Measured cross sections for isolated-photon plus jet production as a function of $m^{\gamma-\rm jet}$.

Measured cross sections for isolated-photon plus jet production as a function of $|\cos\theta^{\star}|$.

Measured differential fiducial cross sections in cos(theta*) (second column). The given uncertainty is split into statistical (first) and systematic components (second). Values without uncertainties are 95% CL limits in the absence of signal events. The third column gives the theoretical prediction of Higgs production in the fiducial volume using Powheg NNLOPS for the ggF process, Powheg for the VBF and the VH processes, and Madgraph5_aMC@NLO for the ttH and bbH processes. The uncertainty includes PDF, scale, and branching fraction uncertainty. All predictions were normalized to the best available inclusive Higgs production cross sections at the time of the publication.

Measured differential fiducial cross sections in number of jets (second column). The given uncertainty is split into statistical (first) and systematic components (second). Values without uncertainties are 95% CL limits in the absence of signal events. The third column gives the theoretical prediction of Higgs production in the fiducial volume using Powheg NNLOPS for the ggF process, Powheg for the VBF and the VH processes, and Madgraph5_aMC@NLO for the ttH and bbH processes. The uncertainty includes PDF, scale, and branching fraction uncertainty. All predictions were normalized to the best available inclusive Higgs production cross sections at the time of the publication.

Measured differential fiducial cross sections in transverse momentum of the leading jet (second column). The given uncertainty is split into statistical (first) and systematic components (second). Values without uncertainties are 95% CL limits in the absence of signal events. The third column gives the theoretical prediction of Higgs production in the fiducial volume using Powheg NNLOPS for the ggF process, Powheg for the VBF and the VH processes, and Madgraph5_aMC@NLO for the ttH and bbH processes. The uncertainty includes PDF, scale, and branching fraction uncertainty. All predictions were normalized to the best available inclusive Higgs production cross sections at the time of the publication.

Measured differential fiducial cross sections in dijet invariant mass (second column). The given uncertainty is split into statistical (first) and systematic components (second). Values without uncertainties are 95% CL limits in the absence of signal events. The third column gives the theoretical prediction of Higgs production in the fiducial volume using Powheg NNLOPS for the ggF process, Powheg for the VBF and the VH processes, and Madgraph5_aMC@NLO for the ttH and bbH processes. The uncertainty includes PDF, scale, and branching fraction uncertainty. All predictions were normalized to the best available inclusive Higgs production cross sections at the time of the publication.

Measured differential fiducial cross sections in dijet angle phi (second column). The given uncertainty is split into statistical (first) and systematic components (second). Values without uncertainties are 95% CL limits in the absence of signal events. The third column gives the theoretical prediction of Higgs production in the fiducial volume using Powheg NNLOPS for the ggF process, Powheg for the VBF and the VH processes, and Madgraph5_aMC@NLO for the ttH and bbH processes. The uncertainty includes PDF, scale, and branching fraction uncertainty. All predictions were normalized to the best available inclusive Higgs production cross sections at the time of the publication.

Measured differential fiducial cross sections in m12 vs m34 (second column). The given uncertainty is split into statistical (first) and systematic components (second). Values without uncertainties are 95% CL limits in the absence of signal events. The third column gives the theoretical prediction of Higgs production in the fiducial volume using Powheg NNLOPS for the ggF process, Powheg for the VBF and the VH processes, and Madgraph5_aMC@NLO for the ttH and bbH processes. The uncertainty includes PDF, scale, and branching fraction uncertainty. All predictions were normalized to the best available inclusive Higgs production cross sections at the time of the publication.

Measured differential fiducial cross sections in Higgs transverse momentum for 0 jet events (second column). The given uncertainty is split into statistical (first) and systematic components (second). Values without uncertainties are 95% CL limits in the absence of signal events. The third column gives the theoretical prediction of Higgs production in the fiducial volume using Powheg NNLOPS for the ggF process, Powheg for the VBF and the VH processes, and Madgraph5_aMC@NLO for the ttH and bbH processes. The uncertainty includes PDF, scale, and branching fraction uncertainty. All predictions were normalized to the best available inclusive Higgs production cross sections at the time of the publication.

