Statistical correlation between bins in data for the differential cross sections for the production of W⁺ bosons as a function of the inclusive jet multiplicity.

Statistical correlation between bins in data for the differential cross sections for the production of W^- bosons as a function of the inclusive jet multiplicity.

Differential cross section for the production of W bosons as a function of H_T for events with N_jets ≥ 1.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of H_T for events with N_jets ≥ 1.

Differential cross sections for the production of W⁺ bosons, W^- bosons and the W⁺/W^- cross section ratio as a function of the H_T for events with N_jets ≥ 1.

Statistical correlation between bins in data for the differential cross sections for the production of W⁺ bosons as a function of the H_T for events with N_jets ≥ 1.

Statistical correlation between bins in data for the differential cross sections for the production of W^- bosons as a function of the H_T for events with N_jets ≥ 1.

Differential cross section for the production of W bosons as a function of the W p_T for events with N_jets ≥ 1.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of the W p_T for events with N_jets ≥ 1.

Differential cross sections for the production of W⁺ bosons, W^- bosons and the W⁺/W^- cross section ratio as a function of the W p_T for events with N_jets ≥ 1.

Statistical correlation between bins in data for the differential cross sections for the production of W⁺ bosons as a function of the W p_T for events with N_jets ≥ 1.

Statistical correlation between bins in data for the differential cross sections for the production of W^- bosons as a function of the W p_T for events with N_jets ≥ 1.

Differential cross section for the production of W bosons as a function of the leading jet p_T for events with N_jets ≥ 1.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of the leading jet p_T for events with N_jets ≥ 1.

Differential cross sections for the production of W⁺ bosons, W^- bosons and the W⁺/W^- cross section ratio as a function of the leading jet p_T for events with N_jets ≥ 1.

Statistical correlation between bins in data for the differential cross sections for the production of W⁺ bosons as a function of the leading jet p_T for events with N_jets ≥ 1.

Statistical correlation between bins in data for the differential cross sections for the production of W^- bosons as a function of the leading jet p_T for events with N_jets ≥ 1.

Differential cross section for the production of W bosons as a function of the leading jet rapidity for events with N_jets ≥ 1.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of the leading jet rapidity for events with N_jets ≥ 1.

Differential cross sections for the production of W⁺ bosons, W^- bosons and the W⁺/W^- cross section ratio as a function of the leading jet rapidity for events with N_jets ≥ 1.

Statistical correlation between bins in data for the differential cross sections for the production of W⁺ bosons as a function of the leading jet rapidity for events with N_jets ≥ 1.

Statistical correlation between bins in data for the differential cross sections for the production of W^- bosons as a function of the leading jet rapidity for events with N_jets ≥ 1.

Differential cross section for the production of W bosons as a function of second leading jet p_T for events with N_jets ≥ 2.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of second leading jet p_T for events with N_jets ≥ 2.

Differential cross section for the production of W bosons as a function of second leading jet rapidity for events with N_jets ≥ 2.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of second leading jet rapidity for events with N_jets ≥ 2.

Differential cross section for the production of W bosons as a function of Δ R_jet1,jet2 for events with N_jets ≥ 2.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of Δ R_jet1,jet2 for events with N_jets ≥ 2.

Differential cross section for the production of W bosons as a function of dijet invariant mass for events with N_jets ≥ 2.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of dijet invariant mass for events with N_jets ≥ 2.

Cross section for the production of W bosons as a function of exclusive jet multiplicity.

Statistical correlation between bins in data for the cross section for the production of W bosons as a function of exclusive jet multiplicity.

Differential cross section for the production of W bosons as a function of the H_T for events with N_jets ≥ 2.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of the H_T for events with N_jets ≥ 2.

Differential cross sections for the production of W⁺ bosons, W^- bosons and the W⁺/W^- cross section ratio as a function of the H_T for events with N_jets ≥ 2.

Statistical correlation between bins in data for the differential cross sections for the production of W⁺ bosons as a function of the H_T for events with N_jets ≥ 2.

Statistical correlation between bins in data for the differential cross sections for the production of W^- bosons as a function of the H_T for events with N_jets ≥ 2.

Differential cross section for the production of W bosons as a function of the W p_T for events with N_jets ≥ 2.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of the W p_T for events with N_jets ≥ 2.

Differential cross sections for the production of W⁺ bosons, W^- bosons and the W⁺/W^- cross section ratio as a function of the W p_T for events with N_jets ≥ 2.

Statistical correlation between bins in data for the differential cross sections for the production of W⁺ bosons as a function of the W p_T for events with N_jets ≥ 2.

Statistical correlation between bins in data for the differential cross sections for the production of W^- bosons as a function of the W p_T for events with N_jets ≥ 2.

Differential cross section for the production of W bosons as a function of the leading jet p_T for events with N_jets ≥ 2.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of the leading jet p_T for events with N_jets ≥ 2.

Differential cross sections for the production of W⁺ bosons, W^- bosons and the W⁺/W^- cross section ratio as a function of the leading jet p_T for events with N_jets ≥ 2.

Statistical correlation between bins in data for the differential cross sections for the production of W⁺ bosons as a function of the leading jet p_T for events with N_jets ≥ 2.

Statistical correlation between bins in data for the differential cross sections for the production of W^- bosons as a function of the leading jet p_T for events with N_jets ≥ 2.

Differential cross section for the production of W bosons as a function of the electron η for events with N_jets ≥ 0.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of the electron η for events with N_jets ≥ 0.

Differential cross sections for the production of W⁺ bosons, W^- bosons and the W⁺/W^- cross section ratio as a function of the electron η for events with N_jets ≥ 0.

Statistical correlation between bins in data for the differential cross sections for the production of W⁺ bosons as a function of the electron η for events with N_jets ≥ 0.

Statistical correlation between bins in data for the differential cross sections for the production of W^- bosons as a function of the electron η for events with N_jets ≥ 0.

Differential cross section for the production of W bosons as a function of the electron η for events with N_jets ≥ 1.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of the electron η for events with N_jets ≥ 1.

Differential cross sections for the production of W⁺ bosons, W^- bosons and the W⁺/W^- cross section ratio as a function of the electron η for events with N_jets ≥ 1.

Statistical correlation between bins in data for the differential cross sections for the production of W⁺ bosons as a function of the electron η for events with N_jets ≥ 1.

