Pre-fit background composition of the SR$3\ell$ Prod. The table shows the event yields as opposed to just the percentages of the relevant background processes.

Post-fit plot of $H_\text{T}(\text{jets})$ in the SR$2\ell$ Dec from a signal-blinded background-only fit.

Post-fit plot of $m(t_\text{SM}, b\text{-jet}_0)$ in the SR$2\ell$ Prod from a signal-blinded background-only fit.

Post-fit plot of $m(\ell_\text{OS},\ell_\text{SS,1})$ in the SR$3\ell$ Dec from a signal-blinded background-only fit.

Post-fit plot of $m(\ell_\text{OS},\ell_\text{SS,1})$ in the SR$3\ell$ Prod from a signal-blinded background-only fit.

Post-fit plot of $D_\text{NN}(tHc)$ in the SR$2\ell$ Dec from the full fit to data.

Post-fit plot of $D_\text{NN}(tHc)$ in the SR$2\ell$ Prod from the full fit to data.

Post-fit plot of $D_\text{NN}(tHc)$ in the SR$3\ell$ Dec from the full fit to data.

Post-fit plot of $D_\text{NN}(tHc)$ in the SR$3\ell$ Prod from the full fit to data.

Post-fit plot of $p_\text{T}(\ell_1)$ in the CR$2\ell$ HF$e$ from the full fit to data.

Post-fit plot of $p_\text{T}(\ell_1)$ in the CR$2\ell$ HF$\mu$ from the full fit to data.

Post-fit plot of $p_\text{T}(\ell_1)$ in the CR$2\ell$ $t\bar{t}V$ from the full fit to data.

Post-fit plot of $p_\text{T}(\ell_2)$ in the CR$3\ell$ HF$e$ from the full fit to data.

Post-fit plot of $p_\text{T}(\ell_2)$ in the CR$3\ell$ HF$\mu$ from the full fit to data.

Post-fit plot of $p_\text{T}(b\text{-jet}_0)$ in the CR$3\ell$ $t\bar{t}W$ from the full fit to data.

Post-fit plot of $p_\text{T}(b\text{-jet}_0)$ in the CR$3\ell$ $t\bar{t}Z$ from the full fit to data.

Observed and expected upper exclusion limits on the branching ratio $\mathcal{B}(t\to Hu)$ for different analyses and their statistical combination.

Observed and expected upper exclusion limits on the branching ratio $\mathcal{B}(t\to Hc)$ for different analyses and their statistical combination.

Post-fit normalisation factors of free-floating background processes and the signal normalisation.

Post-fit predicted and observed yields in all $2\ell$SS signal and control regions. Pre-fit signal contributions for a signal cross section equivalent to $\mathcal{B}(t\to Hq)=0.1\,\%$ are given as well.

Post-fit predicted and observed yields in all $3\ell$ signal and control regions. Pre-fit signal contributions for a signal cross section equivalent to $\mathcal{B}(t\to Hq)=0.1\,\%$ are given as well.

Expected upper limits on $\mathcal{B}(t\to Hq)$ for the nominal fit and alternative fit configurations. One contains the full phase space but only considers statistical uncertainties. Two other configurations consider the full set of systematic uncertainties, but only encompass one final state.

Expected and observed upper limits on $\mathcal{B}(t\to Hq)$ and $|C_{u\phi}^{qt,tq}|$ for the full fit containing all systematic uncertainties.

Pre-fit plot of $H_\text{T}(\text{jets})$ in the SR$2\ell$ Dec from a signal-blinded background-only fit.

Pre-fit plot of $m(t_\text{SM}, b\text{-jet}_0)$ in the SR$2\ell$ Prod from a signal-blinded background-only fit.

Pre-fit plot of $m(\ell_\text{OS},\ell_\text{SS,1})$ in the SR$3\ell$ Dec from a signal-blinded background-only fit.

Pre-fit plot of $m(\ell_\text{OS},\ell_\text{SS,1})$ in the SR$3\ell$ Prod from a signal-blinded background-only fit.

Post-fit plot of $D_\text{NN}(tHu)$ in the SR$2\ell$ Dec from the full fit to data.

Post-fit plot of $D_\text{NN}(tHu)$ in the SR$2\ell$ Prod from the full fit to data.

Post-fit plot of $D_\text{NN}(tHu)$ in the SR$3\ell$ Dec from the full fit to data.

Post-fit plot of $D_\text{NN}(tHu)$ in the SR$3\ell$ Prod from the full fit to data.

Pre-fit plot of $D_\text{NN}(tHc)$ in the SR$2\ell$ Dec from the full fit to data.

