 GeV. These results are obtained from the DV+$E_T^{miss}$ and DV+jets channels, see http://hepdata.cedar.ac.uk/view/ins1362183/d34 for details.

Observed 95% CL exclusion contour in the $m(\tilde{g})$-$c\tau$ plane for the split-SUSY model with gluino production, $[\tilde{g}\to tt \tilde{\chi}_1^0]$ decays and $m(\tilde{\chi}_1^0)$ = 100 GeV. These results are obtained from the DV+$E_T^{miss}$ and DV+jets channels, see http://hepdata.cedar.ac.uk/view/ins1362183/d34 for details.

Expected 95% CL exclusion contour in the $m(\tilde{g})$-$c\tau$ plane for the split-SUSY model with gluino production, $[\tilde{g}\to tt \tilde{\chi}_1^0]$ decays and $m(\tilde{\chi}_1^0)$ = 100 GeV. These results are obtained from the DV+$E_T^{miss}$ and DV+jets channels, see http://hepdata.cedar.ac.uk/view/ins1362183/d34 for details.

Observed 95% CL exclusion contour in the $m(\tilde{g})$-$c\tau$ plane for the split-SUSY model with gluino production, $[\tilde{g}\to g/qq \tilde{\chi}_1^0]$ decays and $m(\tilde{\chi}_1^0)$ = $m(\tilde{g})$ - 480 GeV. These results are obtained from the DV+$E_T^{miss}$ and DV+jets channels, see http://hepdata.cedar.ac.uk/view/ins1362183/d34 for details.

Expected 95% CL exclusion contour in the $m(\tilde{g})$-$c\tau$ plane for the split-SUSY model with gluino production, $[\tilde{g}\to g/qq \tilde{\chi}_1^0]$ decays and $m(\tilde{\chi}_1^0)$ = $m(\tilde{g})$ - 480 GeV. These results are obtained from the DV+$E_T^{miss}$ and DV+jets channels, see http://hepdata.cedar.ac.uk/view/ins1362183/d34 for details.

Choice of signal region in the $m(\tilde{g})$-$c\tau$ plane for the split-SUSY models with gluino decays and neutralino masses in GeV as indicated. A value of 1 indicates that the DV+$E_T^{miss}$ channel provided the best expected constraint for that point, while a value of -1 indicates the DV+jets channel. A dash indicates where results were not calculated for a particular mass/lifetime combination.

Upper limits (95% CL) from the DV+$E_T^{miss}$ channel on the production cross-section and the corresponding event-level efficiencies (from Auxiliary Figure 11a) for four RPV SUSY models as a function of the $\tilde{\chi}_1^0$ proper decay distance $c\tau$. The models consider squark or gluino pair production, with masses in GeV as indicated, with either $\tilde{q}\to q[\tilde{\chi}_1^0\to \nu qq]$ or $\tilde{g}\to qq[\tilde{\chi}_1^0\to \nu qq]$ decays, respectively. For comparison, the production cross-sections for $m(\tilde{g})$ = 700 GeV, $m(\tilde{q})$ = 700 GeV and $m(\tilde{q})$ = 1000 GeV are $430\pm80$ fb, $124\pm17$ fb and $11.9\pm1.5$ fb, respectively.

Upper limits (95% CL) from the DV+$E_T^{miss}$ channel on the production cross-section and the corresponding event-level efficiencies (from Auxiliary Figure 11b) for four RPV SUSY models as a function of the $\tilde{\chi}_1^0$ proper decay distance $c\tau$. The models consider squark pair production, with $\tilde{q}\to q\tilde{\chi}_1^0$ decays and masses in GeV as indicated. For comparison, the production cross-sections for $m(\tilde{q})$ = 700 GeV and 1000 GeV are $124\pm17$ fb and $11.9\pm1.5$ fb, respectively.

Vertex mass distributions in data and one RPV SUSY signal model, for vertices with 3, 4 and $\geq$5 tracks in the DV+muon channel. The entries are the number of DVs in each bin, not normalized according to bin size. The signal model is for squark pair production, with $\tilde{q}\to q[\tilde{\chi}_1^0\to\mu qq]$ decays, $m(\tilde{q})$ = 700 GeV, $m(\tilde{\chi}_1^0)$ = 494 GeV and $c\tau(\tilde{\chi}_1^0)$ = 175 mm.

Vertex mass distributions in data and one GGM SUSY signal model, for vertices with 3, 4 and $\geq$5 tracks in the DV+jets channel. The entries are the number of DVs in each bin, not normalized according to bin size. The signal model is for gluino pair production, with $\tilde{g}\to qq[\tilde{\chi}_1^0\to Z\tilde{G}]$ decays, $m(\tilde{g})$ = 1100 GeV, $m(\tilde{\chi}_1^0)$ = 400 GeV and $c\tau(\tilde{\chi}_1^0)$ = 175 mm.

