Normalized differential cross-section $d\ln\sigma(pp\rightarrow J/\psi \Lambda_c^+ X)/dp_T(J/\psi)$ for $2<y(J/\psi)<4$, $p_T(J/\psi)<12$ GeV/$c$, $2<y(\Lambda_c^+)<4$, $3<p_T(\Lambda_c^+) <12$ GeV/$c$ region.

Normalized differential cross-section $d\ln\sigma(pp\rightarrow J/\psi D^0 X)/dp_T(D^0)$ for $2<y(J/\psi)<4$, $p_T(J/\psi)<12$ GeV/$c$, $2<y(D^0)<4$, $3<p_T(D^0)<12$ GeV/$c$ region.

Normalized differential cross-section $d\ln\sigma(pp\rightarrow J/\psi D^+ X)/dp_T(D^+)$ for $2<y(J/\psi)<4$, $p_T(J/\psi)<12$ GeV/$c$, $2<y(D^+)<4$, $3<p_T(D^+)<12$ GeV/$c$ region.

Normalized differential cross-section $d\ln\sigma(pp\rightarrow J/\psi D_s^+ X)/dp_T(D_s^+)$ for $2<y(J/\psi)<4$, $p_T(J/\psi)<12$ GeV/$c$, $2<y(D_s^+)<4$, $3<p_T(D_s^+)<12$ GeV/$c$ region.

Normalized differential cross-section $d\ln\sigma(pp\rightarrow J/\psi \Lambda_c^+ X)/dp_T(\Lambda_c^+)$ for $2<y(J/\psi)<4$, $p_T(J/\psi)<12$ GeV/$c$, $2<y(\Lambda_c^+)<4$, $3<p_T(\Lambda_c^+)<12$ GeV/$c$ region.

Normalized differential cross-section $\frac{d\ln\sigma\left(pp\rightarrow D^0 D^0 X \right)}{dp_T( D^0 )}$ for $2<y(D^0)<4$, $3<p_T(D^0)<12$ GeV/$c$ region.

Normalized differential cross-section $\frac{d\ln\sigma\left(pp\rightarrow D^0 D^+ X \right)}{dp_T( D )}$ for $2<y(D^0)<4$, $3<p_T(D^0)<12$ GeV/$c$, $2<y(D^+)<4$, $3<p_T(D^+)<12$ GeV/$c$ region.

Normalized differential cross-section $\frac{d\ln\sigma\left(pp\rightarrow D^0 D_s^+ X \right)}{dp_T( D )}$ for $2<y(D^0)<4$, $3<p_T(D^0)<12$ GeV/$c$, $2<y(D_s^+)<4$, $3<p_T(D_s^+)<12$ GeV/$c$ region.

Normalized differential cross-section $\frac{d\ln\sigma\left(pp\rightarrow D^+ D^+ X \right)}{dp_T( D^+ )}$ for $2<y(D^+)<4$, $3<p_T(D^+)<12$ GeV/$c$ region.

Normalized differential cross-section $\frac{d\ln\sigma\left(pp\rightarrow D^+ D_s^+ X \right)}{dp_T( D )}$ for $2<y(D^+)<4$, $3<p_T(D^+)<12$ GeV/$c$, $2<y(D_s^+)<4$, $3<p_T(D_s^+)<12$ GeV/$c$ region.

Normalized differential cross-section $\frac{d\ln\sigma\left(pp\rightarrow D^0 \bar{D}^0 X \right)}{dp_T( D )}$ for $2<y(D^0)<4$, $3<p_T(D^0)<12$ GeV/$c$ region.

Normalized differential cross-section $\frac{d\ln\sigma\left(pp\rightarrow D^0 D^- X \right)}{dp_T( D )}$ for $2<y(D^0)<4$, $3<p_T(D^0)<12~GeV/c$, $2<y(D^-)<4$, $3<p_T(D^-)<12$ GeV/$c$ region.