Pre-fit plot of $D_\text{NN}(tHc)$ in the SR$2\ell$ Prod from the full fit to data.

Pre-fit plot of $D_\text{NN}(tHc)$ in the SR$3\ell$ Dec from the full fit to data.

Pre-fit plot of $D_\text{NN}(tHc)$ in the SR$3\ell$ Prod from the full fit to data.

Pre-fit plot of $D_\text{NN}(tHu)$ in the SR$2\ell$ Dec from the full fit to data.

Pre-fit plot of $D_\text{NN}(tHu)$ in the SR$2\ell$ Prod from the full fit to data.

Pre-fit plot of $D_\text{NN}(tHu)$ in the SR$3\ell$ Dec from the full fit to data.

Pre-fit plot of $D_\text{NN}(tHu)$ in the SR$3\ell$ Prod from the full fit to data.

Pre-fit plot of $p_\text{T}(\ell_1)$ in the CR$2\ell$ HF$e$ from the full fit to data.

Pre-fit plot of $p_\text{T}(\ell_1)$ in the CR$2\ell$ HF$\mu$ from the full fit to data.

Pre-fit plot of $p_\text{T}(\ell_1)$ in the CR$2\ell$ $t\bar{t}V$ from the full fit to data.

Pre-fit plot of $p_\text{T}(\ell_2)$ in the CR$3\ell$ HF$e$ from the full fit to data.

Pre-fit plot of $p_\text{T}(\ell_2)$ in the CR$3\ell$ HF$\mu$ from the full fit to data.

Pre-fit plot of $p_\text{T}(b\text{-jet}_0)$ in the CR$3\ell$ $t\bar{t}W$ from the full fit to data.

Pre-fit plot of $p_\text{T}(b\text{-jet}_0)$ in the CR$3\ell$ $t\bar{t}Z$ from the full fit to data.

Ranking of fit nuisance parameters according to their impact on the post-fit $tHu$ signal normalisation when fixed to $\pm1\sigma$

Ranking of fit nuisance parameters according to their impact on the post-fit $tHc$ signal normalisation when fixed to $\pm1\sigma$

Expected upper exclusion limits on the branching ratio $\mathcal{B}(t\to Hu)$ for each individual final state and the full analysis.

Expected upper exclusion limits on the branching ratio $\mathcal{B}(t\to Hc)$ for each individual final state and the full analysis.

The impact of the eight most important systematic uncertainties on \(R_t\), in %.

The post-fit yields in the two SRs. All uncertainties applied in the analysis are included.

Limits on EFT parameters and Vtb extracted from the analysis. The upper and lower limits correspond to 95% CL.

Results of the main analysis.

Pre-fit distribution of the NN discriminant \(D_{\text{nn}}\) in SR plus.

Post-fit distribution of the NN discriminant \(D_{\text{nn}}\) in SR plus.

Post-fit distribution of the \(\Delta\phi(\vec{p}_{T}^{miss},\mu)\) variable in the muon-plus CR.

Pre-fit distribution of the NN discriminant \(D_{\text{nn}}\) in SR minus.

Post-fit distribution of the NN discriminant \(D_{\text{nn}}\) in SR minus.

Post-fit distribution of the \(\Delta\phi(\vec{p}_{T}^{miss},\mu)\) variable in the muon-minus CR.

Pre-fit distribution of the invariant mass of the untagged jet and the b-tagged jet, \(m(jb)\), in SR plus.

Pre-fit distribution of the absolute value of the pseudorapidity of the untagged jet, \(|\eta(j)|\), in SR plus.

Pre-fit distribution of the absolute value of the difference in \(p_{\text{T}}\) between the reconstructed W boson and the jet pair, \(|\Delta p_{\text{T}}(W, jb)|\), in SR plus.

Pre-fit distribution of the difference in azimuth angle between the reconstructed W boson and the jet pair, \(|\Delta\phi(W, jb)|\), in SR plus.

Pre-fit distribution of the invariant mass of the reconstructed top quark, \(m(t)\), in SR plus.

Pre-fit distribution of the absolute value of the difference in pseudorapidity between the charged lepton and the untagged jet, \(|\Delta\eta(\ell ,j)|\), SR plus.

Pre-fit distribution of the angular distance of the charged lepton and the untagged jet, \(\Delta R(\ell ,j)\), in SR plus.

Pre-fit distribution of the absolute value of the difference in pseudorapidity between the b-tagged jet and the charged lepton, \(|\Delta\eta(b,\ell )|\), in SR plus.