Vertex mass distributions in data and one RPV SUSY signal model, for vertices with 3, 4 and $\geq$5 tracks in the DV+electron channel. The entries are the number of DVs in each bin, not normalized according to bin size. The signal model is for squark pair production, with $\tilde{q}\to q[\tilde{\chi}_1^0\to e qq]$ decays, $m(\tilde{q})$ = 700 GeV, $m(\tilde{\chi}_1^0)$ = 494 GeV and $c\tau(\tilde{\chi}_1^0)$ = 175 mm.

Vertex mass distributions in data and one split-SUSY signal model, for vertices with 3, 4 and $\geq$5 tracks in the DV+$E_T^{miss}$ channel. The entries are the number of DVs in each bin, not normalized according to bin size. The signal model is for gluino pair production, with $[\tilde{g}\to g/qq \tilde{\chi}_1^0]$ decays, $m(\tilde{g})$ = 1400 GeV, $m(\tilde{\chi}_1^0)$ = 100 GeV and $c\tau(\tilde{g})$ = 175 mm.

Vertex mass distributions in data and one RPV SUSY signal model, for vertices with 0, 1 and $\geq$2 charged leptons in the dilepton $e^+e^-$ channel. The entries are the number of DVs in each bin, not normalized according to bin size. The signal model is for gluino pair production, with $\tilde{g}\to qq[\tilde{\chi}_1^0\to e\mu\nu/ee\nu]$ decays, $m(\tilde{g})$ = 1300 GeV, $m(\tilde{\chi}_1^0)$ = 50 GeV and $c\tau(\tilde{\chi}_1^0)$ = 30 mm.

Vertex mass distributions in data and one RPV SUSY signal model, for vertices with 0, 1 and $\geq$2 charged leptons in the dilepton $e^{\pm}\mu^{\mp}$ channel. The entries are the number of DVs in each bin, not normalized according to bin size. The signal model is for gluino pair production, with $\tilde{g}\to qq[\tilde{\chi}_1^0\to e\mu\nu/ee\nu]$ decays, $m(\tilde{g})$ = 1300 GeV, $m(\tilde{\chi}_1^0)$ = 50 GeV and $c\tau(\tilde{\chi}_1^0)$ = 30 mm.

Vertex mass distributions in data and one RPV SUSY signal model, for vertices with 0, 1 and $\geq$2 charged leptons in the dilepton $\mu^+\mu^-$ channel. The entries are the number of DVs in each bin, not normalized according to bin size. The signal model is for gluino pair production, with $\tilde{g}\to qq[\tilde{\chi}_1^0\to e\mu\nu/\mu\mu\nu]$ decays, $m(\tilde{g})$ = 1300 GeV, $m(\tilde{\chi}_1^0)$ = 50 GeV and $c\tau(\tilde{\chi}_1^0)$ = 30 mm.

Details of sparticle decay modes, model parameters, approximate number of generated events $N_{\rm evts}$ and total production cross-section $\sigma$ for selected models considered in this analysis. The long-lived particle (LLP) is the $\tilde{\chi}_1^0$ in all cases except for the model used for DV+$E_T^{miss}$, where it is the $\tilde{g}$. Events in some models are filtered to make better use of computing resources, details are given in the original table and the associated efficiency is already taken into account in the quoted cross-sections.

Numbers of events satisfying each selection criterion in turn for the DV+muon channel, using the model listed in http://hepdata.cedar.ac.uk/view/ins1362183/d44. The ''Filter and trigger'' line includes the requirements placed on the primary vertex.

Numbers of events satisfying each selection criterion in turn for the DV+electron channel, using the model listed in http://hepdata.cedar.ac.uk/view/ins1362183/d44. The ''Filter and trigger'' line includes the requirements placed on the primary vertex.

Numbers of events satisfying each selection criterion in turn for the DV+jets channel, using the model listed in http://hepdata.cedar.ac.uk/view/ins1362183/d44. The ''Filter and trigger'' line includes the requirements placed on the primary vertex.

Numbers of events satisfying each selection criterion in turn for the DV+$E_T^{miss}$ channel, using the model listed in http://hepdata.cedar.ac.uk/view/ins1362183/d44. The ''Filter and trigger'' line includes the requirements placed on the primary vertex.

Numbers of events satisfying each selection criterion in turn for the dilepton $e^+e^-$ channel, using the model listed in http://hepdata.cedar.ac.uk/view/ins1362183/d44. The ''Trigger'' line includes the event-level cosmic-muon veto and the requirements placed on the primary vertex, but not the offline filter selection. This is included in the ''Lepton reconstruction and DV match'' line, along with all other requirements placed on offline-reconstructed leptons. About 20,000 events of the full sample are analyzed, which contain an equal mixture of $\tilde{\chi}_1^0 \to e^{\pm}\mu^{\mp}\nu$ and $\tilde{\chi}_1^0 \to e^+e^-\nu$ decays.