Normalized differential cross-section $\frac{d\ln\sigma\left(pp\rightarrow D^0 D_s^- X \right)}{dp_T( D )}$ for $2<y(D^0)<4$, $3<p_T(D^0)<12$ GeV/$c$, $2<y(D_s^-)<4$, $3<p_T(D_s^-)<12$ GeV/$c$ region.

Normalized differential cross-section $\frac{d\ln\sigma\left(pp\rightarrow D^0 \bar{\Lambda}_c^- X \right)}{dp_T( C )}$ for $2<y(D^0)<4$, $3<p_T(D^0)<12$ GeV/$c$, $2<y(\bar{\Lambda}_c^-)<4$, $3<p_T(\bar{\Lambda}_c^-)<12$ GeV/$c$ region.

Normalized differential cross-section $\frac{d\ln\sigma\left(pp\rightarrow D^+ D- X \right)}{dp_T( D )}$ for $2<y(D^+)<4$, $3<p_T(D^+)<12$ GeV/$c$ region.

Normalized differential cross-section $\frac{d\ln\sigma\left(pp\rightarrow D^+ D_s- X \right)}{dp_T( D )}$ for $2<y(D^+)<4$, $3<p_T(D^+)<12$ GeV/$c$, $2<y(D_s^-)<4$, $3<p_T(D_s^-)<12$ GeV/$c$ region.

Normalized differential cross-section $\frac{d\ln\sigma\left(pp\rightarrow D^+ \bar{\Lambda}_c^- X \right)}{dp_T( C )}$ for $2<y(D^+)<4$, $3<p_T(D^+)<12$ GeV/$c$, $2<y(\bar{\Lambda}_c^-)<4$, $3<p_T(\bar{\Lambda}_c^-)<12$ GeV/$c$ region.

Normalized differential cross-section $\frac{d\ln\sigma\left(pp\rightarrow J/\psi D^0 X \right)}{d \left| \Delta \phi/\pi \right|}$ for $2<y(J/\psi)<4$, $p_T(J/\psi)<12$ GeV/$c$, $2<y(D^0)<4$, $3<p_T(D^0)<12$ GeV/$c$ region.

Normalized differential cross-section $\frac{d\ln\sigma\left(pp\rightarrow J/\psi D^+ X \right)}{d \left| \Delta \phi/\pi \right|}$ for $2<y(J/\psi)<4$, $p_T(J/\psi)<12$ GeV/$c$, $2<y(D^+)<4$, $3<p_T(D^+)<12$ GeV/$c$ region.

Normalized differential cross-section $\frac{d\ln\sigma\left(pp\rightarrow J/\psi D_s^+ X \right)}{d \left| \Delta \phi/\pi \right|}$ for $2<y(J/\psi)<4$, $p_T(J/\psi)<12$ GeV/$c$, $2<y(D_s^+)<4$, $3<p_T(D_s^+)<12$ GeV/$c$ region.

Normalized differential cross-section $\frac{d\ln\sigma\left(pp\rightarrow J/\psi D^0 X \right)}{d \Delta y }$ for $2<y(J/\psi)<4$, $p_T(J/\psi)<12$ GeV/$c$, $2<y(D^0)<4$, $3<p_T(D^0)<12$ GeV/$c$ region.

Normalized differential cross-section $\frac{d\ln\sigma\left(pp\rightarrow J/\psi D^+ X \right)}{d \Delta y }$ for $2<y(J/\psi)<4$, $p_T(J/\psi)<12$ GeV/$c$, $2<y(D^+)<4$, $3<p_T(D^+)<12$ GeV/$c$ region.

Normalized differential cross-section $\frac{d\ln\sigma\left(pp\rightarrow J/\psi D_s^+ X \right)}{d \Delta y}$ for $2<y(J/\psi)<4$, $p_T(J/\psi)<12$ GeV/$c$, $2<y(D_s^+)<4$, $3<p_T(D_s^+)<12$ GeV/$c$ region.