Corrected $m(HH)$ distribution in the resolved $4b$ signal region (dots), after the fit under the background-only hypothesis. The error bars on the $4b$ points represent the Poisson uncertainties corresponding to their event yields. The background model (teal histogram) is shown with its total post-fit uncertainty (gray band). The final bin includes overflow. Representative spin-0 signal hypotheses (dashed, dotted, and dashed-dotted lines) are overlaid, normalized to the overall expected limits on their cross-sections. The bottom panel shows the difference between the $4b$ distribution and the background model, relative to the background model. No significant excess of data relative to the SM background is observed.

Corrected $m(HH)$ distribution in the resolved $4b$ signal region (dots), after the fit under the background-only hypothesis. The error bars on the $4b$ points represent the Poisson uncertainties corresponding to their event yields. The background model (teal histogram) is shown with its total post-fit uncertainty (gray band). The final bin includes overflow. Representative spin-2 signal hypotheses (dashed, dotted, and dashed-dotted lines) are overlaid, normalized to the overall expected limits on their cross-sections. The bottom panel shows the difference between the $4b$ distribution and the background model, relative to the background model. No significant excess of data relative to the SM background is observed.

Cumulative signal acceptance times efficiency as a function of the resonance mass for various selection steps in the boosted channel. The steps up to the $b$-tag categorization are shown for the spin-0.

Cumulative signal acceptance times efficiency as a function of the resonance mass for various selection steps in the boosted channel. The steps up to the $b$-tag categorization are shown for the spin-2.

Cumulative signal acceptance times efficiency as a function of the resonance mass for various selection steps in the boosted channel. The efficiencies of the three b-tag categories are shown for the spin-0 scenario; this efficiency is obtained after the other selection steps including the SR definition. The signal efficiency in the 4b region has a maximum around 1.5 TeV. Above that value the track-jets start to merge together, and for the highest resonance masses the 2b category becomes the most efficient.

Cumulative signal acceptance times efficiency as a function of the resonance mass for various selection steps in the boosted channel. The efficiencies of the three b-tag categories are shown for the spin-2 scenario; this efficiency is obtained after the other selection steps including the SR definition. The signal efficiency in the 4b region has a maximum around 1.5 TeV. Above that value the track-jets start to merge together, and for the highest resonance masses the 2b category becomes the most efficient.

Comparison of the background model (stacked histograms) with data (dots) in the $2b$ validation region. The error bars on the data points represent the Poisson uncertainties corresponding to their event yields. The background uncertainty (gray band) is computed by adding all individual components in quadrature and is not allowed to extend below zero.

Comparison of the background model (stacked histograms) with data (dots) in the $3b$ validation region. The error bars on the data points represent the Poisson uncertainties corresponding to their event yields. The background uncertainty (gray band) is computed by adding all individual components in quadrature and is not allowed to extend below zero.

Comparison of the background model (stacked histograms) with data (dots) in the $4b$ validation region. The error bars on the data points represent the Poisson uncertainties corresponding to their event yields. The background uncertainty (gray band) is computed by adding all individual components in quadrature and is not allowed to extend below zero.

The $m(HH)$ distributions in the boosted $2b$ signal regions (dots), after the fit under the background-only hypothesis. The error bars on the data points represent the Poisson uncertainties corresponding to their event yields. The background model (stacked histogram) is shown with its total post-fit uncertainty (gray band). The uncertainty bands are defined using an ensemble of curves constructed by sampling a multivariate Gaussian probability density function built from the covariance matrix of the fit. Representative spin-0 signal hypotheses (dashed and dashed-dotted lines) are overlaid, normalized to the overall expected limits on their cross-sections. No significant excess of data relative to the SM background is observed.

The $m(HH)$ distributions in the boosted $2b$ signal regions (dots), after the fit under the background-only hypothesis. The error bars on the data points represent the Poisson uncertainties corresponding to their event yields. The background model (stacked histogram) is shown with its total post-fit uncertainty (gray band). The uncertainty bands are defined using an ensemble of curves constructed by sampling a multivariate Gaussian probability density function built from the covariance matrix of the fit. Representative spin-2 signal hypotheses (dashed and dashed-dotted lines) are overlaid, normalized to the overall expected limits on their cross-sections. No significant excess of data relative to the SM background is observed.

The $m(HH)$ distributions in the boosted $3b$ signal regions (dots), after the fit under the background-only hypothesis. The error bars on the data points represent the Poisson uncertainties corresponding to their event yields. The background model (stacked histogram) is shown with its total post-fit uncertainty (gray band). The uncertainty bands are defined using an ensemble of curves constructed by sampling a multivariate Gaussian probability density function built from the covariance matrix of the fit. Representative spin-0 signal hypotheses (dashed and dashed-dotted lines) are overlaid, normalized to the overall expected limits on their cross-sections. No significant excess of data relative to the SM background is observed.