Numbers of events satisfying each selection criterion in turn for the dilepton $e^{\pm}\mu^{\mp}$ channel, using the model listed in http://hepdata.cedar.ac.uk/view/ins1362183/d44. The ''Trigger'' line includes the event-level cosmic-muon veto and the requirements placed on the primary vertex, but not the offline filter selection. This is included in the ''Lepton reconstruction and DV match'' line, along with all other requirements placed on offline-reconstructed leptons. The sample contains about 50% $\tilde{\chi}_1^0 \to e^{\pm}\mu^{\mp}\nu$ decays, 25% $\tilde{\chi}_1^0 \to e^+e^-\nu$ and 25% $\tilde{\chi}_1^0 \to \mu^+\mu^-\nu$ decays.

Numbers of events satisfying each selection criterion in turn for the dilepton $\mu^+\mu^-$ channel, using the model listed in http://hepdata.cedar.ac.uk/view/ins1362183/d44. The ''Trigger'' line includes the event-level cosmic-muon veto and the requirements placed on the primary vertex, but not the offline filter selection. This is included in the ''Lepton reconstruction and DV match'' line, along with all other requirements placed on offline-reconstructed leptons. About 20,000 events of the full sample are analyzed, which contain an equal mixture of $\tilde{\chi}_1^0 \to e^{\pm}\mu^{\mp}\nu$ and $\tilde{\chi}_1^0 \to \mu^+\mu^-\nu$ decays.

The observed and expected $E_T^{miss}$ distribution in the dimuon SR-Z. The negigible estimated contribution from Z+jets is omitted in these distributions. The last bin contains the overflow.

The observed and expected dielectron invariant mass distribution in SR-loose. The last bin contains the overflow.

The observed and expected dimuon invariant mass distribution in SR-loose. The last bin contains the overflow.

The observed and expected dielectron invariant mass distribution in the two-jet $b$-veto SR. The last bin contains the overflow.

The observed and expected dimuon invariant mass distribution in the two-jet $b$-veto SR. The last bin contains the overflow.

The observed and expected dielectron invariant mass distribution in the four jet b-veto SR. The last bin contains the overflow.

The observed and expected dimuon invariant mass distribution in the four-jet $b$-veto SR. The last bin contains the overflow.

The observed and expected dielectron invariant mass distribution in the two-jet $b$-tag SR. The last bin contains the overflow.

The observed and expected dimuon invariant mass distribution in two-jet $b$-tag SR. The last bin contains the overflow.

The observed and expected dielectron invariant mass distribution in the four-jet $b$-tag SR. The last bin contains the overflow.

The observed and expected dimuon invariant mass distribution in the four-jet $b$-tag SR. The last bin contains the overflow.

Expected 95% exclusion contour for the GGM model with $\tan(\beta)=1.5$ in SR-Z.

Observed 95% exclusion contour for the GGM model with $\tan(\beta)=1.5$ in SR-Z.

Expected 95% exclusion contour for the GGM model with $\tan(\beta)=30$ in SR-Z.

Observed 95% exclusion contour for the GGM model with $\tan(\beta)=30$ in SR-Z.

Expected 95% exclusion contour for the two-step first- and second-generation squark simplified model with sleptons in the two-jet $b$-veto SR.

Observed 95% exclusion contour for the two-step first- and second-generation squark simplified model with sleptons in the two-jet $b$-veto SR.

Expected 95% exclusion contour for the two-step gluino simplified model with sleptons in the four-jet $b$-veto SR.

Observed 95% exclusion contour for the two-step gluino simplified model with sleptons in the four-jet $b$-veto SR.

Number of generated events in the two-step gluino simplified model with sleptons.

Production cross-section in the two-step gluino simplified model with sleptons.

Number of generated events in the two-step first- and second-generation squark simplified model with sleptons.

Production cross-section in the two-step first- and second-generation squark simplified model with sleptons.

Number of generated events in the GGM model with $\tan(\beta)=1.5$.

Production cross-section in the GGM model with $\tan(\beta)=1.5$.

Number of generated events in the GGM model with $\tan(\beta)=30$.

Production cross-section in the GGM model with $\tan(\beta)=30$.

Total experimental uncertainty [%] for the two-step gluino simplified model with sleptons.

Total experimental uncertainty [%] for the GGM model with $\tan(\beta)=1.5$.

Total experimental uncertainty for the GGM model with $\tan(\beta)=30$.

Signal acceptance for the GGM model with $\tan(\beta)=1.5$ in the combined electron and muon SR-Z.

Signal acceptance for the GGM model with $\tan(\beta)=30$ in the combined electron and muon SR-Z.