Statistical correlation between bins in data for the differential cross sections for the production of W^- bosons as a function of the electron η for events with N_jets ≥ 1.

List of experimentally considered systematic uncertainties for the W+jets cross section measurement

Non-perturbative corrections for the cross section for the production of W bosons for different inclusive jet multiplicities.

Non-perturbative corrections for the differential cross sections for the production of W⁺ bosons and W^- bosons as a function of the inclusive jet multiplicity.

Non-perturbative corrections for the differential cross section for the production of W bosons as a function of H_T for events with N_jets ≥ 1.

Non-perturbative corrections for the differential cross sections for the production of W⁺ bosons and W^- bosons as a function of the H_T for events with N_jets ≥ 1.

Non-perturbative corrections for the differential cross section for the production of W bosons as a function of the W p_T for events with N_jets ≥ 1.

Non-perturbative corrections for the differential cross sections for the production of W⁺ bosons and W^- bosons as a function of the W p_T for events with N_jets ≥ 1.

Non-perturbative corrections for the differential cross section for the production of W bosons as a function of the leading jet p_T for events with N_jets ≥ 1.

Non-perturbative corrections for the differential cross sections for the production of W⁺ bosons and W^- bosons as a function of the leading jet p_T for events with N_jets ≥ 1.

Non-perturbative corrections for the differential cross section for the production of W bosons as a function of the leading jet rapidity for events with N_jets ≥ 1.

Non-perturbative corrections for the differential cross sections for the production of W⁺ bosons and W^- bosons as a function of the leading jet rapidity for events with N_jets ≥ 1.

Non-perturbative corrections for the differential cross section for the production of W bosons as a function of second leading jet p_T for events with N_jets ≥ 2.

Non-perturbative corrections for the differential cross section for the production of W bosons as a function of second leading jet rapidity for events with N_jets ≥ 2.

Non-perturbative corrections for the differential cross section for the production of W bosons as a function of Δ R_jet1,jet2 for events with N_jets ≥ 2.

Non-perturbative corrections for the differential cross section for the production of W bosons as a function of dijet invariant mass for events with N_jets ≥ 2.

Non-perturbative corrections for the cross section for the production of W bosons as a function of exclusive jet multiplicity.

Non-perturbative corrections for the differential cross section for the production of W bosons as a function of the H_T for events with N_jets ≥ 2.

Non-perturbative corrections for the differential cross sections for the production of W⁺ bosons and W^- bosons as a function of the H_T for events with N_jets ≥ 2.

Non-perturbative corrections for the differential cross section for the production of W bosons as a function of the W p_T for events with N_jets ≥ 2.

Non-perturbative corrections for the differential cross sections for the production of W⁺ bosons and W^- bosons as a function of the W p_T for events with N_jets ≥ 2.

Non-perturbative corrections for the differential cross section for the production of W bosons as a function of the leading jet p_T for events with N_jets ≥ 2.

Non-perturbative corrections for the differential cross sections for the production of W⁺ bosons and W^- bosons as a function of the leading jet p_T for events with N_jets ≥ 2.

NNLO/NLO k-factors determined with NNLO Njetti for the differential cross sections for the production of W⁺ bosons and W^- bosons as a function of the H_T for events with N_jets ≥ 1. These numbers were obtained with code described in Phys. Rev. Lett. 115 (2015) 062002 [arXiv:1504.02131].

NNLO/NLO k-factors determined with NNLO Njetti for the differential cross sections for the production of W⁺ bosons and W^- bosons as a function of the W p_T for events with N_jets ≥ 1. These numbers were obtained with code described in Phys. Rev. Lett. 115 (2015) 062002 [arXiv:1504.02131].

NNLO/NLO k-factors determined with NNLO Njetti for the differential cross sections for the production of W⁺ bosons and W^- bosons as a function of the leading jet p_T for events with N_jets ≥ 1. These numbers were obtained with code described in Phys. Rev. Lett. 115 (2015) 062002 [arXiv:1504.02131].

NNLO/NLO k-factors determined with NNLO Njetti for the differential cross sections for the production of W⁺ bosons and W^- bosons as a function of the leading jet rapidity for events with N_jets ≥ 1. These numbers were obtained with code described in Phys. Rev. Lett. 115 (2015) 062002 [arXiv:1504.02131].