Measured differential fiducial cross sections in Higgs transverse momentum for 1-jet events (second column). The given uncertainty is split into statistical (first) and systematic components (second). Values without uncertainties are 95% CL limits in the absence of signal events. The third column gives the theoretical prediction of Higgs production in the fiducial volume using Powheg NNLOPS for the ggF process, Powheg for the VBF and the VH processes, and Madgraph5_aMC@NLO for the ttH and bbH processes. The uncertainty includes PDF, scale, and branching fraction uncertainty. All predictions were normalized to the best available inclusive Higgs production cross sections at the time of the publication.

Measured differential fiducial cross sections in Higgs transverse momentum for events with 2 or more jets (second column). The given uncertainty is split into statistical (first) and systematic components (second). Values without uncertainties are 95% CL limits in the absence of signal events. The third column gives the theoretical prediction of Higgs production in the fiducial volume using Powheg NNLOPS for the ggF process, Powheg for the VBF and the VH processes, and Madgraph5_aMC@NLO for the ttH and bbH processes. The uncertainty includes PDF, scale, and branching fraction uncertainty. All predictions were normalized to the best available inclusive Higgs production cross sections at the time of the publication.

Measured differential fiducial cross sections in dijet angle eta (second column). The given uncertainty is split into statistical (first) and systematic components (second). Values without uncertainties are 95% CL limits in the absence of signal events. The third column gives the theoretical prediction of Higgs production in the fiducial volume using Powheg NNLOPS for the ggF process, Powheg for the VBF and the VH processes, and Madgraph5_aMC@NLO for the ttH and bbH processes. The uncertainty includes PDF, scale, and branching fraction uncertainty. All predictions were normalized to the best available inclusive Higgs production cross sections at the time of the publication.

Measured differential fiducial cross sections in invariant mass of the leading lepton pair (second column). The given uncertainty is split into statistical (first) and systematic components (second). Values without uncertainties are 95% CL limits in the absence of signal events. The third column gives the theoretical prediction of Higgs production in the fiducial volume using Powheg NNLOPS for the ggF process, Powheg for the VBF and the VH processes, and Madgraph5_aMC@NLO for the ttH and bbH processes. The uncertainty includes PDF, scale, and branching fraction uncertainty. All predictions were normalized to the best available inclusive Higgs production cross sections at the time of the publication.

Measured differential fiducial cross sections in number of bjets (second column). The given uncertainty is split into statistical (first) and systematic components (second). Values without uncertainties are 95% CL limits in the absence of signal events. The third column gives the theoretical prediction of Higgs production in the fiducial volume using Powheg NNLOPS for the ggF process, Powheg for the VBF and the VH processes, and Madgraph5_aMC@NLO for the ttH and bbH processes. The uncertainty includes PDF, scale, and branching fraction uncertainty. All predictions were normalized to the best available inclusive Higgs production cross sections at the time of the publication.

Measured fiducial cross sections (second column). The given uncertainty is split into statistical (first) and systematic components (second). The third column gives the theoretical prediction of Higgs production in the fiducial volume using the best available inclusive Higgs production cross sections at the time of the publication. The acceptance to estimate the cross section in the fiducial volume is calculated using Powheg NNLOPS for the ggF process, Powheg for the VBF and the VH processes, and Madgraph5_aMC@NLO for the ttH and bbH processes. The uncertainty includes PDF, scale, and branching fraction uncertainty.

The measured differential as a function of aT.

The measured differential as a function of phiStarEta.

The measured differential as a function of abs(cosThetaStarEta).

The measured differential as a function of deltaPhi.

Statistical correlation between bins in data for the differential cross sections for the production of W⁺ bosons as a function of the inclusive jet multiplicity.

Statistical correlation between bins in data for the differential cross sections for the production of W^- bosons as a function of the inclusive jet multiplicity.

Differential cross section for the production of W bosons as a function of H_T for events with N_jets ≥ 1.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of H_T for events with N_jets ≥ 1.

Differential cross sections for the production of W⁺ bosons, W^- bosons and the W⁺/W^- cross section ratio as a function of the H_T for events with N_jets ≥ 1.

Statistical correlation between bins in data for the differential cross sections for the production of W⁺ bosons as a function of the H_T for events with N_jets ≥ 1.

Statistical correlation between bins in data for the differential cross sections for the production of W^- bosons as a function of the H_T for events with N_jets ≥ 1.

Differential cross section for the production of W bosons as a function of the W p_T for events with N_jets ≥ 1.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of the W p_T for events with N_jets ≥ 1.