Signal efficiency for the GGM model with $\tan(\beta)=1.5$ in the dielectron SR-Z.

Signal efficiency for the GGM model with $\tan(\beta)=30$ in the dielectron SR-Z.

Signal efficiency for the GGM model with $\tan(\beta)=1.5$ in the dimuon SR-Z.

Signal efficiency for the GGM model with $\tan(\beta)=30$ in the dimuon SR-Z.

Signal efficiency for the GGM model with $\tan(\beta)=1.5$ in the electron and muon combined SR-Z.

Signal efficiency for the GGM model with $\tan(\beta)=30$ in the the electron and muon combined SR-Z.

Signal acceptance for the two-step first- and second-generation squarks simplified model with sleptons in the two-jet $b$-veto SR.

Signal acceptance for the two-step gluino simplified model with sleptons in the four-jet $b$-veto SR.

Signal efficiency for the two-step first- and second-generation squarks simplified model with sleptons in the two-jet $b$-veto SR.

Signal efficiency for the two-step gluino simplified model with sleptons in the four-jet $b$-veto SR.

Upper limits on the signal cross-section at 95% CL for the GGM model with $\tan(\beta)=1.5$.

Observed CL$_{\text{S}}$ for the GGM model with $\tan(\beta)=1.5$.

Expected CL$_{\text{S}}$ for the GGM model with $\tan(\beta)=1.5$.

Upper limits on the signal cross-section at 95% CL for the GGM model with $\tan(\beta)=30$.

Observed CL$_{\text{S}}$ for the GGM model with $\tan(\beta)=30$.

Expected CL$_{\text{S}}$ for the GGM model with $\tan(\beta)=30$.

Upper limits on the signal stength at 95% CL for the two-step first- and second-generation squark simplified model with sleptons. The excluded signal strength is defined as the ratio of the observed excluded production cross section to the expected production cross section calculated at NLO+NLL.

Upper limits on the signal stength at 95% CL for the two-step gluino simplified model with sleptons. The excluded signal strength is defined as the ratio of the observed excluded production cross section to the expected production cross section calculated at NLO+NLL.

Observed CL$_{\text{S}}$ for the two-step first- and second-generation squark simplified model with sleptons.

Expected CL$_{\text{S}}$ for the two-step first- and second-generation squark simplified model with sleptons.

Observed CL$_{\text{S}}$ for the two-step gluino simplified model with sleptons.

Expected CL$_{\text{S}}$ for the two-step gluino simplified model with sleptons.

Cutflow table for three benchmark signal points in SR-Z for the $ee$ and $\mu\mu$ channels separately. The three signal points are taken from the $\tan\beta = 1.5$ grid. 100000 events were generated for each of these points. Shown here are both the unweighted number of events and the number of events normalised to 20.3 fb$^{-1}$. The total experimental systematic uncertainty on the signal yields is indicated at the last cut, along with the corresponding observed and expected $CL_S$ values.

Cutflow table for three benchmark signal points in the two jet b-veto SR of the off-$Z$ search for the $ee$ and $\mu\mu$ channels separately. Shown here are both the unweighted number of events and the number of events normalised to 20.3$^{-1}$. Except for the last two rows indicating the dilepton mass requirements, quoted event yields include all requirements from the top of the table down to the given row.

Cutflow table for three benchmark signal points in the four jet b-veto SR of the off-$Z$ search for the $ee$ and $\mu\mu$ channels separately. Shown here are both the unweighted number of events and the number of events normalised to 20.3 fb$^{-1}$. Except for the last two rows indicating the dilepton mass requirements, quoted event yields include all requirements from the top of the table down to the given row.

NLO cross sections and selection efficiencies (assuming $\beta$ = 1) for different signal points.

Measured fiducial cross section times leptonic branching ratio for W+ production in the W+ -> mu+ nu final state.

Measured fiducial cross section times leptonic branching ratio for W- production in the W- -> mu- nubar final state.

Measured fiducial cross section times leptonic branching ratio for Z/gamma* production in the Z/gamma* -> mu+ mu- final state.

Measured fiducial cross-section ratios (lepton universality) R_{W} = sigma(W+/- -> e+/- nu/nubar)/sigma (W+/- -> mu+/- nu/nubar) and R_{Z} = sigma (Z/gamma^* -> e+ e-)/sigma (Z/gamma* -> mu+ mu-), and the correlation coefficient.

Measured fiducial cross section times leptonic branching ratio for W+ production in the combined W+ -> l+ nu (l = e, mu) final state.

Measured fiducial cross section times leptonic branching ratio for W- production in the combined W- -> l- nubar (l = e, mu) final state.

Measured fiducial cross section times leptonic branching ratio for W+/- production in the combined W+ -> l+ nu and W- -> l- nubar (l = e, mu) final state.

Measured fiducial cross section times leptonic branching ratio for Z/gamma* production in the combined Z/gamma* -> l+l- (l = e, mu) final state.