The $m(HH)$ distributions in the boosted $3b$ signal regions (dots), after the fit under the background-only hypothesis. The error bars on the data points represent the Poisson uncertainties corresponding to their event yields. The background model (stacked histogram) is shown with its total post-fit uncertainty (gray band). The uncertainty bands are defined using an ensemble of curves constructed by sampling a multivariate Gaussian probability density function built from the covariance matrix of the fit. Representative spin-2 signal hypotheses (dashed and dashed-dotted lines) are overlaid, normalized to the overall expected limits on their cross-sections. No significant excess of data relative to the SM background is observed.

The $m(HH)$ distributions in the boosted $4b$ signal regions (dots), after the fit under the background-only hypothesis. The error bars on the data points represent the Poisson uncertainties corresponding to their event yields. The background model (stacked histogram) is shown with its total post-fit uncertainty (gray band). The uncertainty bands are defined using an ensemble of curves constructed by sampling a multivariate Gaussian probability density function built from the covariance matrix of the fit. Representative spin-0 signal hypotheses (dashed and dashed-dotted lines) are overlaid, normalized to the overall expected limits on their cross-sections. No significant excess of data relative to the SM background is observed.

The $m(HH)$ distributions in the boosted $4b$ signal regions (dots), after the fit under the background-only hypothesis. The error bars on the data points represent the Poisson uncertainties corresponding to their event yields. The background model (stacked histogram) is shown with its total post-fit uncertainty (gray band). The uncertainty bands are defined using an ensemble of curves constructed by sampling a multivariate Gaussian probability density function built from the covariance matrix of the fit. Representative spin-2 signal hypotheses (dashed and dashed-dotted lines) are overlaid, normalized to the overall expected limits on their cross-sections. No significant excess of data relative to the SM background is observed.

Expected (dashed black lines) and observed (solid black lines) 95% CL upper limits on the cross-section of resonant $HH$ production in the spin-0 signal models. The $\pm 1 \sigma$ and $\pm 2 \sigma$ uncertainty ranges for the expected limits (colored bands) are shown. Expected limits using each of the resolved and boosted channels individually (dashed colored lines) are shown. The nominal $H\rightarrow b\bar{b}$ branching ratio is taken as 0.582.

Expected (dashed black lines) and observed (solid black lines) 95% CL upper limits on the cross-section of resonant $HH$ production in the spin-2 signal models. The $\pm 1 \sigma$ and $\pm 2 \sigma$ uncertainty ranges for the expected limits (colored bands) are shown. Expected limits using each of the resolved and boosted channels individually (dashed colored lines) are shown. The theoretical prediction for the bulk RS model with $k/\bar{M}_{\text{Pl}} = 1$ (solid red line) is shown; the decrease below 350 GeV is due to a sharp reduction in the $G^{*}_{\text{KK}} \rightarrow HH$ branching ratio. The nominal $H\rightarrow b\bar{b}$ branching ratio is taken as 0.582.

Summary of the observed and expected 95% CL upper limits on the cross section for $\mathrm{LQ}_{\mathrm{mix}}^{\mathrm{d}}$ pair production as a function of $m_{\mathrm{LQ}_{\mathrm{mix}}^{\mathrm{d}}}$ under the assumptions of B(LQ$\rightarrow t\mu$)=1.

Summary of observed and predicted yields in the four signal region categories. The background prediction is shown after the combined likelihood fit to data under the background-only hypothesis across all control region and signal region categories. The expected signal yields that are obtained by using their theoretical cross sections are also shown with their pre-fit uncertainties, assuming B=1 and $\mu$=1. The "Other" contribution is dominated by $t\bar{t}t\bar{t}$ and $t\bar{t}WW$ in the $3\ell$ SRs, whereas it is dominated by $tWZ$ and $t\bar{t}WW$ in the $4\ell$ SRs. Dashes refer to components that are negligible or not applicable.

Summary of the data, background and signal yields in the four signal region categories. The background prediction is shown before the combined likelihood fit to data. Dashes (--) refer to components that are negligible or not applicable.

Summary of the data and background yields in the seven control region categories. The background prediction is shown before the combined likelihood fit to data. Dashes (--) refer to components that are negligible or not applicable.

Summary of the data and background yields in the seven control region categories. The background prediction is shown after the combined likelihood fit to data under the background-only hypothesis across all control region categories. Dashes (--) refer to components that are negligible or not applicable.