Fiducial phase-space relative differential cross-sections after combining the e+jets and $\mu$+jets channels for the $t\bar{t}$ system transverse momentum $p_{T}^{t\bar{t}}$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Fiducial phase-space absolute differential cross-sections after combining the e+jets and $\mu$+jets channels for the $t\bar{t$}$ system absolute rapidity $|y^{t\bar{t}}|$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Fiducial phase-space relative differential cross-sections after combining the e+jets and $\mu$+jets channels for the $t\bar{t$}$ system absolute rapidity $|y^{t\bar{t}}|$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Fiducial phase-space absolute differential cross-sections after combining the e+jets and $\mu$+jets channels for the hadronic top-quark transverse momentum $p_{T}^{t}$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Fiducial phase-space relative differential cross-sections after combining the e+jets and $\mu$+jets channels for the hadronic top-quark transverse momentum $p_{T}^{t}$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Fiducial phase-space absolute differential cross-sections after combining the e+jets and $\mu$+jets channels for the hadronic top-quark absolute rapidity $|y^{t}|$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Fiducial phase-space relative differential cross-sections after combining the e+jets and $\mu$+jets channels for the hadronic top-quark absolute rapidity $|y^{t}|$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Fiducial phase-space absolute differential cross-sections after combining the e+jets and $\mu$+jets channels for the $t\bar{t}$ system absolute out-of-plane momentum $|p_{out}^{t\bar{t}}|$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Fiducial phase-space relative differential cross-sections after combining the e+jets and $\mu$+jets channels for the $t\bar{t}$ system absolute out-of-plane momentum $|p_{out}^{t\bar{t}}|$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Fiducial phase-space absolute differential cross-sections after combining the e+jets and $\mu$+jets channels for the $t\bar{t}$ system azimuthal angle $\Delta \phi^{t\bar{t}}$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Fiducial phase-space relative differential cross-sections after combining the e+jets and $\mu$+jets channels for the $t\bar{t}$ system azimuthal angle $\Delta \phi^{t\bar{t}}$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Fiducial phase-space absolute differential cross-sections after combining the e+jets and $\mu$+jets channels for the scalar sum of the hadronic and leptonic top-quark transverse momenta $H_{T}^{t\bar{t}}$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Fiducial phase-space relative differential cross-sections after combining the e+jets and $\mu$+jets channels for the scalar sum of the hadronic and leptonic top-quark transverse momenta $H_{T}^{t\bar{t}}$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Fiducial phase-space absolute differential cross-sections after combining the e+jets and $\mu$+jets channels for $y_{boost}^{t\bar{t}}$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Fiducial phase-space relative differential cross-sections after combining the e+jets and $\mu$+jets channels for $y_{boost}^{t\bar{t}}$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Fiducial phase-space absolute differential cross-sections after combining the e+jets and $\mu$+jets channels for $\chi^{t\bar{t}}$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Fiducial phase-space relative differential cross-sections after combining the e+jets and $\mu$+jets channels for $\chi^{t\bar{t}}$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Fiducial phase-space absolute differential cross-sections after combining the e+jets and $\mu$+jets channels for $R_{Wt}$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Fiducial phase-space relative differential cross-sections after combining the e+jets and $\mu$+jets channels for $R_{Wt}$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Full phase-space absolute differential cross-sections after combining the e+jets and $\mu$+jets channels for the $t\bar{t}$ system invariant mass $m^{t\bar{t}}$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Full phase-space relative differential cross-sections after combining the e+jets and $\mu$+jets channels for the $t\bar{t}$ system invariant mass $m^{t\bar{t}}$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Full phase-space absolute differential cross-sections after combining the e+jets and $\mu$+jets channels for the $t\bar{t}$ system transverse momentum $p_{T}^{t\bar{t}}$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Full phase-space relative differential cross-sections after combining the e+jets and $\mu$+jets channels for the $t\bar{t}$ system transverse momentum $p_{T}^{t\bar{t}}$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Full phase-space absolute differential cross-sections after combining the e+jets and $\mu$+jets channels for the $t\bar{t}$ system absolute rapidity $|y^{t\bar{t}}|$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Full phase-space relative differential cross-sections after combining the e+jets and $\mu$+jets channels for the $t\bar{t}$ system absolute rapidity $|y^{t\bar{t}}|$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Full phase-space absolute differential cross-sections after combining the e+jets and $\mu$+jets channels for the top-quark transverse momentum $p_{T}^{t}$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Full phase-space relative differential cross-sections after combining the e+jets and $\mu$+jets channels for the top-quark transverse momentum $p_{T}^{t}$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Full phase-space absolute differential cross-sections after combining the e+jets and $\mu$+jets channels for the top-quark absolute rapidity $|y^{t}|$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Full phase-space relative differential cross-sections after combining the e+jets and $\mu$+jets channels for the top-quark absolute rapidity $|y^{t}|$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Full phase-space absolute differential cross-sections after combining the e+jets and $\mu$+jets channels for the $t\bar{t}$ system absolute out-of-plane momentum $|p_{out}^{t\bar{t}}|$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Full phase-space relative differential cross-sections after combining the e+jets and $\mu$+jets channels for the $t\bar{t}$ system absolute out-of-plane momentum $|p_{out}^{t\bar{t}}|$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Full phase-space absolute differential cross-sections after combining the e+jets and $\mu$+jets channels for the $t\bar{t}$ system azimuthal angle $\Delta \phi^{t\bar{t}}$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Full phase-space relative differential cross-sections after combining the e+jets and $\mu$+jets channels for the $t\bar{t}$ system azimuthal angle $\Delta \phi^{t\bar{t}}$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Full phase-space absolute differential cross-sections after combining the e+jets and $\mu$+jets channels for the scalar sum of the hadronic and leptonic top-quark transverse momenta $H_{T}^{t\bar{t}}$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Full phase-space relative differential cross-sections after combining the e+jets and $\mu$+jets channels for the scalar sum of the hadronic and leptonic top-quark transverse momenta $H_{T}^{t\bar{t}}$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Full phase-space absolute differential cross-sections after combining the e+jets and $\mu$+jets channels for $y_{boost}^{t\bar{t}}$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Full phase-space relative differential cross-sections after combining the e+jets and $\mu$+jets channels for $y_{boost}^{t\bar{t}}$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Full phase-space absolute differential cross-sections after combining the e+jets and $\mu$+jets channels for $\chi^{t\bar{t}}$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

Full phase-space relative differential cross-sections after combining the e+jets and $\mu$+jets channels for $\chi^{t\bar{t}}$. All uncertainties are quoted as a percentage with respect to the cross-section values in each bin.

The leptonic asymmetry dependence on the invariant mass of top-antitop system ($m_{t\bar{t}}$) in the fiducial volume.

The leptonic asymmetry dependence on the longitudinal boost of the top-antitop system ($\beta_z^{t\bar{t}}$) in the fiducial volume.

The leptonic asymmetry dependence on the transverse momentum of the top-antitop system ($p_T^{t\bar{t}}$) in the fiducial volume.

The top-antitop inclusive asymmetry in the fiducial volume.

The top-antitop asymmetry dependence on the invariant mass of top-antitop system ($m_{t\bar{t}}$) in the fiducial volume.

The top-antitop asymmetry dependence on the longitudinal boost of the top-antitop system ($\beta_z^{t\bar{t}}$) in the fiducial volume.

The top-antitop asymmetry dependence on the transverse momentum of the top-antitop system ($p_T^{t\bar{t}}$) in the fiducial volume.

Numbers of observed and background events for SR3L low for each bin of the distribution in Meff. The table corresponds to Fig. 4(d). The statistical and systematic uncertainties are combined for the predicted numbers.

Numbers of observed and background events for SR3L high for each bin of the distribution in Meff. The table corresponds to Fig. 4(e). The statistical and systematic uncertainties are combined for the predicted numbers.

The efficiencies are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of squarks that decay into two steps into q q W Z W Z chi1^0 chi1^0 (see Fig. 6c in the paper).

The efficiencies are calculated for all simplified extra dimension model (see Fig. 8d in the paper). For each model, the values are given for the five signal regions and their combination.