Measured total cross section times leptonic branching ratio for W+ production in the W+ -> e+ nu final state.

Measured total cross section times leptonic branching ratio for W- production in the W- -> e- nubar final state.

Measured total cross section times leptonic branching ratio for Z/gamma* production in the Z/gamma* -> e+ e- final state.

Measured total cross section times leptonic branching ratio for W+ production in the W+ -> mu+ nu final state.

Measured total cross section times leptonic branching ratio for W- production in the W- -> mu- nubar final state.

Measured total cross section times leptonic branching ratio for Z/gamma* production in the Z/gamma* -> mu+ mu- final state.

Measured total cross section times leptonic branching ratio for W+ production in the combined W+ -> l+ nu (l = e, mu) final state.

Measured total cross section times leptonic branching ratio for W- production in the combined W- -> l- nubar (l = e, mu) final state.

Measured total cross section times leptonic branching ratio for W+/- production in the combined W+ -> l+ nu and W- -> l- nubar (l = e, mu) final state.

Measured total cross section times leptonic branching ratio for Z/gamma* production in the combined Z/gamma* -> l+ l- (l = e, mu) final state.

Measured fiducial cross-section ratio R_{W+-/Z} = sigma (W+/- -> l+/- nu/nubar) / sigma (Z/gamma^* -> l+ l-) where (l = e, mu).

Measured fiducial cross-section ratio R_{W+/W-} = sigma (W+ -> l+ nu) / sigma (W- -> l- nubar) where (l = e, mu).

Correlation coefficients among (W- -> l- nubar), (W+ -> l+ nu), (Z/gamma^* -> l+ l-) where (l = e, mu) excluding the common normalisation uncertainty due to the luminosity calibration.

The distribution of the missing transverse momentum is shown in soft-lepton 2-jet W+jets control regions after normalising the ttbar and W+jets background processes in the simultaneous fit.

Expected background yields as obtained in the background-only fits in all hard-lepton and soft-lepton validation together with observed data are given. Uncertainties in the fitted background estimates combine statistical (in the simulated event yields) and systematic uncertainties.

Expected background yields as obtained in the background-only fits in all hard-lepton and soft-lepton signal together with observed data are given. Uncertainties in the fitted background estimates combine statistical (in the simulated event yields) and systematic uncertainties.

Distributions of mt for the hard-lepton 4-jet low-x signal region. The requirement on the variable plotted is removed from the definitions of the signal regions, where the arrow indicates the position of the cut in the signal region. The lower panels of the plots show the ratio of the observed data to the total background prediction as derived in the background-only fit. The uncertainty bands plotted include all statistical and systematic uncertainties as discussed in Section 7. The component `Others' is the sum of Z+jets and ttbar+V. The last bin includes the overflow.

Distributions of met/meff for the 4-jet high-x signal region. The requirement on the variable plotted is removed from the definitions of the signal regions, where the arrow indicates the position of the cut in the signal region. The lower panels of the plots show the ratio of the observed data to the total background prediction as derived in the background-only fit. The uncertainty bands plotted include all statistical and systematic uncertainties as discussed in Section 7. The component `Others' is the sum of Z+jets and ttbar+V. The last bin includes the overflow.

Distributions of mt for the hard-lepton 5-jet signal region. The requirement on the variable plotted is removed from the definitions of the signal regions, where the arrow indicates the position of the cut in the signal region. The lower panels of the plots show the ratio of the observed data to the total background prediction as derived in the background-only fit. The uncertainty bands plotted include all statistical and systematic uncertainties as discussed in Section 7. The component `Others' is the sum of Z+jets and ttbar+V. The last bin includes the overflow.

Distributions of mt for the hard-lepton 6-jet signal region. The requirement on the variable plotted is removed from the definitions of the signal regions, where the arrow indicates the position of the cut in the signal region. The lower panels of the plots show the ratio of the observed data to the total background prediction as derived in the background-only fit. The uncertainty bands plotted include all statistical and systematic uncertainties as discussed in Section 7. The component `Others' is the sum of Z+jets and ttbar+V. The last bin includes the overflow.

Distributions of met for the soft-lepton 2-jet signal region. The requirement on the variable plotted is removed from the definitions of the signal regions, where the arrow indicates the position of the cut in the signal region. The lower panels of the plots show the ratio of the observed data to the total background prediction as derived in the background-only fit. The uncertainty bands plotted include all statistical and systematic uncertainties as discussed in Section 7. The component `Others' is the sum of Z+jets and ttbar+V. The last bin includes the overflow.

Distributions of met for the soft-lepton 5-jet signal region. The requirement on the variable plotted is removed from the definitions of the signal regions, where the arrow indicates the position of the cut in the signal region. The lower panels of the plots show the ratio of the observed data to the total background prediction as derived in the background-only fit. The uncertainty bands plotted include all statistical and systematic uncertainties as discussed in Section 7. The component `Others' is the sum of Z+jets and ttbar+V. The last bin includes the overflow.