Two-dimensional distribution of the invariant mass $m_{DV}$ and the track multiplicity in the High-pT jet SR for observed data events

Two-dimensional distribution of the invariant mass $m_{DV}$ and the track multiplicity in the High-pT jet SR for expected signal events in the strong gluino pair pair production model with m(gluino)=1.8 TeV, m(chi0)=0.2 TeV, tau(chi0)=0.1 ns

Two-dimensional distribution of the invariant mass $m_{DV}$ and the track multiplicity in the Trackless jet SR for observed data events

Two-dimensional distribution of the invariant mass $m_{DV}$ and the track multiplicity in the Trackless jet SR for expected signal events in the electroweak pair production model

Expected exclusion limits at 95% CL on the lifetime and mass of the neutralino in electroweakino pair production models

Expected (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in electroweakino pair production models

Expected (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in electroweakino pair production models

Observed exclusion limits at 95% CL on the lifetime and mass of the neutralino in electroweakino pair production models

Observed (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in electroweakino pair production models

Observed (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in electroweakino pair production models

Expected exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.4 TeV

Expected (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.4 TeV

Expected (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.4 TeV

Observed exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.4 TeV

Observed (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.4 TeV

Observed (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.4 TeV

Exclusion limits at 95% CL on the production cross section in the electroweak pair production model.

Exclusion limits at 95% CL on the production cross section in the strong gluino pair production models and m(gluino)=2.4 TeV

Expected exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.0 TeV

Expected (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.0 TeV

Expected (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.0 TeV

Observed exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.0 TeV

Observed (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.0 TeV

Observed (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.0 TeV

Expected exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.2 TeV

Expected (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.2 TeV

Expected (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.2 TeV

Observed exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.2 TeV

Observed (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.2 TeV

Observed (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.2 TeV

Expected exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=50 GeV

Expected (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=50 GeV

Expected (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=50 GeV

Observed exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=50 GeV

Observed (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=50 GeV

Observed (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=50 GeV

Expected exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=450 GeV

Expected (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=450 GeV

Expected (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=450 GeV

Observed exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=450 GeV

Observed (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=450 GeV

Observed (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=450 GeV

Expected exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.01 ns

Expected (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.01 ns

Expected (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.01 ns

Observed exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.01 ns

Observed (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.01 ns

Observed (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.01 ns

Expected exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.1 ns

Expected (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.1 ns

Expected (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.1 ns

Observed exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.1 ns

Observed (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.1 ns

Observed (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.1 ns

Expected exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=1 ns

Expected (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=1 ns

Expected (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=1 ns

Observed exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=1 ns

Observed (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=1 ns

Observed (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=1 ns

Expected exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=10 ns

Expected (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=10 ns

Expected (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=10 ns

Observed exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=10 ns

Observed (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=10 ns

Observed (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=10 ns

Exclusion limits at 95% CL on the production cross section in the strong gluino pair production models and m($ ilde{\chi}^0_1$)=1.25 TeV

Acceptance cutflow for the High-pT SR for representative points in the strong gluino pair production model. See additional resources for more information.

Acceptance cutflow for the Trackless SR for representative points in the electroweak pair production model. See additional resources for more information.

Acceptance cutflow for the Trackless SR for representative points in the electroweak pair production model with heavy-flavor quarks final state. See additional resources for more information.

Acceptance cutflow for the High-pT SR for representative points in the electroweak pair production model with heavy-flavor quarks final state. See additional resources for more information.

Reinterpretation Material: Event-level Efficiency for HighPt SR selections, R < 1150 mm

Reinterpretation Material: Event-level Efficiency for HighPt SR selections, R [1150, 3870] mm

Reinterpretation Material: Event-level Efficiency for HighPt SR selections, R > 3870 mm

Reinterpretation Material: Event-level Efficiency for Trackless SR selections, R < 1150 mm

Reinterpretation Material: Event-level Efficiency for Trackless SR selections, R [1150, 3870] mm

Reinterpretation Material: Event-level Efficiency for Trackless SR selections, R > 3870 mm

Reinterpretation Material: Vertex-level Efficiency for R < 22 mm

Reinterpretation Material: Vertex-level Efficiency for R [22, 25] mm

Reinterpretation Material: Vertex-level Efficiency for R [25, 29] mm

Reinterpretation Material: Vertex-level Efficiency for R [29, 38] mm

Reinterpretation Material: Vertex-level Efficiency for R [38, 46] mm

Reinterpretation Material: Vertex-level Efficiency for R [46, 73] mm

Reinterpretation Material: Vertex-level Efficiency for R [73, 84] mm

Reinterpretation Material: Vertex-level Efficiency for R [84, 111] mm

Reinterpretation Material: Vertex-level Efficiency for R [111, 120] mm

Reinterpretation Material: Vertex-level Efficiency for R [120, 145] mm

Reinterpretation Material: Vertex-level Efficiency for R [145, 180] mm

Reinterpretation Material: Vertex-level Efficiency for R [180, 300] mm

Cutflow (acceptance x efficiency) for the High-pT SR for representative points in the strong gluino pair production model. See additional resources for more information.