The efficiencies are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of gluinos that decay via sleptons into q q q q l l (l l) chi1^0 chi1^0 + neutrinos (see Fig. 6d in the paper).

The efficiencies are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of gluinos that decay into q q q q W W chi1^0 chi1^0 (see Fig. 6a in the paper).

The efficiencies are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of gluinos that decay into t tbar t tbar chi1^0 chi1^0 (see Fig. 5a in the paper). This particular model assumes that top quark is much heavier than gluino.

The efficiencies are calculated for all mSUGRA models (see Fig. 8a in the paper). For each model, the values are given for the five signal regions and their combination. The model assumes tan(beta)=30, A0=2m0, and mu>0.

The efficiencies are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of gluinos. A gluino decays into t c chi1^0 (see Fig. 5c in the paper). This particular model assumes that m(chi1^0) = m(stop) - 20 GeV.

The efficiencies are calculated for all GMSB models (see Fig. 8c in the paper). For each model, the values are given for the five signal regions and their combination. The model assumes mmess=250 TeV, m5=3, mu>0, and Cgrav=1.

The efficiencies are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of bottom squarks. A bottom squark decays into t chi1^(+-) and chi1^(+-) --> W^(+-) chi1^0 (see Fig. 7a in the paper). This particular model assumes that m(chi1^0)=60 GeV.

The efficiencies are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of gluinos and top squarks. Top squarks undergo R-parity violating decays into b s and gluinos decay into t stop (see Fig. 5d in the paper).

The efficiencies are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of bottom squarks. A bottom squark decays into t chi1^(+-) and chi1^(+-) --> W^(+-) chi1^0 (see Fig. 7b in the paper). This particular model assumes that m(chi1^0)=2(chi1^0).

The efficiencies are calculated for all mSUGRA/CMSSM models with bRPV (see Fig. 8b in the paper). For each model, the values are given for the five signal regions and their combination. The model assumes tan(beta)=30, A0=2m0, mu>0, and bRPV.

The efficiencies are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of squarks. Squarks decay into q q l l (l l) chi1^0 chi1^0 + neutrinos (see Fig. 6e in the paper).

The efficiencies are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct pair-production of gluinos that decay via a two-step process into q q q q W Z W Z chi1^0 chi1^0 (see Fig. 6b in the paper).

The efficiencies are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct pair production of gluinos. A gluino decays into t stop. Consequently, a top squark squark decays into b chi1^(+-) and chi1^(+-) --> W^(+-) chi1^0 (see Fig. 5b in the paper). This particular model assumes that m(stop) < m(gluino), m(chi1^0)=6 GeV, and m(chi1^(+-))=118 GeV.

The acceptances (in percent, %) are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of squarks that decay into two steps into q q W Z W Z chi1^0 chi1^0 (see Fig. 6c in the paper).

The acceptances (in percent, %) are calculated for all simplified extra dimension model (see Fig. 8d in the paper). For each model, the values are given for the five signal regions and their combination.

The acceptances (in percent, %) are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of gluinos that decay via sleptons into q q q q l l (l l) chi1^0 chi1^0 + neutrinos (see Fig. 6d in the paper).

The acceptances (in percent, %) are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of gluinos that decay into q q q q W W chi1^0 chi1^0 (see Fig. 6a in the paper).

The acceptances (in percent, %) are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of gluinos that decay into t tbar t tbar chi1^0 chi1^0 (see Fig. 5a in the paper). This particular model assumes that top quark is much heavier than gluino.

The acceptances (in percent, %) are calculated for all mSUGRA models (see Fig. 8a in the paper). For each model, the values are given for the five signal regions and their combination. The model assumes tan(beta)=30, A0=2m0, and mu>0.

The acceptances (in percent, %) are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of gluinos. A gluino decays into t c chi1^0 (see Fig. 5c in the paper). This particular model assumes that m(chi1^0) = m(stop) - 20 GeV.

The acceptances (in percent, %) are calculated for all GMSB models (see Fig. 8c in the paper). For each model, the values are given for the five signal regions and their combination. The model assumes mmess=250 TeV, m5=3, mu>0, and Cgrav=1.

The acceptances (in percent, %) are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of bottom squarks. A bottom squark decays into t chi1^(+-) and chi1^(+-) --> W^(+-) chi1^0 (see Fig. 7a in the paper). This particular model assumes that m(chi1^0)=60 GeV.

The acceptances (in percent, %) are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of gluinos and top squarks. Top squarks undergo R-parity violating decays into bs and gluinos decay into t stop (see Fig. 5d in the paper).

The acceptances (in percent, %) are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of bottom squarks. A bottom squark decays into t chi1^(+-) and chi1^(+-) --> W chi1^0 (see Fig. 7b in the paper). This particular model assumes that m(chi1^0)=2(chi1^0).

The acceptances (in percent, %) are calculated for all mSUGRA/CMSSM models with bRPV (see Fig. 8b in the paper). For each model, the values are given for the five signal regions and their combination. The model assumes tan(beta)=30, A0=2m0, mu>0, and bRPV.

The acceptances (in percent, %) are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of squarks. Squarks decay into q q l l (l l) chi1^0 chi1^0 + neutrinos (see Fig. 6e in the paper).

The acceptances (in percent, %) are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct pair-production of gluinos that decay via a two-step process into q q q q W Z W Z chi1^0 chi1^0 (see Fig. 6b in the paper).

The acceptances (in percent, %) are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct pair production of gluinos. A gluino decays into t stop. Consequently, a top squark squark decays into b chi1^(+-) and chi1^(+-) --> W^(+-) chi1^0 (see Fig. 5b in the paper). This particular model assumes that m(stop) < m(gluino), m(chi1^0)=6 GeV, and m(chi1^(+-))=118 GeV.

The limits on observed cross section are calculated for all simplified models. The simplified models are for direct pair production of squarks that decay into two steps into q q W Z W Z chi1^0 chi1^0 (see Fig. 6c in the paper).

The limits on observed cross sections are calculated for all simplified models. The simplified models are for direct pair-production of gluinos that decay via sleptons into q q q q l l (l l) chi1^0 chi1^0 + neutrinos (see Fig. 6d in the paper).

The limits on observed cross sections are calculated for all simplified models. The simplified models are for direct production of gluinos that decay into q q q q W W chi1^0 chi1^0 (see Fig. 6a in the paper).