Normalized differential cross-section $\frac{d\ln\sigma\left(pp\rightarrow D^0 D^0 X \right)}{d \left| \Delta \phi/\pi \right|}$ for $2<y(D^0)<4$, $3<p_T(D^0)<12$ GeV/$c$ region.

Normalized differential cross-section $\frac{d\ln\sigma\left(pp\rightarrow D^0 D^+ X \right)}{d \left| \Delta \phi/\pi \right|}$ for $2<y(D^0)<4$, $3<p_T(D^0)<12$ GeV/$c$, $2<y(D^+)<4$, $3<p_T(D^+)<12$ GeV/$c$ region.

Normalized differential cross-section $\frac{d\ln\sigma\left(pp\rightarrow D^0 D^0 X \right)}{d \left| \Delta y \right|}$ for $2<y(D^0)<4$, $3<p_T(D^0)<12~GeV/c$ region.

Normalized differential cross-section $\frac{d\ln\sigma\left(pp\rightarrow D^0 D^+ X \right)}{d \left| \Delta y \right|}$ for $2<y(D^0)<4$, $3<p_T(D^0)<12$ GeV/$c$, $2<y(D^+)<4$, $3<p_T(D^+)<12$ GeV/$c$ region.

Normalized differential cross-section $\frac{d\ln\sigma\left(pp\rightarrow D^0 \bar{D}^0 X \right)}{d \left| \Delta \phi/\pi \right|}$ for $2<y(D^0)<4$, $3<p_T(D^0)<12$ GeV/$c$ region.

Normalized differential cross-section $\frac{d\ln\sigma\left(pp\rightarrow D^0 D^- X \right)}{d \left| \Delta \phi/\pi \right|}$ for $2<y(D^0)<4$, $3<p_T(D^0)<12$ GeV/$c$ , $2<y(D^-)<4$, $3<p_T(D^-)<12$ GeV/$c$ region.

Normalized differential cross-section $\frac{d\ln\sigma\left(pp\rightarrow D^0 D_s^- X \right)}{d \left| \Delta \phi/\pi \right|}$ for $2<y(D^0)<4$, $3<p_T(D^0)<12$ GeV/$c$ , $2<y(D_s^-)<4$, $3<p_T(D_s^-)<12$ GeV/$c$ region.

Normalized differential cross-section $\frac{d\ln\sigma\left(pp\rightarrow D^+ D^- X \right)}{d \left| \Delta \phi/\pi \right|}$ for $2<y(D^+)<4$, $3<p_T(D^+)<12$ GeV/$c$ region.

Normalized differential cross-section $\frac{d\ln\sigma\left(pp\rightarrow D^+ D_s^- X \right)}{d \left| \Delta \phi/\pi \right|}$ for $2<y(D^+)<4$, $3<p_T(D^+)<12$ GeV/$c$, $2<y(D_s^-)<4$, $3<p_T(D_s^-)<12$ GeV/$c$ region.

Normalized differential cross-section $\frac{d\ln\sigma\left(pp\rightarrow D^0 \bar{D}^0 X \right)}{d \left| \Delta y \right|}$ for $2<y(D^0)<4$, $3<p_T(D^0)<12~GeV/c$ region.

Normalized differential cross-section $\frac{d\ln\sigma\left(pp\rightarrow D^0 D^- X \right)}{d \left| \Delta y \right|}$ for $2<y(D^0)<4$, $3<p_T(D^0)<12$ GeV/$c$ , $2<y(D^-)<4$, $3<p_T(D^-)<12$ GeV/$c$ region.

Normalized differential cross-section $\frac{d\ln\sigma\left(pp\rightarrow D^0 D_s^- X \right)}{d \left| \Delta y \right|}$ for $2<y(D^0)<4$, $3<p_T(D^0)<12$ GeV/$c$, $2<y(D_s^-)<4$, $3<p_T(D_s^-)<12$ GeV/$c$ region.