Differential cross sections for the production of W⁺ bosons, W^- bosons and the W⁺/W^- cross section ratio as a function of the W p_T for events with N_jets ≥ 1.

Statistical correlation between bins in data for the differential cross sections for the production of W⁺ bosons as a function of the W p_T for events with N_jets ≥ 1.

Statistical correlation between bins in data for the differential cross sections for the production of W^- bosons as a function of the W p_T for events with N_jets ≥ 1.

Differential cross section for the production of W bosons as a function of the leading jet p_T for events with N_jets ≥ 1.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of the leading jet p_T for events with N_jets ≥ 1.

Differential cross sections for the production of W⁺ bosons, W^- bosons and the W⁺/W^- cross section ratio as a function of the leading jet p_T for events with N_jets ≥ 1.

Statistical correlation between bins in data for the differential cross sections for the production of W⁺ bosons as a function of the leading jet p_T for events with N_jets ≥ 1.

Statistical correlation between bins in data for the differential cross sections for the production of W^- bosons as a function of the leading jet p_T for events with N_jets ≥ 1.

Differential cross section for the production of W bosons as a function of the leading jet rapidity for events with N_jets ≥ 1.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of the leading jet rapidity for events with N_jets ≥ 1.

Differential cross sections for the production of W⁺ bosons, W^- bosons and the W⁺/W^- cross section ratio as a function of the leading jet rapidity for events with N_jets ≥ 1.

Statistical correlation between bins in data for the differential cross sections for the production of W⁺ bosons as a function of the leading jet rapidity for events with N_jets ≥ 1.

Statistical correlation between bins in data for the differential cross sections for the production of W^- bosons as a function of the leading jet rapidity for events with N_jets ≥ 1.

Differential cross section for the production of W bosons as a function of second leading jet p_T for events with N_jets ≥ 2.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of second leading jet p_T for events with N_jets ≥ 2.

Differential cross section for the production of W bosons as a function of second leading jet rapidity for events with N_jets ≥ 2.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of second leading jet rapidity for events with N_jets ≥ 2.

Differential cross section for the production of W bosons as a function of Δ R_jet1,jet2 for events with N_jets ≥ 2.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of Δ R_jet1,jet2 for events with N_jets ≥ 2.

Differential cross section for the production of W bosons as a function of dijet invariant mass for events with N_jets ≥ 2.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of dijet invariant mass for events with N_jets ≥ 2.

Cross section for the production of W bosons as a function of exclusive jet multiplicity.

Statistical correlation between bins in data for the cross section for the production of W bosons as a function of exclusive jet multiplicity.

Differential cross section for the production of W bosons as a function of the H_T for events with N_jets ≥ 2.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of the H_T for events with N_jets ≥ 2.

Differential cross sections for the production of W⁺ bosons, W^- bosons and the W⁺/W^- cross section ratio as a function of the H_T for events with N_jets ≥ 2.

Statistical correlation between bins in data for the differential cross sections for the production of W⁺ bosons as a function of the H_T for events with N_jets ≥ 2.

Statistical correlation between bins in data for the differential cross sections for the production of W^- bosons as a function of the H_T for events with N_jets ≥ 2.

Differential cross section for the production of W bosons as a function of the W p_T for events with N_jets ≥ 2.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of the W p_T for events with N_jets ≥ 2.

Differential cross sections for the production of W⁺ bosons, W^- bosons and the W⁺/W^- cross section ratio as a function of the W p_T for events with N_jets ≥ 2.

Statistical correlation between bins in data for the differential cross sections for the production of W⁺ bosons as a function of the W p_T for events with N_jets ≥ 2.

Statistical correlation between bins in data for the differential cross sections for the production of W^- bosons as a function of the W p_T for events with N_jets ≥ 2.

Differential cross section for the production of W bosons as a function of the leading jet p_T for events with N_jets ≥ 2.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of the leading jet p_T for events with N_jets ≥ 2.

Differential cross sections for the production of W⁺ bosons, W^- bosons and the W⁺/W^- cross section ratio as a function of the leading jet p_T for events with N_jets ≥ 2.

Statistical correlation between bins in data for the differential cross sections for the production of W⁺ bosons as a function of the leading jet p_T for events with N_jets ≥ 2.