Cutflow (acceptance x efficiency) for the Trackless SR for representative points in the electroweak pair production model. See additional resources for more information.

Cutflow (acceptance x efficiency) for the Trackless SR for representative points in the electroweak pair production model with heavy-flavor quarks. See additional resources for more information.

Cutflow (acceptance x efficiency) for the High-pT SR for representative points in the electroweak pair production model with heavy-flavor quarks. See additional resources for more information.

Best fit values of $\sigma(gg\to H\to ZZ)$, $\sigma_i/\sigma_{gg\mathrm{F}}$, and $\mathrm{B}^f/\mathrm{B}^{ZZ}$ relative to their SM prediction from the combined analysis of the $\sqrt{s}$=7 and 8 TeV data. The results are shown for the combination of ATLAS and CMS, and also separately for each experiment, together with their total uncertainties and their breakdown into the four components described in the text. The expected uncertainties in the measurements are also shown.

Best fit values of $\sigma(gg\to H\to WW)$, $\sigma_i/\sigma_{gg\mathrm{F}}$, and $\mathrm{B}^f/\mathrm{B}^{WW}$ from the combined analysis of the $\sqrt{s}$=7 and 8 TeV data. The values involving cross sections are given for $\sqrt{s}$=8 TeV, assuming the SM values for $\sigma_i(7 \mathrm{TeV})/\sigma_i(8 \mathrm{TeV})$. The results are shown for the combination of ATLAS and CMS, and also separately for each experiment, together with their total uncertainties and their breakdown into the four components described in the text. The expected uncertainties in the measurements are also shown.

Best fit values of $\sigma(gg\to H\to WW)$, $\sigma_i/\sigma_{gg\mathrm{F}}$, and $\mathrm{B}^f/\mathrm{B}^{WW}$ relative to their SM prediction from the combined analysis of the $\sqrt{s}$=7 and 8 TeV data. The results are shown for the combination of ATLAS and CMS, and also separately for each experiment, together with their total uncertainties and their breakdown into the four components described in the text. The expected uncertainties in the measurements are also shown.

Best fit values of $\kappa_{gZ}= \kappa_{g}\cdot\kappa_{Z} / \kappa_{H}$ and of the ratios of coupling modifiers, as defined in the most generic parameterisation described in the context of the $\kappa$ framework, from the combined analysis of the $\sqrt{s}$=7 and 8 TeV data. The results are shown for the combination of ATLAS and CMS and also separately for each experiment, together with their total uncertainties and their breakdown into the four components described in the text. The uncertainties in $\lambda_{tg}$ and $\lambda_{WZ}$, for which a negative solution is allowed, are calculated around the overall best fit value. The expected total uncertainties in the measurements are also shown. For those parameters with no sensitivity to the sign, only the absolute values are shown.

Measured global signal strength $\mu$ and its total uncertainty, together with the breakdown of the uncertainty into its four components as defined in the text. The results are shown for the combination of ATLAS and CMS, and separately for each experiment. The expected uncertainty, with its breakdown, is also shown.

Measured signal strengths $\mu$ and their total uncertainties for different Higgs boson production processes. The results are shown for the combination of ATLAS and CMS, and separately for each experiment, for the combined $\sqrt{s}$=7 and 8 TeV data. The expected uncertainties in the measurements are also displayed. These results are obtained assuming that the Higgs boson branching fractions are the same as in the SM.

Measured signal strengths $\mu$ and their total uncertainties for different Higgs boson decay channels. The results are shown for the combination of ATLAS and CMS, and separately for each experiment, for the combined $\sqrt{s}$=7 and 8 TeV data. The expected uncertainties in the measurements are also displayed. These results are obtained assuming that the Higgs boson production process cross sections at $\sqrt{s}$ = 7 and 8 TeV are the same as in the SM.

Results of the ten-parameter fit of $\mu_F^f = \mu_{gg\mathrm{F}+ttH}^f$ and $\mu_V^f = \mu_{\mathrm{VBF}+VH}^f$ for each of the five decay channels. The results are shown for the combination of ATLAS and CMS, together with their measured and expected uncertainties. The measured results are also shown separately for each experiment.