Normalized differential cross-section $\frac{d\ln\sigma\left(pp\rightarrow D^+ D^- X \right)}{d \left| \Delta y \right|}$ for $2<y(D^-)<4$, $3<p_T(D^-)<12$ GeV/$c$ region.

Normalized differential cross-section $\frac{d\ln\sigma\left(pp\rightarrow D^+ D_s^- X \right)}{d \left| \Delta y \right|}$ for $2<y(D^+)<4$, $3<p_T(D^+)<12$ GeV/$c$, $2<y(D_s^-)<4$, $3<p_T(D_s^-)<12$ GeV/$c$ region.

Normalized differential cross-section $\frac{d\ln\sigma\left(pp\rightarrow J/\psi D^0 X \right)}{d m_{J/\psi D^0} }$ for $2<y(J/\psi)<4$, $p_T(J/\psi)<12$ GeV/$c$, $2<y(D^0)<4$, $3<p_T(D^0)<12$ GeV/$c$ region.

Normalized differential cross-section $\frac{d\ln\sigma\left(pp\rightarrow J/\psi D^+ X \right)}{d m_{J/\psi D^+} }$ for $2<y(J/\psi)<4$, $p_T(J/\psi)<12$ GeV/$c$, $2<y(D^+)<4$, $3<p_T(D^+)<12$ GeV/$c$ region.

Normalized differential cross-section $\frac{d\ln\sigma\left(pp\rightarrow J/\psi D_s^+ X \right)}{d m_{J/\psi D_s^+} }$ for $2<y(J/\psi)<4$, $p_T(J/\psi)<12$ GeV/$c$, $2<y(D_s^+)<4$, $3<p_T(D_s^+)<12$ GeV/$c$ region.

Normalized differential cross-section $\frac{d\ln\sigma\left(pp\rightarrow D^0 D^0 X \right)}{d m_{D^0 D^0} }$ for $2<y(D^0)<4$, $3<p_T(D^0)<12$ GeV/$c$ region.

Normalized differential cross-section $\frac{d\ln\sigma\left(pp\rightarrow D^0 D^+ X \right)}{d m_{D^0 D^+} }$ for $2<y(D^0)<4$, $3<p_T(D^0)<12$ GeV/$c$, $2<y(D^+)<4$, $3<p_T(D^+)<12$ GeV/$c$ region.

Normalized differential cross-section $\frac{d\ln\sigma\left(pp\rightarrow D^0 \bar{D}^0 X \right)}{d m_{D^0 \bar{D}^0} }$ for $2<y(D^0)<4$, $3<p_T(D^0)<12$ GeV/$c$ region.

Normalized differential cross-section $\frac{d\ln\sigma\left(pp\rightarrow D^0 D^- X \right)}{d m_{D^0 D^-} }$ for $2<y(D^0)<4$, $3<p_T(D^0)<12$ GeV/$c$, $2<y(D^-)<4$, $3<p_T(D^-)<12$ GeV/$c$ region.

Normalized differential cross-section $\frac{d\ln\sigma\left(pp\rightarrow D^0 D_s^- X \right)}{d m_{D^0 D_s^-} }$ for $2<y(D^0)<4$, $3<p_T(D^0)<12$ GeV/$c$, $2<y(D_s^-)<4$, $3<p_T(D_s^-)<12$ GeV/$c$ region.

Normalized differential cross-section $\frac{d\ln\sigma\left(pp\rightarrow D^0 \bar{\Lambda}_c^- X \right)}{d m_{D^0 D_s^-} }$ for $2<y(D^0)<4$, $3<p_T(D^0)<12$ GeV/$c$, $2<y(\bar{\Lambda}_c^-)<4$, $3<p_T(\bar{\Lambda}_c^-)<12$ GeV/$c$ region.

Normalized differential cross-section $\frac{d\ln\sigma\left(pp\rightarrow D^+ D^- X \right)}{d m_{D^+ D^-} }$ for $2<y(D^+)<4$, $3<p_T(D^+)<12$ GeV/$c$ region.