The observed combined 95% CL exclusion limits in the the gluino simplified models using for each model point the signal region with the best expected sensitivity. The limits are presented in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ models.

The expected combined 95% CL exclusion limits in the the gluino simplified models using for each model point the signal region with the best expected sensitivity. The limits are presented in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ models.

The yellow band ($+ 1 \sigma$) of the combined 95% CL exclusion limits in the the gluino simplified models using for each model point the signal region with the best expected sensitivity. The limits are presented in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ models. The yellow band represents the $\pm 1 \sigma$ variation of the median expected limit due to the experimental and theoretical uncertainties.

The yellow band ($- 1 \sigma$) of the combined 95% CL exclusion limits in the the gluino simplified models using for each model point the signal region with the best expected sensitivity. The limits are presented in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ models. The yellow band represents the $\pm 1 \sigma$ variation of the median expected limit due to the experimental and theoretical uncertainties.

The observed combined 95% CL exclusion limits in the the gluino simplified models using for each model point the signal region with the best expected sensitivity. The limits are presented in the (gluino, x) plane for the chargino = 60 GeV models where $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1))$.

The expected combined 95% CL exclusion limits in the the gluino simplified models using for each model point the signal region with the best expected sensitivity. The limits are presented in the (gluino, x) plane for the chargino = 60 GeV models where $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1))$.

The yellow band ($+ 1 \sigma$) of the combined 95% CL exclusion limits in the the gluino simplified models using for each model point the signal region with the best expected sensitivity. The limits are presented in the (gluino, x) plane for the chargino = 60 GeV models where $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1))$. The yellow band represents the $\pm 1 \sigma$ variation of the median expected limit due to the experimental and theoretical uncertainties.

The yellow band ($- 1 \sigma$) of the combined 95% CL exclusion limits in the the gluino simplified models using for each model point the signal region with the best expected sensitivity. The limits are presented in the (gluino, x) plane for the chargino = 60 GeV models where $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1))$. The yellow band represents the $\pm 1 \sigma$ variation of the median expected limit due to the experimental and theoretical uncertainties.

The observed limits for the soft-lepton 2-jet signal region. The limits are presented in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ models.

The expected limits for the soft-lepton 2-jet signal region. The limits are presented in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ models.

The observed limits for the hard-lepton 4-jet low-x signal region. The limits are presented in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ models.

The expected limits for the hard-lepton 4-jet low-x signal region. The limits are presented in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ models.

The observed limits for the hard-lepton 5-jet signal region. The limits are presented in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ models.

The expected limits for the hard-lepton 5-jet signal region. The limits are presented in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ models.

The observed limits for the hard-lepton 6-jet signal region. The limits are presented in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ models.

The expected limits for the hard-lepton 6-jet signal region. The limits are presented in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ models.

The observed limits for the soft-lepton 5-jet signal region. The limits are presented in the (gluino, x) plane for the chargino = 60 GeV models where $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1))$.

The expected limits for the soft-lepton 5-jet signal region. The limits are presented in the (gluino, x) plane for the chargino = 60 GeV models where $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1))$.

The observed limits for the hard-lepton 4-jet low-x signal region. The limits are presented in the (gluino, x) plane for the chargino = 60 GeV models where $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1))$.

The expected limits for the hard-lepton 4-jet low-x signal region. The limits are presented in the (gluino, x) plane for the chargino = 60 GeV models where $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1))$.

The observed limits for the hard-lepton 4-jet high-x signal region. The limits are presented in the (gluino, x) plane for the chargino = 60 GeV models where $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1))$.

The expected limits for the hard-lepton 4-jet high-x signal region. The limits are presented in the (gluino, x) plane for the chargino = 60 GeV models where $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1))$.

The observed limits for the hard-lepton 5-jet signal region. The limits are presented in the (gluino, x) plane for the chargino = 60 GeV models where $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1))$.

The expected limits for the hard-lepton 5-jet signal region. The limits are presented in the (gluino, x) plane for the chargino = 60 GeV models where $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1))$.

The observed limits for the hard-lepton 6-jet signal region. The limits are presented in the (gluino, x) plane for the chargino = 60 GeV models where $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1))$.

The expected limits for the hard-lepton 6-jet signal region. The limits are presented in the (gluino, x) plane for the chargino = 60 GeV models where $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1))$.

Number of generated events in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$.

Number of generated events in the (gluino, x) plane for the chargino = 60 GeV models.

Production cross-section in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$.

Production cross-section in the (gluino, x) plane for the chargino = 60 GeV models.

Acceptance times efficiency obtained in the different signal regions in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ (hard-lepton 4-jet low-x).