Statistical correlation between bins in data for the differential cross sections for the production of W^- bosons as a function of the leading jet p_T for events with N_jets ≥ 2.

Differential cross section for the production of W bosons as a function of the electron η for events with N_jets ≥ 0.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of the electron η for events with N_jets ≥ 0.

Differential cross sections for the production of W⁺ bosons, W^- bosons and the W⁺/W^- cross section ratio as a function of the electron η for events with N_jets ≥ 0.

Statistical correlation between bins in data for the differential cross sections for the production of W⁺ bosons as a function of the electron η for events with N_jets ≥ 0.

Statistical correlation between bins in data for the differential cross sections for the production of W^- bosons as a function of the electron η for events with N_jets ≥ 0.

Differential cross section for the production of W bosons as a function of the electron η for events with N_jets ≥ 1.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of the electron η for events with N_jets ≥ 1.

Differential cross sections for the production of W⁺ bosons, W^- bosons and the W⁺/W^- cross section ratio as a function of the electron η for events with N_jets ≥ 1.

Statistical correlation between bins in data for the differential cross sections for the production of W⁺ bosons as a function of the electron η for events with N_jets ≥ 1.

Statistical correlation between bins in data for the differential cross sections for the production of W^- bosons as a function of the electron η for events with N_jets ≥ 1.

List of experimentally considered systematic uncertainties for the W+jets cross section measurement

Non-perturbative corrections for the cross section for the production of W bosons for different inclusive jet multiplicities.

Non-perturbative corrections for the differential cross sections for the production of W⁺ bosons and W^- bosons as a function of the inclusive jet multiplicity.

Non-perturbative corrections for the differential cross section for the production of W bosons as a function of H_T for events with N_jets ≥ 1.

Non-perturbative corrections for the differential cross sections for the production of W⁺ bosons and W^- bosons as a function of the H_T for events with N_jets ≥ 1.

Non-perturbative corrections for the differential cross section for the production of W bosons as a function of the W p_T for events with N_jets ≥ 1.

Non-perturbative corrections for the differential cross sections for the production of W⁺ bosons and W^- bosons as a function of the W p_T for events with N_jets ≥ 1.

Non-perturbative corrections for the differential cross section for the production of W bosons as a function of the leading jet p_T for events with N_jets ≥ 1.

Non-perturbative corrections for the differential cross sections for the production of W⁺ bosons and W^- bosons as a function of the leading jet p_T for events with N_jets ≥ 1.

Non-perturbative corrections for the differential cross section for the production of W bosons as a function of the leading jet rapidity for events with N_jets ≥ 1.

Non-perturbative corrections for the differential cross sections for the production of W⁺ bosons and W^- bosons as a function of the leading jet rapidity for events with N_jets ≥ 1.

Non-perturbative corrections for the differential cross section for the production of W bosons as a function of second leading jet p_T for events with N_jets ≥ 2.

Non-perturbative corrections for the differential cross section for the production of W bosons as a function of second leading jet rapidity for events with N_jets ≥ 2.

Non-perturbative corrections for the differential cross section for the production of W bosons as a function of Δ R_jet1,jet2 for events with N_jets ≥ 2.

Non-perturbative corrections for the differential cross section for the production of W bosons as a function of dijet invariant mass for events with N_jets ≥ 2.

Non-perturbative corrections for the cross section for the production of W bosons as a function of exclusive jet multiplicity.

Non-perturbative corrections for the differential cross section for the production of W bosons as a function of the H_T for events with N_jets ≥ 2.

Non-perturbative corrections for the differential cross sections for the production of W⁺ bosons and W^- bosons as a function of the H_T for events with N_jets ≥ 2.

Non-perturbative corrections for the differential cross section for the production of W bosons as a function of the W p_T for events with N_jets ≥ 2.

Non-perturbative corrections for the differential cross sections for the production of W⁺ bosons and W^- bosons as a function of the W p_T for events with N_jets ≥ 2.

Non-perturbative corrections for the differential cross section for the production of W bosons as a function of the leading jet p_T for events with N_jets ≥ 2.

Non-perturbative corrections for the differential cross sections for the production of W⁺ bosons and W^- bosons as a function of the leading jet p_T for events with N_jets ≥ 2.