Normalized differential cross-section $\frac{d\ln\sigma\left(pp\rightarrow D^+ D_s^- X \right)}{d m_{D^+ D_s^-} }$ for $2<y(D^+)<4$, $3<p_T(D^+)<12$ GeV/$c$, $2<y(D_s^-)<4$, $3<p_T(D_s^-)<12$ GeV/$c$ region.

Normalized differential cross-section $\frac{d\ln\sigma\left(pp\rightarrow D^+ \bar{\Lambda}_c^- X \right)}{d m_{D^+ \bar{\Lambda}_c^-} }$ for $2<y(D^+)<4$, $3<p_T(D^+)<12$ GeV/$c$, $2<y(\bar{\Lambda}_c^-)<4$, $3<p_T(\bar{\Lambda}_c^-)<12$ GeV/$c$ region.

Normalized ZZ fiducial cross section (multiplied by 10^6 for readability) in bins of the dilepton pT for the 2l2nu channel. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties.

Normalized ZZ fiducial cross section (multiplied by 10^6 for readability) in bins of deltaPhi between the two leptons of the leading dileptons for the 4l channel. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. UPDATE (30 APR 2014): extra significant digit added for first bin.

Normalized ZZ fiducial cross section (multiplied by 10^6 for readability) in bins of deltaPhi between the two leptons for the 2l2nu channel. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties.

Normalized ZZ fiducial cross section (multiplied by 10^6 for readability) in bins of the mass of the ZZ system for the 4l channel. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties.

Normalized ZZ fiducial cross section (multiplied by 10^6 for readability) in bins of the transverse mass of the ZZ system for the 2l2nu channel. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties.

Unfolded normalised differential Z+2j cross section as a function of the rapidity separation between the leading jets in the search region.

Unfolded normalised differential cross section distribution as a function of the number of jets in the rapidity interval between the two leading jets in the high mass region.

Unfolded normalised differential cross section distribution as a function of the normalised transverse momentum balance in the high mass region.

Unfolded normalised differential cross section distribution as a function of the azimuthal angle between the two leading jets in the high mass region.

Unfolded jet veto efficiency as a function of the dijet invariant mass in the baseline region.

Unfolded jet veto efficiency as a function of the rapidity separation between the two leading jets in the baseline region.

Unfolded average number of jets in the rapidity interval between the two leading jets as a function of the dijet invariant mass in the baseline region.

Unfolded average number of jets in the rapidity interval between the two leading jets as a function of the rapidity separation between the two leading jets in the baseline region.

Unfolded transverse momentum balance veto efficiency as a function of the dijet invariant mass in the baseline region.

Unfolded transverse momentum balance veto efficiency as a function of the rapidity separation between the two leading jets in the baseline region.

Unfolded normalised differential Z+2j cross section as a function of dijet invariant mass in the high-pt region.

Unfolded normalised differential Z+2j cross section as a function of dijet invariant mass in the control region.

Unfolded normalised differential Z+2j cross section as a function of the rapidity separation between the leading jets in the high-pt region.

Unfolded normalised differential Z+2j cross section as a function of the rapidity separation between the leading jets in the control region.

Unfolded jet veto efficiency as a function of the dijet invariant mass in the high-pt region.

Unfolded jet veto efficiency as a function of the rapidity separation between the two leading jets in the high-pt region.

Unfolded average number of jets in the rapidity interval between the two leading jets as a function of the dijet invariant mass in the high-pt region.

Unfolded average number of jets in the rapidity interval between the two leading jets as a function of the rapidity separation between the two leading jets in the high-pt region.

Unfolded transverse momentum balance veto efficiency as a function of the dijet invariant mass in the high-pt region.

Unfolded transverse momentum balance veto efficiency as a function of the rapidity separation between the two leading jets in the high-pt region.

Experimental cross-section values per bin in PB for COS(THETA*(2GAMMA)).