Acceptance times efficiency in the different signal regions in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ (hard-lepton 4-jet high-x).

Acceptance times efficiency in the different signal regions in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ (hard-lepton 5-jet).

Acceptance times efficiency in the different signal regions in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ (hard-lepton 6-jet).

Acceptance times efficiency in the different signal regions in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ (soft-lepton 2-jet).

Acceptance times efficiency obtained in the different signal regions in the (gluino, x) plane for the chargino = 60 GeV models (hard-lepton 4-jet low-x).

Acceptance times efficiency in the different signal regions in the (gluino, x) plane for the chargino = 60 GeV models (hard-lepton 4-jet high-x).

Acceptance times efficiency in the different signal regions in the (gluino, x) plane for the chargino = 60 GeV models (hard-lepton 5-jet).

Acceptance times efficiency in the different signal regions in the (gluino, x) plane for the chargino = 60 GeV models (hard-lepton 6-jet).

Acceptance times efficiency in the different signal regions in the (gluino, x) plane for the chargino = 60 GeV models (soft-lepton 5-jet).

The observed CLs values as obtained in the different signal regions in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ (hard-lepton 4-jet low-x).

The observed CLs values as obtained in the different signal regions in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ (hard-lepton 4-jet high-x).

The observed CLs values as obtained in the different signal regions in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ (hard-lepton 5-jet).

The observed CLs values as obtained in the different signal regions in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ (hard-lepton 6-jet).

The observed CLs values as obtained in the different signal regions in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ (soft-lepton 2-jet).

The expected CLs values as obtained in the different signal regions in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ (hard-lepton 4-jet low-x).

The expected CLs values as obtained in the different signal regions in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ (hard-lepton 4-jet high-x).

The expected CLs values as obtained in the different signal regions in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ (hard-lepton 5-jet).

The expected CLs values as obtained in the different signal regions in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ (hard-lepton 6-jet).

The expected CLs values as obtained in the different signal regions in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ (soft-lepton 2-jet).

The observed CLs values as obtained in the different signal regions in the (gluino, x) plane for the chargino = 60 GeV models (hard-lepton 4-jet low-x).

The observed CLs values as obtained in the different signal regions in the (gluino, x) plane for the chargino = 60 GeV models (hard-lepton 4-jet high-x).

The observed CLs values as obtained in the different signal regions in the (gluino, x) plane for the chargino = 60 GeV models (hard-lepton 5-jet).

The observed CLs values as obtained in the different signal regions in the (gluino, x) plane for the chargino = 60 GeV models (hard-lepton 6-jet).

The observed CLs values as obtained in the different signal regions in the (gluino, x) plane for the chargino = 60 GeV models (soft-lepton 5-jet).

The expected CLs values as obtained in the different signal regions in the (gluino, x) plane for the chargino = 60 GeV models (hard-lepton 4-jet low-x).

The expected CLs values as obtained in the different signal regions in the (gluino, x) plane for the chargino = 60 GeV models (hard-lepton 4-jet high-x).

The expected CLs values as obtained in the different signal regions in the (gluino, x) plane for the chargino = 60 GeV models (hard-lepton 5-jet).

The expected CLs values as obtained in the different signal regions in the (gluino, x) plane for the chargino = 60 GeV models (hard-lepton 6-jet).

The expected CLs values as obtained in the different signal regions in the (gluino, x) plane for the chargino = 60 GeV models (soft-lepton 5-jet).

The signal region yielding in the best expected limit is indicated for every signal point used in the the gluino simplified models for the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$.

The signal region yielding in the best expected limit is indicated for every signal point used in the the gluino simplified models for the (gluino, x) mass plane where for the chargino = 60 GeV and $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1))$.

Model-dependent 95% CL upper limits on the visible cross-section in addition to the observed and expected exclusion limits for the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$.

Model-dependent 95% CL upper limits on the visible cross-section in addition to the observed and expected exclusion limits for the (gluino, x) mass plane where for the chargino = 60 GeV and $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1))$.

Simulated background event samples: the corresponding generator, parton shower, cross-section normalisation, PDF set and underlying-event tune are shown.

Overview of the selection criteria for the soft-lepton signal regions. The symbol $p_{T}^{l}$ refers to signal leptons.

Overview of the selection criteria for the hard-lepton signal regions. The symbol $p_{T}^{l}$ refers to signal leptons.

Background fit results for the hard-lepton and soft-lepton signal regions, for an integrated luminosity of 3.2 fb-1. Uncertainties in the fitted background estimates combine statistical (in the simulated event yields) and systematic uncertainties. The uncertainties in this table are symmetrised for propagation purposes but truncated at zero to remain within the physical boundaries.