The limits on observed cross sections are calculated for all simplified models. The simplified models are for direct production of gluinos that decay into t tbar t tbar chi1^0 chi1^0 (see Fig. 5a in the paper). This particular model assumes that top quark is much heavier than gluino.

The limits on observed cross sections are calculated for all simplified models. The simplified models are for direct pair production of gluinos. A gluino decays into t c chi1^0 (see Fig. 5c in the paper). This particular model assumes that m(chi1^0) = m(stop) - 20 GeV.

The limits on observed cross sections are calculated for all simplified models. The simplified models are for direct production of bottom squarks. A bottom squark decays into t chi1^(+-) and chi1^(+-) --> W^(+-) chi1^0 (see Fig. 7a in the paper). This particular model assumes that m(chi1^0)=60 GeV.

The limits on observed cross sections are calculated for all simplified models. The simplified models are for direct production of gluinos and top squarks. Top squarks undergo R-parity violating decays into bs and gluinos decay into t stop (see Fig. 5d in the paper).

The limits on observed cross sections are calculated for all simplified models. The simplified models are for direct production of bottom squarks. A bottom squark decays into t chi1^(+-) and chi1^(+-) --> W^(+-) chi1^0 (see Fig. 7b in the paper). This particular model assumes that m(chi1^0)=2(chi1^0).

The limits on observed cross sections are calculated for all simplified models. The simplified models are for direct production of squarks. Squarks decay into q q l l (l l) chi1^0 chi1^0 + neutrinos (see Fig. 6e in the paper).

The limits on observed cross sections are calculated for all simplified models. The simplified models are for direct pair-production of gluinos that decay via a two-step process into q q q q W Z W Z chi1^0 chi1^0 (see Fig. 6b in the paper).

The limits on observed cross sections are calculated for all simplified models. The simplified models are for direct pair production of gluinos. A gluino decays into t stop. Consequently, a top squark squark decays into b chi1^(+-) and chi1^(+-) --> W^(+-) chi1^0 (see Fig. 5b in the paper). This particular model assumes that m(stop) < m(gluino), m(chi1^0)=6 GeV, and m(chi1^(+-))=118 GeV.

The signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of squarks that decay into two steps into q q W Z W Z chi1^0 chi1^0 (see Fig. 6c in the paper).

The signal event yields are calculated for all simplified extra dimension model (see Fig. 8d in the paper). For each model, the values are given for the five signal regions and their combination.

The signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of gluinos that decay via sleptons into q q q q l l (l l) chi1^0 chi1^0 + neutrinos (see Fig. 6d in the paper).

The signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of gluinos that decay into q q q q W W chi1^0 chi1^0 (see Fig. 6a in the paper).

The signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of gluinos that decay into t tbar t tbar chi1^0 chi1^0 (see Fig. 5a in the paper). This particular model assumes that top quark is much heavier than gluino.

The signal event yields are calculated for all mSUGRA models (see Fig. 8a in the paper). For each model, the values are given for the five signal regions and their combination. The model assumes tan(beta)=30, A0=2m0, and mu>0.

The signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of gluinos. A gluino decays into t c chi1^0 (see Fig. 5c in the paper). This particular model assumes that m(chi1^0) = m(stop)-20 GeV.

The signal event yields are calculated for all GMSB models (see Fig. 8c in the paper). For each model, the values are given for the five signal regions and their combination. The model assumes mmess=250 TeV, m5=3, mu>0, and Cgrav=1.

The signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of bottom squarks. A bottom squark decays into t chi1^(+-) and chi1^(+-) --> W^(+-) chi1^0 (see Fig. 7a in the paper). This particular model assumes that m(chi1^0)=60 GeV.

The signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of gluinos and top squarks. Top squarks undergo R-parity violating decays into bs and gluinos decay into t stop (see Fig. 5d in the paper).

The signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of bottom squarks. A bottom squark decays into t chi1^(+-) and chi1^(+-) --> W^(+-) chi1^0 (see Fig. 7b in the paper). This particular model assumes that m(chi1^0)=2(chi1^0).

The signal event yields are calculated for all mSUGRA/CMSSM models with bRPV (see Fig. 8b in the paper). For each model, the values are given for the five signal regions and their combination. The model assumes tan(beta)=30, A0=2m0, mu>0, and bRPV.

The signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of squarks. Squarks decay into q q l l (l l) chi1^0 chi1^0 + neutrinos (see Fig. 6e in the paper).

The signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct pair-production of gluinos that decay via a two-step process into q q q q W Z W Z chi1^0 chi1^0 (see Fig. 6b in the paper).

The signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct pair-production of gluinos. A gluino decays into t stop. Consequently, a top squark squark decays into b chi1^(+-) and chi1^(+-) --> W^(+-) chi1^0 (see Fig. 5b in the paper). This particular model assumes that m(stop) < m(gluino), m(chi1^0)=6 GeV, and m(chi1^(+-))=118 GeV.

Experimental uncertainties on the signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of squarks that decay into two steps into q q W Z W Z chi1^0 chi1^0 (see Fig. 6c in the paper).

Experimental uncertainties on the signal event yields are calculated for all simplified extra dimension model (see Fig. 8d in the paper). For each model, the values are given for the five signal regions and their combination.

Experimental uncertainties on the signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of gluinos that decay via sleptons into q q q q l l (l l) chi1^0 chi1^0 + neutrinos (see Fig. 6d in the paper).

Experimental uncertainties on the signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of gluinos that decay into q q q q W W chi1^0 chi1^0 (see Fig. 6a in the paper).

Experimental uncertainties on the signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of gluinos that decay into t tbar t tbar chi1^0 chi1^0 (see Fig. 5a in the paper). This particular model assumes that top quark is much heavier than gluino.

Experimental uncertainties on the signal event yields are calculated for all mSUGRA models (see Fig. 8a in the paper). For each model, the values are given for the five signal regions and their combination. The model assumes tan(beta)=30, A0=2m0, and mu>0.

Experimental uncertainties on the signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of gluinos. A gluino decays into t c chi1^0 (see Fig. 5c in the paper). This particular model assumes that m(chi1^0) = m(stop) - 20 GeV.