The electron channel Born-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kDressed) is also provided.

The electron channel Born-level double-differential cross section D2SIG/DM/DABSYRAP. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kDressed) is also provided.

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kDressed) is also provided.

The muon channel Born-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kdressed) is also provided.

The muon channel Born-level double-differential cross section D2SIG/DM/DABSYRAP. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kdressed) is also provided.

The muon channel Born-level double-differential cross section D2SIG/DM/DABSDETA. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kdressed) is also provided.

Born-level differential fiducial cross section prediction DSIG/DM at NNLO including NLO electroweak corrections and the PI contribution. The calculation is performed using the MMHT2014 NNLO PDF set and with dynamic scales set equal to the invariant mass. The predictions are listed together with the statistical uncertainty, the PDF eigenvector variation, the uncertainty from the variation of alpha_s, the combined uncertainty from mu_F and mu_R, and the uncertainty from the variation of the photon PDF in the PI contribution. The fraction of the PI contribution, f(PI), is also given.

Born-level differential fiducial cross section prediction D2SIG/DM/DABSYRAP at NNLO including NLO electroweak corrections and the PI contribution. The calculation is performed using the MMHT2014 NNLO PDF set and with dynamic scales set equal to the invariant mass. The predictions are listed together with the statistical uncertainty, the PDF eigenvector variation, the uncertainty from the variation of alpha_s, the combined uncertainty from mu_F and mu_R, and the uncertainty from the variation of the photon PDF in the PI contribution. The fraction of the PI contribution, f(PI), is also given.

Born-level differential fiducial cross section prediction D2SIG/DM/DABSDETA at NNLO including NLO electroweak corrections and the PI contribution. The calculation is performed using the MMHT2014 NNLO PDF set and with dynamic scales set equal to the invariant mass. The predictions are listed together with the statistical uncertainty, the PDF eigenvector variation, the uncertainty from the variation of alpha_s, the combined uncertainty from mu_F and mu_R, and the uncertainty from the variation of the photon PDF in the PI contribution. The fraction of the PI contribution, f(PI), is also given.

The electron channel dressed-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 116 GeV < M(EE) < 150 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 150 GeV < M(EE) < 200 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 200 GeV < M(EE) < 300 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 300 GeV < M(EE) < 500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 500 GeV < M(EE) < 1500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 116 GeV < M(EE) < 150 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 150 GeV < M(EE) < 200 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 200 GeV < M(EE) < 300 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 300 GeV < M(EE) < 500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 500 GeV < M(EE) < 1500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 116 GeV < M(MM) < 150 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 150 GeV < M(MM) < 200 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 200 GeV < M(MM) < 300 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 300 GeV < M(MM) < 500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 500 GeV < M(MM) < 1500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 116 GeV < M(MM) < 150 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 150 GeV < M(MM) < 200 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 200 GeV < M(MM) < 300 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 300 GeV < M(MM) < 500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 500 GeV < M(MM) < 1500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

Measured differential cross section with associated uncertainties as a function of COS(THETA*). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of DELTAYRAP(2GAMMA). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of MULT(JET,PT>30 GEV). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of MULT(JET,PT>50 GEV). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of PT(JET1). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of PT(JET2). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of HT. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of YRAP(JET1). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of YRAP(JET2). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of M(2JET). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of DELTAYRAP(2JET). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of ABSDPHI(2JET). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of DPHI(2JET). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of PT(2GAMMA2JET). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of DPHI(2GAMMA,2JET). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of TAUJET. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of SUM(TAUJET). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of PT(2GAMMA) [NJET=0,PT>30 GEV]. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of PT(2GAMMA) [NJET=1,PT>30 GEV]. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of PT(2GAMMA) [NJET=2,PT>30 GEV]. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of PT(2GAMMA) [NJET>=3,PT>30 GEV]. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

The measured cross sections or cross section limits of the diphoton, VBF-enhanced, Nlepton $\geq$ 1, high $E_{T}^{miss}$, and ttH-enhanced fiducial regions are shown.