Breakdown of upper limits. The columns show from left to right: the name of the respective signal region; the 95% confidence level (CL) upper limits on the visible cross-section and on the number of signal events the 95% CL upper limit on the number of signal events, given the expected number (and $\pm 1 \sigma$ variations on the expectation) of background events; the two-sided CLb value, i.e. the confidence level observed for the background-only hypothesis and the one-sided discovery p-value (p(s = 0)). The discovery p-values are capped to 0.5 in the case of observing less events than the fitted background estimates.

Table shows the data, fitted background and expected signal event counts for a benchmark signal point in each bin of the mt distribution shown in figure 5 (top left). The fit results are shown for an integrated luminosity of 3.2 fb-1.

Table shows the data, fitted background and expected signal event counts for a benchmark signal point in each bin of the met/meff distribution shown in figure 5 (top right). The fit results are shown for an integrated luminosity of 3.2 fb-1.

Table shows the data, fitted background and expected signal event counts for a benchmark signal point in each bin of the mt distribution shown in figure 5 (middle left). The fit results are shown for an integrated luminosity of 3.2 fb-1.

Table shows the data, fitted background and expected signal event counts for a benchmark signal point in each bin of the mt distribution shown in figure 5 (middle right). The fit results are shown for an integrated luminosity of 3.2 fb-1.

Table shows the data, fitted background and expected signal event counts for a benchmark signal point in each bin of the met distribution shown in figure 5 (bottom left). The fit results are shown for an integrated luminosity of 3.2 fb-1.

Table shows the data, fitted background and expected signal event counts for a benchmark signal point in each bin of the met distribution shown in figure 5 (bottom right). The fit results are shown for an integrated luminosity of 3.2 fb-1.

Cutflow table for the hard-lepton signal regions with representative target signal models. The weighted numbers are normalized to 3.2 fb-1 and rounded to the statistical error.

Cutflow table for the hard-lepton signal regions with representative target signal models. The weighted numbers are normalized to 3.2 fb-1 and rounded to the statistical error.

The electron channel Born-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kDressed) is also provided.

The electron channel Born-level double-differential cross section D2SIG/DM/DABSYRAP. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kDressed) is also provided.

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kDressed) is also provided.

The muon channel Born-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kdressed) is also provided.

The muon channel Born-level double-differential cross section D2SIG/DM/DABSYRAP. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kdressed) is also provided.

The muon channel Born-level double-differential cross section D2SIG/DM/DABSDETA. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kdressed) is also provided.

Born-level differential fiducial cross section prediction DSIG/DM at NNLO including NLO electroweak corrections and the PI contribution. The calculation is performed using the MMHT2014 NNLO PDF set and with dynamic scales set equal to the invariant mass. The predictions are listed together with the statistical uncertainty, the PDF eigenvector variation, the uncertainty from the variation of alpha_s, the combined uncertainty from mu_F and mu_R, and the uncertainty from the variation of the photon PDF in the PI contribution. The fraction of the PI contribution, f(PI), is also given.

Born-level differential fiducial cross section prediction D2SIG/DM/DABSYRAP at NNLO including NLO electroweak corrections and the PI contribution. The calculation is performed using the MMHT2014 NNLO PDF set and with dynamic scales set equal to the invariant mass. The predictions are listed together with the statistical uncertainty, the PDF eigenvector variation, the uncertainty from the variation of alpha_s, the combined uncertainty from mu_F and mu_R, and the uncertainty from the variation of the photon PDF in the PI contribution. The fraction of the PI contribution, f(PI), is also given.

Born-level differential fiducial cross section prediction D2SIG/DM/DABSDETA at NNLO including NLO electroweak corrections and the PI contribution. The calculation is performed using the MMHT2014 NNLO PDF set and with dynamic scales set equal to the invariant mass. The predictions are listed together with the statistical uncertainty, the PDF eigenvector variation, the uncertainty from the variation of alpha_s, the combined uncertainty from mu_F and mu_R, and the uncertainty from the variation of the photon PDF in the PI contribution. The fraction of the PI contribution, f(PI), is also given.

The electron channel dressed-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 116 GeV < M(EE) < 150 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 150 GeV < M(EE) < 200 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 200 GeV < M(EE) < 300 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 300 GeV < M(EE) < 500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 500 GeV < M(EE) < 1500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 116 GeV < M(EE) < 150 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 150 GeV < M(EE) < 200 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 200 GeV < M(EE) < 300 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 300 GeV < M(EE) < 500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 500 GeV < M(EE) < 1500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 116 GeV < M(MM) < 150 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 150 GeV < M(MM) < 200 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 200 GeV < M(MM) < 300 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 300 GeV < M(MM) < 500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 500 GeV < M(MM) < 1500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 116 GeV < M(MM) < 150 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 150 GeV < M(MM) < 200 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 200 GeV < M(MM) < 300 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 300 GeV < M(MM) < 500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 500 GeV < M(MM) < 1500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".