Experimental uncertainties on the signal event yields are calculated for all GMSB models (see Fig. 8c in the paper). For each model, the values are given for the five signal regions and their combination. The model assumes mmess=250 TeV, m5=3, mu>0, and Cgrav=1.

Experimental uncertainties on the signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of bottom squarks. A bottom squark decays into t chi1^(+-) and chi1^(+-) --> W^(+-) chi1^0 (see Fig. 7a in the paper). This particular model assumes that m(chi1^0)=60 GeV.

Experimental uncertainties on the signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of gluinos and top squarks. Top squarks undergo R-parity violating decays into bs and gluinos decay into t stop (see Fig. 5d in the paper).

Experimental uncertainties on the signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of bottom squarks. A bottom squark decays into t chi1^(+-) and chi1^(+-) --> W^(+-) chi1^0 (see Fig. 7b in the paper). This particular model assumes that m(chi1^0)=2(chi1^0).

Experimental uncertainties on the signal event yields are calculated for all mSUGRA/CMSSM models with bRPV (see Fig. 8b in the paper). For each model, the values are given for the five signal regions and their combination. The model assumes tan(beta)=30, A0=2m0, mu>0, and bRPV.

Experimental uncertainties on the signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of squarks. Squarks decay into q q l l (l l) chi1^0 chi1^0 + neutrinos (see Fig. 6e in the paper).

Experimental uncertainties on the signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct pair-production of gluinos that decay via a two-step process into q q q q W Z W Z chi1^0 chi1^0 (see Fig. 6b in the paper).

Experimental uncertainties on the signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct pair-production of gluinos. A gluino decays into t stop. Consequently, a top squark squark decays into b chi1^(+-) and chi1^(+-) --> W^(+-) chi1^0 (see Fig. 5b in the paper). This particular model assumes that m(stop) < m(gluino), m(chi1^0)=6 GeV, and m(chi1^(+-))=118 GeV.

Statistical uncertainties on the signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of squarks that decay into two steps into q q W Z W Z chi1^0 chi1^0 (see Fig. 6c in the paper).

Statistical uncertainties on the signal event yields are calculated for all simplified extra dimension model (see Fig. 8d in the paper). For each model, the values are given for the five signal regions and their combination.

Statistical uncertainties on the signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of gluinos that decay via sleptons into q q q q l l (l l) chi1^0 chi1^0 + neutrinos (see Fig. 6d in the paper).

Statistical uncertainties on the signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of gluinos that decay into q q q q W W chi1^0 chi1^0 (see Fig. 6a in the paper).

Statistical uncertainties on the signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of gluinos that decay into t tbar t tbar chi1^0 chi1^0 (see Fig. 5a in the paper). This particular model assumes that top quark is much heavier than gluino.

Statistical uncertainties on the signal event yields are calculated for all mSUGRA models (see Fig. 8a in the paper). For each model, the values are given for the five signal regions and their combination. The model assumes tan(beta)=30, A0=2m0, and mu>0.

Statistical uncertainties on the signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of gluinos. A gluino decays into t c chi1^0 (see Fig. 5c in the paper). This particular model assumes that m(chi1^0) = m(stop) - 20 GeV.

Statistical uncertainties on the signal event yields are calculated for all GMSB models (see Fig. 8c in the paper). For each model, the values are given for the five signal regions and their combination. The model assumes mmess=250 TeV, m5=3, mu>0, and Cgrav=1.

Statistical uncertainties on the signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of bottom squarks. A bottom squark decays into t chi1^(+-) and chi1^(+-) --> W^(+-) chi1^0 (see Fig. 7a in the paper). This particular model assumes that m(chi1^0)=60 GeV.

Statistical uncertainties on the signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of gluinos and top squarks. Top squarks undergo R-parity violating decays into bs and gluinos decay into t stop (see Fig. 5d in the paper).

Statistical uncertainties on the signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of bottom squarks. A bottom squark decays into t chi1^(+-) and chi1^(+-) --> W^(+-) chi1^0 (see Fig. 7b in the paper). This particular model assumes that m(chi1^0)=2(chi1^0).

Statistical uncertainties on the signal event yields are calculated for all mSUGRA/CMSSM models with bRPV (see Fig. 8b in the paper). For each model, the values are given for the five signal regions and their combination. The model assumes tan(beta)=30, A0=2m0, mu>0, and bRPV.

Statistical uncertainties on the signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of squarks. Squarks decay into q q l l (l l) chi1^0 chi1^0 + neutrinos (see Fig. 6e in the paper).

Statistical uncertainties on the signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct pair-production of gluinos that decay via a two-step process into q q q q W Z W Z chi1^0 chi1^0 (see Fig. 6b in the paper).

Statistical uncertainties on the signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct pair-production of gluinos. A gluino decays into t stop. Consequently, a top squark squark decays into b chi1^(+-) and chi1^(+-) --> W ^(+-) chi1^0 (see Fig. 5b in the paper). This particular model assumes that m(stop) < m(gluino), m(chi1^0)=6 GeV, and m(chi1^(+-))=118 GeV.

The confidence levels are calculated for all simplified models. For each model, the observed and expected values are given. The simplified model is for direct production of gluinos that decay into t tbar t tbar chi1^0 chi1^0 (see Fig. 5a in the paper). This particular model assumes that top quark is much heavier than gluino.

The confidence levels are calculated for all simplified models. For each model, the observed and expected values are given. The simplified model is for direct production of squarks that decay into two steps into q q W Z W Z chi1^0 chi1^0 (see Fig. 6c in the paper).

The confidence levels are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct pair-production of gluinos that decay via a two-step process into q q q q W Z W Z chi1^0 chi1^0 (see Fig. 6b in the paper).

The confidence levels are calculated for all simplified models. For each model, the expected and observed values are given. The simplified model is for direct production of gluinos that decay via sleptons into q q q q l l (l l) chi1^0 chi1^0 + neutrinos (see Fig. 6d in the paper).

The confidence levels are calculated for all simplified models. For each model, the expected and observed values are given. The simplified model is for direct pair-production of gluinos. A gluino decays into t stop. Consequently, a top squark squark decays into b chi1^(+-) and chi1^(+-) --> W^(+-) chi1^0 (see Fig. 5b in the paper). This particular model assumes that m(stop) < m(gluion), m(chi1^0)=6 GeV, and m(chi1^(+-))=118 GeV.