Results of the six-parameter fit of the global ratio $\mu_V/\mu_F = \mu_{\mathrm{VBF}+VH}/\mu_{gg\mathrm{F}+ttH}$ together with $\mu_F^f$ for each of the five decay channels. The results are shown for the combination of ATLAS and CMS, together with their measured and expected uncertainties. The measured results are also shown separately for each experiment.

Fit results allowing BSM loop couplings, assuming that $|\kappa_{V}| \le$ 1, where $\kappa_{V}$ denotes $\kappa_{Z}$ or $\kappa_{W}$, and that $\mathrm{B_{BSM}} \ge$ 0. The results for the combination of ATLAS and CMS are reported with their measured and expected uncertainties. Also shown are the results from each experiment. For the parameters with both signs allowed, the other 1$\sigma$ interval is shown on a second line. For those parameters with no sensitivity to the sign, only the absolute values are shown.

Fit results allowing BSM loop couplings, assuming that there are no additional BSM contributions to the Higgs boson width, i.e. $\mathrm{B_{BSM}}=0$. The results for the combination of ATLAS and CMS are reported with their measured and expected uncertainties. Also shown are the results from each experiment. For the parameters with both signs allowed, the other 1$\sigma$ interval is shown on a second line. When a parameter is constrained and reaches a boundary, namely $\mathrm{B_{BSM}}$ = 0, the uncertainty is not indicated. For those parameters with no sensitivity to the sign, only the absolute values are shown.

Fit results for the parameterisation assuming the absence of BSM particles in the loops ($\mathrm{B_{BSM}}$=0). The results with their measured and expected uncertainties are reported for the combination of ATLAS and CMS, together with the individual results from each experiment. For the parameters with both signs allowed, the other 1$\sigma$ CL interval is shown on a second line. When a parameter is constrained and reaches a boundary, namely $|\kappa_\mu|$ = 0, the uncertainty is not indicated. For those parameters with no sensitivity to the sign, only the absolute values are shown.

Summary of fit results for a parameterisation probing the ratios of coupling modifiers for up-type versus down-type fermions. The results for the combination of ATLAS and CMS are reported together with their measured and expected uncertainties. Also shown are the results from each experiment. The parameter $\kappa_{uu}$ is positive definite since $\kappa_H$ is always assumed to be positive. For the parameter $\lambda_{du}$, for which both signs are allowed, the other 1$\sigma$ CL interval is shown on a second line. Negative values for the parameter $\lambda_{Vu}$ are excluded by more than 4$\sigma$.

Summary of fit results for a parameterisation probing the ratios of coupling modifiers for leptons versus quarks. The results for the combination of ATLAS and CMS are reported together with their measured and expected uncertainties. Also shown are the results from each experiment. The parameter $\kappa_{qq}$ is positive definite since $\kappa_H$ is always assumed to be positive. For the parameter $\lambda_{lq}$, for which there is no sensitivity to the sign, only the absolute values are shown. Negative values for the parameter $\lambda_{Vq}$ are excluded by more than 4$\sigma$.

Correlation matrix obtained from the fit combining the ATLAS and CMS data using the generic parameterisation with 23 parameters, $\sigma_i\cdot\mathrm{B}^f$ for each specific channel $i\to H\to f$. Only 20 parameters are shown because the other three, corresponding to the $H\to ZZ$ decay channel for the $WH$, $ZH$, and $ttH$ production processes, are not measured with a meaningful precision.

Correlation matrix obtained from the fit combining the ATLAS and CMS data using the generic parameterisation with nine parameters, $\sigma(gg\to H\to ZZ)$, $\sigma_i/\sigma_{gg\mathrm{F}}$, and $\mathrm{B}^f/\mathrm{B}^{ZZ}$.

Correlation matrix obtained from the fit combining the ATLAS and CMS data using the generic parameterisation with seven parameters, $\kappa_{gZ}=\kappa_{g}\cdot\kappa_{Z} / \kappa_{H}$ and the ratios of coupling modifiers.

Expected correlation matrix obtained from the fit combining ATLAS and CMS pre-fit Asimov data sets using the generic parameterisation with 23 parameters, $\sigma_i\cdot\mathrm{B}^f$ for each specific channel $i\to H\to f$. Only 20 parameters are shown because the other three, corresponding to the $H\to ZZ$ decay channel for the $WH$, $ZH$, and $ttH$ production processes, are not measured with a meaningful precision.