NNLO/NLO k-factors determined with NNLO Njetti for the differential cross sections for the production of W⁺ bosons and W^- bosons as a function of the H_T for events with N_jets ≥ 1. These numbers were obtained with code described in Phys. Rev. Lett. 115 (2015) 062002 [arXiv:1504.02131].

NNLO/NLO k-factors determined with NNLO Njetti for the differential cross sections for the production of W⁺ bosons and W^- bosons as a function of the W p_T for events with N_jets ≥ 1. These numbers were obtained with code described in Phys. Rev. Lett. 115 (2015) 062002 [arXiv:1504.02131].

NNLO/NLO k-factors determined with NNLO Njetti for the differential cross sections for the production of W⁺ bosons and W^- bosons as a function of the leading jet p_T for events with N_jets ≥ 1. These numbers were obtained with code described in Phys. Rev. Lett. 115 (2015) 062002 [arXiv:1504.02131].

NNLO/NLO k-factors determined with NNLO Njetti for the differential cross sections for the production of W⁺ bosons and W^- bosons as a function of the leading jet rapidity for events with N_jets ≥ 1. These numbers were obtained with code described in Phys. Rev. Lett. 115 (2015) 062002 [arXiv:1504.02131].

Detailed breakdown of systematic uncertainties for the measurement in the central rapidity electron channel. Common systematic uncertainty on the luminosity measurment of 1.8% is not included. Correlated systematic uncertainties with the suffix :A should be treated as additive and with the suffix :M should be treated as multiplicative. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level. 'C Dressed' represents the multiplicative correction factor to translate the cross sections to the dressed level with the cone radius of 0.1: SigmaDressed = C Dressed * SigmaBorn.

Detailed breakdown of systematic uncertainties for the measurement in the central rapidity electron channel. Common systematic uncertainty on the luminosity measurment of 1.8% is not included. Correlated systematic uncertainties with the suffix :A should be treated as additive and with the suffix :M should be treated as multiplicative. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level. 'C Dressed' represents the multiplicative correction factor to translate the cross sections to the dressed level with the cone radius of 0.1: SigmaDressed = C Dressed * SigmaBorn.

Detailed breakdown of systematic uncertainties for the measurement in the central rapidity electron channel. Common systematic uncertainty on the luminosity measurment of 1.8% is not included. Correlated systematic uncertainties with the suffix :A should be treated as additive and with the suffix :M should be treated as multiplicative. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level. 'C Dressed' represents the multiplicative correction factor to translate the cross sections to the dressed level with the cone radius of 0.1: SigmaDressed = C Dressed * SigmaBorn.

Detailed breakdown of systematic uncertainties for the measurement in the forward rapidity electron channel. Common systematic uncertainty on the luminosity measurment of 1.8% is not included. Correlated systematic uncertainties with the suffix :A should be treated as additive and with the suffix :M should be treated as multiplicative. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level. 'C Dressed' represents the multiplicative correction factor to translate the cross sections to the dressed level with the cone radius of 0.1: SigmaDressed = C Dressed * SigmaBorn.

Detailed breakdown of systematic uncertainties for the measurement in the forward rapidity electron channel. Common systematic uncertainty on the luminosity measurment of 1.8% is not included. Correlated systematic uncertainties with the suffix :A should be treated as additive and with the suffix :M should be treated as multiplicative. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level. 'C Dressed' represents the multiplicative correction factor to translate the cross sections to the dressed level with the cone radius of 0.1: SigmaDressed = C Dressed * SigmaBorn.

Detailed breakdown of systematic uncertainties for the measurement in the forward rapidity electron channel. Common systematic uncertainty on the luminosity measurment of 1.8% is not included. Correlated systematic uncertainties with the suffix :A should be treated as additive and with the suffix :M should be treated as multiplicative. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level. 'C Dressed' represents the multiplicative correction factor to translate the cross sections to the dressed level with the cone radius of 0.1: SigmaDressed = C Dressed * SigmaBorn.

Detailed breakdown of systematic uncertainties for the combined measurement of muon, electron central and electron central-forward channels. Common systematic uncertainty on the luminosity measurment of 1.8% is not included. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level.

Detailed breakdown of systematic uncertainties for the combined measurement of muon, electron central and electron central-forward channels. Common systematic uncertainty on the luminosity measurment of 1.8% is not included. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level.

Detailed breakdown of systematic uncertainties for the combined measurement of muon, electron central and electron central-forward channels. Common systematic uncertainty on the luminosity measurment of 1.8% is not included. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level.