The confidence levels are calculated for all simplified models. For each model, the expected and observed values are given. The simplified model is for direct production of gluinos. A gluino decays into t c chi1^0 (see Fig. 5c in the paper). This particular model assumes that m(chi1^0) = m(stop) - 20 GeV.

The confidence levels are calculated for all simplified models. For each model, the expected and observed values are given. The simplified model is for direct production of bottom squarks. A bottom squark decays into t chi1^(+-) and chi1^(+-) --> W^(+-) chi1^0 (see Fig. 7b in the paper). This particular model assumes that m(chi1^0)=2(chi1^0).

The confidence levels are calculated for all simplified models. For each model, the expected and observed values are given. The simplified model is for direct production of bottom squarks. A bottom squark decays into t chi1^(+-) and chi1^(+-) --> W^(+-) chi1^0 (see Fig. 7a in the paper). This particular model assumes that m(chi1^0)=60 GeV.

The confidence levels are calculated for all simplified models. For each model, the expected and observed values are given. The simplified model is for direct production of squarks. Squarks decay into q q l l (l l) chi1^0 chi1^0 + neutrinos (see Fig. 6e in the paper).

The confidence levels are calculated for all GMSB models (see Fig. 8c in the paper). For each model, the expected and observed values are given. The model assumes mmess=250 TeV, m5=3, mu>0, and Cgrav=1.

The confidence levels are calculated for all simplified models. For each model, the expected and observed values are given. The simplified model is for direct production of gluinos and top squarks. Top squarks undergo R-parity violating decays into bs and gluinos decay into t stop (see Fig. 5d in the paper).

The confidence levels are calculated for all mSUGRA/CMSSM models with bRPV (see Fig. 8b in the paper). For each model, the expected and observed values are given. The model assumes tan(beta)=30, A0=2m0, mu>0, and bRPV.

The confidence levels are calculated for all simplified extra dimension model (see Fig. 8d in the paper). For each model, the expected and observed values are given.

The confidence levels are calculated for all simplified models. For each model, the expected and observed values are given. The simplified model is for direct production of gluinos that decay into q q q q W W chi1^0 chi1^0 (see Fig. 6a in the paper).

The confidence levels are calculated for all mSUGRA models (see Fig. 8a in the paper). For each model, the expected and observed values are given. The model assumes tan(beta)=30, A0=2m0, and mu>0.

The measured fiducial as a function of sqrt(d3). The fiducial cross sections are measred for the charged-only particle level in the muon channel as well as the electron channel. Extrapolations to the complete fiducial phase space including charged and neutral particles are also shown for the muon channel and the electron channel.

The measured fiducial as a function of sqrt(d4). The fiducial cross sections are measred for the charged-only particle level in the muon channel as well as the electron channel. Extrapolations to the complete fiducial phase space including charged and neutral particles are also shown for the muon channel and the electron channel.

The measured fiducial as a function of sqrt(d5). The fiducial cross sections are measred for the charged-only particle level in the muon channel as well as the electron channel. Extrapolations to the complete fiducial phase space including charged and neutral particles are also shown for the muon channel and the electron channel.

The measured fiducial as a function of sqrt(d6). The fiducial cross sections are measred for the charged-only particle level in the muon channel as well as the electron channel. Extrapolations to the complete fiducial phase space including charged and neutral particles are also shown for the muon channel and the electron channel.

The measured fiducial as a function of sqrt(d7). The fiducial cross sections are measred for the charged-only particle level in the muon channel as well as the electron channel. Extrapolations to the complete fiducial phase space including charged and neutral particles are also shown for the muon channel and the electron channel.

The measured fiducial cross sections are corrected to the dressed level. The ratio of $C_{WZ}^{\textrm{dressed}}/C_{WZ}^{\textrm{Born}}$ factors presented in this table can be used to correct fiducial integrated cross sections from dressed to Born level.

Cross section extrapolated to total phase space and all W and Z boson decays. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the theory uncertainty and the third is the luminosity uncertainty.

The total cross section is measured at dressed level and can also be corrected to Born level use this acceptance correction factor.

Ratio of fiducial cross sections measured for $W^{+} Z$ and $W^{-} Z$ production. The first systematic uncertainty is the combined systematic uncertainty excluding the luminosity uncertainty, the second is the luminosity uncertainty.

Observed and expected upper limits at $95\%$ CL in fb on the fiducial cross section $\sigma^{\mathrm{fid.}}_{W^{\pm} Zjj \textrm{-EW} \rightarrow \ell^{'} \nu \ell \ell}$, multiplied by the $W$ and $Z$ branching ratios in a single leptonic channel with muons or electrons in the VBS fiducial phase space. Values obtained with or without subtraction of the $tZj$ contribution are presented. The $1$ $\sigma$ and $2$ $\sigma$ uncertainty intervals around the expected limits are also indicated.

Observed and expected upper limits at $95\%$ CL in fb on the fiducial cross section $\sigma^{\mathrm{fid.}}_{W^{\pm} Zjj \textrm{-EW} \rightarrow \ell^{'} \nu \ell \ell}$, multiplied by the $W$ and $Z$ branching ratios in a single leptonic channel with muons or electrons in the aQGC fiducial phase space. Values obtained with or without subtraction of the $tZj$ contribution are presented. The $1$ $\sigma$ and $2$ $\sigma$ uncertainty intervals around the expected limits are also indicated.

Expected and observed one-dimensional 95% Confidence Level intervals on the anomalous couplings parameters. Anomalous couplings are introduced as form factors using a cut-off scale $\Lambda_{\mathrm{co}}$.

Expected and observed one-dimensional intervals at 95% Confidence Level on the Effective Field Theory (EFT) parameters.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Ratio of $W^{+}Z$ over $W^{-}Z$ differential fiducial cross sections measured in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The last bin is a cross section for all events above the lower end of the bin.

Ratio of $W^{+}Z$ over $W^{-}Z$ differential fiducial cross sections measured in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The last bin is a cross section for all events above the lower end of the bin.

Ratio of $W^{+}Z$ over $W^{-}Z$ differential fiducial cross sections measured in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The last bin is a cross section for all events above the lower end of the bin.