Measured differential cross section with associated uncertainties as a function of diphoton transverse momentum in bins of ABS(COS(THETA*)). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.Each systematic uncertainty sources is fully uncorrelated with the other sources.

Non-perturbative correction factors in percent accounting for the impact of hadronisation and the underlying event activity for all measured variables and fiducial regions. Regions of phase space where no reliable estimate could be obtained are listed as 100 without uncertainties. Uncertainties are evaluated by deriving these factors using different generators and tunes as described in the text. No factor are given for the Nlepton $\geq$ 1 and High-$E_{T}^{miss}$ fiducial regions as the gluon fusion contamination in both is negligible.

Isolation efficiencies in percent for gluon fusion $H\rightarrow\gamma\gamma$ for each fiducial region/variable bin measured in this analysis. The isolation efficiency is defined as the probability for both photons to fulfil the isolation criteria (as described in Section 9.1) for events that pass the diphoton kinematic criteria. Regions of phase space where no reliable estimate could be obtained are listed as 100 without uncertainties. Uncertainties are assigned in the same way as for the non-perturbative correction factors: by varying the fragmentation and underlying event modelling. These factors can be multiplied by the kinematic acceptance factors (see Table 29) to extrapolate an inclusive gluon fusion Higgs prediction to the fiducial volume used in this analysis. No factors for the Nlepton $\geq$ 1 and High $E_{T}^{miss}$ fiducial regions are provided as the gluon fusion contamination is negligible.

Combined non-perturbative (Table 27) and particle-level isolation correction factors (Table 28) in percent accounting for the impact of hadronisation and the underlying event activity for all measured variables and fiducial regions. Regions of phase space where no reliable estimate could be obtained are listed as 100 without uncertainties. The uncertainties on the combined values properly take into account the correlations between both multiplicative factors.

Diphoton kinematic acceptances in percent for gluon-gluon fusion for the diphoton fiducial region and all differential variable bins studied in this paper, defined as the probability to fulfill the diphoton kinematic criteria: $p_{T}$/$m_{\gamma\gamma}$ < 0.35 (0.25) for the leading (subleading) photon and $|\eta_{\gamma\gamma}|$ < 2.37. The factors are evaluated using the Powheg NNLOPSevent generator. Uncertainties are taken from PDF variations. QCD scale variations have a negligible impact on these factors. The range of each bin is given in Table 26.

observed statistical correlations between pTyy, Njets, mjj, |DeltaPhijj| and pTj1

ggH default MC + XH predictions

XH ( = VBF + VH + ttH + bbH ) MC predictions

Best-fit values and uncertainties of the production-mode cross sections times branching ratio.

Best-fit values and uncertainties of the simplified template cross sections times branching ratio.

Observed correlations between the measured simplified template cross sections, including both the statistical and systematic uncertainties.

Best-fit values and uncertainties of the simplified template cross sections times branching ratio.

Observed correlations between the measured simplified template cross sections, including both the statistical and systematic uncertainties.

Observed correlations between the measured simplified template cross sections, including both the statistical and systematic uncertainties.

Measured integrated cross sections for the $Z\gamma\gamma$ process for neutrino final state at $\sqrt{s} = 8$ TeV in the extended fiducial regions defined in the paper, table 5. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the inclusive $N_{\mathrm{jets}} \geq 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the exclusive $N_{\mathrm{jets}} = 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \nu\bar{\nu}\gamma$ process in the inclusive $N_{\mathrm{jets}} \geq 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \nu\bar{\nu}\gamma$ process in the exclusive $N_{\mathrm{jets}} = 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $m_{\ell^{+}\ell^{-}\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the inclusive $N_{\mathrm{jets}} \geq 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $m_{\ell^{+}\ell^{-}\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the exclusive $N_{\mathrm{jets}} = 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The cross sections as a function of $N_{\mathrm{jets}}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.