Detailed breakdown of systematic uncertainties for the combined measurement, integerated in cos theta_CS (differential in y, Mll) Common systematic uncertainty on the luminosity measurment of 1.8% is not included. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level.

Detailed breakdown of systematic uncertainties for the combined measurement, integerated in cos theta_CS (differential in y, Mll) Common systematic uncertainty on the luminosity measurment of 1.8% is not included. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level.

Detailed breakdown of systematic uncertainties for the combined measurement, integerated in cos theta_CS (differential in y, Mll) Common systematic uncertainty on the luminosity measurment of 1.8% is not included. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level.

Detailed breakdown of systematic uncertainties for the combined measurement, integerated in cos theta_CS and y (differential in Mll) Common systematic uncertainty on the luminosity measurment of 1.8% is not included. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level.

Detailed breakdown of systematic uncertainties for the combined measurement, integerated in cos theta_CS and y (differential in Mll) Common systematic uncertainty on the luminosity measurment of 1.8% is not included. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level.

Detailed breakdown of systematic uncertainties for the combined measurement, integerated in cos theta_CS and y (differential in Mll) Common systematic uncertainty on the luminosity measurment of 1.8% is not included. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level.

Powheg based prediction for AFB in the central-central fiducial phase space, as reported in Fig 16 of the paper. Powheg prediction is corrected to NNLO QCD and NLO EWK, as described in the paper. PDF uncertainties are computed using CT10 PDF set scaled to 68%.

Powheg based prediction for AFB in the central-fiducial fiducial phase space, as reported in Fig 17 of the paper. Powheg prediction is corrected to NNLO QCD and NLO EWK, as described in the paper. PDF uncertainties are computed using CT10 PDF set scaled to 68%.

Measured cross section in bins of $p_{\rm{T}}^{\rm{j}1}$.

Measured fractions in bins of $p_{\rm{T}}^{\rm{H}}$.

Measured fractions in bins of $|y^{\rm{H}}|$.

Measured fractions in bins of $N_{\rm{jets}}$.

Measured fractions in bins of $p_{\rm{T}}^{\rm{j1}}$.

Correlation matrix for the total uncertainty of the differential cross-section measurement in bins of $p_{\rm{T}}^{\rm{H}}$.

Correlation matrix for the total uncertainty of the differential cross-section measurement in bins of $|y^{\rm{H}}|$.

Correlation matrix for the total uncertainty of the differential cross-section measurement in bins of $N_{\rm{jets}}$.

Correlation matrix for the total uncertainty of the differential cross-section measurement in bins of $p_{\rm{T}}^{\rm{j1}}$.

Correlation matrix for the total uncertainty of the differential shape measurement in bins of $p_{\rm{T}}^{\rm{H}}$.

Correlation matrix for the total uncertainty of the differential shape measurement in bins of $|y^{\rm{H}}|$.

Correlation matrix for the total uncertainty of the differential shape measurement in bins of $N_{\rm{jets}}$.

Correlation matrix for the total uncertainty of the differential shape measurement in bins of $p_{\rm{T}}^{\rm{j1}}$.

The total $pp\to H$ cross section in the $H\to\gamma\gamma$ and $H\to ZZ^*\to 4\ell$ channels and their combination.

The electron channel Born-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kDressed) is also provided.

The electron channel Born-level double-differential cross section D2SIG/DM/DABSYRAP. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kDressed) is also provided.

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kDressed) is also provided.

The muon channel Born-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kdressed) is also provided.

The muon channel Born-level double-differential cross section D2SIG/DM/DABSYRAP. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kdressed) is also provided.

The muon channel Born-level double-differential cross section D2SIG/DM/DABSDETA. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kdressed) is also provided.

Born-level differential fiducial cross section prediction DSIG/DM at NNLO including NLO electroweak corrections and the PI contribution. The calculation is performed using the MMHT2014 NNLO PDF set and with dynamic scales set equal to the invariant mass. The predictions are listed together with the statistical uncertainty, the PDF eigenvector variation, the uncertainty from the variation of alpha_s, the combined uncertainty from mu_F and mu_R, and the uncertainty from the variation of the photon PDF in the PI contribution. The fraction of the PI contribution, f(PI), is also given.