Ratio of $W^{+}Z$ over $W^{-}Z$ differential fiducial cross sections measured in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The last bin is a cross section for all events above the lower end of the bin.

Ratio of $W^{+}Z$ over $W^{-}Z$ differential fiducial cross sections measured in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$.

The measured differential as a function of aT.

The measured differential as a function of phiStarEta.

The measured differential as a function of abs(cosThetaStarEta).

The measured differential as a function of deltaPhi.

The total inelastic cross section.

The measured differential elastic cross section. In addition to the statistical and total systematic uncertainties, the following 22 systematic shifts are given, which are included in the profile fit with their signs: -- Constraints: Beam optics uncertainty obtained by varying the ALFA constraints in the optics fit -- QScan: Variation by +/- 0.1 % of the quadrupole strength -- Q2: Fit of the strength of Q2 using the best value for the strength of Q1 and Q3 -- Q5Q6: Variation of the strength of Q5 and Q6 by -0.2% as indicated by machine constraints -- MadX: Uncertainty related to the beam transport replacing matrix transport by MadX PTC tracking -- Qmisal: Uncertainty due to the mis-alignment of the quadrupoles in the beam line -- Q1Q3: Propagation of the optics fit uncertainty in the strenght of Q1 and Q3 on the differential elastic cross section -- Aopt: Alignment uncertainty from the optimization procedure -- Offv: Alignment uncertainty related to the vertical beam center offset -- Offh: Alignment uncertainty related to the horizontal beam center offset -- Ang: Alignment uncertainty related to the detector rotation in the x-y plane -- BGn: Uncertainty from the background normalization -- BGs: Uncertainty from the background shape -- MCres: Error from modelling of the detector response -- Slope: Residual dependence on the physics model estimated by varying the nuclear slope in the simulation by +/- 1 GeV^-2 -- Emit: Uncertainty from the emittance used to calculate beam divergence in the simulation -- Unf: Unfolding uncertainty from the data-driven closure test -- Trac: Uncertainty from the variation of the track reconstruction selection cuts -- Xing: Uncertainty from residual crossing angle in the horizontal plane -- Eff: Uncertainty from the reconstruction efficiency -- Lumi: Luminosity uncertainty (+/- 1.5%) -- Ebeam: Uncertainty from the nominal beam energy (+/- 0.65%) Small differences in the values given here compared to the published version are related to insignificant rounding issues.

The statistical covariance matrix for the differential elastic cross section.

The electron channel Born-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kDressed) is also provided.

The electron channel Born-level double-differential cross section D2SIG/DM/DABSYRAP. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kDressed) is also provided.

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kDressed) is also provided.

The muon channel Born-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kdressed) is also provided.

The muon channel Born-level double-differential cross section D2SIG/DM/DABSYRAP. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kdressed) is also provided.

The muon channel Born-level double-differential cross section D2SIG/DM/DABSDETA. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kdressed) is also provided.

Born-level differential fiducial cross section prediction DSIG/DM at NNLO including NLO electroweak corrections and the PI contribution. The calculation is performed using the MMHT2014 NNLO PDF set and with dynamic scales set equal to the invariant mass. The predictions are listed together with the statistical uncertainty, the PDF eigenvector variation, the uncertainty from the variation of alpha_s, the combined uncertainty from mu_F and mu_R, and the uncertainty from the variation of the photon PDF in the PI contribution. The fraction of the PI contribution, f(PI), is also given.

Born-level differential fiducial cross section prediction D2SIG/DM/DABSYRAP at NNLO including NLO electroweak corrections and the PI contribution. The calculation is performed using the MMHT2014 NNLO PDF set and with dynamic scales set equal to the invariant mass. The predictions are listed together with the statistical uncertainty, the PDF eigenvector variation, the uncertainty from the variation of alpha_s, the combined uncertainty from mu_F and mu_R, and the uncertainty from the variation of the photon PDF in the PI contribution. The fraction of the PI contribution, f(PI), is also given.

Born-level differential fiducial cross section prediction D2SIG/DM/DABSDETA at NNLO including NLO electroweak corrections and the PI contribution. The calculation is performed using the MMHT2014 NNLO PDF set and with dynamic scales set equal to the invariant mass. The predictions are listed together with the statistical uncertainty, the PDF eigenvector variation, the uncertainty from the variation of alpha_s, the combined uncertainty from mu_F and mu_R, and the uncertainty from the variation of the photon PDF in the PI contribution. The fraction of the PI contribution, f(PI), is also given.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 116 GeV < M(EE) < 150 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 150 GeV < M(EE) < 200 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 200 GeV < M(EE) < 300 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 300 GeV < M(EE) < 500 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 500 GeV < M(EE) < 1500 GeV.

The electron channel dressed-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 116 GeV < M(EE) < 150 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 150 GeV < M(EE) < 200 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 200 GeV < M(EE) < 300 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 300 GeV < M(EE) < 500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 500 GeV < M(EE) < 1500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 116 GeV < M(EE) < 150 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 150 GeV < M(EE) < 200 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 200 GeV < M(EE) < 300 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 300 GeV < M(EE) < 500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 500 GeV < M(EE) < 1500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 116 GeV < M(MM) < 150 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 150 GeV < M(MM) < 200 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 200 GeV < M(MM) < 300 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 300 GeV < M(MM) < 500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 500 GeV < M(MM) < 1500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 116 GeV < M(MM) < 150 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 150 GeV < M(MM) < 200 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 200 GeV < M(MM) < 300 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 300 GeV < M(MM) < 500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 500 GeV < M(MM) < 1500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

Measured cross-section as a function of angular separation between the muon and the closest jet for $500~\text{GeV} < p_T^{\text{leading jet}} < 600~\text{GeV}$. Multiplicative correction factors for using prompt muons and prompt dressing photons in the particle-level selection, derived from ALPGEN 2.14 interfaced with PYTHIA 6.426, are also shown.

Measured cross-section as a function of angular separation between the muon and the closest jet for $p_T^{\text{leading jet}} > 650~\text{GeV}$. Multiplicative correction factors for using prompt muons and prompt dressing photons in the particle-level selection, derived from ALPGEN 2.14 interfaced with PYTHIA 6.426, are also shown.