Expected correlation matrix obtained from the fit combining ATLAS and CMS pre-fit Asimov data sets using the generic parameterisation with nine parameters, $\sigma(gg\to H\to ZZ)$, $\sigma_i/\sigma_{gg\mathrm{F}}$, and $\mathrm{B}^f/\mathrm{B}^{ZZ}$.

Expected correlation matrix obtained from the fit combining ATLAS and CMS pre-fit Asimov data sets using the generic parameterisation with seven parameters, $\kappa_{gZ}=\kappa_{g}\cdot\kappa_{Z} / \kappa_{H}$ and the ratios of coupling modifiers.

ATLAS+CMS combined best-fit and 68% and 95% CL negative log-likelihood contours in the ($\kappa_{g}$,$\kappa_{\gamma}$) plane.

ATLAS best-fit and 68% and 95% CL negative log-likelihood contours in the ($\kappa_{g}$,$\kappa_{\gamma}$) plane.

CMS best-fit and 68% and 95% CL negative log-likelihood contours in the ($\kappa_{g}$,$\kappa_{\gamma}$) plane.

Best-fit and 68% and 95% CL negative log-likelihood contours in the ($\kappa_{F}$,$\kappa_{V}$) plane.

Best-fit and 68% CL negative log-likelihood contour in the ($\kappa_{F}$,$\kappa_{V}$) plane for the $H\rightarrow\gamma\gamma$ channel.

Best-fit and 68% CL negative log-likelihood contour in the ($\kappa_{F}$,$\kappa_{V}$) plane for the $H\rightarrow ZZ$ channel.

Best-fit and 68% CL negative log-likelihood contour in the ($\kappa_{F}$,$\kappa_{V}$) plane for the $H\rightarrow WW$ channel.

Best-fit and 68% CL negative log-likelihood contour in the ($\kappa_{F}$,$\kappa_{V}$) plane for the $H\rightarrow\tau\tau$ channel.

Best-fit and 68% CL negative log-likelihood contour in the ($\kappa_{F}$,$\kappa_{V}$) plane for the $H\rightarrow bb$ channel.

ATLAS best-fit and 68% and 95% CL negative log-likelihood contours in the ($\kappa_{F}$,$\kappa_{V}$) plane.

CMS best-fit and 68% and 95% CL negative log-likelihood contours in the ($\kappa_{F}$,$\kappa_{V}$) plane.

Best-fit and 68% CL negative log-likelihood contour in the ($\kappa_{F}$,$\kappa_{V}$) plane for the $H\rightarrow\gamma\gamma$ channel, assuming $\kappa_{F}>0$.

Best-fit and 68% CL negative log-likelihood contour in the ($\kappa_{F}$,$\kappa_{V}$) plane for the $H\rightarrow ZZ$ channel, assuming $\kappa_{F}>0$.

Best-fit and 68% CL negative log-likelihood contour in the ($\kappa_{F}$,$\kappa_{V}$) plane for the $H\rightarrow WW$ channel, assuming $\kappa_{F}>0$.

Best-fit and 68% CL negative log-likelihood contour in the ($\kappa_{F}$,$\kappa_{V}$) plane for the $H\rightarrow\tau\tau$ channel, assuming $\kappa_{F}>0$.

Best-fit and 68% CL negative log-likelihood contour in the ($\kappa_{F}$,$\kappa_{V}$) plane for the $H\rightarrow bb$ channel, assuming $\kappa_{F}>0$.

Best-fit and 68% and 95% CL negative log-likelihood contours in the ($\mu^{f}_{gg\mathrm{F}+ttH}$,$\mu^{f}_{\mathrm{VBF}+VH}$) plane for the $H\rightarrow\gamma\gamma$ channel.

Best-fit and 68% and 95% CL negative log-likelihood contours in the ($\mu^{f}_{gg\mathrm{F}+ttH}$,$\mu^{f}_{\mathrm{VBF}+VH}$) plane for the $H\rightarrow ZZ$ channel.

Best-fit and 68% and 95% CL negative log-likelihood contours in the ($\mu^{f}_{gg\mathrm{F}+ttH}$,$\mu^{f}_{\mathrm{VBF}+VH}$) plane for the $H\rightarrow WW$ channel.

Best-fit and 68% and 95% CL negative log-likelihood contours in the ($\mu^{f}_{gg\mathrm{F}+ttH}$,$\mu^{f}_{\mathrm{VBF}+VH}$) plane for the $H\rightarrow\tau\tau$ channel.

Best-fit and 68% and 95% CL negative log-likelihood contours in the ($\mu^{f}_{gg\mathrm{F}+ttH}$,$\mu^{f}_{\mathrm{VBF}+VH}$) plane for the $H\rightarrow bb$ channel.