Born-level differential fiducial cross section prediction D2SIG/DM/DABSYRAP at NNLO including NLO electroweak corrections and the PI contribution. The calculation is performed using the MMHT2014 NNLO PDF set and with dynamic scales set equal to the invariant mass. The predictions are listed together with the statistical uncertainty, the PDF eigenvector variation, the uncertainty from the variation of alpha_s, the combined uncertainty from mu_F and mu_R, and the uncertainty from the variation of the photon PDF in the PI contribution. The fraction of the PI contribution, f(PI), is also given.

Born-level differential fiducial cross section prediction D2SIG/DM/DABSDETA at NNLO including NLO electroweak corrections and the PI contribution. The calculation is performed using the MMHT2014 NNLO PDF set and with dynamic scales set equal to the invariant mass. The predictions are listed together with the statistical uncertainty, the PDF eigenvector variation, the uncertainty from the variation of alpha_s, the combined uncertainty from mu_F and mu_R, and the uncertainty from the variation of the photon PDF in the PI contribution. The fraction of the PI contribution, f(PI), is also given.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 116 GeV < M(EE) < 150 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 150 GeV < M(EE) < 200 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 200 GeV < M(EE) < 300 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 300 GeV < M(EE) < 500 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 500 GeV < M(EE) < 1500 GeV.

The electron channel dressed-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 116 GeV < M(EE) < 150 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 150 GeV < M(EE) < 200 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 200 GeV < M(EE) < 300 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 300 GeV < M(EE) < 500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 500 GeV < M(EE) < 1500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 116 GeV < M(EE) < 150 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 150 GeV < M(EE) < 200 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 200 GeV < M(EE) < 300 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 300 GeV < M(EE) < 500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 500 GeV < M(EE) < 1500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 116 GeV < M(MM) < 150 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 150 GeV < M(MM) < 200 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 200 GeV < M(MM) < 300 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 300 GeV < M(MM) < 500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 500 GeV < M(MM) < 1500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 116 GeV < M(MM) < 150 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 150 GeV < M(MM) < 200 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 200 GeV < M(MM) < 300 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 300 GeV < M(MM) < 500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 500 GeV < M(MM) < 1500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

Results for the DeltaR distribution. Statistical and systematic uncertainties are quoted.

Results for the pT distribution. Statistical and systematic uncertainties are quoted.

Results for the y_B distribution. Statistical and systematic uncertainties are quoted.

The total inelastic cross section.

The measured differential elastic cross section. In addition to the statistical and total systematic uncertainties, the following 22 systematic shifts are given, which are included in the profile fit with their signs: -- Constraints: Beam optics uncertainty obtained by varying the ALFA constraints in the optics fit -- QScan: Variation by +/- 0.1 % of the quadrupole strength -- Q2: Fit of the strength of Q2 using the best value for the strength of Q1 and Q3 -- Q5Q6: Variation of the strength of Q5 and Q6 by -0.2% as indicated by machine constraints -- MadX: Uncertainty related to the beam transport replacing matrix transport by MadX PTC tracking -- Qmisal: Uncertainty due to the mis-alignment of the quadrupoles in the beam line -- Q1Q3: Propagation of the optics fit uncertainty in the strenght of Q1 and Q3 on the differential elastic cross section -- Aopt: Alignment uncertainty from the optimization procedure -- Offv: Alignment uncertainty related to the vertical beam center offset -- Offh: Alignment uncertainty related to the horizontal beam center offset -- Ang: Alignment uncertainty related to the detector rotation in the x-y plane -- BGn: Uncertainty from the background normalization -- BGs: Uncertainty from the background shape -- MCres: Error from modelling of the detector response -- Slope: Residual dependence on the physics model estimated by varying the nuclear slope in the simulation by +/- 1 GeV^-2 -- Emit: Uncertainty from the emittance used to calculate beam divergence in the simulation -- Unf: Unfolding uncertainty from the data-driven closure test -- Trac: Uncertainty from the variation of the track reconstruction selection cuts -- Xing: Uncertainty from residual crossing angle in the horizontal plane -- Eff: Uncertainty from the reconstruction efficiency -- Lumi: Luminosity uncertainty (+/- 1.5%) -- Ebeam: Uncertainty from the nominal beam energy (+/- 0.65%) Small differences in the values given here compared to the published version are related to insignificant rounding issues.

The statistical covariance matrix for the differential elastic cross section.